CN205177247U - Pulsed simulation is electrocute and is experienced appearance - Google Patents
Pulsed simulation is electrocute and is experienced appearance Download PDFInfo
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- CN205177247U CN205177247U CN201520868101.0U CN201520868101U CN205177247U CN 205177247 U CN205177247 U CN 205177247U CN 201520868101 U CN201520868101 U CN 201520868101U CN 205177247 U CN205177247 U CN 205177247U
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Abstract
The utility model discloses a pulsed simulation is electrocute and is experienced appearance, simulate electric shock circuit with setting up in the inside pulsed of casing including the casing, pulsed simulation electric shock circuit includes microcontroller and the power supply circuit who connects gradually, boost circuit and discharge circuit, microcontroller's input termination has button operating circuit, microcontroller's output termination has the display circuit and is used for carrying on behind the shaping amplifier shaping amplifier circuit of drive boost circuit and discharge circuit to the pulse signal of microcontroller output, boost circuit and discharge circuit are connected with two outputs of shaping amplifier circuit respectively, the output termination of discharge circuit has the electric shock touch contact that exposes on the surface of casing. The utility model discloses simple structure, reasonable in design, it is convenient and with low costs to realize, uses convenient operation, and the security that the electric shock was experienced is high, and the practicality is strong, excellent in use effect, convenient to popularize and use.
Description
Technical field
The utility model belongs to safe analog machine technical field, is specifically related to a kind of pulsed simulation electric shock experience instrument.
Background technology
Electrical equipment is the instrument of people's often contact and use in life, but because people are to electric understanding deficiency, cause the damage of misoperation or electric equipment to cause the reasons such as electric leakage, electric shock accidents is happened occasionally.For the harm that the understanding making people darker is got an electric shock, need a kind of sensation when people can be allowed to experience electric shock intuitively and understand the safe electric shock experience instrument of electric shock accidents harm, to improve people, the security protection of electric shock accidents is realized; But, also lack in prior art structure simple, reasonable in design, realize convenient and cost is low, use easy to operate, that result of use is good simulation electric shock experience instrument.
Utility model content
Technical problem to be solved in the utility model is for above-mentioned deficiency of the prior art, a kind of pulsed is provided to simulate electric shock experience instrument, its structure is simple, reasonable in design, realization is convenient and cost is low, uses easy to operate, the security of electric shock experience is high, practical, result of use is good, is convenient to promote the use of.
For solving the problems of the technologies described above, the technical solution adopted in the utility model is: a kind of pulsed simulation electric shock experience instrument, it is characterized in that: comprise housing and the pulsed simulation electric shock circuit being arranged on enclosure interior, the power circuit that described pulsed simulation electric shock circuit comprises microcontroller and connects successively, booster circuit and discharge circuit, the input end of described microcontroller is connected to button operation circuit, the output terminal of described microcontroller is connected to display circuit and the pulse signal for exporting microcontroller carries out the shaping amplification circuit that rear drive booster circuit and discharge circuit are amplified in shaping, described booster circuit and discharge circuit are connected with two output terminals of shaping amplification circuit respectively, the output terminal of described discharge circuit is connected to the outer electric shock be exposed on the outside surface of housing and touches contact.
Above-mentioned a kind of pulsed simulation electric shock experience instrument; it is characterized in that: described pulsed simulation electric shock circuit also comprises over under-voltage protection circuit; the voltage detecting circuit that described over under-voltage protection circuit comprises voltage comparator circuit and is connected with the output terminal of booster circuit; two input ends of described voltage comparator circuit are connected with the output terminal of power circuit and the output terminal of voltage detecting circuit respectively, and the output terminal of described voltage comparator circuit is connected with microcontroller and shaping amplification circuit.
Above-mentioned a kind of pulsed simulation electric shock experience instrument, it is characterized in that: described voltage detecting circuit is made up of resistance R1 and resistance R2, two ends after described resistance R1 and resistance R2 connect connect with the cathode voltage output terminal of booster circuit and cathode voltage output terminal respectively, and the link of described resistance R1 and resistance R2 is the output terminal of voltage detecting circuit.
