CN204129082U - Connector test socket and connector testing device - Google Patents
Connector test socket and connector testing device Download PDFInfo
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- CN204129082U CN204129082U CN201420575741.8U CN201420575741U CN204129082U CN 204129082 U CN204129082 U CN 204129082U CN 201420575741 U CN201420575741 U CN 201420575741U CN 204129082 U CN204129082 U CN 204129082U
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- retainer
- fixed orifice
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Abstract
The utility model discloses connector test socket and connector testing device, connector test socket described in the utility model, it is characterized in that, comprising: housing, described housing has probe fixed orifice; Described housing is provided with the first through hole, and described first through hole is communicated with described probe fixed orifice; Probe, described probe is arranged in described probe fixed orifice, and comprises probe segment; Retainer, described retainer is provided with probe fixed orifice, and described retainer is arranged in described housing movably; Described probe segment is positioned at the described probe fixed orifice of described retainer, and can move in described probe fixed orifice.Connector test socket in the utility model and connector testing device, probe is connected in pluggable mode with the splicing ear of connector, after splicing ear is connected with probe, utilize current testing device test splicing ear and probe two ends whether to conduct electricity, can judge whether splicing ear installation is qualified.
Description
Technical field
The utility model relates to a kind of connector test socket and connector testing device.
Background technology
Conventional connector, generally includes multiple splicing ears that connector shell and housing are arranged.Splicing ear is connected with wire.Splicing ear is being arranged in connector shell process, is there is the risk damaged.The connector of miniaturization, the risk that in installation process, splicing ear damages is higher.Situation about damaging is likely that splicing ear departs from wire and is connected, and is also likely that splicing ear is not in place.No matter be that damage, all can affect the normal use of connector.
In prior art, there is no special connector testing device, cannot the splicing ear of test connector fast whether install correctly, whether can beam conduction.
Utility model content
One of the purpose of this utility model is to overcome deficiency of the prior art, provide a kind of can the connector test socket of test connector easily.
For realizing above object, the utility model is achieved through the following technical solutions:
Connector test socket, is characterized in that, comprising:
Housing, described housing has probe fixed orifice; Described housing is provided with the first through hole, and described first through hole is communicated with described probe fixed orifice;
Probe, described probe is arranged in described probe fixed orifice, and comprises probe segment;
Retainer, described retainer is provided with probe fixed orifice, and described retainer is arranged in described housing movably;
Described probe segment is positioned at the described probe fixed orifice of described retainer, and can move in described probe fixed orifice.
Preferably, also elasticity reset device is comprised; Described retainer pressurized makes described elasticity reset device produce elastic deformation and have elastic deformation force when moving; After the distress resolves that described retainer is subject to, the elastic deformation force of described elasticity reset device makes described retainer reset.
Preferably, described elasticity reset device is spring.
Preferably, also comprise guide piece, described guide piece is connected with described retainer; When described retainer pressurized moves, described guide piece limits the motion track of described retainer.
Preferably, described guide piece is guide pole; Described housing comprises probe fixed head; Described probe is arranged on described probe fixed head; Described housing is provided with guide rod hole; Described guide pole one end is connected with described retainer, and described guide pole can be inserted in described housing actively along described guide rod hole.
Preferably, Compress Spring is provided with in described housing; Described guide pole is provided with flange; Described Compress Spring is sleeved on described guide pole; Described Compress Spring one end is resisted against on described flange, and the other end is resisted against in described inner walls.
Preferably, described probe comprises a main part, and main part and the described probe fixed orifice of described probe are interference fit.
Preferably, described probe comprises a probe segment; The probe segment of described probe is positioned at described probe fixed orifice, and is clearance fit with described probe fixed orifice.
Preferably, the probe segment of described probe is positioned at described probe fixed orifice completely, and described retainer is played a protective role to described probe segment.
Preferably, described first through-hole wall is provided with step surface.
