CN204613356U - A kind of transistor test device - Google Patents
A kind of transistor test device Download PDFInfo
- Publication number
- CN204613356U CN204613356U CN201520357902.0U CN201520357902U CN204613356U CN 204613356 U CN204613356 U CN 204613356U CN 201520357902 U CN201520357902 U CN 201520357902U CN 204613356 U CN204613356 U CN 204613356U
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- China
- Prior art keywords
- transistor
- golden finger
- suction nozzle
- test device
- driving mechanism
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- Expired - Fee Related
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Abstract
The utility model relates to a kind of transistor test device, described transistor test device comprise device pedestal, test board, transistor testing circuit board, for draw transistor suction nozzle, for driving the driving mechanism of suction nozzle horizontal motion and movement in vertical direction; Described test board, for driving suction nozzle horizontal motion to be all fixedly connected with device pedestal with the driving mechanism of movement in vertical direction; Described transistor testing circuit board is fixed on test board; Described transistor testing circuit board comprises golden finger assembly, and described golden finger assembly comprises fixed head and golden finger; Described fixed head is fixedly connected with golden finger; Described golden finger is at least 2.Transistor test device of the present utility model, has the advantages such as test is accurate, serviceable life is high.
Description
Technical field
The utility model belongs to checkout equipment field, is specifically related to a kind of transistor test device.
Background technology
Transistor is a kind of microelectronic device or parts, modern computing, exchanges, and manufactures and traffic system, comprises internet, all depend on the existence of transistor.Therefore, the quality management and control for transistor seems particularly important.Existing transistor testing equipment, be provided with some golden fingers above, golden finger wherein each are all independent settings, golden finger is made to locate so accurate not, make testing efficiency not high, simultaneously product needs to turn to adjustment through complexity before testing, and the easy like this suction nozzle that makes produces wearing and tearing, reduces the serviceable life of checkout equipment; In addition, it is too complicated that being arranged so that of this structure changes the program of golden finger, and golden finger also only can use by pros and cons, and service efficiency is not high.
Utility model content
In order to overcome the deficiencies in the prior art, the purpose of this utility model is the transistor test device providing a kind of accurate positioning, long service life.
For solving the problem, the technical scheme that the utility model adopts is as follows:
A kind of transistor test device, described transistor test device comprise device pedestal, test board, transistor testing circuit board, for draw transistor suction nozzle, for driving the driving mechanism of suction nozzle horizontal motion and movement in vertical direction; Described test board, for driving suction nozzle horizontal motion to be all fixedly connected with device pedestal with the driving mechanism of movement in vertical direction; Described transistor testing circuit board is fixed on test board; Described transistor testing circuit board comprises golden finger assembly, and described golden finger assembly comprises fixed head and golden finger; Described fixed head is fixedly connected with golden finger; Described golden finger is at least 2.
The transistor test device method of operation of the present utility model is as follows: the suction nozzle for drawing transistor is subject to the driving of the driving mechanism driving suction nozzle horizontal motion and movement in vertical direction, first move laterally to the top of test transistor, then move down and transistor is adsorbed on suction nozzle; Then moving up, then at transistor testing circuit board transistor being transferred to test board, then transistor is being transported on golden finger assembly, unclamps suction nozzle, starting and complete the detection of transistor; After having tested, transistor siphons away by suction nozzle again, then repeats above-mentioned action, completes the detection of next transistor.Golden finger assembly in the utility model, golden finger is fixed on fixed head, make dismounting more convenient like this, and the location of golden finger is more accurate, measuring accuracy is higher, suction nozzle does not need through numerous and diverse like that the turning to of conventional detection devices, reduces suction nozzle and for driving the wearing and tearing of the driving mechanism of suction nozzle horizontal motion and movement in vertical direction, improves the serviceable life of whole device; In addition, adopt the golden finger that said structure is arranged, pros and cons, face, left and right all can use, and improve service efficiency.
In the utility model, preferred scheme is described for driving the driving mechanism of suction nozzle horizontal motion and movement in vertical direction to comprise for driving the first driving mechanism of suction nozzle horizontal motion, for driving the second driving mechanism of suction nozzle movement in vertical direction.
