CN204479694U - A kind of general ultrasonic probe proving installation - Google Patents
A kind of general ultrasonic probe proving installation Download PDFInfo
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- CN204479694U CN204479694U CN201520133112.4U CN201520133112U CN204479694U CN 204479694 U CN204479694 U CN 204479694U CN 201520133112 U CN201520133112 U CN 201520133112U CN 204479694 U CN204479694 U CN 204479694U
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Abstract
The utility model provides a kind of general ultrasonic probe proving installation, and ultrasonic probe is by a standard interface transmitted test signal, and described standard interface comprises several pins to be measured.Ultrasonic probe proving installation comprises: microprocessor, testing apparatus, test interface and some test accesss; Described microprocessor is in conducting state or off-state for controlling described test access; Described testing apparatus is connected with some described test accesss respectively by described test interface, and described testing apparatus obtains the test data of the described test access of conducting state by described test interface, test access described in every bar comprises pin to be measured described in.The utility model highly versatile, can be applicable to the ultrasonic probe of the distinct interface line sequence of all use identical standard interfaces, both energy random defining interface line sequence as manual testing, remains again proving installation test speed fast, tests advantage accurately.Greatly can reduce the cost of ultrasonic probe test development, shorten the cycle of ultrasonic probe test development.
Description
Technical field
The utility model relates to the field tests of ultrasonic probe, particularly, relates to a kind of general ultrasonic probe proving installation.
Background technology
B ultrasonic system is the equipment diagnosed the illness by ultrasound wave, and Ultrasonic-B probe is device electric signal and acoustical signal can changed mutually, is the critical component of B ultrasonic system imaging.Ultrasonic probe is connected with B ultrasonic system by the interface of standard.But every B ultrasonic system manufacturers interface line sequence definition to ultrasonic probe is different.For the producer of professional production probe, Ke Huduo, the many meetings of interface line sequence cause very large trouble.All the time, the method for testing of ultrasonic probe generally has two kinds: one adopts manually, and the line sequence of docking port is touched one by one and tested.The method inefficiency, also easily there is mistake in labor intensive; Another is the method for testing of proving installation, is exactly for fixing interface line sequence, makes corresponding proving installation and comes automatically to test.Adopt each device of method of testing of proving installation can only a corresponding interface line sequence, for the multiple interfaces line sequence of multiple client, need proving installations different in a large number.Not only cost of manufacture is high for the method for testing of proving installation, and fabrication cycle is long, and corresponding device management also has very large workload.All the time, the proving installation of ultrasonic probe is all the probe for specified interface line sequence.The probe test of a general various interface line sequence of device cannot be accomplished.
Utility model content
For defect of the prior art, the purpose of this utility model is to provide a kind of general ultrasonic probe proving installation.
According to a kind of general ultrasonic probe proving installation that the utility model provides, it is characterized in that, comprising: microprocessor, testing apparatus, test interface and some test accesss;
Described microprocessor is in conducting state or off-state for controlling described test access;
Described testing apparatus is connected with some described test accesss respectively by described test interface, and described testing apparatus obtains the test data of the described test access of conducting state by described test interface, test access described in every bar comprises pin to be measured described in.
As a kind of prioritization scheme, test access described in every bar comprises the relay and described pin to be measured that are connected successively, and described test interface is connected with described relay respectively;
Described microprocessor is connected with the control port of described relay respectively;
Described relay is used for:
Respond the test access conducting that described Microprocessor S3C44B0X makes this relay place, described test interface is communicated with the pin to be measured in this test access,
Or respond described Microprocessor S3C44B0X the test access at this relay place is disconnected, the pin to be measured in described test interface and this test access disconnects;
Described microprocessor is used for automatically controlling the "on" position of described relay or off-position.
As a kind of prioritization scheme, described microprocessor controls the energising of relay and power-off automatically according to described default test sequence.
As a kind of prioritization scheme, also comprise a computing machine, described computing machine is connected with described testing apparatus with described microprocessor respectively; Described computing machine is used for response external input and arranges self-defining test sequence, and this self-defining test sequence is sent to described microprocessor;
Described microprocessor is used for being energized or off-position control to the relay in each test access according to the described test sequence received from described computing machine.
