CN203949986U - Electronic component detection device and jig thereof - Google Patents
Electronic component detection device and jig thereof Download PDFInfo
- Publication number
- CN203949986U CN203949986U CN201420350320.5U CN201420350320U CN203949986U CN 203949986 U CN203949986 U CN 203949986U CN 201420350320 U CN201420350320 U CN 201420350320U CN 203949986 U CN203949986 U CN 203949986U
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- Prior art keywords
- circuit board
- testing circuit
- insulating body
- probe
- perforation
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- Expired - Fee Related
Links
- 238000001514 detection method Methods 0.000 title abstract 3
- 238000012360 testing method Methods 0.000 claims abstract description 88
- 239000000523 sample Substances 0.000 claims abstract description 82
- 238000009434 installation Methods 0.000 claims description 8
- 230000000712 assembly Effects 0.000 claims description 7
- 238000000429 assembly Methods 0.000 claims description 7
- 238000003466 welding Methods 0.000 abstract description 8
- 230000000149 penetrating effect Effects 0.000 abstract 1
- PRPINYUDVPFIRX-UHFFFAOYSA-N 1-naphthaleneacetic acid Chemical compound C1=CC=C2C(CC(=O)O)=CC=CC2=C1 PRPINYUDVPFIRX-UHFFFAOYSA-N 0.000 description 6
- 238000000034 method Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000012774 insulation material Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 229920003023 plastic Polymers 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The electronic element detection device is suitable for electrical test of an electronic element to be detected, the electronic element to be detected is provided with a plurality of conductive contact parts, the electronic element detection device comprises a test circuit board and a jig, the test circuit board is provided with a plurality of welding parts, the jig comprises an insulating body, a plurality of probes and a locking assembly, the insulating body is provided with a containing groove for containing the electronic element to be detected and a plurality of through holes communicated with the containing groove, each probe can be movably arranged in the corresponding through hole in a penetrating mode, the bottom end of each probe is welded on the corresponding welding part, the top end of each probe is abutted against the corresponding conductive contact part, each probe is electrically connected between the corresponding welding part and the corresponding conductive contact part, and the locking assembly detachably locks the insulating body on the test circuit board.
Description
Technical field
The utility model relates to a kind of Electron YuanJianJianCeZhuangZhi and tool thereof, particularly relates to a kind of in order to measured electronic elements is carried out to Electron YuanJianJianCeZhuangZhi and the tool thereof of testing electrical property.
Background technology
At present for example for an electronic component of package assembling is normally electrically connected on a testing circuit board by a test jack, so that electronic component is carried out to testing electrical property.Test jack comprises an insulating body conventionally, and many elastic probes, insulating body is formed with multiple perforation, and each probe wears and is fixed in corresponding perforation, each probe bottom is inserted in the welding hole of a correspondence of testing circuit board, and each probe bottom is welded in corresponding welding hole.
In the time that electronic component is inserted in the insulating body of test jack, each conductive connecting pin of electronic component can be contacted with corresponding tips of probes, and now, electronic component is electrically connected on testing circuit board by probe.Electronic component can be electrically connected to testing circuit board via the probe of test jack, so that electronic component is carried out to testing electrical property.
Because each probe is wear and be fixed in corresponding perforation, therefore, each probe cannot be separated separately insulating body.When insulating body distortion and cause electronic component to plant, or probe damages and cannot electrically conduct time, just whole test jack must be separated to testing circuit board to change, and easily causes the increase of use cost.Moreover, each probe is also very difficult and inconvenient by the operation of tip-off on testing circuit board, therefore existing test jack still has the space of further improvement.
Summary of the invention
Fundamental purpose of the present utility model, is to provide a kind of Electron YuanJianJianCeZhuangZhi, and the insulating body of tool and probe all can be separated separately the operation of testing circuit board to change, and whereby, can effectively reduce use cost.
The purpose of this utility model and solution background technology problem realize by the following technical solutions, according to the Electron YuanJianJianCeZhuangZhi the utility model proposes, be applicable to the testing electrical property of a measured electronic elements, this measured electronic elements has multiple electrically conducting contacts.