Preferably, described housing comprises probe fixed head, is provided with probe fixed orifice in described probe fixed head.
Preferably, described housing comprises base plate, probe base and header board; Described probe fixed orifice is arranged on described probe base; Described header board and described base plate are installed on described probe base two ends respectively; Described first through hole is arranged on header board.
Preferably, described header board is provided with step, for coordinating the projection that tested connector shell is arranged.
Preferably, described header board number is multiple, and described multiple header board and described probe base removably connect, and has the first different through holes.
Two of the purpose of this utility model is to overcome deficiency of the prior art, provide a kind of can the connector testing device of test connector easily.
For realizing above object, the utility model is achieved through the following technical solutions:
Connector testing device, is characterized in that, comprises current testing device and aforesaid connector test socket; Described probe and described current testing device form a part for current return; When the splicing ear of connector is connected with described probe, whether described current testing device test splicing ear and described probe conduct; Whether conduct according to splicing ear and described probe, judge whether splicing ear is installed correctly, as not conducting, then splicing ear, as conducting, then splicing ear is installed correct if installing incorrect.
Connector test socket in the utility model and connector testing device, probe is connected in pluggable mode with the splicing ear of connector, after splicing ear is connected with probe, utilize current testing device test splicing ear and probe two ends whether to conduct electricity, can judge whether splicing ear installation is qualified.As conduction, then splicing ear installation qualification is described; As non-conductive, then illustrate that splicing ear is installed defective.Can whether the connector test socket in the utility model and connector testing device, can the splicing ear of test connector easily install correctly, beam conduction.Be especially suitable for the connector that test setting has multiple splicing ear.Probe tips is positioned at the probe fixed orifice of fender bracket, and fender bracket can protect probe, makes it from damage.Especially when splicing ear is connected with probes touch, fender bracket can protect probe, prevents from damaging probe in connection procedure.Fender bracket is arranged movably, makes it be applicable to various connector, is applicable to the splicing ear of various length dimension.By arranging elasticity reset device, fender bracket both can be made to automatically reset, buffer action can be provided when fender bracket pressurized again.Guide piece is set, the movement of fender bracket can be limited, prevent crooked and stuck in its moving process or damage probe.Header board, base plate are all removably connected with probe base, are convenient for changing.
Accompanying drawing explanation
Fig. 1 is the partial cutaway view schematic of the utility model example structure.
Fig. 2 is the cross-sectional schematic of the utility model example structure.
Fig. 3 is the cross-sectional schematic of the utility model example structure in use location.
Fig. 4 is the using state reference diagram of connector test socket in the utility model.
Fig. 5 is the part A enlarged diagram in Fig. 4.
Embodiment
Below in conjunction with embodiment and accompanying drawing, the utility model is further illustrated.
As shown in Figures 1 to 5, connector test socket 100, comprises housing 110 and probe 120.Housing 110 has probe fixed orifice 111, extends along connector direction of insertion.Probe 120 is fixedly installed in probe fixed orifice 111.Housing 110 is provided with the first through hole 112, for tested connector of planting.First through hole 112 is communicated with probe fixed orifice 111, and the tested connector be plugged in the first through hole 112 can be connected with the probe 120 be arranged in probe fixed orifice 111.Such as, the probe 120 in the splicing ear of connector and probe fixed orifice 111 is with pluggable mode grafting.
In example as shown in the figure, housing 110 comprises header board 113, probe base 114 and base plate 115, and header board 113 and base plate 115 are separately fixed at the two ends of probe base 114 along direction of insertion.Probe base 114 is for fixedly mounting probe 120.Probe base 114 includes probe fixed head 116.One or more probe fixed orifice 111 is provided with, for fixedly mounting probe 120 in probe fixed head 116.In example as shown in the figure, probe fixed orifice 111 is interference fit with the main part 1201 of probe 120, and the probe segment 121 of probe extends upward the upper surface 1161 of probe fixed head 116.Such as, the probe segment 121 of probe is arranged in same plane, as plane in the horizontal direction in Fig. 2.In the example of as shown in Figure 2, the main part 1201 of probe 120 extends upward the upper surface 1161 of probe fixed head 116.