Above-mentioned a kind of pulsed simulation electric shock experience instrument, it is characterized in that: described shaping amplification circuit comprises chip TPS2812, triode Q1, triode Q2 and triode Q4, the base stage of described triode Q1 is connected with the output terminal of microcontroller by resistance R21, the base stage of described triode Q2 is connected with the output terminal of voltage comparator circuit by resistance R8, the collector of described triode Q1 and the collector of triode Q2 all connect with the 2nd pin of chip TPS2812, and be connected with the cathode voltage output terminal of power circuit by resistance R11, the emitter of described triode Q1 and the equal ground connection of emitter of triode Q2, the collector of described triode Q4 connects with the 4th pin of chip TPS2812, and be connected with the cathode voltage output terminal of power circuit by resistance R17, the base stage of described triode Q4 is connected with the output terminal of microcontroller by resistance R18, the grounded emitter of described triode Q4, the 7th pin of described chip TPS2812 and the 5th pin are respectively two output terminals of shaping amplification circuit.
Above-mentioned a kind of pulsed simulation electric shock experience instrument, is characterized in that: described power circuit comprises battery and the mu balanced circuit be connected with the output terminal of battery by power switch, is exposed on the outside surface of housing outside described power switch.
Above-mentioned a kind of pulsed simulation electric shock experience instrument, is characterized in that: described microcontroller is single-chip microcomputer MSP430F149.
Above-mentioned a kind of pulsed simulation electric shock experience instrument, it is characterized in that: described booster circuit is Boost circuit, described Boost circuit comprises inductance L, switching diode D, field effect transistor switch pipe Q5 and polar capacitor C, one end of described inductance L is connected with the cathode voltage output terminal of power circuit, the anode of described switching diode D is all connected with the other end of inductance L with the drain electrode of field effect transistor switch pipe Q5, the positive pole of described polar capacitor C is connected with the negative electrode of switching diode D and is the cathode voltage output terminal of Boost circuit, the source electrode of described field effect transistor switch pipe Q5 and the negative pole of polar capacitor C are all connected with the cathode voltage output terminal of power circuit and are the cathode voltage output terminal of Boost circuit, the grid of described field effect transistor switch pipe Q5 is connected with the output terminal of shaping amplification circuit.
Above-mentioned a kind of pulsed simulation electric shock experience instrument, it is characterized in that: described discharge circuit comprises field effect transistor switch pipe Q6 and resistance R3, the drain electrode of described field effect transistor switch pipe Q6 to be connected with the cathode voltage output terminal of booster circuit by resistance R3 and to be the cathode voltage output terminal of discharge circuit, the described source electrode of field effect transistor switch pipe Q6 is connected with the cathode voltage output terminal of booster circuit and connects for the cathode voltage output terminal of discharge circuit, the grid of described field effect transistor switch pipe Q6 is connected with the output terminal of shaping amplification circuit, described electric shock touches the quantity of contact and is two and is connected with the cathode voltage output terminal of discharge circuit and cathode voltage output terminal respectively.
Above-mentioned a kind of pulsed simulation electric shock experience instrument, it is characterized in that: described button operation circuit comprises beginning/reset key and voltage strengthens button, described beginning/reset key and voltage strengthen button and are exposed on the outside surface of housing all outward.
Above-mentioned a kind of pulsed simulation electric shock experience instrument, it is characterized in that: described display circuit is made up of multiple light emitting diode, multiple light emitting diode stacked on top arranges and is exposed at outward on the outside surface of housing.
The utility model compared with prior art has the following advantages:
1, the utility model structure is simple, reasonable in design, and realization is convenient and cost is low.
2, use of the present utility model is easy to operate, by touching lead-out terminal, can experience different electric shock experiences, can reach the object allowing people experience different electrical sensations to be subject to.
3, the utility model have employed the form that impulse type voltage exports, and intermittent impulse can be adopted in the specific implementation to export, namely after exporting several or tens pulse voltages, circuit can export the second group pulse voltage after the several seconds of interval, even if make the people more weak to this pulsed simulation electric shock experience instrument ability to bear also can recover if having time afterwards and make a response, ensure that the security of electric shock experience.
4, sensation when the utility model can allow people experience electric shock intuitively and understand electric shock accidents harm, practical, result of use is good, is convenient to promote the use of.
In sum, the utility model structure is simple, reasonable in design, and realization is convenient and cost is low, and use easy to operate, the security of electric shock experience is high, practical, and result of use is good, is convenient to promote the use of.
Below by drawings and Examples, the technical solution of the utility model is described in further detail.
Accompanying drawing explanation
Fig. 1 is structural representation of the present utility model.