This Electron YuanJianJianCeZhuangZhi comprises a testing circuit board and a tool, this testing circuit board is formed with multiple weld parts, this tool comprises an insulating body, many probes, and at least one interlocking assembly, this insulating body, be arranged on this testing circuit board, this insulating body is formed with uses the storage tank accommodating for this measured electronic elements, and multiple perforations that are connected with this storage tank, respectively this probe can move apart and be arranged in this corresponding perforation, respectively this probe bottom is welded in this corresponding weld part, respectively this tips of probes is connected to this corresponding electrically conducting contact, each this probe is electrically connected between this corresponding weld part and corresponding this electrically conducting contact, this interlocking assembly is removably locked in this insulating body on this testing circuit board.
Respectively this probe has an external diameter, and respectively this perforation has an aperture that is greater than this external diameter.
This testing circuit board is formed with two perforation, this insulating body is formed with two through holes that are connected with two perforation respectively, this tool comprises two interlocking assemblies, respectively this interlocking assembly comprises a bolt and a nut, respectively this bolt of this interlocking assembly is arranged in this corresponding through hole and this corresponding perforation, and this bolt is screwed onto this nut that is connected to this testing circuit board one side.
The purpose of this utility model and solution background technology problem realize by the following technical solutions, according to the Electron YuanJianJianCeZhuangZhi the utility model proposes, be applicable to the testing electrical property of multiple measured electronic elements, respectively this measured electronic elements has multiple electrically conducting contacts.
This Electron YuanJianJianCeZhuangZhi comprises a testing circuit board and a tool, this testing circuit board is formed with multiple weld parts, this tool comprises an insulating body, many probes, and at least one interlocking assembly, this insulating body is arranged on this testing circuit board, this insulating body is formed with multiple storage tanks accommodating for described measured electronic elements of using respectively, and multiple installation units, respectively this installation unit comprises the perforation that this multiple with corresponding storage tank is connected, respectively this probe can move apart and be arranged in this corresponding perforation, respectively this probe bottom is welded in this corresponding weld part, respectively this tips of probes is connected to this corresponding electrically conducting contact, each this probe is electrically connected between this corresponding weld part and corresponding this electrically conducting contact, this interlocking assembly is removably locked in this insulating body on this testing circuit board.
Respectively this probe has an external diameter, and respectively this perforation has an aperture that is greater than this external diameter.
This testing circuit board is formed with two perforation, this insulating body is formed with two through holes that are connected with two perforation respectively, this tool comprises two interlocking assemblies, respectively this interlocking assembly comprises a bolt and a nut, respectively this bolt of this interlocking assembly is arranged in this corresponding through hole and this corresponding perforation, and this bolt is screwed onto this nut that is connected to this testing circuit board one side.
Another object of the present utility model, is to provide a kind of tool, and its insulating body and probe all can be separated separately the operation of testing circuit board to change, and whereby, can effectively reduce use cost.
The purpose of this utility model and solution background technology problem realize by the following technical solutions, according to the tool the utility model proposes, be suitable for being arranged on a testing circuit board and can place for a measured electronic elements, this testing circuit board is formed with multiple weld parts, and this measured electronic elements is formed with multiple conductions and meets portion of place.
This tool comprises an insulating body, many probes, and at least one interlocking assembly, this insulating body is arranged on this testing circuit board, this insulating body is formed with uses the storage tank accommodating for this measured electronic elements, and multiple perforations that are connected with this storage tank, respectively this probe can move apart and be arranged in this corresponding perforation, respectively this probe bottom is welded in this corresponding weld part, respectively this tips of probes is connected to this corresponding electrically conducting contact, each this probe is electrically connected between this corresponding weld part and corresponding this electrically conducting contact, this interlocking assembly is removably locked in this insulating body on this testing circuit board.
Respectively this probe has an external diameter, and respectively this perforation has an aperture that is greater than this external diameter.
This testing circuit board is formed with two perforation, this insulating body is formed with two through holes that are connected with two perforation respectively, this tool comprises two interlocking assemblies, respectively this interlocking assembly comprises a bolt and a nut, respectively this bolt of this interlocking assembly is arranged in this corresponding through hole and this corresponding perforation, and this bolt is screwed onto this nut that is connected to this testing circuit board one side.