As a kind of prioritization scheme, described relay makes the test access conducting at this relay place in the energized state; Described relay makes the test access at this relay place disconnect in the power-off state.
As a kind of prioritization scheme, described relay makes the test access at this relay place disconnect in the energized state; Described relay makes the test access conducting at this relay place in the power-off state.
As a kind of prioritization scheme, described ultrasonic probe is Ultrasonic-B probe.
Compared with prior art, the utility model has following beneficial effect:
A kind of general ultrasonic probe proving installation that the utility model provides, each passage of standard interface is connected a switch/relay, control multiple switch/relay by microprocessor, reach the sequential control of every bar passage, meet various different interface line sequence.The utility model highly versatile, can be applicable to the ultrasonic probe of the distinct interface line sequence of all use identical standard interfaces, both energy random defining interface line sequence as manual testing, remains again proving installation test speed fast, tests advantage accurately.Greatly can reduce the cost of ultrasonic probe test development, shorten the cycle of ultrasonic probe test development.
Accompanying drawing explanation
In order to be illustrated more clearly in the technical scheme of the utility model embodiment, below the accompanying drawing used required in describing embodiment is briefly described, obviously, accompanying drawing in the following describes is only embodiments more of the present utility model, for those skilled in the art, under the prerequisite not paying creative work, other accompanying drawing can also be obtained according to these accompanying drawings.In accompanying drawing:
Fig. 1 is a kind of Ultrasonic-B probe proving installation schematic diagram of embodiment;
Fig. 2 is a kind of Ultrasonic-B probe proving installation schematic diagram with computing machine of embodiment.
Embodiment
Hereafter in the mode of specific embodiment, the utility model is described in detail by reference to the accompanying drawings.Following examples will contribute to those skilled in the art and understand the utility model further, but not limit the utility model in any form.It should be pointed out that the embodiment that can also use other, or the amendment on 26S Proteasome Structure and Function is carried out to the embodiment enumerated herein, and scope of the present utility model and essence can not be departed from.
The interface line sequence schematic diagram of the interface line sequence signal chart 2 another kind probe of one kind, table 1 probe
A ultrasonic probe is connected with ultrasonic Performance Test System by a standard interface, in test process before the dispatching from the factory of this ultrasonic probe, needs all pins of the interface line ordered pair standard interface according to this probe correspondence to test one by one.Table 1 and table 2 are two kinds of embodiments of the interface line sequence of probe.The pin sequence number of digitized representation interface line sequence in table 1 and table 2, be also sequencing during test, the difference of object line sequence causes testing sequence to there is great difference simultaneously.
In the embodiment of a kind of general ultrasonic probe proving installation provided at the utility model, ultrasonic probe is by a standard interface transmitted test signal, and described standard interface comprises several pins to be measured.Ultrasonic probe proving installation schematic diagram as shown in Figure 1, a kind of general ultrasonic probe proving installation comprises microprocessor, testing apparatus, test interface and some test accesss.Described microprocessor is in conducting state or off-state for controlling described test access.
Described testing apparatus is connected with some described test accesss respectively by described test interface, and described testing apparatus obtains the test data of the described test access of conducting state by described test interface, test access described in every bar comprises pin to be measured described in.
As a kind of embodiment, test access described in every bar comprises the relay and described pin to be measured that are connected successively, and described test interface is connected with described relay respectively.
Described microprocessor is connected with the control port of described relay respectively.
Described relay is used for:
Respond the test access conducting that described Microprocessor S3C44B0X makes this relay place, described test interface is communicated with the pin to be measured in this test access;
Or respond described Microprocessor S3C44B0X the test access at this relay place is disconnected, the pin to be measured in described test interface and this test access disconnects.
Described microprocessor is used for automatically controlling the "on" position of described relay or off-position.
When described relay is in "on" position, the test access conducting at this relay place, described test interface is communicated with the pin to be measured in this test access; When described relay is in off-position, the test access at this relay place disconnects, and the pin to be measured in described test interface and this test access disconnects.
Described microprocessor is used for automatically controlling the "on" position of described relay or off-position, realizes the control to each test access break-make thus respectively, and then obtains the test data of each pin successively.
As a kind of embodiment, can arrange multi-microprocessor, be at least provided with a kind of default test sequence in described microprocessor, described microprocessor controls the energising of relay and power-off automatically according to described default test sequence.
In described micro-process, preset the default test sequence of answering with ultrasonic probe interface line ordered pair to be measured, described microprocessor controls the energising of relay and power-off automatically according to described default test sequence, thus controls the opening and closing of test access.Described testing apparatus finally obtains a pin test data obtained according to described default test sequence, is also the standard interface test data of ultrasonic probe.In this embodiment, test sequence in microprocessor is pre-set, if be only provided with two kinds of test sequences of answering with the ordered pair of interface line shown in table 1 and table 2 in this microprocessor, then can only test the ultrasonic probe of interface line sequence shown in his-and-hers watches 1 and table 2, after technology upgrading, if ultrasonic probe line sequence changes, then need change microprocessor or reset microprocessor.Because when requiring the ultrasonic probe needing to test new interface line sequence, only need to change original microprocessor, have certain advantage than changing whole testing apparatus in prior art, this embodiment is with low cost, but there is the defects such as compatible limited equally.
As another kind of embodiment, as shown in Figure 2, described general ultrasonic probe proving installation also comprises a computing machine.Described computing machine is connected with testing apparatus with described microprocessor respectively.Described computing machine is used for response external input and arranges self-defining test sequence, and this self-defining test sequence is sent to described microprocessor; Described microprocessor is used for being energized or off-position control to the relay in each test access according to the described test sequence received from described computing machine.
The self-defining test sequence that user is corresponding according to the interface line sequence editor of standard interface to be tested on described computing machine, and this self-defining test sequence is sent to described microprocessor, described microprocessor is energized or off-position control to the relay in each test access with this self-defining test sequence, thus makes each test access open with the sequential of setting or close.
As a kind of embodiment, described relay makes the test access conducting at this relay place in the energized state; Described relay makes the test access at this relay place disconnect in the power-off state.
At a time, microprocessor described in one controls a relay J to "on" position according to built-in test sequence, other relay off-positions, the test access J conducting of this relay J place, other test accesss remain open state, and testing apparatus obtains the test data of the pin to be measured that this test access J comprises by test interface.The test data of all pins to be measured sends to described computing machine the most at last.Computing machine obtains the test result of ultrasonic probe according to the test data of all pins being received from testing apparatus.Whole process is the relay work that microprocessor controls according to the test sequence arranged to connect, and then makes test access conducting successively one by one.Described testing apparatus can obtain the test data of all pins to be measured successively according to interface line sequence, be equivalent to test man and test each pin to be measured one by one with probe, the final test data obtaining all pins to be measured.Whole test process instead of the step of manual testing in original test process, in ultrasonic probe dispatches from the factory test process, considerably reduce cost of labor, also accelerates testing process, has significant practicality.And the present embodiment is with the self-defining test sequence of computer installation, can compatible distinct interface line sequence probe test, for the pullover test of multiple interfaces line sequence provides a great convenience.
As another kind of embodiment, described relay makes the test access at this relay place disconnect in the energized state; Described relay makes the test access conducting at this relay place in the power-off state.
In some moment, described microprocessor controls a relay Q according to built-in test sequence and is in off-position, and other relays are in "on" position.Only cause that this is in the test access Q conducting at the relay place of off-position thus, other test accesss remain open state, and testing apparatus obtains the test data of the pin that this test access Q comprises by test interface.
As a kind of embodiment, this ultrasonic probe can be Ultrasonic-B probe, as depicted in figs. 1 and 2.
Key point of the present utility model is: by designing a general ultrasonic probe proving installation, the probe of the distinct interface line sequence of all use identical standard interfaces can be applicable to, both energy random defining interface line sequence as manual testing, remain again proving installation test speed fast, test advantage accurately.Greatly can reduce the cost of probe test development, shorten the cycle of probe test development.
