CN206339310U - The measurement apparatus of smooth surface Temperature Distribution - Google Patents
The measurement apparatus of smooth surface Temperature Distribution Download PDFInfo
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- CN206339310U CN206339310U CN201621487507.5U CN201621487507U CN206339310U CN 206339310 U CN206339310 U CN 206339310U CN 201621487507 U CN201621487507 U CN 201621487507U CN 206339310 U CN206339310 U CN 206339310U
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- smooth surface
- thin
- temperature distribution
- film material
- temperature
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Abstract
The utility model provides a kind of measurement apparatus of smooth surface Temperature Distribution, and the measurement apparatus of the smooth surface Temperature Distribution includes：Thin-film material, the film is suitable to be attached to smooth surface by alite paste；Infrared thermography, the heat of the thin-film material radiation is imaged on the infrared thermography, obtains the Temperature Distribution of thin-film material surface, output temperature detected value TSurvey；Processor, the processor is according to the temperature detection value T receivedSurveyObtain the actual temperature value of the smooth surfaceSo as to obtain the Temperature Distribution of smooth surface.The utility model has the advantages that accuracy is good, quick.
Description
Technical field
The utility model is related to the measurement apparatus of contactless temperature-measuring, more particularly to smooth surface Temperature Distribution.
Background technology
At present, measured for smooth surface thermo parameters method, a kind of method be using traditional contact method (such as thermocouple,
Thermal resistance) carry out pointwise temperature survey, the thermo parameters method information then needed with some statistical methods；This usual side
The thermo parameters method information reliability that method is obtained is not good enough, because on the one hand the accuracy of measurement gained temperature can be passed by temperature
The laminating degree influence of sensor and plane surface, the temperature real-time on the other hand measured can be influenceed by measurement point quantity.
Another method is measured using the method for infrared thermal imaging, and infrared thermography can provide measured zone
The information of whole Temperature Distributions, but for some smooth flats (such as stainless steel plane, aluminium sheet), infrared thermography is in measurement
When can be affected due to the reflection of smooth surface.Because infrared thermography is the infrared emanation (thing by object
Volume emissivity) realize thermometric, and the size of object emission rate is directly related with the property, temperature and surface state of material.
Utility model content
To solve the deficiency in above-mentioned prior art, the utility model provides that a kind of degree of accuracy is high, quick light
The measurement apparatus of sliding surface temperature distribution.
The purpose of this utility model is achieved through the following technical solutions：
A kind of measurement apparatus of smooth surface Temperature Distribution；The measurement apparatus of the smooth surface Temperature Distribution includes：
Thin-film material, the film is suitable to be attached to smooth surface by alite paste；
Infrared thermography, the heat of the thin-film material radiation is imaged on the infrared thermography, obtains film
The Temperature Distribution of material surface, output temperature detected value TSurvey；
Processor, the processor is according to the temperature detection value T receivedSurveyObtain the actual temperature value of the smooth surfaceSo as to obtain the Temperature Distribution of smooth surface；εIt is realFor the surface emitting of thin-film material
Rate, εSurveyThe slin emissivity given tacit consent to during for infrared heat image instrument measuring, h is surface convection transfer rate, TRingEnvironment during for test
Temperature, δ is the thickness of thin-film material, and λ is the coefficient of heat conduction of thin-film material.
Compared with prior art, the utility model have the advantage that for：
1. the utility model ensures that the measurement of smooth surface temperature is not influenceed by environment and surface state, and improves temperature
Accuracy of measurement；
2. the utility model quickly provides the accurate information of smooth flat Temperature Distribution.
Brief description of the drawings
Referring to the drawings, disclosure of the present utility model will be easier to understand.Skilled addressee readily understands that
It is：These accompanying drawings are used only for illustrating the technical solution of the utility model, and are not intended to protection of the present utility model
Scope is construed as limiting.In figure：
Fig. 1 is the structure diagram of the measurement apparatus of the smooth surface Temperature Distribution according to the utility model embodiment 1.
Embodiment
Fig. 1 and following description describe optional embodiment of the present utility model to instruct those skilled in the art how real
Apply and reproduce the utility model.In order to instruct technical solutions of the utility model, simplify or eliminate some conventional aspects.Ability
Field technique personnel should be appreciated that modification or replacement from these embodiments will be in the range of the utility model.This area skill
Art personnel should be appreciated that following characteristics can combine to form multiple modifications of the present utility model in a variety of ways.Thus, this reality
Following optional embodiments are not limited to new, and are only limited by claim and their equivalent.