The beneficial effects of the utility model are: the insulating body of tool and probe all can be separated separately the operation of testing circuit board to change, therefore, in the time of insulating body and one of them damage of probe, can change separately the assembly of damage and not need to change whole tool, whereby, can effectively reduce use cost.Moreover, can conveniently and promptly carry out the tip-off operation between probe and testing circuit board, whereby, can promote the convenience of dismounting and shorten the man-hour of dismantling.
Brief description of the drawings
Fig. 1 is the stereographic map of a preferred embodiment of the utility model Electron YuanJianJianCeZhuangZhi, illustrates that tool is locked on testing circuit board, and each measured electronic elements is placed in corresponding storage tank;
Fig. 2 is the three-dimensional exploded view of a preferred embodiment of the utility model Electron YuanJianJianCeZhuangZhi, and the assembled relation between measured electronic elements, tool and testing circuit board is described;
Fig. 3 is the partial top view of the insulating body of a preferred embodiment of the utility model Electron YuanJianJianCeZhuangZhi, illustrates that the perforation of installation unit is connected with storage tank;
Fig. 4 is the cross-sectional schematic of a preferred embodiment of the utility model Electron YuanJianJianCeZhuangZhi, illustrates that each interlocking assembly is locked in insulating body on testing circuit board;
Fig. 5 is the cross-sectional schematic of a preferred embodiment of the utility model Electron YuanJianJianCeZhuangZhi, illustrate that each probe is arranged in corresponding perforation, and the protuberance of the sleeve bottom of each probe is arranged in corresponding weld part; And
Fig. 6 is the cross-sectional schematic of a preferred embodiment of the utility model Electron YuanJianJianCeZhuangZhi, illustrates that the upper contact element of each probe is connected to the corresponding electrically conducting contact of measured electronic elements.
Embodiment
Below in conjunction with drawings and Examples, the utility model is elaborated.
Consult Fig. 1 and Fig. 2, it is a preferred embodiment of the utility model Electron YuanJianJianCeZhuangZhi, this Electron YuanJianJianCeZhuangZhi 200 is applicable to the testing electrical property of multiple measured electronic elements 1, each measured electronic elements 1 can be the electronic component of package assembling or other class shapes, each measured electronic elements 1 has a body 11, and multiple electrically conducting contacts 12, body 11 has a bottom surface 111, described electrically conducting contact 12 is arranged at bottom surface 111 and spaced apart, and each electrically conducting contact 12 of the present embodiment is to explain as an example of metal gasket example.
Consult Fig. 2, Fig. 3 and Fig. 4, Electron YuanJianJianCeZhuangZhi 200 comprises a testing circuit board 2, and a tool 3.Testing circuit board 2 comprises a upper surface 21, and a lower surface 22, and testing circuit board 2 is formed with multiple weld parts 23, and two perforation 24.Each weld part 23 of the present embodiment is for always putting on the welding hole of surface 21 and lower surface 22.Two perforation 24 are positioned at described weld part 23 opposition sides, respectively bore a hole 24 to run through upper surface 21 and lower surface 22.
Tool 3 comprises an insulating body 31, many probes 32, and two interlocking assemblies 33.Insulating body 31 is that insulating body 31 is arranged on this testing circuit board 2 by for example made for the insulation material of plastics, the load bearing seat 311 that comprises a rectangular shape, and two projections 312 that are convexly set in respectively load bearing seat 311 minor faces.Load bearing seat 311 comprises an end face 313, an and bottom surface 314, the end face 313 of load bearing seat 311 is recessed to form multiple storage tanks 315, and described storage tank 315 is spaced along the length bearing of trend of load bearing seat 311, and described storage tank 315 is used respectively for described measured electronic elements 1 accommodating.
The bottom surface 314 of load bearing seat 311 is recessed to form multiple installation units 316, and each installation unit 316 comprises the perforation 317 that multiple with corresponding storage tank 315 is connected, and each perforation 317 has an aperture D1.Each projection 312 is formed with a through hole 318, and the through hole 318 of each projection 312 is connected with the corresponding perforation 24 of testing circuit board 2.
Consult Fig. 4 and Fig. 5, each probe 32 comprises the upper contact element 322 that a sleeve 321, that is hollow form is arranged in sleeve 321 and protrudes out sleeve 321 tops, and a spring 323 being arranged in sleeve 321.Sleeve 321, upper contact element 322 and spring 323 are all made by metal material.Spring 323 is the Compress Spring that Shang Xia, two ends are connected to respectively contact element 322 and sleeve 321.The sleeve 321 of each probe 32 has an outer diameter D 2, and the aperture D1 of each perforation 317 is greater than the outer diameter D 2 of sleeve 321, whereby, each probe 32 can be moved apart and be arranged in corresponding perforation 317.The upper contact element 322 of each probe 32 is in order to be connected to the corresponding electrically conducting contact 12 of measured electronic elements 1, the sleeve 321 of each probe 32 is in order to be welded in corresponding weld part 23, whereby, each probe 32 can be electrically connected between corresponding weld part 23 and corresponding electrically conducting contact 12.
Consult Fig. 2, Fig. 4 and Fig. 5, each interlocking assembly 33 is removably locked in insulating body 31 on testing circuit board 2.Each interlocking assembly 33 comprises a bolt 331 and a nut 332, the bolt 331 of each interlocking assembly 33 is in order to be arranged in corresponding through hole 318 and corresponding perforation 24, and bolt 331 is screwed onto the nut 332 of the lower surface 22 that is connected to testing circuit board 2, whereby, insulating body 31 can be locked on testing circuit board 2.
Consult Fig. 2, Fig. 4, Fig. 5 and Fig. 6, when wish is carried out testing electrical property to each measured electronic elements 1, first, the two through hole of insulating body 31 318 is alignd with two perforation 24 of testing circuit board 2 respectively, afterwards, insulating body 31 is placed in to the upper surface 21 of testing circuit board 2.Then, the bolt of each interlocking assembly 33 331 is arranged in to corresponding through hole 318 and corresponding perforation 24, bolt 331 is screwed onto be connected to the nut 332 of the lower surface 22 of testing circuit board 2, now, each interlocking assembly 33 is locked in insulating body 31 on testing circuit board 2, and each perforation 317 of insulating body 31 is connected with corresponding weld part 23.
Then, each probe 32 is arranged in corresponding perforation 317 via corresponding storage tank 315, in the time that sleeve 321 bottoms of each probe 32 are connected to the upper surface 21 of testing circuit board 2, probe 32 just cannot continue to move down, now, one protuberance 324 of sleeve 321 bottoms of each probe 32 can be arranged in corresponding weld part 23, and upper contact element 322 stretches through to storage tank 315.Subsequently, by for example welding manner for spot welding, the protuberance of the sleeve of each probe 32 321 324 is welded in corresponding weld part 23, each probe 32 can be electrically connected with testing circuit board 2.
Finally, sequentially described measured electronic elements 1 is positioned over respectively in the described storage tank 315 of insulating body 31, makes each electrically conducting contact 12 of each measured electronic elements 1 be connected to upper contact element 322 tops of corresponding probe 32.Subsequently, press down past the body of each measured electronic elements 1 11 along arrow I direction, in body 11 and electrically conducting contact 12 folding processes, can drive upper contact element 322 to move down, when moving down, upper contact element 322 can make its distortion by Compress Spring 323, whereby, make contact element 322 closely be contacted with corresponding electrically conducting contact 12, to guarantee can keep good contact condition between the two.Now, can carry out testing electrical property to each measured electronic elements 1.
In the time of insulating body 31 deformed damaged of tool 3, each bolt 331 is unscrewed and separated with the nut 332 being screwed together, then, by up lifting one segment distance of insulating body 31, when after corresponding perforation 317 separation of each probe 32 and insulating body 31, just can carry out the replacing operation of insulating body 31.On the other hand, in the time that probe 32 damages and loses the function electrically conducting, can first insulating body 31 be separated to testing circuit board 2 according to aforementioned manner, subsequently, then the operation of tip-off will be carried out between the probe of damage 32 and testing circuit board 2, owing to can not being subject to stopping and hindering of insulating body 31 in tip-off process completely, therefore, can conveniently and promptly carry out tip-off operation, whereby, can promote the convenience of dismounting and shorten the man-hour of dismantling.
Because insulating body 31 and the probe 32 of tool 3 all can be separated separately the operation of testing circuit board 2 to change, therefore,, when one of them damages when insulating body 31 and probe 32, can change separately the assembly of damage and do not need to change whole tool 3, whereby, can effectively reduce use cost.
It should be noted that, in other embodiment, storage tank 315 quantity of insulating body 31, installation unit 316 quantity, through hole 318 quantity, and interlocking assembly 33 quantity also can be respectively one, are not limited with the disclosed quantity of the present embodiment.
Conclude above-mentioned, the Electron YuanJianJianCeZhuangZhi 200 of the present embodiment, because insulating body 31 and the probe 32 of tool 3 all can be separated separately the operation of testing circuit board 2 to change, therefore, in the time of insulating body 31 and probe 32 one of them damage, can change separately the assembly of damage and not need to change whole tool 3, whereby, can effectively reduce use cost.Moreover, can conveniently and promptly carry out the tip-off operation between probe 32 and testing circuit board 2, whereby, can promote the convenience of dismounting and shorten the man-hour of dismantling, really can reach the object of the utility model institute demand.
Claims (9)
1. an Electron YuanJianJianCeZhuangZhi, is applicable to the testing electrical property of a measured electronic elements, and this measured electronic elements has multiple electrically conducting contacts; It is characterized in that:
This Electron YuanJianJianCeZhuangZhi comprises a testing circuit board and a tool, this testing circuit board is formed with multiple weld parts, this tool comprises an insulating body, many probes, and at least one interlocking assembly, this insulating body, be arranged on this testing circuit board, this insulating body is formed with uses the storage tank accommodating for this measured electronic elements, and multiple perforations that are connected with this storage tank, respectively this probe can move apart and be arranged in this corresponding perforation, respectively this probe bottom is welded in this corresponding weld part, respectively this tips of probes is connected to this corresponding electrically conducting contact, each this probe is electrically connected between this corresponding weld part and corresponding this electrically conducting contact, this interlocking assembly is removably locked in this insulating body on this testing circuit board.
2. Electron YuanJianJianCeZhuangZhi according to claim 1, is characterized in that: respectively this probe has an external diameter, and respectively this perforation has an aperture that is greater than this external diameter.
3. Electron YuanJianJianCeZhuangZhi according to claim 1 and 2, it is characterized in that: this testing circuit board is formed with two perforation, this insulating body is formed with two through holes that are connected with two perforation respectively, this tool comprises two interlocking assemblies, respectively this interlocking assembly comprises a bolt and a nut, respectively this bolt of this interlocking assembly is arranged in this corresponding through hole and this corresponding perforation, and this bolt is screwed onto this nut that is connected to this testing circuit board one side.
4. an Electron YuanJianJianCeZhuangZhi, is applicable to the testing electrical property of multiple measured electronic elements, and respectively this measured electronic elements has multiple electrically conducting contacts; It is characterized in that:
This Electron YuanJianJianCeZhuangZhi comprises a testing circuit board and a tool, this testing circuit board is formed with multiple weld parts, this tool comprises an insulating body, many probes, and at least one interlocking assembly, this insulating body is arranged on this testing circuit board, this insulating body is formed with multiple storage tanks accommodating for described measured electronic elements of using respectively, and multiple installation units, respectively this installation unit comprises the perforation that this multiple with corresponding storage tank is connected, respectively this probe can move apart and be arranged in this corresponding perforation, respectively this probe bottom is welded in this corresponding weld part, respectively this tips of probes is connected to this corresponding electrically conducting contact, each this probe is electrically connected between this corresponding weld part and corresponding this electrically conducting contact, this interlocking assembly is removably locked in this insulating body on this testing circuit board.
5. Electron YuanJianJianCeZhuangZhi according to claim 4, is characterized in that: respectively this probe has an external diameter, and respectively this perforation has an aperture that is greater than this external diameter.