Header board 113 and base plate 115 are connected to probe base 114 two ends, form Socket casing 110.Header board 113 is provided with this first through hole 112.Shape and the tested connector shape of the first through hole 112 adapt, and facilitate tested connector to insert, and play the guiding role to it in tested connector insertion process.According to a preferred embodiment of the present utility model, multiple header board 113 is connected with probe base 114 respectively removably.Different header boards 116 arranging difform first through hole 112, by changing header board 116, making the utility model be applicable to test various connector.According to another preferred embodiment of the present utility model, header board 113 is provided with step surface 1131.The position of step surface 1131 is according to the configuration settings of tested connector.
Multiple probe 120 is arranged on probe fixed head 116.Probe 120 for the splicing ear of connector pluggable be connected, formed electric pathway.Structure and the splicing ear of probe 120 adapt, and both connect pluggablely.If splicing ear is tubular, then probe is shaft-like, bar-shaped; If splicing ear is shaft-like, bar-shaped, then probe is tubular.The number of probe 120 and the distribution mode on probe fixed head 116, adapt with the number of splicing ear and distribution mode on the connectors, and each probe 120 and one of them splicing ear are connected pluggablely.In example as shown in the figure, the probe segment 121 of probe is bar-shaped.Probe 120 is fixed on probe fixed head 116.In the example of as shown in Figure 2, the main part 1201 of probe is fixed in probe fixed orifice 111; The probe segment 121 of probe extends upward the upper surface 1161 of probe fixed head 116.In another example, the main part 1201 of probe 120 extends the lower surface 1162 of probe fixed head 116 downwards, is positioned at outside probe fixed orifice 111.In the example of as shown in Figure 2, the main part 1201 of probe 120 extends continuously across base plate 115, and the other end 122 of probe 120 is positioned at outside probe fixed orifice 111.In another example, the other end 122 of probe 120 extends continuously across the lower surface 1151 of base plate 115, for being connected to a test circuit (not shown).
Connector test socket 100 also comprises a retainer 130.Retainer 130 is arranged in housing 110.In the example of as shown in Figure 2, retainer 130 is arranged in the upper space 119 of formation between header board 113 and probe base 114.Retainer 130 is arranged in the upper space 119 of housing 110 movably.
Retainer 130 is provided with probe fixed orifice 132.After connector test socket 100 installs, the probe fixed orifice 132 in retainer 130 aligns with the probe fixed orifice 111 in probe fixed head 116, installs probe 120 in order to hold.In example as shown in the figure, the main part 1201 of each probe 120 is clamped in a probe fixed orifice 111, and the probe segment 121 of each probe 120 extends in a probe fixed orifice 132 on retainer 130.In the example of as shown in Figure 2; the probe segment 121 of probe 120 is positioned at probe fixed orifice 132 and lower than the upper surface 1301 of retainer 130; namely the probe segment 121 of probe 120 is positioned at probe fixed orifice 132 completely, and retainer 130 pairs of probe segments 121 are played a protective role.
According to an embodiment of the present utility model, retainer 130 is arranged on probe base 114 by guide piece and elasticity reset device, and can move up and down along direction of insertion in the upper space 119 of housing 110.In example as shown in the figure, retainer 130 is arranged in the upper space 119 of housing 110, and is connected with guide piece.As shown in FIG., probe base 114 li is provided with guide rod hole 118.Guide piece comprises two guide poles 140, and guide pole 140 can be inserted in probe base 114 li actively along guide rod hole 118.The upper end of guide pole 140 is connected by screw 142 with retainer 130.Probe base 114, by the motion track of restricted guidance bar 140, makes retainer 130 move up and down along direction of insertion.Such as, when retainer 130 pressurized moves down, the motion track of guide piece restriction retainer 130.
