CN204065152U - Quartz crystal test jack - Google Patents
Quartz crystal test jack Download PDFInfo
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- CN204065152U CN204065152U CN201420435698.5U CN201420435698U CN204065152U CN 204065152 U CN204065152 U CN 204065152U CN 201420435698 U CN201420435698 U CN 201420435698U CN 204065152 U CN204065152 U CN 204065152U
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- quartz crystal
- base
- gland
- elastic
- test jack
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Abstract
The utility model relates to a kind of quartz crystal test jack, it is characterized in that comprising base 1, gland 2, elastic probe 3, positive stop 4, buckle 5, wherein positive stop 4 is located on base 1, one end of gland 2 is connected with base 1, and the other end of gland 2 is provided with buckle 5, and the bottom of elastic probe 3 is exposed to the bottom of base 1.Advantage of the present utility model: 1) quartz crystal and probe remain Elastic Contact, ensure that the electrical connection reliability in temperature variation and vibration environment; 2) easy to operate to socket, reliability is high; Good electrical connection reliability, thus optimize the test process of quartz crystal.
Description
Technical field
The utility model relates to a kind of quartz crystal test jack, for optimizing the test process of quartz crystal.
Background technology
Quartz crystal belongs to high precision electro sub-element, and in the test process of quartz crystal, the loose contact of test fixture and quartz crystal can cause the serious distortion of test result.Particularly in temperature characteristic test frequently, test fixture will keep good electrical contact with quartz crystal in high temperature and low temperature environment, has higher requirement to test fixture.Traditional temperature characteristic test frequently frock normally arranges stopper slot on substrate, has the protruding hard contact carrying out being electrically connected with quartz crystal, crystal is put into stopper slot respectively, then compresses elastic pressuring plate in stopper slot.Such mounting means there will be following fault usually: 1) elastic pressuring plate is one-piece construction, and the situation that build-up of pressure is uneven because of misoperation sometimes, causes part quartz crystal and hard contact loose contact; 2) elastic pressuring plate can cause the distortion of local in long-term use unavoidably and affect effect of exerting pressure; 4) physical dimension of quartz crystal is more and more less, also more and more difficult with coordinating of stopper slot and hard contact, usually there will be quartz crystal and is tilted in situation in stopper slot, have impact on operating efficiency greatly in operation.Above situation all has to be solved in the production of quartz crystal.
Summary of the invention
The utility model proposes a kind of quartz crystal test jack, its object is intended to the above-mentioned defect overcome existing for prior art, has good electrical connection reliability.
Technical solution of the present utility model: quartz crystal test jack, its structure comprises base, gland, elastic probe, positive stop, buckle, wherein positive stop is located on base, one end of gland is connected with base, and the other end of gland is provided with buckle, and the bottom of elastic probe is exposed to the bottom of base.
Advantage of the present utility model: 1) quartz crystal and probe remain Elastic Contact, ensure that the electrical connection reliability in temperature variation and vibration environment; 2) easy to operate to socket, reliability is high.
Accompanying drawing explanation
Fig. 1 be quartz crystal test jack open schematic diagram.
Fig. 2 is the fastening schematic diagram of quartz crystal test jack.
In figure 1 is base, and 2 is glands, and 3 is elastic probes, and 4 is positive stops, and 5 is buckles, and 6 is bulge-structures.
Embodiment
Contrast accompanying drawing, quartz crystal test jack, its structure comprises base 1, gland 2, elastic probe 3, positive stop 4, buckle 5, wherein positive stop 4, elastic probe 3 are located on base 1, and one end of gland 2 is connected with base 1, the other end of gland 2 is provided with buckle 5, and the bottom of elastic probe 3 is exposed to the bottom of base 2.
The spacing of bulge-structure 6 and base 1 is the Elastic Contact distance of elastic probe 3 and quarts crystal electrode.
Bulge-structure 6 is the just right positions of gland 2 and quartz crystal.
Embodiment
Base is provided with positive stop and elastic probe, and the position of postive stop baffle accurately fidelity quartz crystal, the position of elastic probe is corresponding with the electrode of quartz crystal.One end of gland and base carry out chain connection, and the other end is provided with buckle, and when gland is pressed, buckle will snap together with base.The just right position of gland and quartz crystal is provided with has given prominence to structure, for promoting the quality of balance of exerting pressure to quartz crystal.The distance of protruding access node structure and base makes elastic probe and quarts crystal electrode carry out Elastic Contact just.
Claims (3)
1. quartz crystal test jack, is characterized in that comprising base, gland, elastic probe, positive stop, buckle, wherein positive stop is located on base, one end of gland is connected with base, and the other end of gland is provided with buckle, and the bottom of elastic probe is exposed to the bottom of base.
2. quartz crystal test jack according to claim 1, is characterized in that the Elastic Contact distance of described elastic probe and quarts crystal electrode is the spacing of bulge-structure and base.
3. quartz crystal test jack according to claim 2, is characterized in that described bulge-structure is the just right position of gland and quartz crystal.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420435698.5U CN204065152U (en) | 2014-08-04 | 2014-08-04 | Quartz crystal test jack |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420435698.5U CN204065152U (en) | 2014-08-04 | 2014-08-04 | Quartz crystal test jack |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN204065152U true CN204065152U (en) | 2014-12-31 |
Family
ID=52206636
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201420435698.5U Active CN204065152U (en) | 2014-08-04 | 2014-08-04 | Quartz crystal test jack |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN204065152U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105067847A (en) * | 2015-08-10 | 2015-11-18 | 苏州赛腾精密电子股份有限公司 | Flip-type probe module |
-
2014
- 2014-08-04 CN CN201420435698.5U patent/CN204065152U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105067847A (en) * | 2015-08-10 | 2015-11-18 | 苏州赛腾精密电子股份有限公司 | Flip-type probe module |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |