CN204464266U - 一种小球间距的pop芯片叠层封装结构 - Google Patents
一种小球间距的pop芯片叠层封装结构 Download PDFInfo
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Abstract
本实用新型公开了一种小球间距的POP芯片叠层封装结构,它包括顶层封装元件(1)和底层封装元件(2),顶层封装元件(1)包括设置在顶层封装基板(4)上表面的上焊垫(7)、设置在顶层封装基板(4)下表面的下焊垫(8)和导通孔(9);底层封装元件(2)还包括设置在底层密封件(12)上表面的上焊垫(7)、设置在底层封装基板(13)下表面的下焊垫(8)和导通孔(9);相连接的上焊垫(7)、下焊垫(8)和导通孔(9)组成工字型结构,顶层封装基板(4)的下焊垫(8)通过顶层焊球(11)与底层封装元件(2)的上焊垫(7)连接,导通孔(9)呈梯形结构。本实用新型具有结构强度大、承压性能好、散热效率高、小球间距等特点。
Description
技术领域
本实用新型涉及半导体封装领域,特别是涉及一种小球间距的POP芯片叠层封装结构。
背景技术
PoP(Package on Package)堆叠装配技术的出现更加模糊了一级封装与二级装配之间的界线,在大大提高逻辑运算功能和存储空间的同时,也为终端用户提供了自由选择器件组合的可能,生产成本也得以更有效的控制。对于3G手机PoP无疑是一个值得考虑的优选方案。勿庸置否,随着小型化高密度封装的出现,对高速与高精度装配的要求变得更加关键。相关的组装设备和工艺也更具先进性与高灵活性。元器件堆叠装配(Package on Package)技术必须经受这一新的挑战。
目前的POP叠层封装结构,常常会遇到封装体翘曲、承压性能差、散热效率低、焊球间距大等问题,。
实用新型内容
本实用新型的目的在于克服现有技术的不足,提供一种小球间距的POP芯片叠层封装结构,具有结构强度大、承压性能好、散热效率高、小球间距等特点。
本实用新型的目的是通过以下技术方案来实现的:一种小球间距的POP芯片叠层封装结构,它包括顶层封装元件和底层封装元件,顶层封装元件中从上至下依次包括顶层密封件、一个或多个顶层封装芯片、封装垫片、顶层封装基板和顶层焊球,底层封装元件中从上至下依次包括底层密封件、底层封装芯片、底层封装基板和底层焊球。
顶层封装元件还包括设置在顶层封装基板上表面的上焊垫、设置在顶层封装基板下表面的下焊垫和用于连接上焊垫与下焊垫的导通孔。
底层封装元件还包括设置在底层密封件上表面的上焊垫、设置在底层封装基板下表面的下焊垫和用于连接上焊垫与下焊垫的导通孔。
相连接的上焊垫、下焊垫和导通孔组成工字型结构,顶层封装基板的下焊垫通过顶层焊球与底层封装元件的上焊垫连接,导通孔呈梯形结构。
顶层焊球的球径为0.26 mm,底层焊球的球径为0.25 mm,相邻两个顶层焊球的中心球间距为0.5mm,相邻两个底层焊球的中心球间距为0.283 mm。
所述的顶层封装芯片固定在封装垫片上,并通过连接线与顶层封装基板上表面的上焊垫连接,底层封装芯片通过倒装的方式固定在底层封装基板上。
所述的底层封装芯片设置在底层密封件的梯形锥台型凹槽里。
本实用新型的有益效果是:
1)本实用新型采用组成工字型结构的上焊垫、下焊垫和导通孔,其中,导通孔也设置为梯形结构,有效提升叠层封装体的承压性能,使得较薄的基板也不会影响,多叠层芯片的承压性问题,本实用新型结构强度更大。
2)本实用新型中,底层密封件设置有梯形锥台型凹槽,既保证底层封装元件具有较强的结构性,又扩大了底层封装芯片的散热空间,能够更好地解决叠层封装芯片的散热问题。
3)本实用新型中,焊球球径可设置在0.245mm~0.25mm之间,焊球间的间距可以制作为0.283mm,达到细间距POP封装的目的。
附图说明
图1为本实用新型POP芯片叠层封装结构的结构图;
图中,1-顶层封装元件,2-底层封装元件,3-顶层密封件,4-顶层封装基板,5-顶层封装芯片,6-封装垫片,7-上焊垫,8-下焊垫,9-导通孔,10-焊线,11-顶层焊球,12-底层密封件,13-底层封装基板,14-底层封装芯片,15-底层焊球。
具体实施方式