Fig. 2 is the schematic block circuit diagram of the utility model pulsed simulation electric shock circuit.
Fig. 3 is the schematic block circuit diagram of the utility model microcontroller.
Fig. 4 is the circuit theory diagrams of the utility model shaping amplification circuit.
Description of reference numerals:
1-housing; 2-microcontroller; 3-booster circuit;
4-discharge circuit; 5-button operation circuit; 5-1-beginning/reset key;
5-2-voltage strengthens button; 6-display circuit; 7-shaping amplification circuit;
8-getting an electric shock touches contact; 9-voltage comparator circuit; 10-voltage detecting circuit;
11-battery; 12-mu balanced circuit; 13-power switch;
14-light emitting diode.
Embodiment
As depicted in figs. 1 and 2, the utility model comprises housing 1 and is arranged on the pulsed simulation electric shock circuit of housing 1 inside, the power circuit that described pulsed simulation electric shock circuit comprises microcontroller 2 and connects successively, booster circuit 3 and discharge circuit 4, the input end of described microcontroller 2 is connected to button operation circuit 5, the output terminal of described microcontroller 2 is connected to display circuit 6 and the pulse signal for exporting microcontroller 2 carries out the shaping amplification circuit 7 that rear drive booster circuit 3 and discharge circuit 4 are amplified in shaping, described booster circuit 3 and discharge circuit 4 are connected with two output terminals of shaping amplification circuit 7 respectively, the output terminal of described discharge circuit 4 is connected to the outer electric shock be exposed on the outside surface of housing 1 and touches contact 8.
As shown in Figure 2; in the present embodiment; described pulsed simulation electric shock circuit also comprises over under-voltage protection circuit; the voltage detecting circuit 10 that described over under-voltage protection circuit comprises voltage comparator circuit 9 and is connected with the output terminal of booster circuit 3; two input ends of described voltage comparator circuit 9 are connected with the output terminal of power circuit and the output terminal of voltage detecting circuit 10 respectively, and the output terminal of described voltage comparator circuit 9 is connected with microcontroller 2 and shaping amplification circuit 7.
As shown in Figure 2, in the present embodiment, described voltage detecting circuit 10 is made up of resistance R1 and resistance R2, two ends after described resistance R1 and resistance R2 connect connect with the cathode voltage output terminal of booster circuit 3 and cathode voltage output terminal respectively, and the link of described resistance R1 and resistance R2 is the output terminal of voltage detecting circuit 10.
As shown in Figure 4, in the present embodiment, described shaping amplification circuit 7 comprises chip TPS2812, triode Q1, triode Q2 and triode Q4, the base stage of described triode Q1 is connected with the output terminal of microcontroller 2 by resistance R21, the base stage of described triode Q2 is connected with the output terminal of voltage comparator circuit 9 by resistance R8, the collector of described triode Q1 and the collector of triode Q2 all connect with the 2nd pin of chip TPS2812, and be connected with the cathode voltage output terminal VCC of power circuit by resistance R11, the emitter of described triode Q1 and the equal ground connection of emitter of triode Q2, the collector of described triode Q4 connects with the 4th pin of chip TPS2812, and be connected with the cathode voltage output terminal VCC of power circuit by resistance R17, the base stage of described triode Q4 is connected with the output terminal of microcontroller 2 by resistance R18, the grounded emitter of described triode Q4, the 7th pin of described chip TPS2812 and the 5th pin are respectively two output terminal OUT1 and OUT2 of shaping amplification circuit 7.
As depicted in figs. 1 and 2, in the present embodiment, described power circuit comprises battery 11 and the mu balanced circuit 12 be connected with the output terminal of battery 11 by power switch 13, is exposed on the outside surface of housing 1 outside described power switch 13.During concrete enforcement, described battery 11 adopts 3 joint 1.5V dry cells 11, and mu balanced circuit 12 at 6V, is the voltage source of circuit with stable below for the power good that exported by battery 11.
As shown in Figure 3, in the present embodiment, described microcontroller 2 is single-chip microcomputer MSP430F149.Single-chip microcomputer MSP430F149 has the feature of super low-power consumption, and has multiple peripheral hardware, can produce multiple different PWM waveform, produces different pulse voltages to control booster circuit 3.During concrete enforcement, the base stage of described triode Q1 is connected with the P4.1 pin of single-chip microcomputer MSP430F149 by resistance R21, and the base stage of described triode Q4 is connected with the P1.7 pin of single-chip microcomputer MSP430F149 by resistance R18.
