CN207117586U - A kind of metal-oxide-semiconductor current foldback circuit - Google Patents
A kind of metal-oxide-semiconductor current foldback circuit Download PDFInfo
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- CN207117586U CN207117586U CN201721125190.5U CN201721125190U CN207117586U CN 207117586 U CN207117586 U CN 207117586U CN 201721125190 U CN201721125190 U CN 201721125190U CN 207117586 U CN207117586 U CN 207117586U
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Abstract
This application discloses a kind of metal-oxide-semiconductor current foldback circuit, utilizes its conducting voltage V during metal-oxide-semiconductor generation excessively streamDSPressure drop this characteristic will be produced, judges whether metal-oxide-semiconductor occurs excessively stream, its specific deterministic process is, after metal-oxide-semiconductor is connected, if the conducting voltage V of metal-oxide-semiconductorDSIt is stable, then judge in metal-oxide-semiconductor normal operation；If the conducting voltage V of metal-oxide-semiconductorDSRise, then judge that over current fault occurs for metal-oxide-semiconductor.Compared with traditional metal-oxide-semiconductor current foldback circuit, the metal-oxide-semiconductor current foldback circuit of the application utilizes its conducting voltage V during metal-oxide-semiconductor generation excessively streamDSPressure drop this characteristic will be produced, the use of the devices such as high cost, high power consumption current sampler is avoided, significantly reduces the power consumption and cost of protection circuit.
Description
Technical field
The application is related to metal-oxide-semiconductor protection field, more particularly to a kind of metal-oxide-semiconductor current foldback circuit.
Background technology
In recent years, semiconductor device development is swift and violent, MOS (Metal Oxide Semiconductor, metal oxide half
Conductor) pipe is because switching frequency is high, gradually substitutes relay without the features such as mechanical loss, then as electricity main in power equipment
Flow-control element, such as in switching amplifier, metal-oxide-semiconductor is the Primary Component for controlling its electric current.But metal-oxide-semiconductor lacks circuit
Overload capacity, i.e., short circuit occurs for circuit where it or over current fault, metal-oxide-semiconductor are easily breakdown.At present, solves the side of the problem
Method is usually to increase current foldback circuit to metal-oxide-semiconductor.
In the prior art, the operation principle of metal-oxide-semiconductor current foldback circuit is：Pass through current sampler (such as current sense
Device or current divider) current signal in Acquisition Circuit, and it is fed back to controller；Controller according to the current signal of reception,
Judge whether the electric current exceedes default current threshold, if exceeding, metal-oxide-semiconductor is cut off, so as to realize the protection to metal-oxide-semiconductor；It is no
Then, monitored always by current sampler and Acquisition Circuit on current signal, until the electric current exceed default current threshold or
Metal-oxide-semiconductor is stopped.
But the current sensor or current divider used in existing metal-oxide-semiconductor current foldback circuit typically has higher valency
Lattice, and with the rise of its power, its price will also be in that staged rises, and this results in existing metal-oxide-semiconductor current foldback circuit
Cost is higher, so as to have impact on widely using for the protection circuit.In addition, in current course is detected, current sensor or point
Stream device needs the power supply beyond metal-oxide-semiconductor drive circuit (power supply of driving metal-oxide-semiconductor work) to be powered for it, and which results in existing MOS
Pipe current foldback circuit the problem of power consumption is high in use.
Utility model content
This application provides a kind of metal-oxide-semiconductor current foldback circuit, to solve metal-oxide-semiconductor current foldback circuit of the prior art
The problem of power consumption is high, cost is high.
This application provides a kind of metal-oxide-semiconductor current foldback circuit, for being connected with metal-oxide-semiconductor, the metal-oxide-semiconductor overcurrent protection electricity
Road includes the first electric capacity, charging circuit, discharge circuit and metal-oxide-semiconductor disconnecting circuit；
First electric capacity is connected between the S poles of metal-oxide-semiconductor and the D poles of metal-oxide-semiconductor；
It is connected on after the charging circuit is in parallel with discharge circuit between first electric capacity and metal-oxide-semiconductor drive circuit, institute
The metal-oxide-semiconductor Continuity signal that charging circuit is used to transmit according to metal-oxide-semiconductor crystal drive circuit is stated, and first electric capacity is charged, is made described
The charging voltage of first electric capacity with metal-oxide-semiconductor conducting voltage VDSSynchronization lifting；
The discharge circuit is used for the metal-oxide-semiconductor cut-off signal transmitted according to metal-oxide-semiconductor drive circuit, and to first electric capacity
Electric discharge completely；
The metal-oxide-semiconductor disconnecting circuit is connected between the G poles of first electric capacity and metal-oxide-semiconductor, in the described first electricity
When the charging voltage of appearance exceedes default voltage stabilizing value, the G pole tensions of metal-oxide-semiconductor are reduced, so that metal-oxide-semiconductor disconnects.
