CN204349922U - A kind of EL test circuit with protection assembly - Google Patents
A kind of EL test circuit with protection assembly Download PDFInfo
- Publication number
- CN204349922U CN204349922U CN201420734855.2U CN201420734855U CN204349922U CN 204349922 U CN204349922 U CN 204349922U CN 201420734855 U CN201420734855 U CN 201420734855U CN 204349922 U CN204349922 U CN 204349922U
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- CN
- China
- Prior art keywords
- power supply
- protected location
- diode
- protection assembly
- terminal box
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn - After Issue
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
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- Emergency Protection Circuit Devices (AREA)
Abstract
The utility model relates to a kind of EL test circuit with protection assembly; during this circuit is used for preventing EL from testing, terminal box diode is breakdown; comprise power supply; this circuit also comprises protection assembly; protection assembly is by the first protected location connected successively, interlock contact-making switch and the second protected location; first protected location is connected with power supply, and the second protected location is connected with terminal box diode.Compared with prior art, the utility model can protect the terminal box diode in assembly not breakdown when EL equipment generation surge current is excessive, and respectively connecing one on switch both sides can play better protected effect simultaneously.
Description
Technical field
The utility model relates to a kind of EL test circuit, especially relates to a kind of EL test circuit with protection assembly.
Background technology
Terminal box is extremely important in the composition of solar components, Main Function is connected with outside line by the electricity that solar cell produces, wherein bypass diode directly affects the product reliability such as electrical component performance, cell piece hot spot, tool I take charge of incomplete statistics, 2012 are only in client diode fails up to several thousand; Inside plants lost efficacy 623.When casting glue terminal box imports batch production, backboard scuffing can be had influence on because diode fails causes reprocessing, cause repair for 2nd time.And diode in client examines goods process or client lost efficacy will have a strong impact on the confidence of I being taken charge of to product.Current factory uses EL tester circuit as shown in Figure 1.As can be seen from the figure, EL equipment gives assembly positively biased power transmission in test process, and assembly diode circuit directly bears reverse voltage.Suppose that diode resistance resistance uniformity is consistent, when voltage is greater than 150V, diode will puncture.
Under prior art, Switching Power Supply connects moment, can produce high surge voltage, to terminal box diode 3 positively biased power transmission, diode circuit bears reverse voltage then to produce surge current (general surge current is at least 10-100 times of running current).When voltage is greater than 150V, diode will puncture.
In the utility model; protect at the EL testing equipment interlock each reversal connection in contact-making switch 22 two ends diode, once surge voltage exceedes rated voltage, be connected to interlock contact-making switch both sides diode by breakdown; by power supply short circuit, to protect terminal box diode 3.
Summary of the invention
The purpose of this utility model be exactly in order to overcome above-mentioned prior art exist defect and provide a kind of avoid EL test in terminal box diode breakdown band protection assembly EL test circuit.
The purpose of this utility model can be achieved through the following technical solutions:
A kind of EL test circuit with protection assembly; during this circuit is used for preventing EL from testing, terminal box diode is breakdown; comprise power supply; this circuit also comprises protection assembly; described protection assembly is by the first protected location connected successively, interlock contact-making switch and the second protected location; described first protected location is connected with power supply, and described second protected location is connected with terminal box diode.
Described power supply is DC power supply.
Described first protected location and the second protected location include protection diode; the described negative electrode of the first protected location is connected with the positive pole of power supply; anode is connected with the negative pole of power supply; the negative electrode of described second protected location is connected with the positive pole of power supply by interlock contact-making switch, and anode is connected with the negative pole of power supply by interlock contact-making switch.
Described first protected location and the second protected location include delay action circuit breaker;
The negative electrode of protection diode of the first protected location is connected with the positive pole of power supply, and anode is connected with delay action circuit breaker, and delay action circuit breaker is also connected with the negative pole of power supply;
The negative electrode of the protection diode of the second protected location is connected with the positive pole of power supply by interlock contact-making switch, and anode is connected with delay action circuit breaker, and delay action circuit breaker is also connected with the negative pole of power supply by interlock contact-making switch.
The reverse breakdown voltage of described protection diode is less than the reverse breakdown voltage of terminal box diode.
The rated current of described protection diode is 10A, and rated voltage is 50V.
Compared with prior art, the utility model has the following advantages:
1) the more existing instrument of this utility model is compared; can when EL equipment produces surge current by the diode breakdown of protection assembly; make power supply short circuit, thus protection terminal box diode is not breakdown, respectively connecing one on switch both sides can play better protected effect simultaneously.
2) described power supply is that DC power supply can realize solar module defects detection.
3) described first protected location and the second protected location can be protection diode, and structure is simple, effective.
4) rated current protecting the diode of assembly is 10A, and rated voltage is 50V, more easily punctures compared to terminal box diode, can available protecting terminal box diode.
Accompanying drawing explanation
Fig. 1 is the circuit diagram of existing EL tester;
Fig. 2 is structural representation of the present utility model;
Fig. 3 is the realizing circuit figure of the utility model embodiment one;
Wherein: 1, power supply, 2, protection assembly, 3, terminal box diode 21, first protected location, 22, interlock contact-making switch, the 23, second protected location.
Embodiment
Below in conjunction with the drawings and specific embodiments, the utility model is described in detail.The present embodiment is implemented premised on technical solutions of the utility model, give detailed execution mode and concrete operating process, but protection range of the present utility model is not limited to following embodiment.