In the utility model, preferred scheme is that described first driving mechanism comprises the first motor, the first screw mandrel, and described first motor and the first screw mandrel are electrically connected, and described first screw mandrel and suction nozzle are spirally connected.
In the utility model, preferred scheme is that described second driving mechanism comprises the second motor, the second screw mandrel, and described second motor and the second screw mandrel are electrically connected, and described second screw mandrel and the first driving mechanism are spirally connected.
In the utility model, preferred scheme is that described second driving mechanism comprises the second motor, the second screw mandrel, and described second motor and the second screw mandrel are electrically connected, and described second screw mandrel and suction nozzle are spirally connected.
In the utility model, preferred scheme is the side that described golden finger is all fixed on fixed head.
In the utility model, preferred scheme is described golden finger is 6.
In the utility model, preferred scheme is described golden finger assembly is 2, and described 2 golden finger assemblies distribute axisymmetricly.
In the utility model, preferred scheme is that described transistor testing circuit board is fixedly connected with test board by dismountable mode.
In the utility model, preferred scheme is that described golden finger assembly is fixed on transistor testing circuit board by dismountable mode.
Compared to existing technology, the beneficial effects of the utility model are: adopt transistor test device of the present utility model, it is more accurate that golden finger assembly wherein can make golden finger locate, improve the precision of test, reduce suction nozzle and for driving the wearing and tearing of the driving mechanism of suction nozzle horizontal motion and movement in vertical direction, improve the serviceable life of whole device; Meanwhile, its dismounting is more convenient, and the golden finger adopting said structure to arrange, pros and cons, face, left and right all can use, and improve service efficiency.
Below in conjunction with the drawings and specific embodiments, the utility model is described in further detail.
Accompanying drawing explanation
The utility model embodiment is illustrated further below in conjunction with accompanying drawing.
Fig. 1 is the transistor test device structural representation of embodiment 1;
Fig. 2 is the golden finger modular construction schematic diagram of the transistor test device of embodiment 1;
Wherein, 1, device pedestal; 2, test board; 3, transistor testing circuit board; 30, golden finger assembly; 310, golden finger; 320, fixed head; 321, through hole; 4, for drawing the suction nozzle of transistor; 5, for driving the driving mechanism of suction nozzle horizontal motion and movement in vertical direction; 6, transistor.
Embodiment
Embodiment 1
A kind of transistor test device, described transistor 6 proving installation comprise device pedestal 1, test board 2, transistor testing circuit board 3, for draw transistor suction nozzle 4, for driving the driving mechanism 5 of suction nozzle horizontal motion and movement in vertical direction; Described test board, for driving suction nozzle horizontal motion to be all fixedly connected with device pedestal with the driving mechanism of movement in vertical direction; Described transistor testing circuit board is fixed on test board; Described transistor testing circuit board comprises golden finger assembly 30, and described golden finger assembly comprises fixed head 320 and golden finger 310; Described fixed head is fixedly connected with golden finger, and described fixed head is provided with 2 through holes 321, and golden finger assembly is fixed on transistor testing circuit board through the through hole on fixed head by screw; Described golden finger is at least 6, and described 6 golden fingers are all fixed on the side of fixed head; Described golden finger assembly is 2, and described 2 golden finger assemblies distribute axisymmetricly.
Embodiment 2
A kind of transistor test device, it is described that for driving, the driving mechanism of suction nozzle horizontal motion and movement in vertical direction comprises for driving the first driving mechanism of suction nozzle horizontal motion, for driving the second driving mechanism of suction nozzle movement in vertical direction, all the other structures, parameter are identical with embodiment 1.
Embodiment 3
A kind of transistor test device, described first driving mechanism comprises the first motor, the first screw mandrel, and described first motor and the first screw mandrel are electrically connected, and described first screw mandrel and suction nozzle are spirally connected; Described second driving mechanism comprises the second motor, the second screw mandrel, and described second motor and the second screw mandrel are electrically connected, and described second screw mandrel and the first driving mechanism are spirally connected, and all the other structures, parameter are identical with embodiment 2.
Embodiment 4
A kind of transistor test device, described first driving mechanism comprises the first motor, the first screw mandrel, and described first motor and the first screw mandrel are electrically connected, and described first screw mandrel and suction nozzle are spirally connected; Described second driving mechanism comprises the second motor, the second screw mandrel, and described second motor and the second screw mandrel are electrically connected, and described second screw mandrel and suction nozzle are spirally connected, and all the other structures, parameter are identical with embodiment 2.
Above-mentioned embodiment is only preferred implementation of the present utility model; can not limit the scope of the utility model protection with this, change and the replacement of any unsubstantiality that those skilled in the art does on basis of the present utility model all belong to the utility model scope required for protection.
Claims (10)
1. a transistor test device, is characterized in that: described transistor test device comprise device pedestal, test board, transistor testing circuit board, for draw transistor suction nozzle, for driving the driving mechanism of suction nozzle horizontal motion and movement in vertical direction;
Described test board, for driving suction nozzle horizontal motion to be all fixedly connected with device pedestal with the driving mechanism of movement in vertical direction;
Described transistor testing circuit board is fixed on test board; Described transistor testing circuit board comprises golden finger assembly, and described golden finger assembly comprises fixed head and golden finger; Described fixed head is fixedly connected with golden finger; Described golden finger is at least 2.
2. transistor test device according to claim 1, is characterized in that: described for driving the driving mechanism of suction nozzle horizontal motion and movement in vertical direction to comprise for driving the first driving mechanism of suction nozzle horizontal motion, for driving the second driving mechanism of suction nozzle movement in vertical direction.
3. transistor test device according to claim 2, is characterized in that: described first driving mechanism comprises the first motor, the first screw mandrel, and described first motor and the first screw mandrel are electrically connected, and described first screw mandrel and suction nozzle are spirally connected.
4. transistor test device according to claim 2, is characterized in that: described second driving mechanism comprises the second motor, the second screw mandrel, and described second motor and the second screw mandrel are electrically connected, and described second screw mandrel and the first driving mechanism are spirally connected.
5. transistor test device according to claim 2, is characterized in that: described second driving mechanism comprises the second motor, the second screw mandrel, and described second motor and the second screw mandrel are electrically connected, and described second screw mandrel and suction nozzle are spirally connected.
6. transistor test device according to claim 1, is characterized in that: described golden finger is all fixed on the side of fixed head.
7. transistor test device according to claim 1, is characterized in that: described golden finger is 6.
8. transistor test device according to claim 1, is characterized in that: described golden finger assembly is 2, and described 2 golden finger assemblies distribute axisymmetricly.
9. transistor test device according to claim 1, is characterized in that: described transistor testing circuit board is fixedly connected with test board by dismountable mode.
10. transistor test device according to claim 9, is characterized in that: described golden finger assembly is fixed on transistor testing circuit board by dismountable mode.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520357902.0U CN204613356U (en) | 2015-05-28 | 2015-05-28 | A kind of transistor test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520357902.0U CN204613356U (en) | 2015-05-28 | 2015-05-28 | A kind of transistor test device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN204613356U true CN204613356U (en) | 2015-09-02 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201520357902.0U Expired - Fee Related CN204613356U (en) | 2015-05-28 | 2015-05-28 | A kind of transistor test device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN204613356U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105469982A (en) * | 2016-01-12 | 2016-04-06 | 秦皇岛视听机械研究所 | Slight adjustment test seat device for naked core of universal single-layer capacitor |
-
2015
- 2015-05-28 CN CN201520357902.0U patent/CN204613356U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105469982A (en) * | 2016-01-12 | 2016-04-06 | 秦皇岛视听机械研究所 | Slight adjustment test seat device for naked core of universal single-layer capacitor |
| CN105469982B (en) * | 2016-01-12 | 2017-10-13 | 秦皇岛视听机械研究所 | Universal single-layer capacitor naked core grain fine setting test base device |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20150902 Termination date: 20180528 |
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| CF01 | Termination of patent right due to non-payment of annual fee |