Preferably, the charging circuit includes the first triode and the second triode, and the c poles of first triode pass through
7th resistance is connected to the b poles of the second triode,
One end of the b poles connection second resistance of first triode, the e poles ground connection of first triode 1；
The other end of the second resistance is used to connect metal-oxide-semiconductor drive circuit；
The e poles of second triode are used to connect dc source, and its c pole is connected to first electricity by first resistor
One end of appearance.
Preferably, the metal-oxide-semiconductor disconnecting circuit includes the 4th triode, the c poles connection the six or two of the 4th triode
The negative pole of pole pipe, the positive pole of the 6th diode are used for the G poles for connecting metal-oxide-semiconductor,
The b poles of 4th triode are sequentially connected the positive pole of the second diode and the negative pole of the first diode, and the described 1st
The positive pole of pole pipe is connected to one end of the first electric capacity, wherein, the second diode is voltage-regulator diode；
The metal-oxide-semiconductor, which disconnects open circuit, also includes the 4th resistance and the second electric capacity, the 4th resistance and second electric capacity
Both ends of the b poles with e poles of the 4th triode, the e poles ground connection of the 4th triode are connected after parallel connection.
Preferably, the discharge circuit includes the 3rd triode, and the b poles of the 3rd triode connect the one of the 3rd electricity group
End, its e pole are connected to one end of first electric capacity, its c pole ground connection；
The other end of the 3rd electricity group is used to connect the metal-oxide-semiconductor drive circuit.
Preferably, first electric capacity with setting clamp circuit on the connection line of metal-oxide-semiconductor e poles, use by the clamp circuit
In when the charging voltage of the first electric capacity is not less than default voltage stabilizing value, the charging voltage of first electric capacity is clamped down on default
Pincers voltage on.
Preferably, the clamp circuit includes the 5th diode and the 3rd diode 3, and the negative pole of the 5th diode leads to
Cross one end that the 5th resistance is connected to first electric capacity；
The positive pole of 5th diode connects the positive pole of the 3rd diode, wherein, the 5th diode is voltage stabilizing two
Pole pipe；
The negative pole of 3rd diode is connected to the D poles of metal-oxide-semiconductor.
Preferably, the metal-oxide-semiconductor current foldback circuit also includes telegraph circuit in excessively stream, and telegraph circuit is used in the excessively stream
When the charging voltage of first electric capacity exceedes default voltage stabilizing value, over current fault signal is sent.
Preferably, telegraph circuit includes the 4th diode in the excessively stream, and the negative pole of the 4th diode connects the MOS
The c poles of 3rd triode in pipe disconnecting circuit,
The positive pole of 4th diode connects one end of the 6th resistance, the other end connection direct current of the 6th resistance
Pressure；
The positive pole of 4th diode is additionally coupled to controller, and the controller is used for the break-make for controlling metal-oxide-semiconductor.
The metal-oxide-semiconductor current foldback circuit that the embodiment of the present application provides, utilize its conducting voltage V during metal-oxide-semiconductor generation excessively streamDSWill
This characteristic of generation pressure drop, judges whether metal-oxide-semiconductor occurs excessively stream, its specific deterministic process is, after metal-oxide-semiconductor is connected, if metal-oxide-semiconductor
Conducting voltage VDSIt is stable, then judge in metal-oxide-semiconductor normal operation；If the conducting voltage V of metal-oxide-semiconductorDSRise, then judge metal-oxide-semiconductor hair
Raw over current fault.