As shown in Figure 2, in the present embodiment, described booster circuit 3 is Boost circuit, described Boost circuit comprises inductance L, switching diode D, field effect transistor switch pipe Q5 and polar capacitor C, one end of described inductance L is connected with the cathode voltage output terminal of power circuit, the anode of described switching diode D is all connected with the other end of inductance L with the drain electrode of field effect transistor switch pipe Q5, the positive pole of described polar capacitor C is connected with the negative electrode of switching diode D and is the cathode voltage output terminal of Boost circuit, the source electrode of described field effect transistor switch pipe Q5 and the negative pole of polar capacitor C are all connected with the cathode voltage output terminal of power circuit and are the cathode voltage output terminal of Boost circuit, the grid of described field effect transistor switch pipe Q5 is connected with the output terminal of shaping amplification circuit 7.During concrete enforcement, the described grid of field effect transistor switch pipe Q5 and the output terminal OUT1 of shaping amplification circuit 7, namely the 7th pin of described chip TPS2812 connects.The capacity that polar capacitor C chooses is at nanofarad range, and storing electricity is less, even if be also not enough to when human body resistance is less produce excessive electric current, ensure that the security of electric shock experience.
As shown in Figure 2, in the present embodiment, described discharge circuit 4 comprises field effect transistor switch pipe Q6 and resistance R3, the drain electrode of described field effect transistor switch pipe Q6 to be connected with the cathode voltage output terminal of booster circuit 3 by resistance R3 and to be the cathode voltage output terminal of discharge circuit 4, the described source electrode of field effect transistor switch pipe Q6 is connected with the cathode voltage output terminal of booster circuit 3 and connects for the cathode voltage output terminal of discharge circuit 4, the grid of described field effect transistor switch pipe Q6 is connected with the output terminal of shaping amplification circuit 7, described electric shock touches the quantity of contact 8 and is two and is connected with the cathode voltage output terminal of discharge circuit 4 and cathode voltage output terminal respectively.During concrete enforcement, the described grid of field effect transistor switch pipe Q6 and the output terminal OUT2 of shaping amplification circuit 7, namely the 5th pin of described chip TPS2812 connects.
As shown in Figure 1, in the present embodiment, described button operation circuit 5 comprises beginning/reset key 5-1 and voltage strengthens button 5-2, and described beginning/reset key 5-1 and voltage strengthen button 5-2 and is exposed on the outside surface of housing 1 all outward.
As shown in Figure 1, in the present embodiment, described display circuit 6 is made up of multiple light emitting diode 14, and multiple light emitting diode 14 stacked on top arranges and is exposed at outward on the outside surface of housing 1.Multiple light emitting diode 14 directly can be lighted by microcontroller 2.
The utility model output voltage range is 50V ~ 200V, and output pulse width scope is 100us ~ 1.5ms, and pulses range is 10Hz ~ 100Hz.
When the utility model uses, first guarantee that battery 11 is correctly installed, and contact is good.Then power switch is pressed, this pulsed simulation electric shock experience instrument enters duty, button 5-2 is strengthened by voltage after pressing beginning/reset key 5-1, first light emitting diode 14 being stacked on lowermost end is lighted, experiencer's both hands contact two touch contacts 8 that get an electric shock respectively, experience small electric stream to get an electric shock, continue to press voltage and strengthen button 5-2, second light emitting diode 14 being positioned at first light emitting diode 14 top is lighted, experiencer experiences larger current and gets an electric shock, by that analogy, when crawl voltage enhancing button 5-2 lights to the tenth light emitting diode 14, experience the strongest electric shock feeling, press beginning/reset key 5-1, experience and terminate, press power switch, shutdown.
