CN203881304U - Device for measuring deformation of diamond anvil cell under extreme high-temperature and high-pressure conditions - Google Patents
Device for measuring deformation of diamond anvil cell under extreme high-temperature and high-pressure conditions Download PDFInfo
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- CN203881304U CN203881304U CN201320830307.5U CN201320830307U CN203881304U CN 203881304 U CN203881304 U CN 203881304U CN 201320830307 U CN201320830307 U CN 201320830307U CN 203881304 U CN203881304 U CN 203881304U
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Abstract
The utility model relates to the field of non-contact measurement, and especially relates to a device for measuring the deformation of a diamond anvil cell under extreme high-temperature and high-pressure conditions. Aiming at the problems that there is currently no effective method for measuring the deformation of the diamond anvil cell under extreme high-temperature and high-pressure conditions and the in-situ precise measurement of the thickness of a sample under the condition of DAC loading cannot be achieved, the utility model provides the device for measuring the deformation of the diamond anvil cell under extreme high-temperature and high-pressure conditions. Specifically, the measurement is achieved through a probe light-transmitting optical path, a signal-receiving light path, and a signal processing computer. The probe light-transmitting optical path provides wide-and probe light, and the signal-receiving light path collects signal light returned from the front table surface of the diamond anvil cell, and reference light returning from the rear table surface of the diamond anvil cell. The frequency spectrum interference of the signal light with the reference light happens in an optical-fiber spectrometer of the signal-receiving light path. A frequency spectrum interference signal outputted by the optical-fiber spectrometer is processed by a computer, thereby obtaining the deformation of the diamond anvil cell under extreme high-temperature and high-pressure conditions.
Description
Technical field
The utility model relates to non-contact measurement field, especially relates to the device of measuring diamond anvil deformation under thermal extremes condition of high voltage.
Background technology
The invention of diamond press (DAC) is the important breakthrough of quiet High-Voltage Experimentation research field with application, also be the most general high pressure generating apparatus in current quiet high pressure research field, its produce UHV (ultra-high voltage) ability for people provide more profound understanding material under thermal extremes condition of high voltage physics, chemical property may.By DAC loading technique, people have carried out the research of phase transformation, state equation, intensity, the velocity of sound and the optical property of material under thermal extremes condition of high voltage, magnetic property, electrical properties etc.
Utilizing DAC to carry out during conductivity, the velocity of sound and pressure gradient method intensity etc. measures, the original position of thickness of sample is accurately measured most important, and the deformation meeting under high pressure of diamond anvil and packing has a strong impact on the accurate measurement of thickness of sample.If can obtain the deformation data of diamond anvil under high-temperature and high-pressure conditions, can carry out refine to the thickness of sample under high pressure, thereby improve experimental precision.To diamond anvil, deformation under high pressure mainly contains the methods such as finite element numerical simulation, X-ray transmission imaging and contact miking and assesses, finite element numerical simulation depends on the characterisitic parameter of set up model and diamond anvil and gasket material, X-ray transmission imaging method needs the synchrotron radiation light source of high brightness, while expending the synchrotron radiation machine of a large amount of preciousnesses, miking owned by France in contact type measurement, measuring accuracy is limited and cannot provide the pattern of pressing anvil facial disfigurement.In sum, there is no at present effective method diamond anvil is measured in the deformation under High Temperature High Pressure, be difficult to meet under DAC loading environment thickness of sample is carried out to the requirement that original position is accurately measured.
Utility model content
Technical problem to be solved in the utility model is: the problem existing for prior art, provides the device of measuring diamond anvil deformation under thermal extremes condition of high voltage.This device comprises surveys light transmitting light path, signal receiving light path and signal process computer; Described detection light transmitting light path provides broad band to survey light, and described signal receiving light path collects table top returns from diamond anvil flashlight and from the reference light that table top returns thereafter, two-beam, in the fiber spectrometer of signal receiving light path, frequency spectrum interference occurs; Process the frequency spectrum interference signal of fiber spectrometer output by computing machine, obtain the deformation of diamond anvil under thermal extremes condition of high voltage.
The technical solution adopted in the utility model is as follows:
A kind of device of measuring diamond anvil deformation under thermal extremes condition of high voltage comprises surveys light transmitting light path, signal receiving light path and signal process computer; Described detection light transmitting light path is connected by optical component with signal receiving light path, and the fiber spectrometer of signal receiving light path is connected by data line with computing machine.
Preferably, described detection light transmitting light path comprises:
Wideband light source 10 with tail optical fiber, for sending detection light;
Optical fiber circulator 11, the detection light of wideband light source 10 being inputted by optical fiber circulator 11 first ports, from optical fiber circulator 11 second port outputs;
Optical fiber collimator 13, for the detection light of optical fiber circulator 11 second port outputs being transformed into the collimated light of free space transmission, and is with the output of anti-reflection film one end by optical fiber collimator 13;
Microcobjective 6, focuses on the front table top of diamond anvil 7 for the collimated light that optical fiber collimator 13 is exported; Wherein said wideband light source 10 is connected with optical fiber circulator 11 first port opticals, and optical fiber circulator 11 second ports are connected by the first optical patchcord 12 with optical fiber collimator 13;
Preferably, described signal receiving light path comprises:
Microcobjective 6, for collecting the reference light that table top returns from diamond anvil 7 and the flashlight that table top returns from it;
Optical fiber collimator 13, is coupled into optical fiber for reference light and flashlight that microcobjective 6 is collected, and is with the output of tail optical fiber one end by optical fiber collimator 13;
Optical fiber circulator 11, is connected the second port of optical fiber circulator 11 with the tail optical fiber of optical fiber collimator 13, the reference light of collecting and flashlight are exported from optical fiber circulator 11 the 3rd port;
Fiber spectrometer 15, is connected with the 3rd port of optical fiber circulator 11 by the second optical patchcord 14, for receiving reference light and the flashlight of optical fiber circulator 11 the 3rd port output, and records the frequency spectrum interference signal that reference light and flashlight occur in spectrum domain;
Signal process computer 16, the frequency spectrum interference signal that fiber spectrometer 15 is exported is processed, and obtains the deformation of diamond anvil 7 under thermal extremes condition of high voltage.
Preferably, described wideband light source 10 is that centre wavelength is the broad spectrum light source of 1550nm, and line width is not less than common spontaneous radiation (ASE) light source that 30nm or line width are not less than 30nm, and power is not less than 30mW.
Preferably, described microcobjective 6 operating distances are greater than 20mm, and enlargement factor is not less than 10 times;
Preferably, the resolution of described fiber spectrometer 15 is higher than 20pm, and available general spectrometer replaces.
Preferably, the device of measuring diamond anvil deformation under thermal extremes condition of high voltage also comprises auxiliary imaging optical path, for the auxiliary adjusting of surveying light transmitting light path and signal receiving light path, and the measuring position of monitoring diamond anvil 7 deformation.
Preferably, described auxiliary imaging optical path comprises lighting source 1, aperture 2, first lens 3, the first broadband spectroscope 4, the second broadband spectroscope 5, the second lens 8, feldspar mineral 9; By regulating the relative position of aperture 2, first lens 3, make the light that described lighting source 1 sends form parallel beam after small holes 2, first lens 3, then after the first broadband spectroscope 4, the second broadband spectroscope 5, focused on the front table top of diamond anvil 7 by microcobjective 6; Focal position images in feldspar mineral 9 after microcobjective 6, the second broadband spectroscope 5, the first broadband spectroscope 4, the second lens 8, the picture by feldspar mineral 9 complete observation to diamond anvil 7 front table tops; Wherein said the second broadband spectroscope 5 is positioned between microcobjective 6 and optical fiber collimator 13, and the second broadband spectroscope 5 is for the position of auxiliary adjustment optical fiber collimator 13; Between described the first broadband spectroscope 4 and the second broadband spectroscope 5, distance is not less than 10cm, and the first broadband spectroscope 4 and the second broadband spectroscope 5 medium light splitting faces are parallel to each other; The first broadband spectroscope 4 and the second broadband spectroscope 5, first lens 3, aperture 2 common optical axis, the logical optical surface of the first broadband spectroscope 4 is vertical with this optical axis; The second broadband spectroscope 5 and optical fiber collimator 13, microcobjective 6 common optical axis, the logical optical surface of the second broadband spectroscope 5 is vertical with this optical axis; The first broadband spectroscope 4 and the second lens 8, feldspar mineral 9 common optical axis, and this optical axis is perpendicular to the logical optical surface of the first broadband spectroscope 4.
