CN207908059U - 一种用于红外测温仪温度校正的视镜和一种红外测温仪的校正装置 - Google Patents
一种用于红外测温仪温度校正的视镜和一种红外测温仪的校正装置 Download PDFInfo
- Publication number
- CN207908059U CN207908059U CN201820251385.2U CN201820251385U CN207908059U CN 207908059 U CN207908059 U CN 207908059U CN 201820251385 U CN201820251385 U CN 201820251385U CN 207908059 U CN207908059 U CN 207908059U
- Authority
- CN
- China
- Prior art keywords
- temperature
- radiation thermometer
- glass
- infrared radiation
- visor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 230000005855 radiation Effects 0.000 title claims abstract description 70
- 238000012937 correction Methods 0.000 title claims abstract description 25
- 239000011521 glass Substances 0.000 claims abstract description 51
- 239000000498 cooling water Substances 0.000 claims abstract description 45
- 238000009529 body temperature measurement Methods 0.000 claims abstract description 14
- 238000001839 endoscopy Methods 0.000 claims description 8
- CFOAUMXQOCBWNJ-UHFFFAOYSA-N [B].[Si] Chemical compound [B].[Si] CFOAUMXQOCBWNJ-UHFFFAOYSA-N 0.000 claims description 5
- 238000012545 processing Methods 0.000 claims description 5
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical group O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 4
- 230000008676 import Effects 0.000 claims description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 abstract description 37
- 229910052710 silicon Inorganic materials 0.000 abstract description 37
- 239000010703 silicon Substances 0.000 abstract description 37
- 238000004519 manufacturing process Methods 0.000 abstract description 17
- 238000007670 refining Methods 0.000 abstract description 10
- 238000004857 zone melting Methods 0.000 abstract description 10
- 229910021420 polycrystalline silicon Inorganic materials 0.000 abstract description 8
- 229920005591 polysilicon Polymers 0.000 abstract description 8
- 230000000694 effects Effects 0.000 abstract description 6
- 239000011159 matrix material Substances 0.000 description 11
- 239000010410 layer Substances 0.000 description 10
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 10
- 238000000034 method Methods 0.000 description 7
- 238000005259 measurement Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 4
- 238000009826 distribution Methods 0.000 description 3
- 230000005457 Black-body radiation Effects 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 239000011229 interlayer Substances 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 239000000523 sample Substances 0.000 description 2
- 238000001228 spectrum Methods 0.000 description 2
- 230000003746 surface roughness Effects 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- -1 see Fig. 4 Substances 0.000 description 1
- 239000002210 silicon-based material Substances 0.000 description 1
- 229920002545 silicone oil Polymers 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
Landscapes
- Radiation Pyrometers (AREA)
Abstract
Description
Claims (6)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201820251385.2U CN207908059U (zh) | 2018-02-12 | 2018-02-12 | 一种用于红外测温仪温度校正的视镜和一种红外测温仪的校正装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201820251385.2U CN207908059U (zh) | 2018-02-12 | 2018-02-12 | 一种用于红外测温仪温度校正的视镜和一种红外测温仪的校正装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
CN207908059U true CN207908059U (zh) | 2018-09-25 |
Family
ID=63559912
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201820251385.2U Active CN207908059U (zh) | 2018-02-12 | 2018-02-12 | 一种用于红外测温仪温度校正的视镜和一种红外测温仪的校正装置 |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN207908059U (zh) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108132100A (zh) * | 2018-02-12 | 2018-06-08 | 江苏鑫华半导体材料科技有限公司 | 一种红外测温仪的校正装置及校正方法 |
CN111204042A (zh) * | 2018-11-21 | 2020-05-29 | 三纬国际立体列印科技股份有限公司 | 具红外线测温器校正结构的3d打印装置 |
-
2018
- 2018-02-12 CN CN201820251385.2U patent/CN207908059U/zh active Active
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108132100A (zh) * | 2018-02-12 | 2018-06-08 | 江苏鑫华半导体材料科技有限公司 | 一种红外测温仪的校正装置及校正方法 |
CN108132100B (zh) * | 2018-02-12 | 2022-07-15 | 江苏鑫华半导体科技股份有限公司 | 一种红外测温仪的校正装置及校正方法 |
CN111204042A (zh) * | 2018-11-21 | 2020-05-29 | 三纬国际立体列印科技股份有限公司 | 具红外线测温器校正结构的3d打印装置 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN106768380B (zh) | 一种对红外测温设备的测试结果进行修正的方法 | |
CN112050948B (zh) | 基于探测器温度漂移模型的无挡片红外测温方法 | |
CN107677375A (zh) | 一种红外辐射测量***定标装置及定标方法 | |
CN104731131B (zh) | 航天器热真空试验温度控制方法 | |
WO2015093930A1 (es) | Sistema y método para calibración y caracterización de instrumentos de medición de temperatura por telemetría | |
CN104155008A (zh) | 一种红外温度监测***测量误差修正方法 | |
CN107817054B (zh) | 一种用于真空腔内部件的红外成像仪测温方法 | |
CN103954366B (zh) | 一种用于真空低温条件下的超大面源黑体校准*** | |
CN104634458A (zh) | 一种测温标定***及测温方法 | |
CN207908059U (zh) | 一种用于红外测温仪温度校正的视镜和一种红外测温仪的校正装置 | |
CN105758208B (zh) | 高温热处理非接触式温度均匀性检测***及其检测方法 | |
CN107101994B (zh) | 一种不透明材料的光谱发射率测量装置 | |
CN106500848A (zh) | 用于红外测温***的发射率校准方法 | |
CN108132100A (zh) | 一种红外测温仪的校正装置及校正方法 | |
Zhang et al. | Investigation of the normal spectral band emissivity characteristic within 7.5 to 13 μm for Molybdenum between 100 and 500° C | |
CN104316194A (zh) | 一种调光式红外辐射标定方法 | |
CN109030556A (zh) | 一种基于太阳能模拟器加热的不透明固体材料法向发射率测量装置及测量方法 | |
CN106644085A (zh) | 一种测温方法及红外测温计 | |
CN209247174U (zh) | 自定标热像检测仪 | |
CN105136304B (zh) | 温度校准方法及*** | |
CN104007137A (zh) | 一种用于测量伪装遮障红外热透过率的装置及其方法 | |
CN108007579A (zh) | 超高温材料光谱发射率测量***及其使用方法 | |
CN107966208A (zh) | 一种基于腔温修正的太阳绝对辐射计的测量方法 | |
CN110455417A (zh) | 针对红外光学***杂散辐射的定量测量误差校正方法 | |
US3610592A (en) | Method and apparatus for estimating errors in pyrometer readings |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
GR01 | Patent grant | ||
GR01 | Patent grant | ||
CP01 | Change in the name or title of a patent holder | ||
CP01 | Change in the name or title of a patent holder |
Address after: 221004 No.66, Yangshan Road, Xuzhou Economic and Technological Development Zone, Jiangsu Province Patentee after: Jiangsu Xinhua Semiconductor Technology Co.,Ltd. Address before: 221004 No.66, Yangshan Road, Xuzhou Economic and Technological Development Zone, Jiangsu Province Patentee before: JIANGSU XINHUA SEMICONDUCTOR MATERIALS TECHNOLOGY CO.,LTD. |
|
EE01 | Entry into force of recordation of patent licensing contract | ||
EE01 | Entry into force of recordation of patent licensing contract |
Assignee: Yangzhou Xinhua Semiconductor Technology Co.,Ltd. Assignor: Jiangsu Xinhua Semiconductor Technology Co.,Ltd. Contract record no.: X2024980007191 Denomination of utility model: A mirror for temperature calibration of infrared thermometers and a calibration device for infrared thermometers Granted publication date: 20180925 License type: Common License Record date: 20240614 |