Embodiment one:
A kind of EL test circuit with protection assembly; during this circuit is used for preventing EL from testing, terminal box diode 3 is breakdown; as shown in Figure 2; comprise power supply 1 and protection assembly 2; protection assembly 2 is by the first protected location 21 connected successively, interlock contact-making switch 22 and the second protected location 23; first protected location 21 is connected with power supply 1, and the second protected location 23 is connected with terminal box diode 3.
Power supply 1 is DC power supply.
As shown in Figure 3; first protected location 21 and the second protected location 22 are diode; the negative electrode of the first protected location 21 is connected with the positive pole of power supply 1; anode is connected with the negative pole of power supply 1; the negative electrode of the second protected location 22 is connected with the positive pole of power supply 1 by interlock contact-making switch 22, and anode is connected with the negative pole of power supply 1 by interlock contact-making switch 22.
The rated current of diode is 10A, and rated voltage is 50V.
Embodiment two:
The present embodiment and a kind of something in common of embodiment no longer describe, and only describe difference.
In the present embodiment, the first protected location 21 and the second protected location 23 include the diode, time delay coil and the delay action circuit breaker that are connected successively.
Wherein, the negative electrode of the diode of the first protected location 21 is connected with the positive pole of power supply 1, and anode is connected with time delay coil, and time delay coil is connected with delay action circuit breaker, and delay action circuit breaker is also connected with the negative pole of power supply 1; The negative electrode of the diode of the second protected location 23 is connected with the positive pole of power supply 1 by interlock contact-making switch 22, and anode is connected with time delay coil, and time delay coil is connected with delay action circuit breaker, and delay action circuit breaker is also connected with the negative pole of power supply 1 by interlock contact-making switch 22.
When after diode breakdown, time delay coil electricity, delay action circuit breaker time delay open circuit, therefore protected location disconnects, and staff can carry out EL test by butted line box diode 3.
Claims (6)
1. the EL test circuit with protection assembly; during this circuit is used for preventing EL from testing, terminal box diode is breakdown; comprise power supply; it is characterized in that; this circuit also comprises protection assembly; described protection assembly is by the first protected location connected successively, interlock contact-making switch and the second protected location, and described first protected location is connected with power supply, and described second protected location is connected with terminal box diode.
2. a kind of EL test circuit with protection assembly according to claim 1, it is characterized in that, described power supply is DC power supply.
3. a kind of EL test circuit with protection assembly according to claim 2; it is characterized in that; described first protected location and the second protected location include protection diode; the described negative electrode of the first protected location is connected with the positive pole of power supply; anode is connected with the negative pole of power supply; the negative electrode of described second protected location is connected with the positive pole of power supply by interlock contact-making switch, and anode is connected with the negative pole of power supply by interlock contact-making switch.
4. a kind of EL test circuit with protection assembly according to claim 3, it is characterized in that, described first protected location and the second protected location include delay action circuit breaker;
The negative electrode of protection diode of the first protected location is connected with the positive pole of power supply, and anode is connected with delay action circuit breaker, and delay action circuit breaker is also connected with the negative pole of power supply;
The negative electrode of the protection diode of the second protected location is connected with the positive pole of power supply by interlock contact-making switch, and anode is connected with delay action circuit breaker, and delay action circuit breaker is also connected with the negative pole of power supply by interlock contact-making switch.
5. a kind of EL test circuit with protection assembly according to claim 3 or 4, it is characterized in that, the reverse breakdown voltage of described protection diode is less than the reverse breakdown voltage of terminal box diode.
6. a kind of EL test circuit with protection assembly according to claim 5, it is characterized in that, the rated current of described protection diode is 10A, and rated voltage is 50V.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420734855.2U CN204349922U (en) | 2014-11-28 | 2014-11-28 | A kind of EL test circuit with protection assembly |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420734855.2U CN204349922U (en) | 2014-11-28 | 2014-11-28 | A kind of EL test circuit with protection assembly |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN204349922U true CN204349922U (en) | 2015-05-20 |
Family
ID=53233159
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201420734855.2U Withdrawn - After Issue CN204349922U (en) | 2014-11-28 | 2014-11-28 | A kind of EL test circuit with protection assembly |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN204349922U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105703710A (en) * | 2014-11-28 | 2016-06-22 | 中电电气(上海)太阳能科技有限公司 | EL test circuit with protective component |
| CN107659266A (en) * | 2017-09-19 | 2018-02-02 | 华为数字技术（苏州）有限公司 | The EL detection methods and EL detecting systems of solar power system |
-
2014
- 2014-11-28 CN CN201420734855.2U patent/CN204349922U/en not_active Withdrawn - After Issue
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105703710A (en) * | 2014-11-28 | 2016-06-22 | 中电电气(上海)太阳能科技有限公司 | EL test circuit with protective component |
| CN105703710B (en) * | 2014-11-28 | 2018-08-21 | 中电电气(上海)太阳能科技有限公司 | A kind of EL test circuits of band protection component |
| CN107659266A (en) * | 2017-09-19 | 2018-02-02 | 华为数字技术（苏州）有限公司 | The EL detection methods and EL detecting systems of solar power system |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| AV01 | Patent right actively abandoned | ||
| AV01 | Patent right actively abandoned |
Granted publication date: 20150520 Effective date of abandoning: 20180821 |