Embodiment：
Fig. 1 schematically illustrates the structure letter of the purifier of gas in the closing space of the utility model embodiment
Figure, as shown in figure 1, the purifier of gas includes in the closing space：
Thin-film material, such as black thin film paster or black insulating tape, the film are smooth suitable for being attached to by alite paste
Surface；
Infrared thermography, the heat of the thin-film material radiation is imaged on the infrared thermography, obtains film
The Temperature Distribution of material surface, output temperature detected value TSurvey；
Processor, such as process circuit, the processor is according to the temperature detection value T receivedSurveyObtain the smooth surface
Actual temperature valueSo as to obtain the Temperature Distribution of smooth surface；εIt is realFor thin-film material
Slin emissivity, εSurveyThe slin emissivity given tacit consent to during for infrared heat image instrument measuring, h is surface convection transfer rate, TRingTo survey
Environment temperature during examination, δ is the thickness of thin-film material, and λ is the coefficient of heat conduction of thin-film material.
The measuring method of the smooth surface Temperature Distribution of the utility model embodiment, namely above-mentioned measurement apparatus work side
Method, the measuring method of the smooth surface Temperature Distribution comprises the following steps：
(A1) thin-film material is attached to by smooth surface by alite paste, tight between thin-film material and smooth surface；
(A2) infrared thermography obtains the Temperature Distribution of the thin-film material surface, output temperature detected value TSurvey；
(A3) processor is according to the temperature detection value T receivedSurveyObtain the actual temperature value of the smooth surfaceSo as to obtain the Temperature Distribution of smooth surface；εIt is realFor the surface emitting of thin-film material
Rate, εSurveyThe slin emissivity given tacit consent to during for infrared heat image instrument measuring, h is surface convection transfer rate, TRingEnvironment during for test
Temperature, δ is the thickness of thin-film material, and λ is the coefficient of heat conduction of thin-film material.
Claims (2)
1. a kind of measurement apparatus of smooth surface Temperature Distribution；It is characterized in that：The measurement dress of the smooth surface Temperature Distribution
Put including：
Thin-film material, the film is suitable to be attached to smooth surface by alite paste；
Infrared thermography, the heat of the thin-film material radiation is imaged on the infrared thermography, obtains thin-film material
The Temperature Distribution on surface, output temperature detected value TSurvey；
Processor, the processor is according to the temperature detection value T receivedSurveyObtain the actual temperature value of the smooth surfaceSo as to obtain the Temperature Distribution of smooth surface；εIt is realFor the surface emitting of thin-film material
Rate, εSurveyThe slin emissivity given tacit consent to during for infrared heat image instrument measuring, h is surface convection transfer rate, TRingEnvironment during for test
Temperature, δ is the thickness of thin-film material, and λ is the coefficient of heat conduction of thin-film material.
2. the measurement apparatus of smooth surface Temperature Distribution according to claim 1, it is characterised in that：The film is black
Film paster or black insulating tape.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201621487507.5U CN206339310U (en) | 2016-12-31 | 2016-12-31 | The measurement apparatus of smooth surface Temperature Distribution |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201621487507.5U CN206339310U (en) | 2016-12-31 | 2016-12-31 | The measurement apparatus of smooth surface Temperature Distribution |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN206339310U true CN206339310U (en) | 2017-07-18 |
Family
ID=59303553
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201621487507.5U Active CN206339310U (en) | 2016-12-31 | 2016-12-31 | The measurement apparatus of smooth surface Temperature Distribution |
Country Status (1)
| Country | Link |
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| CN (1) | CN206339310U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106679818A (en) * | 2016-12-31 | 2017-05-17 | 宁波大学 | Measuring apparatus and method of temperature distribution on smooth surface |
-
2016
- 2016-12-31 CN CN201621487507.5U patent/CN206339310U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106679818A (en) * | 2016-12-31 | 2017-05-17 | 宁波大学 | Measuring apparatus and method of temperature distribution on smooth surface |
| CN106679818B (en) * | 2016-12-31 | 2023-10-24 | 宁波大学 | Device and method for measuring temperature distribution of smooth surface |
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