In sum, owing to having adopted technique scheme, the beneficial effects of the utility model are:
1) measure the device of diamond anvil deformation under thermal extremes condition of high voltage, by surveying light transmitting light path, signal receiving light path is built simple light path and obtained desired signal.Wherein survey light transmitting light path and signal receiving light path some device wherein and share, can effectively reduce the device of this device, improve the stability of system.
2) receive and process by signal process computer 16 the frequency spectrum interference signal that fiber spectrometer 15 is exported, calculate the one-tenth-value thickness 1/10 of diamond anvil 7 at each point place, and then analysis obtains the deformation of diamond anvil 7 under high-temperature and high-pressure conditions.
3) through this device of experimental verification repeatedly can measure diamond anvil 7 under high-temperature and high-pressure conditions sub-micron to the deformation in hundreds of micrometer range, break through the limitation of existing measurement mechanism, possess DAC is loaded to the ability that lower sample in-situ thickness carries out refine, improve the measuring accuracy of the experiments such as resistivity measurement, pressure gradient method ionization meter and laser-ultrasound measurement.
4) possess through this device of experimental verification repeatedly the ability of measuring diamond anvil 7 diamond anvil 7 table top patterns under thermal extremes condition of high voltage, thereby can original position obtain the pattern of sample under High Temperature High Pressure.
5) this measurement mechanism adopts conventional optical component to form, and is easy to debugging and operation, has larger application and promotional value.Set forth from technical scheme, reference light in this device and flashlight are respectively from the forward and backward table top of diamond anvil 7, and pass through identical path transmission to fiber spectrometer 15, it is a kind of typical common optical axis formula structure, this structure contributes to avoid the factors such as environmental temperature fluctuation, air turbulence, mechanical shock to the impact of measuring, and antijamming capability is strong.
Brief description of the drawings
The utility model will illustrate by example and with reference to the mode of accompanying drawing, wherein:
Fig. 1 is the structural representation of the utility model device.
Fig. 2 is the schematic diagram that in the utility model, reference light and flashlight produce.
Reference numeral: after 1-lighting source 2-aperture 3-first lens 4-first broadband spectroscope 5-second broadband spectroscope 6-microcobjective 7-diamond anvil 8-second lens 9-feldspar mineral (CCD) 10-wideband light source 11-optical fiber circulator 12-first optical patchcord 13-optical fiber collimator 14-the second optical patchcord 15-fiber spectrometer 16-signal process computer 17-T301 stainless steel packing 18-diamond anvil, before table top 19. diamond anvils, light 21-reference light 22-flashlight is surveyed in table top 20-incident broadband.
Embodiment
Disclosed all features in this instructions, or step in disclosed all methods or process, except mutually exclusive feature and/or step, all can combine by any way.
Disclosed arbitrary feature in this instructions (comprising any accessory claim, summary and accompanying drawing), unless narration especially all can be replaced by other equivalences or the alternative features with similar object.,, unless narration especially, each feature is an example in a series of equivalences or similar characteristics.
One, the utility model related description:
1, thermal extremes condition of high voltage refers to pressure and is greater than standard atmospheric pressure, a temperature and is greater than room temperature.In quiet high pressure research field, general high voltage refers to 0GPa can reach 500GPa at present to hundreds of GPa(), high temperature refers to room temperature to several thousand degree (can reach at present 6000 degree).
