CN206563784U - A kind of patch capacitor burn-in test device and device - Google Patents
A kind of patch capacitor burn-in test device and device Download PDFInfo
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- CN206563784U CN206563784U CN201720297759.XU CN201720297759U CN206563784U CN 206563784 U CN206563784 U CN 206563784U CN 201720297759 U CN201720297759 U CN 201720297759U CN 206563784 U CN206563784 U CN 206563784U
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- patch capacitor
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Abstract
The utility model provides a kind of patch capacitor burn-in test device and device, and patch capacitor burn-in test device includes conductive plate, insulation board and conducting probe, wherein：Insulation board is provided with through hole；Conductive plate is provided with below insulation board；During test, in conducting probe insertion through hole.Patch capacitor burn-in test device and device that the utility model is provided, patch capacitor burn-in test device on insulation board by setting through hole, conductive plate is fixed in through hole side, opposite side sets conducting probe, during test, conducting probe is inserted in through hole, so as to patch capacitor two ends making alive, traditional welding formula burn-in test mode is changed into contact test mode, the problem of solving the welded plate of traditional welding formula aging techniques and can not reuse.It using the patch capacitor ageing tester of above-mentioned patch capacitor burn-in test device, can repeatedly use, realize and burn-in test is carried out to high-volume patch capacitor simultaneously, save the time of manual scolding tin, improve burn-in test efficiency.
Description
Technical field
The utility model is related to patch capacitor testing field, more particularly to a kind of patch capacitor burn-in test device and device.
Background technology
Patch capacitor full name is multiple-layer sheet ceramic capacitor, and also referred to as patch capacitor or piece holds.Patch capacitor is due to tool
Have the advantages that high-precision automatic assembling, good frequency characteristic, excellent intensity and reliability, long lifespan, stability are high
It is widely used in Electronic products manufacturing field.
Burn-in test is detection patch capacitor reliability important step, and aging effect is not good will to influence patch capacitor product
Service life, therefore the accuracy of burn-in test is particularly important.Existing patch capacitor burn-in test will using manual paster
Patch capacitor is welded on support plate, is then attached in test equipment and is tested.Manual welding efficiency is relatively low, if desired carries out large quantities of
The burn-in test of volume production product, then need first to be welded for a long time, then could be tested, and wastes testing time and manpower
Resource；Also, the phenomenon of failure welding often occurs in manual scolding tin, easily cause that test result is inaccurate, by mistake by good product
Defective products is judged to, production efficiency is reduced.
Utility model content
The problem of to solve to mention in above-mentioned background technology, the utility model provide a kind of patch capacitor burn-in test device and
Device.
A kind of patch capacitor burn-in test device that the utility model is provided, including conductive plate, insulation board and conducting probe, its
In：
The insulation board is provided with through hole；The conductive plate is provided with below the insulation board；During test, the conducting probe
Insert in the through hole.
Further, the conducting probe is spring probe.
Further, the conductive plate is copper-clad plate.
The utility model also provides a kind of patch capacitor ageing tester, using the patch capacitor described in as above Arbitrary Term
Burn-in test device；
The conducting probe is arranged on pressing plate；Conducting probe described at least two is set on the pressing plate；The insulation
Plate is provided with through hole described at least two；Each described conducting probe parallel conductance connection on the pressing plate.
Further, the through hole on the insulation board is corresponding with the position of the conducting probe on the pressing plate.
Further, the insulation board is provided with screwed hole；The pressing plate is bolted with the insulation board；It is described
Pressing plate is provided with the bolt hole being adapted with the Bolt sizes.
Further, the screwed hole is in crossing distribution.