Elasticity reset device is arranged in housing 110.Retainer 130 pressurized makes elasticity reset device produce elastic deformation and have elastic deformation force when moving.After the distress resolves that retainer 130 is subject to, the elastic deformation force of elasticity reset device makes retainer 130 reset.In example as shown in the figure, elasticity reset device comprises Compress Spring 150.In the example of as shown in the figure, guide pole 140 bottom is arranged in the mounting hole 1152 of the guide pole 140 arranged in base plate 115, and can move in mounting hole 1152.The lower end of guide pole 140 is provided with flange 141.Guide pole 140 bottom is arranged in guide pole 140 mounting hole 1152 in base plate 115, and can move in mounting hole 1152.Compress Spring 150 is arranged around the lower end of guide pole 140.Compress Spring 150 one end is resisted against on flange 141, and the other end is resisted against on base plate 115.
As shown in Figure 4, Figure 5, when the present embodiment uses, connector 200 is inserted in the first through hole 112 of header board 113.In example as shown in the figure, the splicing ear 210 in connector 200 is female terminal, and the probe segment 121 of probe is shaft-like.Be inserted in the first through hole 112 process at connector 200, first the front end of connector 200 contacts retainer 130, then by retainer 130 along direction of insertion to pressing down.Along with retainer 130 is connected device 200 to pressing down, the probe segment 121 of probe 120 exposes the upper surface 1301 of retainer 130, enters the front end of connector 200, to connect with corresponding splicing ear 210.When the projection 201 that connector 200 shell is arranged stops by step surface 1131, connector 200 inserts and puts in place.Splicing ear 210 on connector 200 contacts with probe 120 probe segment 121 of the probe fixed orifice 132 exposing retainer 130 and realizes being electrically connected.
When splicing ear 210 and probe 120 probe segment 121 electrical contact, form electric pathway.Utilize reometer or voltage table, connect splicing ear 210 and probe 120 respectively, according to the testing result of reometer or voltage table, can judge whether splicing ear 210 contacts with probe 120 and be energized.After connector 200 is in place in the first through hole 112, as most of splicing ear 210 combines rear energising, part no power with probe 120, then illustrate that this part splicing ear is installed defective.As whole energising, then whole installation qualification is described.As whole no power, then illustrate that whole splicing ear is installed defective, or be not in place in the first through hole 112.
When using connector test socket 100, move down with retainer 130, guide pole 140 moves down thereupon.Guide pole 140 limits by the guide rod hole 118 of probe base 114 li, only can move axially along guide rod hole 118.Matched with guide pole 140 by guide rod hole 118, limit the motion track of retainer 130, thus retainer 130 is played a protective role to probe 120 probe segment 121 be arranged in probe fixed orifice 132.When guide pole 140 moves down, Compress Spring 150 is made to be produced elastic deformation force by compressing.
After detection completes, connector 200 is extracted in the first through hole 112.Splicing ear 210 is separated with probe 120.In connector 200 withdrawal process, retainer 130, under elastic deformation force's effect of Compress Spring 150, moves up, and will be housed in the probe 120 exited from connector 200 in probe fixed orifice 132.Retainer 130 plays a protective role to the probe 120 be separated from connector 200.。
According to preferred embodiment of the present utility model, the configurable multiple header board 113 of housing 110.Every block header board 113 can arrange a kind of first through hole 112 of shape.Often kind of first through hole 112 is applicable to a kind of connector.By changing different header boards 113, header board 113, probe base 114 and base plate 115 can be combined to the test jack being applicable to different connector, and applicability is wider.Retainer 130 can protect probe 120 not damaged.The probe segment 121 of probe 120 inserts in the probe fixed orifice 132 of retainer 130; at probe 120 with splicing ear 210 swapping process of connector 200; retainer 130 both can make splicing ear 210 and probe 120 plug easily; probe 120 not easily bending and fractureing can be protected again, extend the serviceable life of probe 120.