In above use procedure, the principle of work of described pulsed simulation electric shock circuit is: described microcontroller 2 strengthens the operation of button 5-2 according to voltage, export different pulse waveforms and after carrying out shaping amplification by shaping amplification circuit 7, drive the field effect transistor switch pipe Q5 of booster circuit 3, booster circuit 3 is made to export the voltage of different amplitude, the charge storage exported is in the polar capacitor C of booster circuit 3, simultaneously, described microcontroller 2 exports the control signal of field effect transistor switch pipe Q6 and after carrying out shaping amplification by shaping amplification circuit 7, drive field effect transistor switch pipe Q6, charge consumption in polar capacitor C is fallen, therefore discharge circuit 4 can export distinct pulse widths, the pulse voltage of different amplitude, conducted to human body by two touch contacts 8 that get an electric shock again.Voltage comparator circuit 9 monitors the output voltage of mu balanced circuit 12, when the electricity of battery 11 is not enough, mu balanced circuit 12 output voltage also corresponding meeting fluctuates to some extent, now voltage comparator circuit 9 produces a low level, microcontroller 2 quits work after receiving this low level, therefore, it is possible to prevention causes booster circuit 3 to work not normal caused potential safety hazard because of power supply instability; Simultaneously, the voltage that voltage detecting circuit 10 pairs of booster circuits 3 export detects in real time and exports to voltage comparator circuit 9, when the safe voltage of voltage higher than defined that booster circuit 3 exports, voltage comparator circuit 9 exports control signal to shaping amplification circuit 7, booster circuit 3 is quit work, and make discharge circuit 4 continuous discharge, to avoid producing danger because output voltage is too high.
The above; it is only preferred embodiment of the present utility model; not the utility model is imposed any restrictions; every above embodiment is done according to the utility model technical spirit any simple modification, change and equivalent structure change, all still belong in the protection domain of technical solutions of the utility model.
Claims (10)
1. a pulsed simulation electric shock experience instrument, it is characterized in that: comprise housing (1) and be arranged on the inner pulsed simulation electric shock circuit of housing (1), the power circuit that described pulsed simulation electric shock circuit comprises microcontroller (2) and connects successively, booster circuit (3) and discharge circuit (4), the input end of described microcontroller (2) is connected to button operation circuit (5), the output terminal of described microcontroller (2) is connected to display circuit (6) and the pulse signal for exporting microcontroller (2) carries out the shaping amplification circuit (7) that rear drive booster circuit (3) and discharge circuit (4) are amplified in shaping, described booster circuit (3) and discharge circuit (4) are connected with two output terminals of shaping amplification circuit (7) respectively, the output terminal of described discharge circuit (4) is connected to the outer electric shock be exposed on the outside surface of housing (1) and touches contact (8).
2. according to a kind of pulsed simulation electric shock experience instrument according to claim 1, it is characterized in that: described pulsed simulation electric shock circuit also comprises over under-voltage protection circuit, the voltage detecting circuit (10) that described over under-voltage protection circuit comprises voltage comparator circuit (9) and is connected with the output terminal of booster circuit (3), two input ends of described voltage comparator circuit (9) are connected with the output terminal of power circuit and the output terminal of voltage detecting circuit (10) respectively, the output terminal of described voltage comparator circuit (9) is connected with microcontroller (2) and shaping amplification circuit (7).
3. according to a kind of pulsed simulation electric shock experience instrument according to claim 2, it is characterized in that: described voltage detecting circuit (10) is made up of resistance R1 and resistance R2, two ends after described resistance R1 and resistance R2 connect connect with the cathode voltage output terminal of booster circuit (3) and cathode voltage output terminal respectively, and the link of described resistance R1 and resistance R2 is the output terminal of voltage detecting circuit (10).
4. according to a kind of pulsed simulation electric shock experience instrument according to claim 2, it is characterized in that: described shaping amplification circuit (7) comprises chip TPS2812, triode Q1, triode Q2 and triode Q4, the base stage of described triode Q1 is connected with the output terminal of microcontroller (2) by resistance R21, the base stage of described triode Q2 is connected with the output terminal of voltage comparator circuit (9) by resistance R8, the collector of described triode Q1 and the collector of triode Q2 all connect with the 2nd pin of chip TPS2812, and be connected with the cathode voltage output terminal of power circuit by resistance R11, the emitter of described triode Q1 and the equal ground connection of emitter of triode Q2, the collector of described triode Q4 connects with the 4th pin of chip TPS2812, and be connected with the cathode voltage output terminal of power circuit by resistance R17, the base stage of described triode Q4 is connected with the output terminal of microcontroller (2) by resistance R18, the grounded emitter of described triode Q4, the 7th pin of described chip TPS2812 and the 5th pin are respectively two output terminals of shaping amplification circuit (7).