The metal-oxide-semiconductor current foldback circuit of the application includes the first electric capacity, charging circuit and metal-oxide-semiconductor disconnecting circuit.First electricity
Hold the both ends of the S poles with D poles that are connected in parallel on metal-oxide-semiconductor, the charging voltage of the first electric capacity and the conducting voltage V of metal-oxide-semiconductorDSMatch, i.e.,
The charging voltage of first electric capacity with metal-oxide-semiconductor conducting voltage VDSChange and change.Charging circuit is that the first electric capacity is charged,
Under its effect, the charging voltage of the first electric capacity will be with conducting voltage VDSPressure drop occur synchronization lifting.Metal-oxide-semiconductor disconnecting circuit with
First electric capacity is connected, and in metal-oxide-semiconductor normal operation, metal-oxide-semiconductor disconnecting circuit is in off state；If excessively stream occurs for metal-oxide-semiconductor,
Metal-oxide-semiconductor disconnecting circuit is turned on, and metal-oxide-semiconductor is cut off, and so as to cut off the overcurrent for flowing through metal-oxide-semiconductor, and then is completed to metal-oxide-semiconductor
Overcurrent protection.
Compared with traditional metal-oxide-semiconductor current foldback circuit, the metal-oxide-semiconductor current foldback circuit of the application utilizes metal-oxide-semiconductor
Its conducting voltage V during excessively streamDSPressure drop this characteristic will be produced, avoids making for the devices such as high cost, high power consumption current sampler
With significantly reducing the power consumption and cost of protection circuit.In addition, the metal-oxide-semiconductor current foldback circuit of the application is using resistance, electricity
The simple Devices such as appearance, diode and triode, and dosage is few, therefore the protection circuit small volume, it can be placed in power equipment
Optional position, such as set switching amplifier on half-bridge circuit, the i.e. detectable master of metal-oxide-semiconductor current foldback circuit now
Over current fault on output loop, the over current fault occurred on half-bridge circuit is can detect again.
Brief description of the drawings
In order to illustrate more clearly of the technical scheme of the application, letter will be made to the required accompanying drawing used in embodiment below
Singly introduce, it should be apparent that, for those of ordinary skills, on the premise of not paying creative work, also
Other accompanying drawings can be obtained according to these accompanying drawings.
Fig. 1 is the circuit diagram of the metal-oxide-semiconductor current foldback circuit of the application.
Embodiment
Metal-oxide-semiconductor current foldback circuit in the application make use of the conducting voltage V of metal-oxide-semiconductorDSPressed in over current fault
This feature is dropped, judges whether metal-oxide-semiconductor occurs excessively stream.Here, the conducting voltage V to metal-oxide-semiconductorDSPressure drop occurs in over current fault
This characteristic illustrates.When metal-oxide-semiconductor access failure, the resistance between its S pole and D poles is larger；When metal-oxide-semiconductor is just switched on, its S
Resistance between pole and D poles quickly reduces；When metal-oxide-semiconductor is fully on, the conducting resistance of metal-oxide-semiconductor keeps constant, and the resistance is
Conducting resistance, now metal-oxide-semiconductor S poles and the voltage of D interpolars are conducting voltage VDS.After metal-oxide-semiconductor is fully on, if network system is just
Normal stable operation, then flow through that the electric current of metal-oxide-semiconductor is constant, now the conducting voltage V of metal-oxide-semiconductorDSAlso keep constant；If network system is sent out
Raw over current fault, then the electric current increase of metal-oxide-semiconductor is flowed through, now the conducting voltage V of metal-oxide-semiconductorDSIt will raise rapidly.Therefore, MOS is passed through
The conducting voltage V of pipeDSSituation of change, you can judge whether metal-oxide-semiconductor occurs over current fault.
Fig. 1 is the circuit diagram of the metal-oxide-semiconductor current foldback circuit of the application, as shown in figure 1, metal-oxide-semiconductor current foldback circuit bag
The first electric capacity C1, charging circuit L1, discharge circuit L2 and metal-oxide-semiconductor disconnecting circuit L3 are included, wherein, the first electric capacity C1 is connected on MOS
Between the S poles of pipe and the D poles of metal-oxide-semiconductor；The first electric capacity C1 is connected on after charging circuit L1 is in parallel with discharge circuit L2 to drive with metal-oxide-semiconductor
Between dynamic circuit；Metal-oxide-semiconductor disconnecting circuit L3 is connected between the G poles of the first electric capacity C1 and metal-oxide-semiconductor, it should be noted that metal-oxide-semiconductor
D poles, charging circuit L1, discharge circuit L2 are connected with the same one end of metal-oxide-semiconductor disconnecting circuit L3 with the first electric capacity C1.