Connector test socket in embodiment can be used as connector testing device together with current sensing means, and whether the splicing ear of test connector is installed correctly.
Described in the utility model " on ", D score, "left", "right", be all with Fig. 3 be with reference to use relative concept.
Embodiment in the utility model, only for being described the utility model, does not form the restriction to right, other equivalent in fact substituting, all in the utility model protection domain that those skilled in that art can expect.
Claims (15)
1. connector test socket, is characterized in that, comprising:
Housing, described housing has probe fixed orifice; Described housing is provided with the first through hole, and described first through hole is communicated with described probe fixed orifice;
Probe, described probe is arranged in described probe fixed orifice, and comprises probe segment;
Retainer, described retainer is provided with probe fixed orifice, and described retainer is arranged in described housing movably;
Described probe segment is positioned at the described probe fixed orifice of described retainer, and can move in described probe fixed orifice.
2. connector test socket according to claim 1, is characterized in that, also comprise elasticity reset device; Described retainer pressurized makes described elasticity reset device produce elastic deformation and have elastic deformation force when moving; After the distress resolves that described retainer is subject to, the elastic deformation force of described elasticity reset device makes described retainer reset.
3. connector test socket according to claim 2, is characterized in that, described elasticity reset device is spring.
4. connector test socket according to claim 1, is characterized in that, also comprise guide piece, and described guide piece is connected with described retainer; When described retainer pressurized moves, described guide piece limits the motion track of described retainer.
5. connector test socket according to claim 4, is characterized in that, described guide piece is guide pole; Described housing comprises probe fixed head; Described probe is arranged on described probe fixed head; Described housing is provided with guide rod hole; Described guide pole one end is connected with described retainer, and described guide pole can be inserted in described housing actively along described guide rod hole.
6. connector test socket according to claim 5, is characterized in that, is provided with Compress Spring in described housing; Described guide pole is provided with flange; Described Compress Spring is sleeved on described guide pole; Described Compress Spring one end is resisted against on described flange, and the other end is resisted against in described inner walls.
7. connector test socket according to claim 1, is characterized in that, described probe comprises a main part, and main part and the described probe fixed orifice of described probe are interference fit.
8. connector test socket according to claim 1, is characterized in that, described probe comprises a probe segment; The probe segment of described probe is positioned at described probe fixed orifice, and is clearance fit with described probe fixed orifice.
9. connector test socket according to claim 8, is characterized in that, the probe segment of described probe is positioned at described probe fixed orifice completely, and described retainer is played a protective role to described probe segment.
10. connector test socket according to claim 1, is characterized in that, described first through-hole wall is provided with step surface.
11. connector test sockets according to claim 1, it is characterized in that, described housing comprises probe fixed head, is provided with probe fixed orifice in described probe fixed head.
12. connector test sockets according to the arbitrary claim of claim 1 to 11, it is characterized in that, described housing comprises base plate, probe base and header board; Described probe fixed orifice is arranged on described probe base; Described header board and described base plate are installed on described probe base two ends respectively; Described first through hole is arranged on header board.
13. connector test sockets according to claim 12, is characterized in that, described header board is provided with step, for coordinating the projection that tested connector shell is arranged.
14. connector test sockets according to claim 12, it is characterized in that, described header board number is multiple, described multiple header board and described probe base removably connect, and have the first different through holes.