2, as shown in Figure 2, two diamond anvils and T301 stainless steel packing adopt the assembling of " sandwich " formula, pushs diamond anvil and produce high pressure, by Resistant heating or LASER HEATING acquisition high temperature by special device.The utility model is under the condition all existing in High Temperature High Pressure, and the deformation of diamond anvil is measured in real time.Before diamond anvil, table top (diamond anvil culet) refers to face (the return signal light 22) (see figure 2) that diamond anvil directly contacts with T301 stainless steel packing.Table top after diamond anvil (diamond anvil back facet) refers to another face (referring back to the light 21) (see figure 2) that is parallel to front table top.
3, the course of work:
Survey the 11,13,6, the 7th in light transmitting light path, signal receiving light path, share, just optical transmission direction difference.
31), in the utility model device, the light path trend while not comprising auxiliary imaging optical path is: (in conjunction with Fig. 1,2)
311): from wideband light source 10, be followed successively by wideband light source 10, optical fiber circulator 11, optical fiber collimator 13, microcobjective 6, diamond anvil 7, produce incident broadband and survey light 20;
312): light 20 is surveyed in incident broadband, what from diamond anvil 7, table top returned is flashlight 22, what from diamond anvil 7, table top returned is reference light 21, and this two-beam is successively by microcobjective 6, optical fiber collimator 13, optical fiber circulator 11 and fiber spectrometer 15; When wherein reference light and flashlight are by fiber spectrometer 15, there is frequency spectrum interference, and record frequency spectrum interference signal by fiber spectrometer 15, the frequency spectrum interference signal of fiber spectrometer 15 being exported by signal process computer 16 carries out signal processing, obtain the one-tenth-value thickness 1/10 of diamond anvil 7 under high-temperature and high-pressure conditions, and then analysis obtains deformation and the table top pattern of diamond anvil 7 under High Temperature High Pressure.
32), in the utility model device, the light path trend while comprising auxiliary imaging optical path is: (in conjunction with Fig. 1,2):
321): lighting source 1 emissive lighting light, after small holes 2, first lens 3, the first broadband spectroscope 4, the second broadband spectroscope 5, microcobjective 6, throws light on to the front table top of diamond anvil 7 successively;
22): the illuminated front table top of diamond anvil 7, successively by microcobjective 6, the second broadband spectroscope 5, the first broadband spectroscope 4, the second lens 8, image in feldspar mineral 9.
4, the position relationship of the first broadband spectroscope 4 and the second broadband spectroscope 5: between the first broadband spectroscope 4 and the second broadband spectroscope 5, distance is not less than 10cm, the first broadband spectroscope 4 and the second broadband spectroscope 5 medium light splitting faces are parallel to each other; The first broadband spectroscope 4 and the second broadband spectroscope 5, first lens 3, aperture 2 common optical axis, the logical optical surface of the first broadband spectroscope 4 is vertical with this optical axis; The second broadband spectroscope 5 and optical fiber collimator 13, microcobjective 6 common optical axis, the logical optical surface of the second broadband spectroscope 5 is vertical with this optical axis; The first broadband spectroscope 4 and the second lens 8, also common optical axis of feldspar mineral 9, and this optical axis is perpendicular to the logical optical surface of the first broadband spectroscope 4.
5, microcobjective 6 operating distances are greater than 20mm, and enlargement factor is not less than 10 times; Wideband light source 10 can be common spontaneous radiation (ASE) light source, and line width General Requirements is greater than 30nm, and spectrum is more smooth, and power is not less than 30mW.
