CN205898176U - Automatic test system in batches of photoelectric detector - Google Patents
Automatic test system in batches of photoelectric detector Download PDFInfo
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- CN205898176U CN205898176U CN201620798888.2U CN201620798888U CN205898176U CN 205898176 U CN205898176 U CN 205898176U CN 201620798888 U CN201620798888 U CN 201620798888U CN 205898176 U CN205898176 U CN 205898176U
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Abstract
The utility model discloses an automatic test system in batches of photoelectric detector, carry dish, accurate vibrations dish, automatic chip mounter, light source, automatic braider, test equipment and reservation test equipment including control cabinet, test guide rail, chip. Under the control of control cabinet, accurate vibration dish and automatic chip mounter are mutually supported, put into the chip with photoelectric detector in proper order according to specific direction and carry the dish. Control cabinet control test guide rail accuracy is step -by -step to the control light source produces the light of suitable characteristic, and then control test equipment accomplishes the test to the photoelectric detector photoelectric characteristic. The unqualified photoelectric detector of the last mark of control cabinet to it loads qualified photoelectric detector one -tenth dish to control automatic braider. The utility model has the beneficial effects of, can automize simultaneously to a large amount of photoelectric detector and test in batches, can realize a plurality of photoelectric detector's electricity volume, the measurement of optics volume in high efficiency ground, can conveniently realize a plurality of test amount's quick statistical analysis.
Description
Technical field
The utility model is related to microelectronics or photoelectron field tests, is especially for photodetector and is advised greatly
The automation batch testing system of mould test.
Background technology
In the production process of photodetector, the performance test of photodetector is critically important, because it is directly connected to
The outgoing quality of photodetector.The performance test of photodetector is related to the test of electric property and optical property.At present
The measurement of photodetector uses the method that single product is tested one by one, and single detector to be measured is put into product by tester
Fixing on product test load plate, it is then assembled in test system, carry out the measurement of the electrical quantities such as Current Voltage successively and spectrum rings
The measurement of optical quantities should be waited.Need constantly to change detector to be measured by the way of single product is tested one by one it is impossible to realize
Measure while multiple detector, be unfavorable for extensive batch testing.Additionally, during single product is tested one by one, needing
Manually it is operated manually, this not only considerably increases the testing time, and the automaticity of test system is not high, and this causes
Traditional test mode measurement efficiency is low, waste time and energy.Furthermore, due to its survey by the way of being tested one by one using single product
Test result relative distribution, is unfavorable for the photodetector of same batch manufacture is carried out with the statistical analysis of system.Thus, compel to be essential
Large scale test can be facilitated high efficiency can to carry out the batch testing system of automatic test again.
Utility model content
The utility model aims to solve the problem that above technical problem, and provides one kind to can be used for photodetector automation batch and survey
Examination, and it is greatly improved the batch testing system of testing efficiency.For achieving the above object, the utility model provides following technical side
Case:
A kind of photodetector automates batch testing system, including console, test guide rail, chip load plate, accurate shake
Moving plate, automatic placement machine, light source, automatic taping-machine, test equipment and reserved test equipment it is characterised in that: described test is led
A site, test site, reserved test site and sorting site are disposed with rail, and each site is respectively positioned on test guide rail
Specific location；Described precision vibration disk is used for adjusting the positive and negative of photodetector to be measured, and will adjust suitable light electrical resistivity survey
Survey device and be sequentially sent to automatic placement machine；Described automatic placement machine is used for the upper piece site in test guide rail, by photodetector
It is sequentially placed in chip load plate according to specific direction；Described chip load plate is used for carrying and fix photodetector to be measured, and
There is provided and be in communication with each other, with the test site on test guide rail, the interface being connected；Array arrangement is provided with described chip load plate
Chip slot, described chip slot is used for placing photodetector to be measured and being fixed；Described chip load plate can be used for multiple
Photodetector measures simultaneously；Described test site is used for setting up photodetector to be measured with the communication between test equipment
Connect；Described test equipment is used for treating the electric property of light-metering electric explorer or optical property is tested；Described light source position
In the surface of described test site, during for being tested in the optical property treating light-metering electric explorer, it is photodetection
Device provides light stimulus；Described reserved test site is used for setting up photodetector to be measured with the communication link between reserved test equipment
Connect, facilitate the extension of test system other functions；Described reserved test equipment is used for realizing other test functions of test system；
Described automatic taping-machine is used for the sorting site in test guide rail, by the photodetector of test passes in particular order
It is sequentially placed in chip reel；Described console simultaneously with precision vibration disk, automatic placement machine, test guide rail, test equipment, pre-
Stay test equipment, light source and automatic taping-machine communication connection, for controlling the whole operation automating batch testing system and right
Test result carries out quick Geostatistics analysis.
Further, described test guide rail comprises at least two test site and at least one reserved test site；Institute
State in test site, at least one is used for setting up photodetector to be measured with the communication connection between electrical quantities test equipment,
Tested with the electric property to photodetector；In described test site, at least one is used for setting up smooth electrical resistivity survey to be measured
Survey device with the communication connection between optical measurement examination equipment, tested with the optical property to photodetector；Described light source
It is located at the surface trying the corresponding test site of equipment with optical measurement, measure in the optical property to photodetector
When, described light source provides light stimulus for photodetector to be measured.
The batch survey being beneficial in that, a large amount of photodetectors can be automated simultaneously of the present utility model
Examination；The electrical quantities of multiple photodetectors, the measurement of optical quantities can quickly and efficiently be realized, treat without constantly changing
Survey detector；The quick Geostatistics analysis of multiple test volumes can be conveniently realized.
Brief description
With reference to embodiment and accompanying drawing, the utility model is described in detail, wherein:
Fig. 1 is the schematic diagram of the automation batch testing system that the utility model is proposed.
In figure, the implication of each label is as follows: 10- precision vibration disk；20- automatic placement machine；30- tests guide rail；Upper of 31-
Site；32- test site 1；33- test site 2；34- reserves test site；35- sorts site；40- chip load plate；50- light
Source；62- test equipment 1；63- test equipment 2；64- reserves test equipment；70- automatic taping-machine；80- console.
Specific embodiment
As shown in Figure 1, in the present embodiment, described test guide rail 30 comprises two test site 32 and 33, and
One reserved test site 34.Based on this, a kind of corresponding photodetector of this embodiment automates batch testing system, including
Console 80, test guide rail 30, chip load plate 40, accurate vibrating disc 10, automatic placement machine 20, light source 50, automatic taping-machine 70,
Electrical quantities test equipment 62, optical quantities test equipment 63, and reserved test equipment 64 it is characterised in that: described test guide rail
On be disposed with a site 31, test site 32 and 33, reserved test site 34 and sorting site 35, and the equal position in each site
Specific location in test guide rail 30；Described precision vibration disk 10 is used for adjusting the positive and negative of photodetector to be measured, and will adjust
Whole suitable photodetector is sequentially sent to automatic placement machine 20；Described automatic placement machine 20 is used for the upper piece position in test guide rail
At point 31, photodetector is sequentially placed in chip load plate 40 according to specific direction；Described chip load plate 40 is used for carrying
With fixing photodetector to be measured, and provide and be in communication with each other, with the test site tested on guide rail, the interface being connected；Described chip
The chip slot of array arrangement is provided with load plate 40, described chip slot is used for placing photodetector to be measured and being fixed；
Described chip load plate 40 can be used for multiple photodetectors are measured simultaneously；Described test site 32 is used for setting up to be measured
Photodetector, with the communication connection between electrical quantities test equipment 62, is tested with the electric property to photodetector；
Described test site 33 is used for setting up photodetector to be measured with the communication connection between optical measurement examination equipment 63, with to photoelectricity
The optical property of detector is tested；Described light source 50 is located at and tries the corresponding test site 33 of equipment 63 with optical measurement
Surface, when the optical property to photodetector measures, provides light stimulus for photodetector to be measured；Described reserved
Test site 34 is used for setting up photodetector to be measured with the communication connection between reserved test equipment 64, facilitate test system its
The extension of his function；Described reserved test equipment 64 is used for realizing other test functions of test system；Described automatic taping-machine
70 are used for, at the sorting site 35 of test guide rail 30, the photodetector of test passes being sequentially placed in particular order
In chip reel；Described console 80 simultaneously with precision vibration disk 10, automatic placement machine 20, test guide rail 30, test equipment 62
Communicate to connect with 63, reserved test equipment 64, light source 50 and automatic taping-machine 70, for controlling whole automation batch testing system
The operation of system, and quick Geostatistics analysis are carried out to test result.
Specifically, the function of console 80 is as follows: controls startup and the closing of precision vibration disk 10；Control automatic placement machine
20 start and stop；Control the test operation of guide rail 30 and stopping, especially, precise control test guide rail 30 stepping away from
From it is ensured that chip load plate 40 can realize good communication connection with test site 32 or 33；Control test equipment 62 and 63 (or
Reserved test equipment 64) start test and terminate test；Light source 50 is controlled to produce needed for the optical property of testing photoelectronic detector
The light with proper characteristics wanted；The underproof photodetector of labeled test, and control automatic taping-machine by test passes
Photodetector is loaded in chip reel in a certain order；Quick Geostatistics analysis are carried out to test result.
This test system is controlled to equipment each in system and assembly by console, by rationally rigorous logic control
System, you can realize the full-automatic operation of test system.Further, since test system is collocated with can be used for multiple smooth electrical resistivity surveys
Survey the chip load plate that device is tested simultaneously, thus the mass test of extensive photodetector product can be realized.From light
The placement of electric explorer chip, test, screen into disk load, all do not need substantial amounts of human input, this improve measurement effect
While rate, also greatly save the cost of batch testing.Automation batch testing as a result, it is possible to conveniently by console
Realize the statistical analysis of test data, so as to hold the performance of the photodetector that same batch manufactures on the whole.
Above-described embodiment is it will be appreciated that with using the utility model for ease of those skilled in the art
Description.Person skilled in the art obviously easily can make various modifications to these embodiments, and here is said
Bright General Principle is applied in other embodiment without through performing creative labour.Therefore, the utility model is not limited to
State embodiment, those skilled in the art are according to announcement of the present utility model, the improvement made without departing from the utility model category
All should be within protection domain of the present utility model with modification.
Claims (2)
1. a kind of photodetector automates batch testing system, including console, test guide rail, chip load plate, accurate vibrations
Disk, automatic placement machine, light source, automatic taping-machine, test equipment and reserved test equipment it is characterised in that: described test guide rail
On be disposed with a site, test site, reserved test site and sorting site, and each site is respectively positioned on test guide rail
Specific location；Described precision vibration disk is used for adjusting the positive and negative of photodetector to be measured, and will adjust suitable photodetection
Device is sequentially sent to automatic placement machine；Described automatic placement machine is used for the upper piece site in test guide rail, and photodetector is pressed
It is sequentially placed in chip load plate according to specific direction；Described chip load plate is used for carrying and fix photodetector to be measured, and carries
For being in communication with each other, with the test site on test guide rail, the interface being connected；The core of array arrangement is provided with described chip load plate
Film trap, described chip slot is used for placing photodetector to be measured and being fixed；Described chip load plate can be used for multiple light
Electric explorer measures simultaneously；Described test site is used for setting up photodetector to be measured with the communication link between test equipment
Connect；Described test equipment is used for treating the electric property of light-metering electric explorer or optical property is tested；Described light source is located at
The surface of described test site, during for being tested in the optical property treating light-metering electric explorer, is photodetector
Light stimulus is provided；Described reserved test site is used for setting up photodetector to be measured with the communication link between reserved test equipment
Connect, facilitate the extension of test system other functions；Described reserved test equipment is used for realizing other test functions of test system；
Described automatic taping-machine is used for the sorting site in test guide rail, by the photodetector of test passes in particular order
It is sequentially placed in chip reel；Described console simultaneously with precision vibration disk, automatic placement machine, test guide rail, test equipment, pre-
Stay test equipment, light source and automatic taping-machine communication connection, for controlling the whole operation automating batch testing system and right
Test result carries out quick Geostatistics analysis.
