CN204241514U - A kind of LED mercerising source test fixture - Google Patents
A kind of LED mercerising source test fixture Download PDFInfo
- Publication number
- CN204241514U CN204241514U CN201420670092.XU CN201420670092U CN204241514U CN 204241514 U CN204241514 U CN 204241514U CN 201420670092 U CN201420670092 U CN 201420670092U CN 204241514 U CN204241514 U CN 204241514U
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- probe
- shell
- probe shell
- core
- test fixture
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Abstract
A kind of LED mercerising source test fixture, comprise support and plural probe, probe comprises probe shell and probe core, the bottom of probe shell is fixed on support, the upper end of probe shell is provided with opening, probe core comprises head and clamping part, and head stretches out outside probe shell by described opening, and clamping part is limited in probe shell; Clamping part is provided with more than one upper draw-in groove, probe shell is provided with more than one lower bayonet slot, forming the clamping device for clamping filament leg between adjacent upper draw-in groove and lower bayonet slot, being provided with between bottom probe core and bottom probe shell and can making probe core Flexible Reset body.Due to LED silk by frame on two probes, therefore its surface 360 ° be all unsettled, can not block the bright dipping of LED silk, test result is accurate.In addition, the utility model can arrange multiple probe, or on probe, arranges multiple clamping device increase the quantity of each test LED silk, to improve testing efficiency.
Description
Technical field
The utility model relates to test fixture, especially a kind of LED mercerising source test fixture.
Background technology
LED silk needs the test it being carried out to optical property before dispatching from the factory, as integrating sphere measurement.The existing tool for LED silk integrating sphere measurement comprises test board, and test board is provided with clamping device, during test, is fixed on clamping device by LED silk, and then energising makes the luminescence of LED silk align to test.Although above-mentioned this measurement jig also can carry out integrating sphere measurement to LED silk, LED silk is subject to blocking of test board itself when luminescence, and after 360 ° of luminous LED silk part bright dippings are blocked, its integrating sphere measurement resultant error is larger; And in test process, the LED silk heat blocked is difficult to distribute, causing its light decay serious, is also the factor affecting its test result; In addition, existing test fixture at every turn can only clamping test LED silk, causes testing efficiency low.
Summary of the invention
Technical problem to be solved in the utility model is to provide a kind of LED mercerising source test fixture, and can not block the bright dipping of LED silk, test result is accurate.
For solving the problems of the technologies described above, the technical solution of the utility model is: a kind of LED mercerising source test fixture, comprise support and be located at the plural probe on support, described probe comprises probe shell and is located at the probe core in described probe shell, the bottom of described probe shell is fixed on support, and the upper end of described probe shell is provided with opening, and described probe core comprises head and clamping part, described head stretches out outside probe shell by described opening, and described clamping part is limited in probe shell; Described clamping part is provided with more than one upper draw-in groove, described probe shell is provided with more than one lower bayonet slot, forming the clamping device for clamping filament leg between adjacent upper draw-in groove and lower bayonet slot, being provided with between bottom described probe core and bottom probe shell and can making probe core Flexible Reset body.Utility model works principle: form one between adjacent two probes for testing the fixture of LED silk, two pin sides of LED silk are not clamped on two probes, LED silk can be made to carry out luminescence after external power source and probe are energized, thus alignment is tested; During test, by touching probe core head, clamping part is moved up and down, thus the upper draw-in groove of clamping device and lower bayonet slot are opened, two of LED silk pins are put into respectively the clamping device of both sides probe, then the outside power that head is applied is removed, probe core resets under elastomeric effect, the upper draw-in groove of clamping device and lower bayonet slot is made mutually to draw close and be clamped by the pin of LED silk, due to LED silk by frame on two probes, therefore its 360 °, surface is all unsettled, can not block the bright dipping of LED silk, test result is accurate.In addition, the utility model can arrange multiple probe, or on probe, arranges multiple clamping device increase the quantity of each test LED silk, to improve testing efficiency.
As improvement, described elastic body is spring or extension spring.If when elastic body is spring, clamping device can open by the head down pressing probe core; If when elastic body is extension spring, clamping device can open by the head down going up pull-up probe core.No matter elastic body is spring or extension spring, and after removing the power to head, clamping device all can automatically reset formation clamped condition.