Embodiment mono-:
The device implementation step of this measurement diamond anvil deformation under thermal extremes high pressure:
The first step, opens lighting source 1, regulates the relative position of aperture 2, first lens 3 and lighting source 1, and the illumination light that makes outgoing is directional light;
Second step, regulate position and the attitude of the first broadband spectroscope 4, the second broadband spectroscope 5, make the illumination light of outgoing be parallel to optical table, place an alternative plane mirror in the position of diamond anvil 7, and make it reflecting surface perpendicular to optical axis, utilize the LAL 8 and the feldspar mineral 9 that reflect back from width spectroscope 4;
The 3rd step, adds microcobjective 6, by imaging in feldspar mineral 9, regulates the attitude of microcobjective 6;
The 4th step, optical fiber circulator 11 first ports are connected with the tail optical fiber of wideband light source 10, optical fiber circulator 11 second ports are connected by the first optical patchcord 12 with optical fiber collimator 13, and optical fiber circulator 11 the 3rd port is connected by the second optical patchcord 14 with fiber spectrometer 15;
The 5th step, utilizes replaced catoptron to reflect, regulated by the illumination light of the second broadband spectroscope 5 transmissions the attitude of optical fiber collimator 13; Open wideband light source 10, the attitude of fine setting optical fiber collimator 13, makes to be not less than 0.5% of wideband light source 10 emergent powers from the detection of optical power of optical fiber circulator 11 the 3rd port outgoing;
The 6th step, opens fiber spectrometer 15, carries out suitable parameter setting; Add diamond anvil 7, front and back fine adjustment diamond stone is pressed the position of anvil 7, make can clearly observe by feldspar mineral 9 picture of diamond anvil 7 front table tops, and the contrast of the frequency spectrum interference signal obtaining by fiber spectrometer 15 is not less than 0.1;
The 7th step, calculates the thickness of diamond anvil 7 under High Temperature High Pressure by signal process computer 16, and further obtains the deformation of diamond anvil 7 under High Temperature High Pressure;
The 8th step, as need obtain the pattern of diamond anvil 7 table tops under High Temperature High Pressure, need along moving diamond anvil 7 perpendicular to optical axis direction, gather successively experimental data and repeat the 7th step, can obtain diamond anvil 7 in thickness distribution radially, thereby obtain the pattern of diamond anvil 7 table tops under High Temperature High Pressure.
The utility model is not limited to aforesaid embodiment.The utility model can expand to any new feature or any new combination disclosing in this manual, and the arbitrary new method disclosing or step or any new combination of process.
Claims (8)
1. measure a device for diamond anvil deformation under thermal extremes condition of high voltage, it is characterized in that comprising that surveying light launches light path, signal receiving light path and signal process computer; Described detection light transmitting light path is connected by optical component with signal receiving light path, and the fiber spectrometer in signal receiving light path is connected by data line with signal process computer.
2. the device of measurement diamond anvil according to claim 1 deformation under thermal extremes condition of high voltage, is characterized in that described detection light transmitting light path comprises:
With the wideband light source of tail optical fiber, for sending detection light;
Optical fiber circulator,, exports from optical fiber circulator the second port the detection light of wideband light source input by optical fiber circulator the first port;
Optical fiber collimator, for the detection light of optical fiber circulator the second port output is transformed into the collimated light of free space transmission, and exports by optical fiber collimator band anti-reflection film one end;
Microcobjective, for focusing on the collimated light of optical fiber collimator output table top before diamond anvil;
Wherein said wideband light source is connected with optical fiber circulator the first port, and optical fiber circulator the second port is connected with optical fiber collimator light.
3. the device of measurement diamond anvil according to claim 2 deformation under thermal extremes condition of high voltage, is characterized in that described signal receiving light path comprises:
Microcobjective, for collecting the reference light that table top returns from diamond anvil and the flashlight that table top returns from it;
Optical fiber collimator, is coupled into optical fiber for reference light and flashlight that microcobjective is collected, and exports by optical fiber collimator band tail optical fiber one end;
Optical fiber circulator, optical fiber circulator the second port is connected with optical fiber collimator band tail optical fiber one end, and optical fiber circulator the 3rd port is connected with fiber spectrometer light, and the reference light of collecting and flashlight are exported from optical fiber circulator the 3rd port;
Fiber spectrometer, for receiving reference light and the flashlight of optical fiber circulator the 3rd port output, and records the frequency spectrum interference signal that reference light and flashlight occur in spectrum domain;
Signal process computer, processes the frequency spectrum interference signal of fiber spectrometer output, obtains the deformation of diamond anvil under thermal extremes condition of high voltage.
