CN203758722U - Fixture for testing semiconductor laser devices - Google Patents
Fixture for testing semiconductor laser devices Download PDFInfo
- Publication number
- CN203758722U CN203758722U CN201420148368.8U CN201420148368U CN203758722U CN 203758722 U CN203758722 U CN 203758722U CN 201420148368 U CN201420148368 U CN 201420148368U CN 203758722 U CN203758722 U CN 203758722U
- Authority
- CN
- China
- Prior art keywords
- push rod
- blind hole
- fixture
- pedestal
- groove
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- Semiconductor Lasers (AREA)
Abstract
The utility model discloses a fixture for testing semiconductor laser devices. The fixture comprises a base. A blind hole is formed in the rear of the base, an ejector rod is movably inserted in the blind hole, a spring sleeve which is fixedly connected onto the base sleeves the ejector rod and is positioned at the outer end of the blind hole, an ejector rod spring sleeves the ejector rod and is positioned in the blind hole, the front end of the ejector rod spring is butted to the middle of the ejector rod, the rear end of the ejector rod spring is butted to the spring sleeve, the front end of the ejector rod penetrates the blind hole, extends into a first groove with an opening top and extends into a second groove for accommodating a laser device, the second groove is formed in the front end of the first groove, the top, which is positioned in the first groove, of the ejector rod is connected to one end of an ejector rod ram, the other end of the ejector rod ram extends to the lower side of a lower transverse rod of an insulating curved rod, and the middle of the lower transverse rod is hinged to the base. According to the scheme, the fixture has the advantages that the fixture is reasonable in structural design, the laser devices can be quickly, reliably and stably clamped by the fixture and can be accessed conveniently, the fixture is favorable for quickly testing the laser devices, and testing results are high in reliability.
Description
Technical field:
The utility model relates to a kind of fixture for semiconductor laser test.
Background technology:
Semiconductor laser is as highly reliable light source, have low in energy consumption, lightweight, the life-span is long, volume is little, lower-price characteristic, is widely used in pumped solid-state laser, laser display technology, the fields such as the medical treatment of light power, light of stage, laser lighting.In above-mentioned numerous areas, there is comparatively strict evaluating standard for laser instrument itself, after meeting standard, just can reach request for utilization.
When semiconductor laser dispatches from the factory, all to use semiconductor laser parameter test instrument to detect laser optical electrical quantity, detect and whether meet standard.When at present laser instrument detection, normally clamp with tweezers, because laser instrument volume very pincet clamps inconvenience very, and clamp unstablely, can affect like this reliability of test result, cannot realize quick test.How the laser instrument of various encapsulation being clamped reliably, test fast, is the important topic of semiconductor laser quality inspection.
Utility model content:
The utility model is in order to make up the deficiencies in the prior art, a kind of fixture for semiconductor laser test is provided, its reasonable in design, can realize the fast and reliable clamping to laser instrument, and clamping is stable, laser instrument picks and places conveniently, is conducive to complete fast test job, and test result reliability is high, problems of the prior art are solved.
The utility model for solving the problems of the technologies described above adopted technical scheme is:
A kind of fixture for semiconductor laser test, comprise pedestal, be provided with a blind hole at the rear portion of pedestal, one push rod is actively plugged in blind hole, be arranged with a spring cover being connected on pedestal in blind hole outer end push rod outside, push rod outside in blind hole is arranged with a push rod spring, the front end of push rod spring and push rod middle part connect, rear end and spring cover connect, the blind hole that passes the front end of push rod stretches in the first groove of an open-top setting, and extend in second groove of putting laser instrument of the first groove front end setting, the top that is positioned at the push rod of the first groove is connected with one end of a push rod rod, the other end of push rod rod extends the sheer pole below of a middle part and the hinged insulation curved bar of pedestal, between the cross tube of insulation curved bar and pedestal, be connected by curved bar spring, the bottom, sheer pole outer end of insulation curved bar is provided with an electrode pressure head, the pedestal of electrode pressure head below is provided with a cross-over block, on cross-over block, be provided with an electrode contact, one end of electrode contact extends electrode pressure head below.
Push rod rear end in blind hole outside is provided with a handwheel.
Described pedestal is brass pedestal.
The utility model adopts such scheme, and reasonable in design can realize the fast and reliable clamping to laser instrument, and clamping is stable, and laser instrument picks and places conveniently, be conducive to complete fast test job, and test result reliability is high.
Brief description of the drawings:
Fig. 1 is structural representation of the present utility model.
Fig. 2 is the partial cutaway vertical view of Fig. 1.
In figure, 1, pedestal, 2, blind hole, 3, the first groove, 4, push rod, 5, push rod spring, 6, spring cover, 7, push rod rod, 8, insulation curved bar, 9, curved bar spring, 10, electrode pressure head, 11, cross-over block, 12, electrode contact, 13, handwheel, 14, the second groove.
Embodiment:
For clearly demonstrating the technical characterstic of this programme, below by embodiment, and in conjunction with its accompanying drawing, the utility model is elaborated.
As shown in Figure 1-2, a kind of fixture for semiconductor laser test, comprise pedestal 1, be provided with a blind hole 2 at the rear portion of pedestal 1, one push rod 4 is actively plugged in blind hole 2, be arranged with a spring cover 6 being connected on pedestal 1 in blind hole 2 outer end push rod 4 outsides, push rod 4 outsides in blind hole 2 are arranged with a push rod spring 5, the front end of push rod spring 5 and push rod 4 middle parts connect, rear end and spring cover 6 connect, the blind hole 2 that passes the front end of push rod 4 stretches into the first groove interior 3 that an open-top arranges, and extend in second groove of putting laser instrument of the first groove 3 front end settings 14, the top that is positioned at the push rod 4 of the first groove 3 is connected with one end of a push rod rod 7, the other end of push rod rod 7 extends the sheer pole below of a middle part and the hinged insulation curved bar 8 of pedestal 1, between the cross tube of insulation curved bar 8 and pedestal 1, be connected by curved bar spring 9, the bottom, sheer pole outer end of insulation curved bar 8 is provided with an electrode pressure head 10, the pedestal 1 of electrode pressure head 10 belows is provided with a cross-over block 11, on cross-over block 11, be provided with an electrode contact 12, one end of electrode contact 12 extends electrode pressure head 10 belows.
Push rod 4 rear ends in blind hole 2 outsides are provided with a handwheel 13, conveniently push rod 4 are operated, to realize the fast clamp to laser instrument.
Described pedestal 1 is brass pedestal, and the pedestal 1 that brass is made is as the positive electrode to laser instrument energising, and in the time that laser instrument detects, the pedestal 1 that brass is made can ensure laser instrument quick heat radiating, has reduced the damage to laser instrument in testing process.
Laser instrument described in the utility model is the semiconductor laser of C-mount encapsulation, while using the utility model fixture clamping laser instrument, first the positive and negative polarities of energising power supply are connected with electrode contact 12 with pedestal 1 respectively, then, left hand is held handwheel 13 and is pulled out push rod 4, make the front end contraction of push rod 4 exit the second groove 14, and rotate push rod 4 and by push rod rod 7, the sheer pole of insulation curved bar 8 is upwards provoked, the electrode pressure head 10 of bottom, sheer pole outer end is lifted, make to leave space between electrode pressure head 10 and electrode contact 12, the right hand is clamped laser instrument with tweezers again, laser instrument is put into the second groove 14, and the negative pole wiring that makes laser instrument is placed between motor pressure head 10 and electrode contact 12, then left hand reversing handle 13, push rod rod 7 is declined, the upwards cross tube of jack-up insulation curved bar 8 of compressed curved bar spring 9 simultaneously, sheer pole is declined, at this moment electrode pressure head 10 coordinates the negative pole wiring of laser instrument is compressed with the electrode contact 12 of its below, and then unclamp handwheel 13, push rod 4 is resetted under the elastic force effect of push rod spring 5, push rod 4 front ends compress laser instrument, so just realize the reliable clamping of laser instrument, starting power supply switches on to laser instrument, can start testing.
When having detected laser instrument and laser instrument need to having been taken off, first left hand is held handwheel 13 and is pulled out push rod 4, push rod 4 separates with laser instrument, and rotate push rod 4 simultaneously, by push rod rod 7, the sheer pole of insulation curved bar 8 is upwards provoked, the electrode pressure head 10 of sheer pole outer end bottom is lifted, the negative pole wiring that electrode pressure head 10 is unclamped press, then for the right hand, tweezers take out laser instrument.
Whole operating process is simple and convenient, and laser instrument clamping is stable, picks and places conveniently, be conducive to complete fast test job, and test result reliability is high.
The utility model does not describe part in detail, is those skilled in the art of the present technique's known technology.
Claims (3)
1. the fixture for semiconductor laser test, it is characterized in that: comprise pedestal, be provided with a blind hole at the rear portion of pedestal, one push rod is actively plugged in blind hole, be arranged with a spring cover being connected on pedestal in blind hole outer end push rod outside, push rod outside in blind hole is arranged with a push rod spring, the front end of push rod spring and push rod middle part connect, rear end and spring cover connect, the blind hole that passes the front end of push rod stretches in the first groove of an open-top setting, and extend in second groove of putting laser instrument of the first groove front end setting, the top that is positioned at the push rod of the first groove is connected with one end of a push rod rod, the other end of push rod rod extends the sheer pole below of a middle part and the hinged insulation curved bar of pedestal, between the cross tube of insulation curved bar and pedestal, be connected by curved bar spring, the bottom, sheer pole outer end of insulation curved bar is provided with an electrode pressure head, the pedestal of electrode pressure head below is provided with a cross-over block, on cross-over block, be provided with an electrode contact, one end of electrode contact extends electrode pressure head below.
2. a kind of fixture for semiconductor laser test according to claim 1, is characterized in that: the push rod rear end in blind hole outside is provided with a handwheel.
3. a kind of fixture for semiconductor laser test according to claim 1, is characterized in that: described pedestal is brass pedestal.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420148368.8U CN203758722U (en) | 2014-03-28 | 2014-03-28 | Fixture for testing semiconductor laser devices |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420148368.8U CN203758722U (en) | 2014-03-28 | 2014-03-28 | Fixture for testing semiconductor laser devices |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203758722U true CN203758722U (en) | 2014-08-06 |
Family
ID=51253978
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201420148368.8U Expired - Fee Related CN203758722U (en) | 2014-03-28 | 2014-03-28 | Fixture for testing semiconductor laser devices |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203758722U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109387771A (en) * | 2018-10-16 | 2019-02-26 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | Fixture and test method for semiconductor integrated circuit particle encounter noise fest |
| CN113340565A (en) * | 2021-05-07 | 2021-09-03 | 桂林芯隆科技有限公司 | A place anchor clamps for single terminal surface of laser instrument detects |
-
2014
- 2014-03-28 CN CN201420148368.8U patent/CN203758722U/en not_active Expired - Fee Related
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109387771A (en) * | 2018-10-16 | 2019-02-26 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | Fixture and test method for semiconductor integrated circuit particle encounter noise fest |
| CN109387771B (en) * | 2018-10-16 | 2020-12-29 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | Clamp for semiconductor integrated circuit particle impact noise test and test method |
| CN113340565A (en) * | 2021-05-07 | 2021-09-03 | 桂林芯隆科技有限公司 | A place anchor clamps for single terminal surface of laser instrument detects |
| CN113340565B (en) * | 2021-05-07 | 2023-11-07 | 桂林芯隆科技有限公司 | A place anchor clamps for laser instrument list terminal surface detects |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20140806 Termination date: 20150328 |
|
| EXPY | Termination of patent right or utility model |