Patch capacitor burn-in test device and device that the utility model is provided, patch capacitor burn-in test device pass through in insulation
Through hole is set on plate, and conductive plate is fixed in through hole side, and opposite side sets conducting probe, during test, conducting probe is inserted into through hole
It is interior, patch capacitor two ends making alive is given by conducting probe and conductive plate, traditional welding formula burn-in test mode is changed into and connect
Touch test mode, the problem of solving the welded plate of traditional welding formula aging techniques and can not reuse, it is to avoid resource wave
Take, save the time before aging, improve efficiency.Using the patch capacitor aging of above-mentioned patch capacitor burn-in test device
Test device, it is simple in construction, it can repeatedly use, save natural resources, realize and high-volume patch capacitor is carried out simultaneously
Burn-in test, the time of manual scolding tin, improves burn-in test efficiency when saving the test of high-volume patch capacitor.
Brief description of the drawings
, below will be to embodiment in order to illustrate more clearly of the utility model embodiment or technical scheme of the prior art
Or the accompanying drawing used required in description of the prior art is briefly described, it should be apparent that, drawings in the following description are
Some embodiments of the present utility model, for those of ordinary skill in the art, are not paying the premise of creative labor
Under, other accompanying drawings can also be obtained according to these accompanying drawings.
The patch capacitor burn-in test device profile that Fig. 1 provides for the utility model；
Fig. 2 is patch capacitor burn-in test device test mode schematic diagram；
The pressing plate and insulation board exploded perspective view for the patch capacitor ageing tester that Fig. 3 provides for the utility model.
Reference：
The through hole of 10 conductive plate, 20 insulation board 21
The conducting probe of 22 screwed hole, 30 pressing plate 40
The conductive region of 50 patch capacitor 51
Embodiment
It is new below in conjunction with this practicality to make the purpose, technical scheme and advantage of the utility model embodiment clearer
Accompanying drawing in type embodiment, the technical scheme in the utility model embodiment is clearly and completely described, it is clear that retouched
The embodiment stated is a part of embodiment of the utility model, rather than whole embodiments.Based on the implementation in the utility model
Example, the every other embodiment that those of ordinary skill in the art are obtained under the premise of creative work is not made is belonged to
The scope of the utility model protection.
, it is necessary to explanation in description of the present utility model, term " on ", " under ", "front", "rear", "left", "right",
The orientation or position relationship of the instruction such as " vertical ", " level ", " top ", " bottom ", " interior ", " outer " be based on orientation shown in the drawings or
Position relationship, is for only for ease of description the utility model and simplifies description, rather than indicate or imply the device or member of meaning
Part must have specific orientation, with specific azimuth configuration and operation, therefore it is not intended that to limitation of the present utility model.
As shown in figure 1, the patch capacitor burn-in test device that the utility model embodiment is provided, including conductive plate 10, insulation
Plate 20 and conducting probe 40, wherein：
The insulation board 20 is provided with through hole 21；The lower section of insulation board 20 is provided with the conductive plate 10；It is described during test
Conducting probe 40 is inserted in the through hole 21.
When it is implemented, as shown in Fig. 2 patch capacitor 50 is put into through hole 21 vertically, one end of patch capacitor 50 is led
Electric region 51 is contacted with the surface of conductive plate 10, and conducting probe 40 is pushed, and conducting probe 40 is led with the other end of patch capacitor 50
Electric region 51 is contacted, and conductive plate 10 is connected the positive pole and negative pole of power supply with conducting probe 40 respectively, so that the two ends of patch capacitor 50
Making alive, carries out burn-in test；Insulation board 20 is made up of isolation materials such as ceramics, glass or plastics, can be by the conductive spy of insulation
Pin 40 and conductive plate 10, while avoiding the conductive region 51 of patch capacitor 50 during test from being contacted with the side wall of insulation board 20, make paster
The short circuit of electric capacity 50.
The patch capacitor burn-in test device that the utility model is provided, by fixing conductive plate, opposite side in the side of through hole
Conducting probe is set, during test, conducting probe is inserted in through hole, added by conducting probe and conductive plate to patch capacitor two ends
Voltage, contact burn-in test mode is changed into by traditional welding formula burn-in test mode, solves traditional welding formula aging survey
The problem of welded plate of examination mode can not be reused, it is to avoid the wasting of resources, saves the time before aging, improves
Efficiency.
Preferably, the conducting probe 40 is spring probe.