15. connector testing devices, is characterized in that, comprise current testing device and the connector test socket described in the arbitrary claim of claim 1 to 14; Described probe and described current testing device form a part for current return; When the splicing ear of connector is connected with described probe, whether described current testing device test splicing ear and described probe conduct; Whether conduct according to splicing ear and described probe, judge whether splicing ear is installed correctly, as not conducting, then splicing ear, as conducting, then splicing ear is installed correct if installing incorrect.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420575741.8U CN204129082U (en) | 2014-09-30 | 2014-09-30 | Connector test socket and connector testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420575741.8U CN204129082U (en) | 2014-09-30 | 2014-09-30 | Connector test socket and connector testing device |
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| Publication Number | Publication Date |
|---|---|
| CN204129082U true CN204129082U (en) | 2015-01-28 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201420575741.8U Active CN204129082U (en) | 2014-09-30 | 2014-09-30 | Connector test socket and connector testing device |
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| CN (1) | CN204129082U (en) |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105527465A (en) * | 2014-09-30 | 2016-04-27 | 泰科电子(上海)有限公司 | Connector testing socket and connector testing device |
| CN112462111A (en) * | 2020-11-30 | 2021-03-09 | 强一半导体（苏州）有限公司 | Wedge block amplitude modulation probe card amplitude modulation structure and butt joint structure thereof |
| CN112462110A (en) * | 2020-11-30 | 2021-03-09 | 强一半导体（苏州）有限公司 | Wedge block amplitude modulation probe card amplitude modulation piece and butt joint structure thereof |
| CN112462112A (en) * | 2020-11-30 | 2021-03-09 | 强一半导体（苏州）有限公司 | Probe card wedge amplitude modulation method |
| CN112526179A (en) * | 2020-11-30 | 2021-03-19 | 强一半导体（苏州）有限公司 | Wedge block amplitude modulation probe card and main body thereof |
| CN113391242A (en) * | 2021-04-26 | 2021-09-14 | 厦门钛阳工贸有限公司 | Quick detection tool of connector terminal assembly location |
| CN113848422A (en) * | 2021-09-22 | 2021-12-28 | 中国商用飞机有限责任公司 | Cable conduction testing device |
| CN113917319A (en) * | 2021-12-06 | 2022-01-11 | 新恒汇电子股份有限公司 | Chip packaging switching test device and method |
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2014
- 2014-09-30 CN CN201420575741.8U patent/CN204129082U/en active Active
Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105527465A (en) * | 2014-09-30 | 2016-04-27 | 泰科电子(上海)有限公司 | Connector testing socket and connector testing device |
| CN105527465B (en) * | 2014-09-30 | 2020-03-20 | 泰科电子(上海)有限公司 | Connector test socket and connector test device |
| CN112462111A (en) * | 2020-11-30 | 2021-03-09 | 强一半导体（苏州）有限公司 | Wedge block amplitude modulation probe card amplitude modulation structure and butt joint structure thereof |
| CN112462110A (en) * | 2020-11-30 | 2021-03-09 | 强一半导体（苏州）有限公司 | Wedge block amplitude modulation probe card amplitude modulation piece and butt joint structure thereof |
| CN112462112A (en) * | 2020-11-30 | 2021-03-09 | 强一半导体（苏州）有限公司 | Probe card wedge amplitude modulation method |
| CN112526179A (en) * | 2020-11-30 | 2021-03-19 | 强一半导体（苏州）有限公司 | Wedge block amplitude modulation probe card and main body thereof |
| CN112526179B (en) * | 2020-11-30 | 2022-01-21 | 强一半导体（苏州）有限公司 | Wedge block amplitude modulation probe card and main body thereof |
| CN112462112B (en) * | 2020-11-30 | 2022-04-08 | 强一半导体（苏州）有限公司 | Probe card wedge amplitude modulation method |
| CN113391242A (en) * | 2021-04-26 | 2021-09-14 | 厦门钛阳工贸有限公司 | Quick detection tool of connector terminal assembly location |
| CN113848422A (en) * | 2021-09-22 | 2021-12-28 | 中国商用飞机有限责任公司 | Cable conduction testing device |
| CN113917319A (en) * | 2021-12-06 | 2022-01-11 | 新恒汇电子股份有限公司 | Chip packaging switching test device and method |
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| Date | Code | Title | Description |
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| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |