CN205404692U - MOS device PK appearance - Google Patents
MOS device PK appearance Download PDFInfo
- Publication number
- CN205404692U CN205404692U CN201521117370.XU CN201521117370U CN205404692U CN 205404692 U CN205404692 U CN 205404692U CN 201521117370 U CN201521117370 U CN 201521117370U CN 205404692 U CN205404692 U CN 205404692U
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- module
- mos device
- connects
- test platform
- outfan
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Abstract
The utility model discloses a MOS device PK appearance mainly by the casing, fixes the switch on the casing, 2 liquid crystal display, the 2 test gear selecting button of group and 2 adjust knob of group to and 2 sets of test platform that set up in the casing constitute, wherein switch is continuous with 2 sets of test platform's power end simultaneously, 1 test gear selecting button of group and 1 adjust knob's of group output is connected to every set of test platform's input, 1 liquid crystal display is connected to every set of test platform's output. The utility model is simple in operation, the contrast circumstances is directly perceived, need not buy dear measuring testing equipment, alright relaxed desampling property can the contrast circumstances, small light in weight, portable, be favorable to the business personnel for customer's ocular demonstration produce property can, be favorable to the on -the -spot quick desampling property of research staff can the contrast circumstances.
Description
Technical field
This utility model relates to MOS device field tests, is specifically related to a kind of MOS device PK instrument.
Background technology
In the research and development of MOS device new product and the presentation process of MOS new product performance, different brands often to be contrasted by we with the MOS device product of type, to judge the quality of each properties of product.Generally before carrying out product contrast, first every electrical parameter data of each sample is contrasted.Situation about often can run into is some sample is have data information, but some sample does not have data information.If sample does not have data information, it is necessary for returning in laboratory or in factory, it is carried out actual measurement and obtain sample data.By test when specific application environment could be carried out after Data Comparison respectively, finally obtain contrast test situation.So we cannot understand contrast situation at the scene in time, it is necessary to spends the longer time, applies to more test/test equipment and the easy impact occurring anthropic factor during the course, causes the inaccurate of contrast situation.
Utility model content
To be solved in the utility model be existing MOS device product way of contrast need spend the longer time, the problem applying to more test/test equipment, it is provided that one MOS device PK instrument.
For solving the problems referred to above, this utility model is achieved through the following technical solutions:
A kind of MOS device PK instrument, mainly by housing, is fixed on the on and off switch on housing, 2 LCDs, 2 groups of test gears selection keys and 2 groups of adjusting knobs, and is arranged on 2 set test platforms compositions in housing；Wherein on and off switch is connected with 2 power ends overlapping test platform simultaneously；The input often overlapping test platform connects the outfan of 1 group of test gear selection key and 1 group of adjusting knob；The outfan often overlapping test platform connects 1 LCDs.
In such scheme, often set test platform forms by power module, microcontroller, voltage measurement module, grid voltage generation module, constant-current source module, current measurement module and temperature-measuring module；Wherein the outfan of power module connects the power end of microcontroller and constant-current source module；The input of constant-current source module connects microcontroller, and the outfan of constant-current source module connects the input of current measurement module；Current measurement module outfan is divided into three tunnels, and a road connects microcontroller, and a road connects the input of voltage measurement module, and a road connects the source electrode of MOS device to be measured；The outfan of grid voltage generation module connects the grid of MOS device to be measured, and the input of temperature-measuring module connects the drain electrode of MOS device to be measured.
In such scheme, described test gear selects key to be connected with microcontroller with the outfan of adjusting knob, and the input of LCDs is connected with microcontroller.
In such scheme, described on and off switch is connected with power module.
In such scheme, 2 set test platforms share 1 power module, share 1 microcontroller, share 1 voltage measurement module and share 1 grid voltage generation module.
Compared with prior art, this utility model is simple to operate, and contrast situation is directly perceived, it is not necessary to buy expensive detection/testing equipment, just can easily understand properties of sample contrast situation；Small in volume, it is simple to carry, being conducive to business personnel is client's ocular demonstration properties of product, is conducive to research staff's on-the-spot quickly understanding properties of sample contrast situation.
Accompanying drawing explanation
Fig. 1 is the three-dimensional structure diagram of a kind of MOS device PK instrument.
Fig. 2 is the theory diagram of test platform.
Number in the figure: 1, housing；2, LCDs；3, on and off switch；4, test gear selects key；5, adjusting knob；6, test platform.
Detailed description of the invention
A kind of MOS device PK instrument, as it is shown in figure 1, main by housing 1,3,2 LCDs of on and off switch 2, the 2 groups test gear being fixed on housing 1 selects key 4 and 2 groups of adjusting knobs 5, and the 2 set test platforms 6 being arranged in housing 1 form；Wherein on and off switch 3 is connected with 2 power ends overlapping test platform 6 simultaneously；The input often overlapping test platform 6 connects the outfan of 1 group of test gear selection key 4 and 1 group of adjusting knob 5；The outfan often overlapping test platform 6 connects 1 LCDs 2.
Often set test platform 6 forms by power module, microcontroller, voltage measurement module, grid voltage generation module, constant-current source module, current measurement module and temperature-measuring module；Wherein the outfan of power module connects the power end of microcontroller and constant-current source module；The input of constant-current source module connects microcontroller, and the outfan of constant-current source module connects the input of current measurement module；Current measurement module outfan is divided into three tunnels, and a road connects microcontroller, and a road connects the input of voltage measurement module, and a road connects the source electrode of MOS device to be measured；The outfan of grid voltage generation module connects the grid of MOS device to be measured, and the input of temperature-measuring module connects the drain electrode of MOS device to be measured.Described test gear selects key 4 to be connected with microcontroller with the outfan of adjusting knob 5, and the input of LCDs 2 is connected with microcontroller.On and off switch 3 is connected with power module.For effectively save cost, in this utility model preferred embodiment, 2 set test platforms 6 share 1 power module, share 1 microcontroller, share 1 voltage measurement module and share 1 grid voltage generation module.Referring to Fig. 2.
This utility model is by focusing on Specifeca tion speeification and main applied environment condition, together with circuit integrated with main applied environment condition test for Specifeca tion speeification tester, use adjustable pair of test platform 6 of applied environment condition, performance parameter when simultaneously show difference sample same application on an instrument or when different application.So contrast is not only simple but also directly perceived, and scene can be obtained by contrast situation, it is not necessary to buy expensive detection equipment, it is not required that spend the longer time to come and go and laboratory/factory.Test operation is easy, practical again.
Claims (5)
1.MOS device PK instrument, it is characterized in that: main by housing (1), it is fixed on the on and off switch (3) on housing (1), 2 LCDs (2), 2 groups of tests gears selection key (4) and 2 groups of adjusting knobs (5), and is arranged on 2 set test platform (6) compositions in housing (1)；Wherein on and off switch (3) is connected with 2 power ends overlapping test platform (6) simultaneously；The input often overlapping test platform (6) connects the outfan of 1 group of test gear selection key (4) and 1 group of adjusting knob (5)；The outfan often overlapping test platform (6) connects 1 LCDs (2).
2. MOS device PK instrument according to claim 1, it is characterised in that: often overlap test platform (6) and form by power module, microcontroller, voltage measurement module, grid voltage generation module, constant-current source module, current measurement module and temperature-measuring module；Wherein the outfan of power module connects the power end of microcontroller and constant-current source module；The input of constant-current source module connects microcontroller, and the outfan of constant-current source module connects the input of current measurement module；Current measurement module outfan is divided into three tunnels, and a road connects microcontroller, and a road connects the input of voltage measurement module, and a road connects the source electrode of MOS device to be measured；The outfan of grid voltage generation module connects the grid of MOS device to be measured, and the input of temperature-measuring module connects the drain electrode of MOS device to be measured.
3. MOS device PK instrument according to claim 2, it is characterized in that: test gear selects key (4) to be connected with microcontroller with the outfan of adjusting knob (5), and the input of LCDs (2) is connected with microcontroller.
4. MOS device PK instrument according to claim 2, it is characterised in that: on and off switch (3) is connected with power module.
5. MOS device PK instrument according to claim 2, it is characterised in that: 2 sets test platform (6) share 1 power module, share 1 microcontroller, share 1 voltage measurement module and share 1 grid voltage generation module.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201521117370.XU CN205404692U (en) | 2015-12-29 | 2015-12-29 | MOS device PK appearance |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201521117370.XU CN205404692U (en) | 2015-12-29 | 2015-12-29 | MOS device PK appearance |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN205404692U true CN205404692U (en) | 2016-07-27 |
Family
ID=56450603
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201521117370.XU Withdrawn - After Issue CN205404692U (en) | 2015-12-29 | 2015-12-29 | MOS device PK appearance |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN205404692U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105425083A (en) * | 2015-12-29 | 2016-03-23 | 桂林斯壮微电子有限责任公司 | Mos device pk instrument |
-
2015
- 2015-12-29 CN CN201521117370.XU patent/CN205404692U/en not_active Withdrawn - After Issue
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105425083A (en) * | 2015-12-29 | 2016-03-23 | 桂林斯壮微电子有限责任公司 | Mos device pk instrument |
| CN105425083B (en) * | 2015-12-29 | 2018-04-20 | 桂林斯壮微电子有限责任公司 | Mos device pk instrument |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| AV01 | Patent right actively abandoned |
Granted publication date: 20160727 Effective date of abandoning: 20180420 |
|
| AV01 | Patent right actively abandoned |