CN204807200U - Measure high strength terahertz device of time domain spectrum now - Google Patents

Measure high strength terahertz device of time domain spectrum now Download PDF

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CN204807200U
CN204807200U CN201520383540.2U CN201520383540U CN204807200U CN 204807200 U CN204807200 U CN 204807200U CN 201520383540 U CN201520383540 U CN 201520383540U CN 204807200 U CN204807200 U CN 204807200U
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direct impulse
terahertz
pulse
signal
terahertz signal
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郑水钦
徐世祥
潘新建
蔡懿
曾选科
朱天龙
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Shenzhen University
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Shenzhen University
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Abstract

The utility model discloses a measure high strength terahertz device of time domain spectrum now, the device includes: the stretcher for be psec chirped pulse with ultrashort pulse broadening, the beam splitter for divide into direct impulse and reference pulse with chirped pulse, the ware is restrainted to first closing for with thz signals with the direct impulse closes to be restrainted, lightning sampling crystal for phase modulation, the optics delay timer, be used for with the reference pulse carries out the delayed time processing, the second closes restraints the ware, be used for with the direct impulse with the reference pulse closes to be restrainted to shu guang is closed in formation, lens, be used for with it focuses on the processing to close shu guang, the spectrum appearance for form interference fringe, and acquire the signal data among the interference fringe, the treater obtains thz signals's time domain spectrum. The utility model discloses time domain spectrum linearity degree is high now for the terahertz of measuring, and high strength thz signals takes place the distortion in the solution measurement process, and the modulation excessively results in correctly reflecting the problem of thz signals wave form.

Description

A kind of device measuring high strength terahertz time-domain spectroscopy
Technical field
The utility model embodiment relates to Terahertz detection technique, particularly relates to a kind of device measuring high strength terahertz time-domain spectroscopy.
Background technology
Terahertz (THz) is between the frequency range of macroelectronics to the transition of microcosmic photonics, and frequency is between 0.1THz to 10THz.Particular frequency bands residing for Terahertz determines its special character, and it is not only suitable for biomedical imaging and detection imaging, and be space movement target Zhen Cha ﹑ Shi Bie ﹑ Zhi Mang ﹑ resist the powerful that poison is collected in radio communication and anti-terrorism.In the past few years, Terahertz application has penetrated into the fields such as physics, sensing, communication, life science.
The application of Terahertz be unable to do without Terahertz detection technique, and photoconduction sampling and electro optic sampling are two kinds of conventional Terahertz detection techniques.Direct impulse energy needed for electro optic sampling is low, so have higher parallel measurement ability.Simultaneously for Terahertz, electro optic sampling has higher sensitivity and detective bandwidth.
Traditional electro optic sampling is based on utilizing electrooptical effect to change detection polarization state, the intensity of the detection light converted with terahertz signal is detected to react the intensity of terahertz signal after analyzer, this method is applicable to the detection of low intensive terahertz signal, but for the terahertz signal of high strength, in measuring process, terahertz signal can distort, even there is excessively modulation, thus cannot the waveform of correct response terahertz signal.
Utility model content
The utility model provides a kind of device measuring high strength terahertz time-domain spectroscopy, to realize the terahertz signal measuring high strength, and the terahertz time-domain spectroscopy linearity measured is high, solve high strength terahertz signal in measuring process to distort, modulate that excessively cause cannot the problem of correct response terahertz signal waveform.
The utility model embodiment provides a kind of device measuring high strength terahertz time-domain spectroscopy, comprising:
Stretcher, for being Picosecond Chirped Pulse by ultra-short pulse-width expansion, and determines the pulsed frequency of described Picosecond Chirped Pulse and the mapping relations of time according to stretcher characteristic;
Beam splitter, for being divided into direct impulse and reference pulse by chirped pulse;
First bundling device, for carrying out conjunction bundle by terahertz signal and described direct impulse;
Electro optic sampling crystal, for being loaded in described direct impulse by the terahertz signal closing bundle, carries out phase-modulation;
Retarder, for adjusting the time time delays between described reference pulse and direct impulse;
Second bundling device, for described direct impulse and described reference pulse being carried out conjunction bundle, closes Shu Guang to be formed;
Lens, for carrying out focusing process by described conjunction Shu Guang;
Spectrometer, for the described conjunction Shu Guang after collectiong focusing process, to form interference fringe, and obtains the signal data in interference fringe, and wherein, described signal data is interference fringe data when having terahertz signal;
Processor, for determining the phase differential between reference data and described signal data, wherein, described reference data is interference fringe data when not having terahertz signal; And for according to the phase place of described phase differential, described terahertz signal and the frequency of electric field intensity relation and described chirped pulse and the mapping relations of time, obtain the time-domain spectroscopy of described terahertz signal.
The utility model embodiment provides a kind of device measuring high strength terahertz time-domain spectroscopy, and ultra-short pulse-width expansion is chirped pulse by stretcher by this device, by optical splitter, chirped pulse is divided into probing pulse and reference pulse, the phase-modulation of terahertz signal to direct impulse is realized by electro optic sampling crystal, the delay process between reference pulse and direct impulse is realized by retarder, respectively the reference pulse of the direct impulse after phase-modulation and delay process is closed bundle by the second bundling device and lens, after focusing on process, interference fringe is formed by spectrometer, obtain the signal data of interference fringe, by processor to signal data and the reference data that obtains in advance, obtain the time-domain spectroscopy of terahertz signal, the terahertz signal measuring high strength can be realized, and the terahertz time-domain spectroscopy linearity measured is high, solve high strength terahertz signal in measuring process to distort, modulation excessively causes cannot the problem of correct response terahertz signal waveform.
Accompanying drawing explanation
A kind of apparatus structure schematic diagram measuring high strength terahertz time-domain spectroscopy that Fig. 1 provides for the present embodiment one;
Fig. 2 is the apparatus structure schematic diagram of another measurement high strength terahertz time-domain spectroscopy that the present embodiment one provides;
Fig. 3 is the light path contrast figure of the device of another measurement high strength terahertz time-domain spectroscopy that the present embodiment one provides;
Fig. 4 is a kind of process flow diagram measuring the method for high strength terahertz time-domain spectroscopy performed by the present embodiment.
Embodiment
Below in conjunction with drawings and Examples, the utility model is described in further detail.Be understandable that, specific embodiment described herein only for explaining the utility model, but not to restriction of the present utility model.It also should be noted that, for convenience of description, illustrate only the part relevant to the utility model in accompanying drawing but not entire infrastructure.
Embodiment one
A kind of apparatus structure schematic diagram measuring high strength terahertz time-domain spectroscopy that Fig. 1 provides for the present embodiment one; Wherein, thin dotted line arrow is reference pulse, solid arrows direct impulse, heavy solid line arrows is that direct impulse and reference pulse close the conjunction Shu Guang restrainting and formed afterwards, double-head arrow with arrow tail is chirped pulse, and arrow frame is femtosecond ultrashort pulse, is terahertz signal without arrow tail double-head arrow.This device comprises: stretcher 190, beam splitter 110, first bundling device 120, electro optic sampling crystal 130, retarder 140, second bundling device 150, lens 160, spectrometer 170 and processor 180.