5. according to a kind of pulsed simulation electric shock experience instrument described in claim 1 or 2, it is characterized in that: described power circuit comprises battery (11) and the mu balanced circuit (12) be connected with the output terminal of battery (11) by power switch (13), and described power switch is exposed on the outside surface of housing (1) outside (13).
6., according to a kind of pulsed simulation electric shock experience instrument described in claim 1 or 2, it is characterized in that: described microcontroller (2) is single-chip microcomputer MSP430F149.
7. according to a kind of pulsed simulation electric shock experience instrument described in claim 1 or 2, it is characterized in that: described booster circuit (3) is Boost circuit, described Boost circuit comprises inductance L, switching diode D, field effect transistor switch pipe Q5 and polar capacitor C, one end of described inductance L is connected with the cathode voltage output terminal of power circuit, the anode of described switching diode D is all connected with the other end of inductance L with the drain electrode of field effect transistor switch pipe Q5, the positive pole of described polar capacitor C is connected with the negative electrode of switching diode D and is the cathode voltage output terminal of Boost circuit, the source electrode of described field effect transistor switch pipe Q5 and the negative pole of polar capacitor C are all connected with the cathode voltage output terminal of power circuit and are the cathode voltage output terminal of Boost circuit, the grid of described field effect transistor switch pipe Q5 is connected with the output terminal of shaping amplification circuit (7).
8. according to a kind of pulsed simulation electric shock experience instrument described in claim 1 or 2, it is characterized in that: described discharge circuit (4) comprises field effect transistor switch pipe Q6 and resistance R3, the drain electrode of described field effect transistor switch pipe Q6 to be connected with the cathode voltage output terminal of booster circuit (3) by resistance R3 and to be the cathode voltage output terminal of discharge circuit (4), the source electrode of described field effect transistor switch pipe Q6 is connected with the cathode voltage output terminal of booster circuit (3) and connects for the cathode voltage output terminal of discharge circuit (4), the grid of described field effect transistor switch pipe Q6 is connected with the output terminal of shaping amplification circuit (7), the described quantity touching contact (8) of getting an electric shock is two and is connected with the cathode voltage output terminal of discharge circuit (4) and cathode voltage output terminal respectively.
9. according to a kind of pulsed simulation electric shock experience instrument described in claim 1 or 2, it is characterized in that: described button operation circuit (5) comprises beginning/reset key (5-1) and voltage strengthens button (5-2), described beginning/reset key (5-1) and voltage enhancing button (5-2) are all outer to be exposed on the outside surface of housing (1).
10. according to a kind of pulsed simulation electric shock experience instrument described in claim 1 or 2, it is characterized in that: described display circuit (6) is made up of multiple light emitting diode (14), multiple light emitting diode (14) stacked on top arranges and is exposed at outward on the outside surface of housing (1).
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CN201520868101.0U CN205177247U (en) | 2015-11-03 | 2015-11-03 | Pulsed simulation is electrocute and is experienced appearance |
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CN201520868101.0U CN205177247U (en) | 2015-11-03 | 2015-11-03 | Pulsed simulation is electrocute and is experienced appearance |
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
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CN108074454A (en) * | 2016-11-15 | 2018-05-25 | 天津中德应用技术大学 | Electric shock experience insert row teaching aid |
CN108922302A (en) * | 2018-08-20 | 2018-11-30 | 国家电网有限公司 | A kind of electric shock accidents analogue system |
CN109147450A (en) * | 2018-08-20 | 2019-01-04 | 国家电网有限公司 | A kind of electric shock accidents dummy emulation method, device and server |
CN109545025A (en) * | 2018-11-30 | 2019-03-29 | 西安润兴电子科技有限公司 | A kind of human electric shock's simulator and method |
-
2015
- 2015-11-03 CN CN201520868101.0U patent/CN205177247U/en not_active Expired - Fee Related
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108074454A (en) * | 2016-11-15 | 2018-05-25 | 天津中德应用技术大学 | Electric shock experience insert row teaching aid |
CN108922302A (en) * | 2018-08-20 | 2018-11-30 | 国家电网有限公司 | A kind of electric shock accidents analogue system |
CN109147450A (en) * | 2018-08-20 | 2019-01-04 | 国家电网有限公司 | A kind of electric shock accidents dummy emulation method, device and server |
CN109545025A (en) * | 2018-11-30 | 2019-03-29 | 西安润兴电子科技有限公司 | A kind of human electric shock's simulator and method |
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Granted publication date: 20160420 Termination date: 20211103 |