4. the device of measurement diamond anvil according to claim 3 deformation under thermal extremes condition of high voltage, it is characterized in that described wideband light source is that centre wavelength is the broad spectrum light source of 1550nm, line width is not less than the common spontaneous radiation light source that 30nm or line width are not less than 30nm, and power is not less than 30mW.
5. the device of measurement diamond anvil according to claim 3 deformation under thermal extremes condition of high voltage, is characterized in that described microcobjective operating distance is greater than 20mm, and enlargement factor is not less than 10 times.
6. the device of measurement diamond anvil according to claim 3 deformation under thermal extremes condition of high voltage, is characterized in that described fiber spectrometer resolution is higher than 20pm, and available general spectrometer replaces.
7. according to the device of the measurement diamond anvil deformation under thermal extremes condition of high voltage one of claim 1 to 6 Suo Shu, characterized by further comprising auxiliary imaging optical path, launch the adjusting of light path and signal receiving light path for auxiliary detection light, and monitor the measuring position of diamond anvil deformation.
8. the device of measurement diamond anvil according to claim 7 deformation under thermal extremes condition of high voltage, is characterized in that described auxiliary imaging optical path comprises lighting source, aperture, first lens, the first broadband spectroscope, the second broadband spectroscope, the second lens, feldspar mineral; By regulating the relative position of aperture, first lens, make the illumination light that described lighting source sends form parallel beam after small holes, first lens, then after the first broadband spectroscope, the second broadband spectroscope, focused on before diamond anvil on table top by microcobjective; Focal position images in feldspar mineral after microcobjective, the second broadband spectroscope, the first broadband spectroscope, the second lens, the picture by feldspar mineral complete observation to table top before diamond anvil; Wherein said the second broadband spectroscope is positioned between microcobjective and optical fiber collimator, and the second broadband spectroscope is for the position of auxiliary adjustment optical fiber collimator; Between described the first broadband spectroscope and the second broadband spectroscope, distance is not less than 10cm, and the first broadband spectroscope and the second broadband spectroscope medium light splitting face are parallel to each other; The first broadband spectroscope and the second broadband spectroscope, first lens, aperture common optical axis, the first spectroscopical logical optical surface in broadband is vertical with this optical axis; The second broadband spectroscope and optical fiber collimator, microcobjective common optical axis, the second spectroscopical logical optical surface in broadband is vertical with this optical axis; The first broadband spectroscope and the second lens, feldspar mineral common optical axis, and this optical axis is perpendicular to the first spectroscopical logical optical surface in broadband.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320830307.5U CN203881304U (en) | 2013-12-16 | 2013-12-16 | Device for measuring deformation of diamond anvil cell under extreme high-temperature and high-pressure conditions |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320830307.5U CN203881304U (en) | 2013-12-16 | 2013-12-16 | Device for measuring deformation of diamond anvil cell under extreme high-temperature and high-pressure conditions |
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| CN203881304U true CN203881304U (en) | 2014-10-15 |
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| CN201320830307.5U Expired - Fee Related CN203881304U (en) | 2013-12-16 | 2013-12-16 | Device for measuring deformation of diamond anvil cell under extreme high-temperature and high-pressure conditions |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108621024A (en) * | 2018-07-11 | 2018-10-09 | 北京中研环科科技有限公司 | Diamond lap equipment |
| CN113567400A (en) * | 2021-07-16 | 2021-10-29 | 北京高压科学研究中心 | Device capable of measuring second harmonic of substance under ultrahigh pressure condition and application thereof |
-
2013
- 2013-12-16 CN CN201320830307.5U patent/CN203881304U/en not_active Expired - Fee Related
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108621024A (en) * | 2018-07-11 | 2018-10-09 | 北京中研环科科技有限公司 | Diamond lap equipment |
| CN108621024B (en) * | 2018-07-11 | 2023-11-28 | 北京中研环科科技有限公司 | Diamond grinding device |
| CN113567400A (en) * | 2021-07-16 | 2021-10-29 | 北京高压科学研究中心 | Device capable of measuring second harmonic of substance under ultrahigh pressure condition and application thereof |
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| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20141015 Termination date: 20161216 |