Wherein, stretcher 190, for being Picosecond Chirped Pulse by ultra-short pulse-width expansion, and determines the pulsed frequency of described Picosecond Chirped Pulse and the mapping relations of time according to stretcher characteristic.
Beam splitter 110, for being divided into direct impulse and reference pulse by chirped pulse.
First bundling device 120, for carrying out conjunction bundle by terahertz signal and described direct impulse; Wherein, terahertz signal is the terahertz signal of high strength, and the first bundling device 120 is chosen as silicon chip.
Electro optic sampling crystal 130, for being loaded in described direct impulse by the terahertz signal closing bundle, carries out phase-modulation; Concrete, by electro optic sampling crystal 130, terahertz signal is loaded in direct impulse with phase delay, the phase delay that the polarization of adjustment direct impulse or electric rotating Optical Sampling crystal make terahertz signal introduce can not make the polarization of direct impulse change, in the present embodiment, electro optic sampling crystal 130 is chosen as ZnTe<110> electro-optic crystal.
Retarder 140, for setting the delay time process between described reference pulse and direct impulse.
Concrete, retarder 140, by the delay time between the described reference pulse of setting and direct impulse, the interference fringe formed carry out closing bundle to make described direct impulse and described reference pulse after is satisfied to impose a condition, spacing as the striped of the interference of formation can not be overstocked or excessively sparse, so that carry out the identification of phase differential, thus accurately can obtain the data of interference fringe.
Second bundling device 150, for described direct impulse and described reference pulse being carried out conjunction bundle, closes Shu Guang to be formed.
Lens 160, for carrying out focusing process by described conjunction Shu Guang.
Spectrometer 170, for the described conjunction Shu Guang after collectiong focusing process, to form interference fringe, and obtains the signal data in interference fringe, and wherein, described signal data is interference fringe data when having terahertz signal.
Processor 180, for determining the phase differential between reference data and described signal data, wherein, described reference data is interference fringe data when not having terahertz signal; And processor 180 is for according to the phase place of described phase differential, described terahertz signal and the frequency of electric field intensity relation and described chirped pulse and the mapping relations of time, obtains the time-domain spectroscopy of described terahertz signal.
The said apparatus course of work is as follows: ultra-short pulse-width expansion is Picosecond Chirped Pulse by stretcher 190, and determines the pulsed frequency of described Picosecond Chirped Pulse and the mapping relations of time according to stretcher characteristic; Chirped pulse is divided into two bundles by beam splitter 110, direct impulse and reference pulse; First direct impulse and terahertz signal close after bundle through the first bundling device 120, by electro optic sampling crystal 130, carry out phase-modulation; Reference pulse is through retarder 140 suitable time-delay; Then, direct impulse and reference pulse close Shu Jinhang through the second bundling device 150 and close bundle, through focusing on process, being input to spectrometer 170, forming interference fringe, obtain the signal data of interference fringe; Last processor 180 processes according to the reference data prestored and signal data, obtain the time-domain spectroscopy of terahertz signal, wherein, reference data is interference fringe data when not having terahertz signal, according to the phase place of the phase differential between reference data and signal data, terahertz signal and the frequency of electric field intensity relation and chirped pulse and the mapping relations of time, obtain the time-domain spectroscopy of described terahertz signal.
On the basis of above-described embodiment, as shown in Figures 2 and 3, in figure, thin dotted line arrow is reference pulse, solid arrows direct impulse, heavy solid line arrows is that direct impulse and reference pulse close the conjunction Shu Guang restrainting and formed afterwards, and the double-head arrow of band arrow tail is chirped pulse, arrow frame is femtosecond ultrashort pulse, is terahertz signal without arrow tail double-head arrow; Described device also comprises: the first paraboloidal mirror 200 and the second paraboloidal mirror 210.
Wherein the first paraboloidal mirror 200, for carrying out focusing process by the terahertz signal and described direct impulse that close bundle; Second paraboloidal mirror 210, for carrying out collimation process by the described direct impulse after modulation.
On the basis of above-described embodiment, as shown in Figures 2 and 3, described device also comprises: catoptron 220, for direct impulse being reflected, introduces the first bundling device 120 with direct impulse.
On the basis of the above embodiments, as shown in Figure 2, processor 180 comprises:
Phase differential determination module 1801, specifically for determining the phase differential between described reference data and described signal data according to following formula:
I ( &omega; ) = I r e f ( &omega; ) + I p r o ( &omega; ) + 2 &beta; I p r o ( &omega; ) I r e f ( &omega; ) c o s &lsqb; &omega; &tau; + &phi; N L ( &omega; ) + &phi; T H z ( &omega; ) &rsqb;
Wherein, ω is pulsed frequency, the spectrum being loaded with terahertz signal interference fringe that I (ω) records for spectrometer, I ref(ω) spectrum of the described reference pulse recorded for spectrometer, I pro(ω) spectrum of the described direct impulse recorded for spectrometer, β is intetference-fit strengthening (contrast between bright fringes and dark fringe brightness), and τ is the setting delay time between direct impulse and reference pulse, φ nL(ω) be described electro optic sampling crystal introduce nonlinear phase, φ tHz(ω) be the phase place that terahertz signal introduces described direct impulse.
Time-domain spectroscopy determining unit 1802, for according to the phase place of described phase differential, described terahertz signal and the frequency of electric field intensity relation and described chirped pulse and the mapping relations of time, obtains the time-domain spectroscopy of described terahertz signal.
Concrete, before measurement terahertz signal, measure one group of spectral interference striped (reference data) in advance, and store, now the phase place of interference fringe contains: the phase place ω τ that the mistiming between reference light and detection light introduces and the nonlinear phase φ that ZnTe electro optic sampling crystal is introduced nL(ω).When there being terahertz signal, the phase place of interference fringe is except ω τ and φ nL(ω), outside, the phase that terahertz signal is introduced also is comprised tHz(ω).Having terahertz signal and subtracting each other without the interference fringe phase place of terahertz signal, obtain the phase that terahertz signal is introduced tHz(ω) (phase differential between reference data and signal data), and φ tHz(ω) with Terahertz electric field strength E tHzbe directly proportional, the mapping corresponding relation that the last frequency (wavelength) according to being determined by stretcher and time are determined, obtains E tHz-ttime-domain spectroscopy data.
The present embodiment one provides a kind of device measuring high strength terahertz time-domain spectroscopy, and ultra-short pulse-width expansion is chirped pulse by stretcher by this device, by optical splitter, chirped pulse is divided into probing pulse and reference pulse, the phase-modulation of terahertz signal to direct impulse is realized by electro optic sampling crystal, the delay time between described reference pulse and direct impulse is set by retarder, respectively the reference pulse of the direct impulse after phase-modulation and delay process is closed bundle by the second bundling device and lens, after focusing on process, interference fringe is formed by spectrometer, obtain the signal data of interference fringe, by processor to signal data and the reference data that prestores, obtain the time-domain spectroscopy of terahertz signal, the utility model embodiment can realize the terahertz signal measuring high strength, and the terahertz time-domain spectroscopy linearity measured is high, solve high strength terahertz signal in measuring process to distort, modulation excessively causes cannot the problem of correct response terahertz signal waveform.
The device that the present embodiment provides can perform a kind of method measuring high strength terahertz time-domain spectroscopy, it should be mentioned that some exemplary embodiments are described as the process or method described as process flow diagram before in further detail exemplary embodiment being discussed.Although operations (or step) is described as the process of order by process flow diagram, many operations wherein can be implemented concurrently, concomitantly or simultaneously.
Fig. 4 is a kind of process flow diagram measuring the method for high strength terahertz time-domain spectroscopy performed by the present embodiment, as shown in the figure, comprising:
S100: femtosecond ultra-short pulse-width expansion is become Picosecond Chirped Pulse, and determine the pulsed frequency of described Picosecond Chirped Pulse and the mapping relations of time according to stretcher characteristic.
S101: utilized by chirped pulse beam splitter to be divided into direct impulse and reference pulse.
S102: by electro optic sampling technology, terahertz signal is loaded in described direct impulse, carries out phase-modulation.
S103: described reference pulse is carried out the delay process setting delay time.
S104: described direct impulse and described reference pulse are carried out conjunction bundle, closes Shu Guang to be formed.
S105: described conjunction Shu Guang is carried out focusing process.
S106: will focus on the conjunction bundle light input spectrum instrument after process, to obtain the signal data in interference fringe, wherein, described signal data is interference fringe data when having terahertz signal.
S107: determine the phase differential between reference data and described signal data, wherein, described reference data is interference fringe data when not having terahertz signal.
S108: according to the phase place of described phase differential, described terahertz signal and the frequency of electric field intensity relation and described chirped pulse and the mapping relations of time, obtain the time-domain spectroscopy of described terahertz signal.
The device of the measurement high strength terahertz time-domain spectroscopy that this technical scheme is provided by above-described embodiment, the terahertz signal measuring high strength can be realized, and the terahertz time-domain spectroscopy linearity measured is high, solve high strength terahertz signal in measuring process to distort, modulate that excessively cause cannot the problem of correct response terahertz signal waveform.
On the basis of technique scheme, S103: described reference pulse is carried out the delay process setting delay time, comprising:
Described reference pulse is carried out the delay process setting delay time, meet with the cycle making described direct impulse and described reference pulse carry out the rear interference fringe formed of conjunction bundle and impose a condition.
On the basis of technique scheme, S107: determine the phase differential between described reference data and described signal data, comprising:
The phase differential between described reference data and described signal data is determined according to following formula:
I ( &omega; ) = I r e f ( &omega; ) + I p r o ( &omega; ) + 2 &beta; I p r o ( &omega; ) I r e f ( &omega; ) c o s &lsqb; &omega; &tau; + &phi; N L ( &omega; ) + &phi; T H z ( &omega; ) &rsqb;
Wherein, ω is pulsed frequency, the spectrum being loaded with terahertz signal interference fringe that I (ω) records for spectrometer, I ref(ω) spectrum of the described reference pulse recorded for spectrometer, I pro(ω) spectrum of the described direct impulse recorded for spectrometer, β is intetference-fit strengthening, and τ is the setting delay time between direct impulse and reference pulse, φ nL(ω) be described electro optic sampling crystal introduce nonlinear phase, φ tHz(ω) be the phase place that terahertz signal introduces described direct impulse.
Femtosecond ultra-short pulse-width expansion can be become Picosecond Chirped Pulse by this technical scheme, the pulsed frequency of described Picosecond Chirped Pulse and the mapping relations of time are determined according to stretcher characteristic, and according to stating phase differential, the phase place of described terahertz signal and electric field intensity relation, and the frequency of described chirped pulse and the mapping relations of time, obtain the time-domain spectroscopy of described terahertz signal, the terahertz signal measuring high strength can be realized, and the terahertz time-domain spectroscopy linearity measured is high, solve high strength terahertz signal in measuring process to distort, modulation excessively causes cannot the problem of correct response terahertz signal waveform.
Note, above are only preferred embodiment of the present utility model and institute's application technology principle.Skilled person in the art will appreciate that the utility model is not limited to specific embodiment described here, various obvious change can be carried out for a person skilled in the art, readjust and substitute and protection domain of the present utility model can not be departed from.Therefore, although be described in further detail the utility model by above embodiment, but the utility model is not limited only to above embodiment, when not departing from the utility model design, can also comprise other Equivalent embodiments more, and scope of the present utility model is determined by appended right.