The metal-oxide-semiconductor current foldback circuit of the application is connected with metal-oxide-semiconductor, when over current fault occurs for metal-oxide-semiconductor, metal-oxide-semiconductor excessively stream
Protection circuit will cut off metal-oxide-semiconductor, so that metal-oxide-semiconductor is from overcurrent damage.In actual use, after metal-oxide-semiconductor conducting, fill
The metal-oxide-semiconductor Continuity signal that circuit L1 transmits according to metal-oxide-semiconductor drive circuit, the first electric capacity C1 is charged, makes the first electric capacity
C1 charging voltage with metal-oxide-semiconductor conducting voltage VDSSynchronization lifting.If power network normal operation, the conducting voltage V of metal-oxide-semiconductorDSCompared with
Small, the first electric capacity C1 charging voltage does not reach metal-oxide-semiconductor disconnecting circuit L3 conducting voltage, and now, metal-oxide-semiconductor disconnects open circuit and is in
Off working state.If open circuit fault, the conducting voltage V of metal-oxide-semiconductor occur for power networkDSQuick rise, the first electric capacity C1 charging electricity
Pressure reaches metal-oxide-semiconductor disconnecting circuit L3 conducting voltage, and now, metal-oxide-semiconductor disconnects open circuit and enters working condition, and the G of metal-oxide-semiconductor is extremely electric
Pressure drop is low, so that metal-oxide-semiconductor disconnects.
Each branch in metal-oxide-semiconductor current foldback circuit will be illustrated below.
Charging circuit L1 is used for when metal-oxide-semiconductor is connected, and the first electric capacity C1 is charged.In the application, charging circuit L1
Including the first triode Q1 and the second triode Q2, the first triode Q1 c poles are connected to the two or three pole by the 7th resistance R7
Pipe Q2 b poles；First triode Q1 b poles are connected to metal-oxide-semiconductor drive circuit, the first triode Q1 e by second resistance R2
Pole is grounded；Second triode Q2 e poles are used to connect dc source, and its c pole is connected to the first electric capacity C1 by first resistor R1
One end, wherein, dc source can be charged by first resistor R1 to the first electric capacity C1.
In real work, when metal-oxide-semiconductor is off, metal-oxide-semiconductor drive circuit exports low-voltage, then the one or three pole
Pipe Q1 and the second triode Q2 are in cut-off state, and now, DC voltage does not charge to the first electric capacity C1.Work as metal-oxide-semiconductor
During into on-state, metal-oxide-semiconductor drive circuit output HIGH voltage, then the first triode Q1 turned on the second triode Q2, now,
DC voltage is charged by first resistor R1 to the first electric capacity C1.
Generally, metal-oxide-semiconductor S poles and the conducting voltage V of D interpolarsDSIt is smaller, when connecting metal-oxide-semiconductor, the first electric capacity C1 charging electricity
Pressure is smaller, then the first electric capacity C1 charging interval is shorter.In order to prevent metal-oxide-semiconductor disconnecting circuit L3 from maloperation occurs, in the application
In, set clamp circuit L4, clamp circuit L4 to be used in the first electric capacity on the connection line of the first electric capacity C1 Yu metal-oxide-semiconductor e poles
When C1 charging voltage is not less than default voltage stabilizing value, the first electric capacity C1 charging voltage is clamped down on default pincers voltage.
In the present embodiment, clamp circuit L4 includes the 5th diode D5 and the 3rd diode D3, and the 5th diode D5's is negative
Pole is connected to the first electric capacity C1 one end by the 5th resistance R5；5th diode D5 positive pole is connecting the 3rd diode D3 just
Pole, wherein, the 5th diode D5 is voltage-regulator diode；3rd diode D3 negative pole is connected to the D poles of metal-oxide-semiconductor.
In real work, if short trouble does not occur in power network, charging circuit L1 charges to the first electric capacity C1, by first
Electric capacity C1 charging voltage is by the zero conducting voltage V for rising to metal-oxide-semiconductorDSWith the 5th diode D5 voltage stabilizing value sum.Wherein, MOS
The conducting voltage V of pipeDSMuch smaller than the 5th diode D5 voltage stabilizing value, thus, it is believed that the 5th diode D5 has clamped down on the first electricity
Hold the upper limit of C1 charging voltages, wherein, the higher limit of the charging voltage is less than the second diode D2 voltage stabilizing value.
Discharge circuit L2 is used for when metal-oxide-semiconductor disconnects, and the first electric capacity C1 is discharged, the first electric capacity C1 is discharged completely
It is zero to its charging voltage.In the application, discharge circuit L2 includes the 3rd triode Q3, the 3rd triode Q3 b poles connection the
Three electricity group R3 one end, its e pole are connected to the first electric capacity C1 one end, its c pole ground connection；The 3rd electricity group R3 other end is used to connect
Connect metal-oxide-semiconductor drive circuit.
In real work, during metal-oxide-semiconductor power cut-off, metal-oxide-semiconductor drive circuit output low-voltage, then the 3rd triode Q3 lead
It is logical, make the first electric capacity C1 start to discharge, until its charging voltage is zero.First electric capacity C1 charging voltage is put to most zero original
Because being, when metal-oxide-semiconductor is again switched on, its charging voltage will start from scratch, during so as to effectively control the charging of metal-oxide-semiconductor
Between.
Metal-oxide-semiconductor disconnecting circuit L3 is used for when the charging voltage of the first electric capacity C1 exceedes default voltage stabilizing value, by metal-oxide-semiconductor
G pole tensions reduce so that metal-oxide-semiconductor disconnect.Metal-oxide-semiconductor disconnecting circuit L3 disconnects electricity using voltage-regulator diode control metal-oxide-semiconductor
Whether is road L3 conducting, i.e., when the first electric capacity C1 charging voltage is less than the voltage stabilizing value of the voltage-regulator diode, metal-oxide-semiconductor disconnects electricity
Road L3 is off；When the voltage at the first electric capacity C1 both ends is more than the voltage stabilizing value of the voltage-regulator diode, metal-oxide-semiconductor disconnects electricity
Road L3 is turned on, and metal-oxide-semiconductor starts work.
In the application, metal-oxide-semiconductor disconnecting circuit L3 includes the 4th triode Q4, the 4th triode Q4 c poles connection the six or two
Pole pipe D6 negative pole, the 6th diode D6 positive pole are used for the G poles for connecting metal-oxide-semiconductor.4th triode Q4 b poles are sequentially connected
The negative pole of two diode D2 positive pole and the first diode D1, the first diode D1 positive pole are connected to the one of the first electric capacity C1
End, wherein, the second diode D2 is voltage-regulator diode.Metal-oxide-semiconductor, which disconnects open circuit, also includes the 4th resistance R4 and the second electric capacity C2, the
Four resistance R4 after the second electric capacity C2 parallel connections with being connected the 4th triode Q4 b poles and the both ends of e poles, the 4th triode Q4 e poles
Ground connection.
In real work, when over current fault does not occur, the first electric capacity C1 charging voltage is less than the second diode D2
Voltage stabilizing value, the second diode D2 is not turned on, and metal-oxide-semiconductor disconnecting circuit L3 is in not on-state；When over current fault occurs, the
One electric capacity C1 charging voltage is more than the second diode D2 voltage stabilizing value, and the second diode D2 is turned on, then metal-oxide-semiconductor disconnecting circuit L3
Into conducting state, now, the 4th triode Q4 is turned on, so as to drag down the voltage of metal-oxide-semiconductor G poles by the 6th diode D6, from
And disconnect metal-oxide-semiconductor.
Find that overcurrent fault occurs in power network for the ease of staff, in the application, metal-oxide-semiconductor current foldback circuit is also
Including telegraph circuit L5 in excessively stream, telegraph circuit L5 is used to exceed default voltage stabilizing value in the first electric capacity C1 charging voltage in excessively stream
When, send over current fault signal.
In the application, telegraph circuit L5 includes the 4th diode D4 in excessively stream, and the 4th diode D4 negative pole connection metal-oxide-semiconductor breaks
3rd triode Q4 c poles in open circuit L3, the 4th diode D4 positive pole connect the 6th resistance R6 one end, the 6th resistance R6
The other end connection DC voltage；4th diode D4 positive pole is additionally coupled to controller, and controller is used to control the logical of metal-oxide-semiconductor
It is disconnected.