下面结合附图进一步详细描述本实用新型的技术方案,但本实用新型的保护范围不局限于以下所述。
如图1所示,一种小球间距的POP芯片叠层封装结构,它包括顶层封装元件1和底层封装元件2。
顶层封装元件1中从上至下依次包括顶层密封件3、一个或多个顶层封装芯片5、封装垫片6、顶层封装基板4和顶层焊球11。
顶层封装元件1还包括设置在顶层封装基板4上表面的上焊垫7、设置在顶层封装基板4下表面的下焊垫8和用于连接上焊垫7与下焊垫8的导通孔9。
底层封装元件2中从上至下依次包括底层密封件12、一个或多个底层封装芯片14、底层封装基板13和底层焊球15。
底层封装元件2还包括设置在底层密封件12上表面的上焊垫7、设置在底层封装基板13下表面的下焊垫8和用于连接上焊垫7与下焊垫8的导通孔9。
导通孔9内为铜柱,顶层封装元件1的导通孔9的高度与顶层封装基板4的厚度相同,底层封装元件2的导通孔9的高度与底层密封件12和底层封装基板13的厚度之后相同。
相连接的上焊垫7、下焊垫8和导通孔9组成工字型结构,顶层封装基板4的下焊垫8通过顶层焊球11与底层封装元件2的上焊垫7连接,导通孔9呈梯形结构。有效提升叠层封装体的承压性能,使得较薄的基板也不会影响,多叠层芯片的承压性问题,本实用新型结构强度更大。
顶层焊球11的球径为0.26mm,底层焊球15的球径为0.25mm,相邻两个顶层焊球11的球中心间距为0.5mm,相邻两个底层焊球15的中心球间距为0.283mm。
顶层封装元件1与底层封装元件2之间还设置有0.175mm厚的助焊剂。底层封装元件2的厚度为0.3mm。
所述的顶层封装芯片5固定在封装垫片6上,并通过连接线10与顶层封装基板4上表面的上焊垫7连接,多个顶层封装芯片5均通过正装的方式与顶层封装基板4电连接。底层封装芯片14通过倒装的方式与底层封装基板13电连接。
所述的底层封装芯片14设置在底层密封件12的梯形锥台型凹槽里。既保证底层封装元件具有较强的结构性,又扩大了底层封装芯片的散热空间,能够更好地解决叠层封装芯片的散热问题。
Claims (3)
1.一种小球间距的POP芯片叠层封装结构,其特征在于:它包括顶层封装元件(1)和底层封装元件(2),顶层封装元件(1)中从上至下依次包括顶层密封件(3)、一个或多个顶层封装芯片(5)、封装垫片(6)、顶层封装基板(4)和顶层焊球(11),底层封装元件(2)中从上至下依次包括底层密封件(12)、一个或多个底层封装芯片(14)、底层封装基板(13)和底层焊球(15);
顶层封装元件(1)还包括设置在顶层封装基板(4)上表面的上焊垫(7)、设置在顶层封装基板(4)下表面的下焊垫(8)和用于连接上焊垫(7)与下焊垫(8)的导通孔(9);
底层封装元件(2)还包括设置在底层密封件(12)上表面的上焊垫(7)、设置在底层封装基板(13)下表面的下焊垫(8)和用于连接上焊垫(7)与下焊垫(8)的导通孔(9);
相连接的上焊垫(7)、下焊垫(8)和导通孔(9)组成工字型结构,顶层封装基板(4)的下焊垫(8)通过顶层焊球(11)与底层封装元件(2)的上焊垫(7)连接,导通孔(9)呈梯形结构;
顶层焊球(11)的球径为0.26mm,底层焊球(15)的球径为0.25mm,相邻两个顶层焊球(11)的球中心间距为0.5mm,相邻两个底层焊球(15)的球中心间距为0.283mm。
2.根据权利要求1所述的一种小球间距的POP芯片叠层封装结构,其特征在于:所述的顶层封装芯片(5)固定在封装垫片(6)上,并通过连接线(10)与顶层封装基板(4)上表面的上焊垫(7)连接,底层封装芯片(14)通过倒装的方式固定在底层封装基板(13)上。
3.根据权利要求1所述的一种小球间距的POP芯片叠层封装结构,其特征在于:所述的底层封装芯片(14)设置在底层密封件(12)的梯形锥台型凹槽里。
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CN115656968B (zh) * | 2022-11-04 | 2023-12-01 | 扬州扬芯激光技术有限公司 | 一种高互连高集成化激光雷达芯片封装结构及封装工艺 |
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