Claims (3)

1. measure a device for high strength terahertz time-domain spectroscopy, it is characterized in that, comprising:
Stretcher, for being Picosecond Chirped Pulse by ultra-short pulse-width expansion; And determine the pulsed frequency of described Picosecond Chirped Pulse and the mapping relations of time according to stretcher characteristic;
Beam splitter, for being divided into direct impulse and reference pulse by chirped pulse;
First bundling device, for carrying out conjunction bundle by terahertz signal and described direct impulse;
Electro optic sampling crystal, for being loaded in described direct impulse by the terahertz signal closing bundle, carries out phase-modulation;
Retarder, for adjusting the relative time delay time of described reference pulse and direct impulse;
Second bundling device, for described direct impulse and described reference pulse being carried out conjunction bundle, closes Shu Guang to be formed;
Lens, for carrying out focusing process by described conjunction Shu Guang;
Spectrometer, for the described conjunction Shu Guang after collectiong focusing process, to form interference fringe, and obtains the signal data in interference fringe, and wherein, described signal data is interference fringe data when having terahertz signal;
Processor, for determining the phase differential between reference data and described signal data, wherein, described reference data is interference fringe data when not having terahertz signal; And for according to the phase place of described phase differential, described terahertz signal and the frequency of electric field intensity relation and described chirped pulse and the mapping relations of time, obtain the time-domain spectroscopy of described terahertz signal.
2. device according to claim 1, is characterized in that, also comprises:
First paraboloidal mirror, for carrying out focusing process by the terahertz signal and described direct impulse that close bundle;
Second paraboloidal mirror, for carrying out collimation process by the described direct impulse after modulation.
3. device according to claim 1, is characterized in that, described processor comprises:
Phase differential determination module, specifically for determining the phase differential between described reference data and described signal data according to following formula:
Wherein, ω is pulsed frequency, the spectrum being loaded with terahertz signal interference fringe that I (ω) records for spectrometer, I ref(ω) spectrum of the described reference pulse recorded for spectrometer, I pro(ω) spectrum of the described direct impulse recorded for spectrometer, β is intetference-fit strengthening, and τ is the setting delay time between direct impulse and reference pulse, φ nL(ω) be described electro optic sampling crystal introduce nonlinear phase, φ tHz(ω) be the phase place that terahertz signal introduces described direct impulse.
CN201520383540.2U 2015-06-04 2015-06-04 Measure high strength terahertz device of time domain spectrum now Expired - Fee Related CN204807200U (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104913847A (en) * 2015-06-04 2015-09-16 深圳大学 Device and method for measuring high-intensity terahertz time-domain spectroscopy
CN111817786A (en) * 2020-06-19 2020-10-23 上海师范大学 Transient energy chirp reconstruction method for electron beam

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104913847A (en) * 2015-06-04 2015-09-16 深圳大学 Device and method for measuring high-intensity terahertz time-domain spectroscopy
CN111817786A (en) * 2020-06-19 2020-10-23 上海师范大学 Transient energy chirp reconstruction method for electron beam

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