When it is implemented, conducting probe 40 is made up of metal materials such as iron, copper, the probe of conducting probe 40 is set to bullet
Spring type is popped one's head in, and can be applied to different type, thin and thick, the test of the patch capacitor 50 of length.
Preferably, the conductive plate 10 is copper-clad plate.
As shown in figure 3, the patch capacitor ageing tester that the utility model embodiment is provided, using as above Arbitrary Term institute
The patch capacitor burn-in test device stated；
The conducting probe 40 is arranged on pressing plate 30；Conducting probe 40 described at least two is set on the pressing plate 30；
The insulation board 20 is provided with through hole 21 described at least two；Each described parallel conductance of conducting probe 40 on the pressing plate 30
Connection.
When it is implemented, according to national standard, the quantity of patch capacitor 50 in parallel is different under different magnitudes of voltage, magnitude of voltage is got over
Height, the quantity of patch capacitor 50 in parallel is more；At least two conducting probes 40 are set on pressing plate 30, and insulation board 20 is provided with leading
The consistent through hole 21 of the quantity of electric probe 40；During burn-in test, pressing plate 30 is pushed, and each conducting probe 40 is inserted respectively and is placed with
In each through hole 21 of patch capacitor 50, realize and burn-in test is carried out to high-volume patch capacitor simultaneously；Each conducting probe 40
Between parallel circuit is set by scolding tin or in the pressing plate 30, each conducting probe 40 on pressing plate 30 is connected in parallel, made every
The voltage at the individual two ends of patch capacitor 50 is consistent, realizes the burn-in test simultaneously to high-volume patch capacitor 50, it is ensured that test knot
The accuracy of fruit.
The patch capacitor ageing tester that the utility model passes through, it is simple in construction, it can repeatedly use, save certainly
Right resource, realizes the burn-in test simultaneously to high-volume patch capacitor, manual scolding tin when saving the test of high-volume patch capacitor
Time, improve burn-in test efficiency.
Preferably, the through hole 21 on the insulation board 20 is corresponding with the position of the conducting probe 40 on the pressing plate 30.
Preferably, the insulation board 20 is provided with screwed hole 22；The pressing plate 30 is connected with the insulation board 20 by bolt
Connect；The pressing plate 30 is provided with the bolt hole being adapted with the Bolt sizes.
Preferably, the screwed hole 22 is in crossing distribution.
When it is implemented, screwed hole 22 in crossing distribution on insulation board 20, pressing plate 30 is provided with and the bolt chi
The very little bolt hole being adapted, when pressing plate 30 is with 20 bolt connection of insulation board, bolt hole uses crossing distribution, can make pressing plate 30
When each conducting probe 40 of upper different zones is pushed, the uniform force of the regional on pressing plate 30, it is ensured that each conduction is visited
Pin 40 can fully be contacted with patch capacitor 50, it is to avoid the phenomenon of loose contact occur.
Although more herein used such as conductive plate, insulation board, through hole, screwed hole, pressing plate, bolt, conductive visited
The terms such as pin, patch capacitor, conductive region, but it is not precluded from the possibility using other terms.It is only using these terms
In order to more easily describe and explain essence of the present utility model；Being construed as any additional limitation is all and this
Utility model spirit is disagreed.
Finally it should be noted that：Various embodiments above is only limited to illustrate the technical solution of the utility model, rather than to it
System；Although the utility model is described in detail with reference to foregoing embodiments, one of ordinary skill in the art should
Understand：It can still modify to the technical scheme described in foregoing embodiments, or to which part or whole
Technical characteristic carries out equivalent substitution；And these modifications or replacement, the essence of appropriate technical solution is departed from this practicality newly
The scope of each embodiment technical scheme of type.
Claims (7)
1. a kind of patch capacitor burn-in test device, it is characterised in that：Including conductive plate (10), insulation board (20) and conducting probe
(40), wherein：
The insulation board (20) is provided with through hole (21)；The conductive plate (10) is provided with below the insulation board (20)；During test,
The conducting probe (40) is inserted in the through hole (21).
2. patch capacitor burn-in test device according to claim 1, it is characterised in that：The conducting probe (40) is spring
Probe.
3. patch capacitor burn-in test device according to claim 1, it is characterised in that：The conductive plate (10) is to cover copper
Plate.
4. a kind of patch capacitor ageing tester, it is characterised in that：Using the paster electricity as described in claim any one of 1-3
Hold burn-in test device；
The conducting probe (40) is arranged on pressing plate (30)；Conducting probe described at least two is set on the pressing plate (30)
(40)；The insulation board (20) is provided with through hole (21) described at least two；Each described conductive spy on the pressing plate (30)
Pin (40) parallel conductance is connected.
5. patch capacitor ageing tester according to claim 4, it is characterised in that：It is logical on the insulation board (20)
Hole (21) is corresponding with the position of the conducting probe (40) on the pressing plate (30).
6. patch capacitor ageing tester according to claim 4, it is characterised in that：The insulation board (20) is provided with
Screwed hole (22)；The pressing plate (30) is bolted with the insulation board (20)；The pressing plate (30) be provided with it is described
The bolt hole that Bolt sizes are adapted.
7. patch capacitor ageing tester according to claim 6, it is characterised in that：The screwed hole (22) is in cross
Shape is distributed.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201720297759.XU CN206563784U (en) | 2017-03-24 | 2017-03-24 | A kind of patch capacitor burn-in test device and device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201720297759.XU CN206563784U (en) | 2017-03-24 | 2017-03-24 | A kind of patch capacitor burn-in test device and device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN206563784U true CN206563784U (en) | 2017-10-17 |
Family
ID=60033145
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201720297759.XU Active CN206563784U (en) | 2017-03-24 | 2017-03-24 | A kind of patch capacitor burn-in test device and device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN206563784U (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108802545A (en) * | 2018-08-24 | 2018-11-13 | 重庆大及电子科技有限公司 | A kind of welded type filter degradation tooling |
| CN109444618A (en) * | 2018-12-28 | 2019-03-08 | 苏州比雷艾斯电子科技有限公司 | A kind of electronic component Current Voltage ageing tester and method |
| CN109459634A (en) * | 2018-11-07 | 2019-03-12 | 深圳振华富电子有限公司 | SMD components test module |
| CN115639446A (en) * | 2022-12-23 | 2023-01-24 | 浙江杭可仪器有限公司 | Selective capacitance testing device |
-
2017
- 2017-03-24 CN CN201720297759.XU patent/CN206563784U/en active Active
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108802545A (en) * | 2018-08-24 | 2018-11-13 | 重庆大及电子科技有限公司 | A kind of welded type filter degradation tooling |
| CN108802545B (en) * | 2018-08-24 | 2023-09-22 | 重庆大及电子科技有限公司 | Welding type filter aging test tool |
| CN109459634A (en) * | 2018-11-07 | 2019-03-12 | 深圳振华富电子有限公司 | SMD components test module |
| CN109459634B (en) * | 2018-11-07 | 2024-05-24 | 深圳振华富电子有限公司 | Chip component testing module |
| CN109444618A (en) * | 2018-12-28 | 2019-03-08 | 苏州比雷艾斯电子科技有限公司 | A kind of electronic component Current Voltage ageing tester and method |
| CN115639446A (en) * | 2022-12-23 | 2023-01-24 | 浙江杭可仪器有限公司 | Selective capacitance testing device |
| CN115639446B (en) * | 2022-12-23 | 2023-06-02 | 浙江杭可仪器有限公司 | Selective capacitance testing device |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| PE01 | Entry into force of the registration of the contract for pledge of patent right |
Denomination of utility model: Chip capacitor aging testing ware and device Effective date of registration: 20190618 Granted publication date: 20171017 Pledgee: Xiamen finance Company limited by guarantee Pledgor: Xiamen SINOFAITH Electronics Technology Co., Ltd. Registration number: 2019990000581 |
|
| PE01 | Entry into force of the registration of the contract for pledge of patent right |