As improvement, described probe core is metallic object, and the bottom of described probe core and Electrode connection, described electrode is stretched out by the bottom of probe shell.When clamping device clamps the pin of LED silk, probe core all can contact with pin with probe shell, therefore can be drawn by electrode by probe core or probe shell.
As improvement, described probe shell is metallic object, the bottom of probe shell and Electrode connection.When clamping device clamps the pin of LED silk, probe core all can contact with pin with probe shell, therefore can be drawn by electrode by probe core or probe shell.
As improvement, the probe on described support is word order, and the distance between adjacent probe is the length of a LED silk.
As improvement, described upper draw-in groove is arranged on the side of probe core, and described lower bayonet slot is arranged on the side of probe shell, and upper draw-in groove and lower bayonet slot are towards identical.
As improvement, described upper draw-in groove and lower bayonet slot all c-shaped, facilitate the pin of LED silk to put into clamping device.
As improvement, the bottom of described probe shell is provided with Fixing clamp-seat, and probe shell is fixed on support by described Fixing clamp-seat.
As improvement, the head upper end of described probe core is provided with weighted table, and the diameter of weighted table is greater than head diameter.The arranging of weighted table facilitates and manually applies pressure or pulling force to probe core.
As improvement, the diameter of the clamping part of described probe core is greater than the open-topped diameter of probe shell.
The beneficial effect that the utility model is compared with prior art brought is:
During test, LED guide frame is on two probes, and its 360 °, surface is all unsettled, and can not block the bright dipping of LED silk, test result is accurate; In addition, the utility model can arrange multiple probe, or on probe, arranges multiple clamping device increase the quantity of each test LED silk, to improve testing efficiency.
Accompanying drawing explanation
Fig. 1 is embodiment 1 test fixture schematic diagram.
Fig. 2 is embodiment 2 test fixture schematic diagram.
Fig. 3 is probe structure schematic diagram.
Embodiment
Below in conjunction with Figure of description, the utility model is described in further detail.
Embodiment 1
As shown in Figure 1, a kind of LED mercerising source test fixture, two probes 1 comprising support 7 and be located on support 7, and the distance between two probes 1 is the length of a LED silk 4, during test, LED silk 4 frame is between two probes 1.
As shown in Figure 1,3, described probe 1 comprises probe shell 11 and the probe core 12 be located in described probe shell 11; The bottom of described probe shell 11 is provided with Fixing clamp-seat 8, and Fixing clamp-seat 8 can be fixed by bolt and support 7, and probe shell 11 is fixed on support 7 by described Fixing clamp-seat 8; Described probe shell 11 is hollow-core construction, and the upper end of described probe shell 11 is provided with opening, and the upper end of probe core 12 is stretched out by described opening.Described probe core 12 comprises head 121 and clamping part 122, and described head 121 stretches out outside probe shell 11 by described opening; The diameter of the clamping part 122 of described probe core 12 is greater than the open-topped diameter of probe shell 11, probe shell 11 open top is tapered, and the top of clamping part 122 is also tapered, so probe shell 11 top structure can retrain clamping part 122, makes it can not depart from probe shell 11.Head 121 upper end of described probe core 12 is provided with weighted table 123, and the diameter of weighted table 123 is greater than head 121 diameter, and the arranging of weighted table 123 facilitates and manually apply pressure to probe core 12.
Described clamping part 122 is provided with the upper draw-in groove 124 of a C shape, and described probe shell 11 is provided with the lower bayonet slot 111 of a C shape, forms the clamping device 3 for clamping filament leg between upper draw-in groove 124 and lower bayonet slot 111.Be provided with between bottom described probe core 12 and bottom probe shell 11 and can make probe core 12 Flexible Reset body 5, described elastic body 5 is spring, and clamping device 3 can open by the head 121 down pressing probe core 12; After removing the power to head 121, clamping device 3 all can automatically reset formation clamped condition.
Described probe core 12 is metallic object, and the bottom of described probe core 12 is connected with electrode 6, and described electrode 6 is stretched out by the bottom of probe shell 11; When clamping device 3 clamps the pin 41 of LED silk 4, probe core 12 and probe shell 11 all can contact with pin 41, therefore can be drawn by electrode 6 by probe core 12 or probe shell 11.