6. according to the Electron YuanJianJianCeZhuangZhi described in claim 4 or 5, it is characterized in that: this testing circuit board is formed with two perforation, this insulating body is formed with two through holes that are connected with two perforation respectively, this tool comprises two interlocking assemblies, respectively this interlocking assembly comprises a bolt and a nut, respectively this bolt of this interlocking assembly is arranged in this corresponding through hole and this corresponding perforation, and this bolt is screwed onto this nut that is connected to this testing circuit board one side.
7. a tool, is suitable for being arranged on a testing circuit board and can places for a measured electronic elements, and this testing circuit board is formed with multiple weld parts, and this measured electronic elements is formed with multiple conductions and meets portion of place; It is characterized in that:
This tool comprises an insulating body, many probes, and at least one interlocking assembly, this insulating body is arranged on this testing circuit board, this insulating body is formed with uses the storage tank accommodating for this measured electronic elements, and multiple perforations that are connected with this storage tank, respectively this probe can move apart and be arranged in this corresponding perforation, respectively this probe bottom is welded in this corresponding weld part, respectively this tips of probes is connected to this corresponding electrically conducting contact, each this probe is electrically connected between this corresponding weld part and corresponding this electrically conducting contact, this interlocking assembly is removably locked in this insulating body on this testing circuit board.
8. tool according to claim 7, is characterized in that: respectively this probe has an external diameter, and respectively this perforation has an aperture that is greater than this external diameter.
9. according to the tool described in claim 7 or 8, it is characterized in that: this testing circuit board is formed with two perforation, this insulating body is formed with two through holes that are connected with two perforation respectively, this tool comprises two interlocking assemblies, respectively this interlocking assembly comprises a bolt and a nut, respectively this bolt of this interlocking assembly is arranged in this corresponding through hole and this corresponding perforation, and this bolt is screwed onto this nut that is connected to this testing circuit board one side.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW103210275 | 2014-06-11 | ||
| TW103210275U TWM487436U (en) | 2014-06-11 | 2014-06-11 | Electronic element testing device and fixture thereof |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203949986U true CN203949986U (en) | 2014-11-19 |
Family
ID=51892014
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201420350320.5U Expired - Fee Related CN203949986U (en) | 2014-06-11 | 2014-06-27 | Electronic component detection device and jig thereof |
Country Status (2)
| Country | Link |
|---|---|
| CN (1) | CN203949986U (en) |
| TW (1) | TWM487436U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110836985A (en) * | 2018-08-15 | 2020-02-25 | 万润科技股份有限公司 | Probe, probe module, probe device, and method and apparatus for inspecting electronic component using the probe device |
| CN113030705A (en) * | 2021-03-12 | 2021-06-25 | 深圳市雷铭科技发展有限公司 | Method, system and equipment for automatically testing circuit board |
| CN113370167A (en) * | 2021-07-06 | 2021-09-10 | 广东电网有限责任公司 | Tool box |
-
2014
- 2014-06-11 TW TW103210275U patent/TWM487436U/en not_active IP Right Cessation
- 2014-06-27 CN CN201420350320.5U patent/CN203949986U/en not_active Expired - Fee Related
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110836985A (en) * | 2018-08-15 | 2020-02-25 | 万润科技股份有限公司 | Probe, probe module, probe device, and method and apparatus for inspecting electronic component using the probe device |
| CN113030705A (en) * | 2021-03-12 | 2021-06-25 | 深圳市雷铭科技发展有限公司 | Method, system and equipment for automatically testing circuit board |
| CN113030705B (en) * | 2021-03-12 | 2023-12-01 | 深圳市雷铭科技发展有限公司 | Method, system and equipment for automatically testing circuit board |
| CN113370167A (en) * | 2021-07-06 | 2021-09-10 | 广东电网有限责任公司 | Tool box |
| CN113370167B (en) * | 2021-07-06 | 2023-01-24 | 广东电网有限责任公司 | Tool box |
Also Published As
| Publication number | Publication date |
|---|---|
| TWM487436U (en) | 2014-10-01 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20141119 Termination date: 20150627 |
|
| EXPY | Termination of patent right or utility model |