CN207816483U - 芯片内核温度检测电路 - Google Patents
芯片内核温度检测电路 Download PDFInfo
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- CN207816483U CN207816483U CN201721678655.XU CN201721678655U CN207816483U CN 207816483 U CN207816483 U CN 207816483U CN 201721678655 U CN201721678655 U CN 201721678655U CN 207816483 U CN207816483 U CN 207816483U
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- module
- electrically connected
- resistor
- temperature
- terminal
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- 238000001514 detection method Methods 0.000 claims abstract description 57
- 238000012545 processing Methods 0.000 claims abstract description 26
- 238000006243 chemical reaction Methods 0.000 claims description 11
- 238000012512 characterization method Methods 0.000 claims description 5
- 238000012360 testing method Methods 0.000 claims description 5
- 238000010586 diagram Methods 0.000 description 18
- 238000000034 method Methods 0.000 description 7
- 238000013461 design Methods 0.000 description 5
- 238000005070 sampling Methods 0.000 description 5
- 238000003491 array Methods 0.000 description 3
- 238000012356 Product development Methods 0.000 description 1
- 230000005856 abnormality Effects 0.000 description 1
- 230000003321 amplification Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
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- Measuring Temperature Or Quantity Of Heat (AREA)
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CN201721678655.XU CN207816483U (zh) | 2017-12-06 | 2017-12-06 | 芯片内核温度检测电路 |
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CN201721678655.XU CN207816483U (zh) | 2017-12-06 | 2017-12-06 | 芯片内核温度检测电路 |
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107764431A (zh) * | 2017-12-06 | 2018-03-06 | 西安智多晶微电子有限公司 | 芯片内核温度检测电路 |
CN110849493A (zh) * | 2019-11-22 | 2020-02-28 | 成都三零嘉微电子有限公司 | 一种温度检测电路 |
CN111028880A (zh) * | 2019-12-19 | 2020-04-17 | 上海贝岭股份有限公司 | 参考电流产生电路及存储芯片 |
CN115840075A (zh) * | 2023-02-17 | 2023-03-24 | 紫光同芯微电子有限公司 | 一种电流检测比较电路 |
-
2017
- 2017-12-06 CN CN201721678655.XU patent/CN207816483U/zh active Active
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107764431A (zh) * | 2017-12-06 | 2018-03-06 | 西安智多晶微电子有限公司 | 芯片内核温度检测电路 |
CN107764431B (zh) * | 2017-12-06 | 2023-12-08 | 西安智多晶微电子有限公司 | 芯片内核温度检测电路 |
CN110849493A (zh) * | 2019-11-22 | 2020-02-28 | 成都三零嘉微电子有限公司 | 一种温度检测电路 |
CN110849493B (zh) * | 2019-11-22 | 2021-03-16 | 成都三零嘉微电子有限公司 | 一种温度检测电路 |
CN111028880A (zh) * | 2019-12-19 | 2020-04-17 | 上海贝岭股份有限公司 | 参考电流产生电路及存储芯片 |
CN111028880B (zh) * | 2019-12-19 | 2021-10-29 | 上海贝岭股份有限公司 | 参考电流产生电路及存储芯片 |
CN115840075A (zh) * | 2023-02-17 | 2023-03-24 | 紫光同芯微电子有限公司 | 一种电流检测比较电路 |
CN115840075B (zh) * | 2023-02-17 | 2023-08-15 | 紫光同芯微电子有限公司 | 一种电流检测比较电路 |
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GR01 | Patent grant | ||
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PE01 | Entry into force of the registration of the contract for pledge of patent right | ||
PE01 | Entry into force of the registration of the contract for pledge of patent right |
Denomination of utility model: Chip core temperature detection circuit Effective date of registration: 20201221 Granted publication date: 20180904 Pledgee: Pudong Development Bank of Shanghai Limited by Share Ltd. Xi'an branch Pledgor: XI'AN INTELLIGENCE SILICON TECHNOLOGY, Inc. Registration number: Y2020610000239 |
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PC01 | Cancellation of the registration of the contract for pledge of patent right | ||
PC01 | Cancellation of the registration of the contract for pledge of patent right |
Date of cancellation: 20220401 Granted publication date: 20180904 Pledgee: Pudong Development Bank of Shanghai Limited by Share Ltd. Xi'an branch Pledgor: XI'AN INTELLIGENCE SILICON TECHNOLOGY, Inc. Registration number: Y2020610000239 |