2. a kind of photodetector automation batch testing system according to claim 1 is it is characterised in that described test
At least two test site and at least one reserved test site are comprised on guide rail；In described test site, at least one use
In setting up photodetector to be measured with the communication connection between electrical quantities test equipment, entered with the electric property to photodetector
Row test；In described test site, at least one be used for set up photodetector to be measured with optical measurement examination equipment between
Communication connection, is tested with the optical property to photodetector；Described light source is located at corresponding with optical measurement examination equipment
Test site surface, when the optical property to photodetector measures, described light source be photodetection to be measured
Device provides light stimulus.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620798888.2U CN205898176U (en) | 2016-07-27 | 2016-07-27 | Automatic test system in batches of photoelectric detector |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620798888.2U CN205898176U (en) | 2016-07-27 | 2016-07-27 | Automatic test system in batches of photoelectric detector |
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| Publication Number | Publication Date |
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| CN205898176U true CN205898176U (en) | 2017-01-18 |
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| CN201620798888.2U Active CN205898176U (en) | 2016-07-27 | 2016-07-27 | Automatic test system in batches of photoelectric detector |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107861147A (en) * | 2017-12-26 | 2018-03-30 | 同方威视技术股份有限公司 | Scintillator sensitivity measuring apparatus and measuring method |
| CN109748129A (en) * | 2019-02-21 | 2019-05-14 | 嘉兴七色狼服饰有限公司 | A kind of efficient braid dispensing device |
| CN110095143A (en) * | 2019-06-04 | 2019-08-06 | 哈尔滨理工大学 | A kind of reliability detection device of trough type photoelectric sensor |
| CN116952538A (en) * | 2023-07-27 | 2023-10-27 | 湖南大学 | A quick quality control device for ultraviolet detector photoelectric property detects |
-
2016
- 2016-07-27 CN CN201620798888.2U patent/CN205898176U/en active Active
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107861147A (en) * | 2017-12-26 | 2018-03-30 | 同方威视技术股份有限公司 | Scintillator sensitivity measuring apparatus and measuring method |
| CN109748129A (en) * | 2019-02-21 | 2019-05-14 | 嘉兴七色狼服饰有限公司 | A kind of efficient braid dispensing device |
| CN109748129B (en) * | 2019-02-21 | 2020-05-08 | 嘉兴七色狼服饰有限公司 | Device is got to efficient braid volume |
| CN110095143A (en) * | 2019-06-04 | 2019-08-06 | 哈尔滨理工大学 | A kind of reliability detection device of trough type photoelectric sensor |
| CN116952538A (en) * | 2023-07-27 | 2023-10-27 | 湖南大学 | A quick quality control device for ultraviolet detector photoelectric property detects |
| CN116952538B (en) * | 2023-07-27 | 2024-01-19 | 湖南大学 | A quick quality control device for ultraviolet detector photoelectric property detects |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| PE01 | Entry into force of the registration of the contract for pledge of patent right |
Denomination of utility model: Automatic test system in batches of photoelectric detector Effective date of registration: 20170913 Granted publication date: 20170118 Pledgee: Ezhou City Tatsu Tatsu Asset Management Co., Ltd. Pledgor: WUHAN JOINBON TECHNOLOGY CO., LTD. Registration number: 2017420000029 |
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| PE01 | Entry into force of the registration of the contract for pledge of patent right |