The foregoing is only preferred embodiment of the present utility model, those skilled in the art know, when not departing from spirit and scope of the present utility model, can carry out various change or equivalent replacement to these characteristic sum embodiments.In addition, under instruction of the present utility model, can modify to adapt to concrete situation and material to these characteristic sum embodiments and spirit and scope of the present utility model can not be departed from.Therefore, the utility model is not by the restriction of specific embodiment disclosed herein, and the embodiment in the right of all the application of falling into all belongs to protection domain of the present utility model.
Claims (7)
1. a general ultrasonic probe proving installation, is characterized in that, comprising: microprocessor, testing apparatus, test interface and some test accesss;
Described microprocessor is in conducting state or off-state for controlling described test access;
Described testing apparatus is connected with some described test accesss respectively by described test interface, and described testing apparatus obtains the test data of the described test access of conducting state by described test interface, test access described in every bar comprises a pin to be measured.
2. a kind of general ultrasonic probe proving installation according to claim 1, is characterized in that, test access described in every bar comprises the relay and described pin to be measured that are connected successively, and described test interface is connected with described relay respectively;
Described microprocessor is connected with the control port of described relay respectively;
Described relay is used for:
Respond the test access conducting that described Microprocessor S3C44B0X makes this relay place, described test interface is communicated with the pin to be measured in this test access,
Or respond described Microprocessor S3C44B0X the test access at this relay place is disconnected, the pin to be measured in described test interface and this test access disconnects;
Described microprocessor is used for automatically controlling the "on" position of described relay or off-position.
3. a kind of general ultrasonic probe proving installation according to claim 2, is characterized in that, described microprocessor is used for automatically controlling the energising of relay and power-off according to presetting test sequence.
4. a kind of general ultrasonic probe proving installation according to claim 2, it is characterized in that, also comprise a computing machine, described computing machine is connected with described testing apparatus with described microprocessor respectively; Described computing machine is used for response external input and arranges self-defining test sequence, and this self-defining test sequence is sent to described microprocessor;
Described microprocessor is used for being energized or off-position control to the relay in each test access according to the described test sequence received from described computing machine.
5. a kind of general ultrasonic probe proving installation according to Claims 2 or 3 or 4, is characterized in that, described relay is used for the test access conducting making this relay place in the energized state; Described relay is used in the power-off state the test access at this relay place being disconnected.
6. a kind of general ultrasonic probe proving installation according to Claims 2 or 3 or 4, is characterized in that, described relay is used in the energized state the test access at this relay place being disconnected; Described relay is used for the test access conducting making this relay place in the power-off state.
7. a kind of general ultrasonic probe proving installation according to claim 1, it is characterized in that, described ultrasonic probe is Ultrasonic-B probe.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520133112.4U CN204479694U (en) | 2015-03-09 | 2015-03-09 | A kind of general ultrasonic probe proving installation |
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| CN201520133112.4U CN204479694U (en) | 2015-03-09 | 2015-03-09 | A kind of general ultrasonic probe proving installation |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104678248A (en) * | 2015-03-09 | 2015-06-03 | 上海爱声生物医疗科技有限公司 | Universal ultrasonic probe testing device |
| CN105021714A (en) * | 2015-07-28 | 2015-11-04 | 南通友联数码技术开发有限公司 | Ultrasonic probe testing device |
-
2015
- 2015-03-09 CN CN201520133112.4U patent/CN204479694U/en active Active
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104678248A (en) * | 2015-03-09 | 2015-06-03 | 上海爱声生物医疗科技有限公司 | Universal ultrasonic probe testing device |
| CN104678248B (en) * | 2015-03-09 | 2017-12-12 | 上海爱声生物医疗科技有限公司 | A kind of general ultrasonic probe test device |
| CN105021714A (en) * | 2015-07-28 | 2015-11-04 | 南通友联数码技术开发有限公司 | Ultrasonic probe testing device |
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