In real work, when over current fault does not occur, the first electric capacity C1 charging voltage is less than the second diode D2
Voltage stabilizing value, the second diode D2 is not turned on, then the 4th diode D4 be in cut-off state, no current stream in the 6th resistance R6
Cross, now, telegraph circuit L5 is in not on-state in excessively stream.When over current fault occurs, the first electric capacity C1 charging voltage is big
In the second diode D2 voltage stabilizing value, the second diode D2 is turned on, then the 4th diode D4 is turned on, had electric current in the 6th resistance R6
Flow through, now, telegraph circuit L5 enters conducting state in excessively stream.Electric current in excessively stream in telegraph circuit L5 closes trigger controller
Metal-oxide-semiconductor.Meanwhile controller also closes the metal-oxide-semiconductor in other circuits in power network, so as to ensure the safety of whole power network.
The metal-oxide-semiconductor current foldback circuit that the embodiment of the present application provides, utilize its conducting voltage V during metal-oxide-semiconductor generation excessively streamDSWill
This characteristic of generation pressure drop, judges whether metal-oxide-semiconductor occurs excessively stream, its specific deterministic process is, after metal-oxide-semiconductor is connected, if metal-oxide-semiconductor
Conducting voltage VDSIt is stable, then judge in metal-oxide-semiconductor normal operation；If the conducting voltage V of metal-oxide-semiconductorDSRise, then judge metal-oxide-semiconductor hair
Raw over current fault.
Compared with traditional metal-oxide-semiconductor current foldback circuit, the metal-oxide-semiconductor current foldback circuit of the application utilizes metal-oxide-semiconductor
Its conducting voltage V during excessively streamDSPressure drop this characteristic will be produced, avoids making for the devices such as high cost, high power consumption current sampler
With significantly reducing the power consumption and cost of protection circuit.In addition, each device that the metal-oxide-semiconductor current foldback circuit of the application uses
The equal discrete device of part, such as resistance, electric capacity, diode and triode etc., it is higher that these discrete devices have protection circuit
Reliability, antijamming capability and adaptability.Wherein, higher adaptability is shown, changes the second diode D2 and the
Five diode D5 voltage stabilizings values are to be suitable for the metal-oxide-semiconductor of different voltages or power, or adjustment first resistor R1 and the first electric capacity C1
I.e. adjustable first electric capacity C1 charging interval, so as to flexibly apply the metal-oxide-semiconductor in different voltages or power.
Above-described the application embodiment does not form the restriction to the application protection domain.
Claims (8)
- A kind of 1. metal-oxide-semiconductor current foldback circuit, for being connected with metal-oxide-semiconductor, it is characterised in that the metal-oxide-semiconductor current foldback circuit Including the first electric capacity (C1), charging circuit (L1), discharge circuit (L2) and metal-oxide-semiconductor disconnecting circuit (L3)；First electric capacity (C1) is connected between the S poles of metal-oxide-semiconductor and the D poles of metal-oxide-semiconductor；First electric capacity (C1) and metal-oxide-semiconductor drive circuit are connected on after the charging circuit (L1) is in parallel with discharge circuit (L2) Between, the charging circuit (L1) is used for the metal-oxide-semiconductor Continuity signal transmitted according to metal-oxide-semiconductor crystal drive circuit, and to first electric capacity (C1) charge, make the charging voltage of first electric capacity (C1) with the conducting voltage V of metal-oxide-semiconductorDSSynchronization lifting；The discharge circuit (L2) is used for the metal-oxide-semiconductor cut-off signal transmitted according to metal-oxide-semiconductor drive circuit, and to first electric capacity (C1) electric discharge completely；The metal-oxide-semiconductor disconnecting circuit (L3) is connected between first electric capacity (C1) and the G poles of metal-oxide-semiconductor, for described When the charging voltage of one electric capacity (C1) exceedes default voltage stabilizing value, the G pole tensions of metal-oxide-semiconductor are reduced, so that metal-oxide-semiconductor disconnects.
- 2. metal-oxide-semiconductor current foldback circuit according to claim 1, it is characterised in that the charging circuit (L1) includes the One triode (Q1) and the second triode (Q2), the c poles of first triode (Q1) are connected to the by the 7th resistance (R7) The b poles of two triodes (Q2),One end of the b poles connection second resistance (R2) of first triode (Q1), the e poles of first triode (Q1) connect Ground；The other end of the second resistance (R2) is used to connect metal-oxide-semiconductor drive circuit；The e poles of second triode (Q2) are used to connect dc source, and its c pole is connected to described the by first resistor (R1) One end of one electric capacity (C1).
- 3. metal-oxide-semiconductor current foldback circuit according to claim 1, it is characterised in that the metal-oxide-semiconductor disconnecting circuit (L3) Including the 4th triode (Q4), the negative pole of the 6th diode (D6) of c poles connection of the 4th triode (Q4), the described 6th 2 The positive pole of pole pipe (D6) is used for the G poles for connecting metal-oxide-semiconductor,The b poles of 4th triode (Q4) are sequentially connected the positive pole of the second diode (D2) and bearing for the first diode (D1) Pole, the positive pole of first diode (D1) are connected to one end of first electric capacity (C1), wherein, second diode (D2) it is voltage-regulator diode；The metal-oxide-semiconductor, which disconnects open circuit, also includes the 4th resistance (R4) and the second electric capacity (C2), the 4th resistance (R4) with it is described The b poles of the 4th triode (Q4) and the both ends of e poles are connected after second electric capacity (C2) is in parallel, the 4th triode (Q4) E poles are grounded.
- 4. metal-oxide-semiconductor current foldback circuit according to claim 1, it is characterised in that the discharge circuit (L2) includes the Three triodes (Q3), the b poles of the 3rd triode (Q3) connect the one end of the 3rd electric group (R3), and its e pole is connected to described the One end of one electric capacity (C1), its c pole ground connection；The other end of the 3rd electric group (R3) is used to connect the metal-oxide-semiconductor drive circuit.
- 5. metal-oxide-semiconductor current foldback circuit according to claim 1, it is characterised in that first electric capacity (C1) and MOS Clamp circuit (L4) is set on the connection line of pipe e poles, and the clamp circuit (L4) is used for the charging electricity in the first electric capacity (C1) When pressure is not less than default voltage stabilizing value, the charging voltage of first electric capacity (C1) is clamped down on default pincers voltage.
- 6. metal-oxide-semiconductor current foldback circuit according to claim 5, it is characterised in that the clamp circuit (L4) includes the Five diodes (D5) and the 3rd diode (D3), the negative pole of the 5th diode (D5) are connected to institute by the 5th resistance (R5) State the first electric capacity (C1) one end；The positive pole of 5th diode (D5) connects the positive pole of the 3rd diode (D3), wherein, the 5th diode (D5) For voltage-regulator diode；The negative pole of 3rd diode (D3) is connected to the D poles of metal-oxide-semiconductor.
- 7. metal-oxide-semiconductor current foldback circuit according to claim 1, it is characterised in that the metal-oxide-semiconductor current foldback circuit Also include telegraph circuit (L5) in excessively stream, telegraph circuit (L5) is used to surpass in the charging voltage of first electric capacity (C1) in the excessively stream When crossing default voltage stabilizing value, over current fault signal is sent.
- 8. metal-oxide-semiconductor current foldback circuit according to claim 7, it is characterised in that telegraph circuit (L5) wraps in the excessively stream The 4th diode (D4) is included, the negative pole of the 4th diode (D4) connects the three or three pole in the metal-oxide-semiconductor disconnecting circuit (L3) The c poles of (Q4) are managed,The positive pole of 4th diode (D4) connects one end of the 6th resistance (R6), and the other end of the 6th resistance (R6) connects Connect DC voltage；The positive pole of 4th diode (D4) is additionally coupled to controller, and the controller is used for the break-make for controlling metal-oxide-semiconductor.
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| CN201721125190.5U CN207117586U (en) | 2017-09-04 | 2017-09-04 | A kind of metal-oxide-semiconductor current foldback circuit |
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| CN (1) | CN207117586U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108896899A (en) * | 2018-07-23 | 2018-11-27 | 广东志高暖通设备股份有限公司 | A kind of integrated switch pipe over-current detection circuit |
| CN116545291A (en) * | 2023-04-24 | 2023-08-04 | 无锡凌博电子技术股份有限公司 | Boosting controller of electric vehicle |
-
2017
- 2017-09-04 CN CN201721125190.5U patent/CN207117586U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108896899A (en) * | 2018-07-23 | 2018-11-27 | 广东志高暖通设备股份有限公司 | A kind of integrated switch pipe over-current detection circuit |
| CN116545291A (en) * | 2023-04-24 | 2023-08-04 | 无锡凌博电子技术股份有限公司 | Boosting controller of electric vehicle |
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