Utility model works principle: form one between adjacent two probes for testing the fixture of LED silk 4, two pin 41 sides of LED silk 4 are not clamped on two probes 1, LED silk 4 can be made to carry out luminescence after external power source and probe 1 are energized, thus alignment is tested, during test, by touching probe core 12 head 121, clamping part 122 is moved up and down, thus the upper draw-in groove 124 of clamping device 3 is opened with lower bayonet slot 111, two of LED silk 4 pins 41 are put into respectively the clamping device 3 of both sides probe 1, then remove outside to head 121 applied pressure, probe core 12 resets under the effect of elastic body 5, the upper draw-in groove 124 of clamping device 3 is made mutually to draw close with lower bayonet slot 111 and be clamped by the pin 41 of LED silk 4, due to LED silk 4 by frame on two probes 1, therefore its 360 °, surface is all unsettled, LED silk 4 bright dipping can not be blocked, test result is accurate.
Embodiment 2
As shown in Figure 2, a kind of LED silk 4 light source test fixture, comprise support 7 and be located at three on support 7 probes 1 in word order, and the distance between two probes 1 is the length of a LED silk 4, during test, LED silk 4 frame is between two probes 1.
As shown in Figure 2, described probe comprises probe shell 11 and the probe core 12 be located in described probe shell 11; The bottom of described probe shell 11 is provided with Fixing clamp-seat 8, and Fixing clamp-seat 8 can be fixed by bolt and support 7, and probe shell 11 is fixed on support 7 by described Fixing clamp-seat 8; Described probe shell 11 is hollow-core construction, and the upper end of described probe shell 11 is provided with opening, and the upper end of probe core 12 is stretched out by described opening.Described probe core 12 comprises head 121 and clamping part 122, and described head 121 stretches out outside probe shell 11 by described opening; The diameter of the clamping part 122 of described probe core 12 is greater than the open-topped diameter of probe shell 11, probe shell 11 open top is tapered, and the top of clamping part 122 is also tapered, so probe shell 11 top structure can retrain clamping part 122, makes it can not depart from probe shell 11.Head 121 upper end of described probe core 12 is provided with weighted table 123, and the diameter of weighted table 123 is greater than head 121 diameter, and the arranging of weighted table 123 facilitates and manually apply pressure or pulling force to probe core 12.
Described clamping part 122 is provided with the upper draw-in groove 124 of two C shapes set up and down, described probe shell 11 is provided with the lower bayonet slot 111 of two C shapes set up and down, forms the clamping device 3 for clamping filament leg 41 between adjacent upper draw-in groove 124 and lower bayonet slot 111.Be provided with between bottom described probe core 12 and bottom probe shell 11 and can make probe core 12 Flexible Reset body 5, described elastic body 5 is extension spring, and up clamping device 3 can open by the head 121 of pull-up probe core 12; After removing the power to head 121, clamping device 3 all can automatically reset formation clamped condition.
Described probe shell 11 is metallic object, and the bottom of probe shell 11 is connected with electrode 6; When clamping device 3 clamps the pin 41 of LED silk 4, probe core 12 and probe shell 11 all can contact with pin 41, therefore can be drawn by electrode 6 by probe core 12 or probe shell 11.
Utility model works principle: form one between adjacent two probes for testing the fixture of LED silk 4, two pin 41 sides of LED silk 4 are not clamped on two probes, LED silk 4 can be made after external power source and probe are energized to carry out luminescence, thus alignment is tested, during test, by touching probe core 12 head 121, clamping part 122 is moved up and down, thus the upper draw-in groove 124 of clamping device 3 is opened with lower bayonet slot 111, two of LED silk 4 pins 41 are put into respectively the clamping device 3 of both sides probe, then the outside pulling force that head 121 is applied is removed, probe core 12 resets under the effect of elastic body 5, the upper draw-in groove 124 of clamping device 3 is made mutually to draw close with lower bayonet slot 111 and be clamped by the pin 41 of LED silk 4, due to LED silk 4 by frame on two probes, therefore its 360 °, surface is all unsettled, LED silk 4 bright dipping can not be blocked, test result is accurate.In addition, the utility model can arrange multiple probe, or on probe, arranges the quantity that multiple clamping device 3 increases each test LED silk 4, to improve testing efficiency.
