CN203587627U - Low-impedance broadband test fixture - Google Patents
Low-impedance broadband test fixture Download PDFInfo
- Publication number
- CN203587627U CN203587627U CN201320799653.1U CN201320799653U CN203587627U CN 203587627 U CN203587627 U CN 203587627U CN 201320799653 U CN201320799653 U CN 201320799653U CN 203587627 U CN203587627 U CN 203587627U
- Authority
- CN
- China
- Prior art keywords
- microstrip line
- impedance
- gradual change
- test fixture
- low
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 25
- 230000010355 oscillation Effects 0.000 abstract description 9
- 238000006243 chemical reaction Methods 0.000 abstract description 2
- 230000003247 decreasing effect Effects 0.000 abstract 2
- 238000005259 measurement Methods 0.000 abstract 1
- 230000009466 transformation Effects 0.000 description 8
- 239000003990 capacitor Substances 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000002847 impedance measurement Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2621—Circuits therefor for testing field effect transistors, i.e. FET's
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Tests Of Electronic Circuits (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Abstract
The utility model belongs to the technical field of radio frequency microwave measurement and discloses a low-impedance broadband test fixture. The low-impedance broadband test fixture includes an impedance converter and a supporting member; the impedance converter is fixed on the supporting member; the impedance converter includes a first gradually-varied microstrip line and a second gradually-varied microstrip line; and the first gradually-varied microstrip line and the second gradually-varied microstrip line are both printed on a PCB and clamp an LDMOS device to be tested. According to the low-impedance broadband test fixture of the utility model, the impedance conversion range of the test fixture can be extended through the gradually-varied microstrip lines, and therefore, impedance mismatch degree of the fixture and the LDMOS device to be tested can be decreased, and low-frequency oscillation and tube burning risks can be decreased.
Description
Technical field
The utility model relates to frequency microwave field of measuring technique, particularly a kind of Low ESR broadband test fixture.
Background technology
During application Loadpull system testing power tube, the impedance of test fixture pin is 50 Ω, does not design impedance transformation function.While adopting the large grid width that the test fixture Impedance measurement of 50 Ω is very little, high-power LDMOS device, due to the serious mismatch of impedance, cause low-frequency oscillation, device is easy to burn.Fixture for package level test, has certain impedance transformation, can transform to tens ohm from 50 ohm, and the impedance after conversion is still relatively high, and easily low-frequency oscillation, burns device.In addition, with biasing circuit power supply, fixture is subject to the impact of biasing circuit filter capacitor, and bandwidth of operation is very narrow.
Utility model content
Technical problem to be solved in the utility model is to provide the large test fixture of a kind of impedance transformation scope, avoids low-frequency oscillation.
For solving the problems of the technologies described above, the utility model provides a kind of Low ESR broadband test fixture, comprising: impedance transformer and support member; Described impedance transformer is fixed on described support member; Described impedance transformer comprises: the first gradual change microstrip line and the second gradual change microstrip line; Described the first gradual change microstrip line and described the second gradual change microstrip line are printed on pcb board, clamp LDMOS device to be measured.
Further, described the first gradual change microstrip line and described the second gradual change microstrip line are 100 joints.
Further, the length of described the first gradual change microstrip line and described the second gradual change microstrip line is all greater than 210mm.
Further, described the first gradual change microstrip line and described the second gradual change microstrip line are
Klopfenstein gradual change microstrip line.
The impedance transformer that the Low ESR broadband test fixture that the utility model provides forms by two gradual change microstrip lines expands the impedance transformation scope of test fixture, thereby impedance can be dropped to very low level, reduce the impedance mismatching degree of fixture and LDMOS device to be tested, reduce low frequency oscillation, reduce and burn manage-style danger.
Accompanying drawing explanation
The pcb board circuit of the impedance transformer that Fig. 1 provides for the utility model embodiment.
Embodiment
Referring to Fig. 1, a kind of Low ESR broadband test fixture that the utility model embodiment provides, comprising: impedance transformer and support member; Impedance transformer is fixed on described support member, for realizing fixture impedance transformation, to coordinate all kinds of LDMOS devices to be tested, reduces the degree of impedance mismatching; Impedance transformer comprises: the first gradual change microstrip line 1 and the second gradual change microstrip line 2; The first gradual change microstrip line 1 and the second gradual change microstrip line 2 as high-frequency circuit are printed on pcb board 3, during test, LDMOS device to be measured are clipped between the first gradual change microstrip line 1 and the second gradual change microstrip line 2; Pcb board 3 is fixed on support member by the fixed orifice 4 arranging on plate face, forms robust structure, facilitates test operation.
The impedance transformer that the gradual change microstrip line that the present embodiment provides forms, under the prerequisite of getting rid of Effect of Materials, impedance variation scope is 50 Ω～5.4 Ω; Therefore, corresponding, the first gradual change microstrip line 1 and the second gradual change microstrip line 2 are 100 joints, thereby guarantee the lower limit of impedance transformation.Impedance lower limit is lower, and the cooperate degree of itself and LDMOS device to be measured is just higher, and low-frequency oscillation just more relaxes, and the risk of burning pipe is just less.
The narrow problem of bandwidth of operation causing in order to improve feed circuit filter capacitor, preferred, the length of the first gradual change microstrip line 1 and the second gradual change microstrip line 2 is all greater than 210mm, thereby frequency coverage is comprised: pattern-band, L-band and S-band; Large bandwidth can be clearly seen that vibration region, solves the problem of low-frequency oscillation, has reduced the risk of burning pipe.
For the impedance phase of device under test, to low feature, adopt Klopfenstein gradual change microstrip line can coordinate preferably low-impedance measurement.
The impedance transformer that the Low ESR broadband test fixture that the utility model embodiment provides forms by two gradual change microstrip lines expands the impedance transformation scope of test fixture, thereby impedance can be dropped to low level, reduce the impedance mismatching degree of fixture and LDMOS device to be tested, reduce low frequency oscillation, reduce and burn manage-style danger.By Klopfenstein100, save gradual change microstrip line and impedance transformation scope can be maximized to 50 Ω～5.4 Ω, greatly reduce the risk of impedance mismatching; Two Klopfenstein gradual change microstrip lines are arranged to minimum 210mm and can expand bandwidth, see vibration region clearly, the burning manage-style danger that reduces low-frequency oscillation and brought by it.
It should be noted last that, above embodiment is only unrestricted in order to the technical solution of the utility model to be described, although the utility model is had been described in detail with reference to example, those of ordinary skill in the art is to be understood that, can modify or be equal to replacement the technical solution of the utility model, and not departing from the spirit and scope of technical solutions of the utility model, it all should be encompassed in the middle of claim scope of the present utility model.
Claims (4)
1. a Low ESR broadband test fixture, is characterized in that, comprising: impedance transformer and support member; Described impedance transformer is fixed on described support member; Described impedance transformer comprises: the first gradual change microstrip line and the second gradual change microstrip line; Described the first gradual change microstrip line and described the second gradual change microstrip line are printed on pcb board, clamp LDMOS pipe to be measured.
2. Low ESR broadband test fixture as claimed in claim 1, is characterized in that: described the first gradual change microstrip line and described the second gradual change microstrip line are 100 joints.
3. Low ESR broadband test fixture as claimed in claim 2, is characterized in that: the length of described the first gradual change microstrip line and described the second gradual change microstrip line is all greater than 210mm.
4. the Low ESR broadband test fixture as described in claim 1～3 any one, is characterized in that: described the first gradual change microstrip line and described the second gradual change microstrip line are Klopfenstein gradual change microstrip line.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320799653.1U CN203587627U (en) | 2013-12-05 | 2013-12-05 | Low-impedance broadband test fixture |
| PCT/CN2014/083050 WO2015081707A1 (en) | 2013-12-05 | 2014-07-25 | Improved low-impedance test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320799653.1U CN203587627U (en) | 2013-12-05 | 2013-12-05 | Low-impedance broadband test fixture |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203587627U true CN203587627U (en) | 2014-05-07 |
Family
ID=50585527
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201320799653.1U Expired - Lifetime CN203587627U (en) | 2013-12-05 | 2013-12-05 | Low-impedance broadband test fixture |
Country Status (2)
| Country | Link |
|---|---|
| CN (1) | CN203587627U (en) |
| WO (1) | WO2015081707A1 (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104407181A (en) * | 2014-12-25 | 2015-03-11 | 上海联星电子有限公司 | Testing clamp |
| WO2015081707A1 (en) * | 2013-12-05 | 2015-06-11 | 上海联星电子有限公司 | Improved low-impedance test fixture |
| WO2015081708A1 (en) * | 2013-12-05 | 2015-06-11 | 上海联星电子有限公司 | Improved low-impedance test fixture |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106383251B (en) * | 2016-11-30 | 2018-10-09 | 中国电子科技集团公司第二十九研究所 | A kind of wideband high-power test fixture |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CA2073886A1 (en) * | 1991-07-19 | 1993-01-20 | Tatsuya Hashinaga | Burn-in apparatus and method |
| US6395569B1 (en) * | 2001-01-15 | 2002-05-28 | Ericsson Inc. | Method for characterization of LDMOS devices at the die reference plane |
| CN203587627U (en) * | 2013-12-05 | 2014-05-07 | 上海联星电子有限公司 | Low-impedance broadband test fixture |
| CN103852602B (en) * | 2014-03-19 | 2016-12-07 | 上海联星电子有限公司 | Radio frequency asymmetric Low ESR test fixture |
-
2013
- 2013-12-05 CN CN201320799653.1U patent/CN203587627U/en not_active Expired - Lifetime
-
2014
- 2014-07-25 WO PCT/CN2014/083050 patent/WO2015081707A1/en active Application Filing
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2015081707A1 (en) * | 2013-12-05 | 2015-06-11 | 上海联星电子有限公司 | Improved low-impedance test fixture |
| WO2015081708A1 (en) * | 2013-12-05 | 2015-06-11 | 上海联星电子有限公司 | Improved low-impedance test fixture |
| CN104407181A (en) * | 2014-12-25 | 2015-03-11 | 上海联星电子有限公司 | Testing clamp |
| CN104407181B (en) * | 2014-12-25 | 2017-06-30 | 上海联星电子有限公司 | A kind of test fixture |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2015081707A1 (en) | 2015-06-11 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CX01 | Expiry of patent term |
Granted publication date: 20140507 |
|
| CX01 | Expiry of patent term |