Claims (10)
1. a LED mercerising source test fixture, it is characterized in that: comprise support and be located at the plural probe on support, described probe comprises probe shell and is located at the probe core in described probe shell, the bottom of described probe shell is fixed on support, the upper end of described probe shell is provided with opening, described probe core comprises head and clamping part, and described head stretches out outside probe shell by described opening, and described clamping part is limited in probe shell; Described clamping part is provided with more than one upper draw-in groove, described probe shell is provided with more than one lower bayonet slot, forming the clamping device for clamping filament leg between adjacent upper draw-in groove and lower bayonet slot, being provided with between bottom described probe core and bottom probe shell and can making probe core Flexible Reset body.
2. a kind of LED mercerising source according to claim 1 test fixture, is characterized in that: described elastic body is spring or extension spring.
3. a kind of LED mercerising source according to claim 1 test fixture, it is characterized in that: described probe core is metallic object, the bottom of described probe core and Electrode connection, described electrode is stretched out by the bottom of probe shell.
4. a kind of LED mercerising source according to claim 1 test fixture, is characterized in that: described probe shell is metallic object, the bottom of probe shell and Electrode connection.
5. a kind of LED mercerising source according to claim 1 test fixture, it is characterized in that: the probe on described support is word order, the distance between adjacent probe is the length of a LED silk.
6. a kind of LED mercerising source according to claim 1 test fixture, it is characterized in that: described upper draw-in groove is arranged on the side of probe core, described lower bayonet slot is arranged on the side of probe shell, and upper draw-in groove and lower bayonet slot are towards identical.
7. a kind of LED mercerising source according to claim 6 test fixture, is characterized in that: described upper draw-in groove and lower bayonet slot all c-shaped.
8. a kind of LED mercerising source according to claim 1 test fixture, is characterized in that: the bottom of described probe shell is provided with Fixing clamp-seat, and probe shell is fixed on support by described Fixing clamp-seat.
9. a kind of LED mercerising source according to claim 1 test fixture, is characterized in that: the head upper end of described probe core is provided with weighted table, and the diameter of weighted table is greater than head diameter.
10. a kind of LED mercerising source according to claim 1 test fixture, is characterized in that: the diameter of the clamping part of described probe core is greater than the open-topped diameter of probe shell.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420670092.XU CN204241514U (en) | 2014-11-11 | 2014-11-11 | A kind of LED mercerising source test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420670092.XU CN204241514U (en) | 2014-11-11 | 2014-11-11 | A kind of LED mercerising source test fixture |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN204241514U true CN204241514U (en) | 2015-04-01 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201420670092.XU Expired - Fee Related CN204241514U (en) | 2014-11-11 | 2014-11-11 | A kind of LED mercerising source test fixture |
Country Status (1)
| Country | Link |
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| CN (1) | CN204241514U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104777438A (en) * | 2015-04-17 | 2015-07-15 | 深圳市炫硕光电科技有限公司 | Filament lighting increasing device |
| CN106291193A (en) * | 2016-08-26 | 2017-01-04 | 黄山市展硕半导体科技有限公司 | A kind of PIN needle formula backlight testing jig |
| CN116559633A (en) * | 2023-07-10 | 2023-08-08 | 华羿微电子股份有限公司 | Semiconductor chip high temperature test box |
-
2014
- 2014-11-11 CN CN201420670092.XU patent/CN204241514U/en not_active Expired - Fee Related
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104777438A (en) * | 2015-04-17 | 2015-07-15 | 深圳市炫硕光电科技有限公司 | Filament lighting increasing device |
| CN106291193A (en) * | 2016-08-26 | 2017-01-04 | 黄山市展硕半导体科技有限公司 | A kind of PIN needle formula backlight testing jig |
| CN116559633A (en) * | 2023-07-10 | 2023-08-08 | 华羿微电子股份有限公司 | Semiconductor chip high temperature test box |
| CN116559633B (en) * | 2023-07-10 | 2023-09-29 | 华羿微电子股份有限公司 | Semiconductor chip high temperature test box |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C56 | Change in the name or address of the patentee | ||
| CP03 | Change of name, title or address |
Address after: 510890 Huadu District, Guangdong, Guangzhou Flower Town, SAST Road, No. 1, No. 1 Patentee after: Hongli Newell group Limited by Share Ltd Address before: Huadu District, Guangdong city of Guangzhou Province, 510890 East Town Airport high-tech industrial base and SAST Jingu South Road intersection Patentee before: Guangzhou Hongli Tronic Co., Ltd. |
|
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20150401 Termination date: 20181111 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |