CN203572922U - Voltage test panel for surface mount diode test wires - Google Patents
Voltage test panel for surface mount diode test wires Download PDFInfo
- Publication number
- CN203572922U CN203572922U CN201320618625.5U CN201320618625U CN203572922U CN 203572922 U CN203572922 U CN 203572922U CN 201320618625 U CN201320618625 U CN 201320618625U CN 203572922 U CN203572922 U CN 203572922U
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- China
- Prior art keywords
- test panel
- main body
- panel main
- metal cushion
- diode
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- Expired - Fee Related
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Abstract
The utility model discloses a voltage test panel for surface mount diode test wires. The voltage test panel comprises a test panel main body, and a central circle of the excircle circumference side of the test panel main body is provided with a loop of uniformly distributed diode locating slots; and the excircle circumference side position of the test panel main body is also provided with symmetrical metal cushion blocks, an arc-shaped external periphery of each metal cushion block is flush with the excircle circumference of the test panel main body, and the metal cushion blocks are tightly locked on the test panel main body through bolts. The metal cushion blocks are disposed at the excircle circumference side position of the test panel main body, the arc-shaped external periphery of each metal cushion block is flush with the excircle circumference of the test panel main body, so that wear resistance performance of the test panel is largely improved due to the metal cushion blocks; and only corresponding metal cushion blocks are required to be partially replaced after the metal cushion blocks are worn for a long-term use, the test panel is not required to be integrally replaced, and use cost is largely reduced.
Description
Technical field
The utility model relates to a kind of voltage tester dish of stamp-mounting-paper diode p-wire.
Background technology
Shown in Fig. 1 is the voltage tester dish of a kind of stamp-mounting-paper diode p-wire of prior art, it is provided with one week equally distributed diode locating slot 12 on the circumference side central ring of test panel main body 11, after two test panel Parallel Symmetrics are installed, the diode locating slot of two test panels is corresponding one by one, during pending voltage tester, the wire at stamp-mounting-paper diode two ends snaps in respectively in two corresponding diode locating slots 12 of both sides, and the two ends wire of then sequentially pushing down respectively stamp-mounting-paper diode when test panel synchronous rotary by testing compressing tablet carries out voltage tester.Because the test panel of prior art is plastic material, when the test compressing tablet of metal material carries out relative spin friction with the test panel of plastic material for a long time, the test panel of plastic material can exist compared with galling, therefore needs whole replacing test panel, and not only cost drops into high and changes comparatively loaded down with trivial details.
Utility model content
For solving the problems of the technologies described above, the utility model provides a kind of voltage tester dish of stamp-mounting-paper diode p-wire, to improve anti-wear performance and the serviceable life of test panel.
For achieving the above object, the technical solution of the utility model is as follows:
A voltage tester dish for stamp-mounting-paper diode p-wire, comprises test panel main body, on the cylindrical circumference side central ring of described test panel main body, is provided with one week equally distributed diode locating slot;
The cylindrical circumference lateral location of described test panel main body is also provided with symmetrical backing metal, and the arc outward flange of described backing metal is concordant with the cylindrical circumference side of described test panel main body, and by bolt-locking in described test panel main body.
Preferably, described backing metal is corresponding one by one with described diode locating slot.
Preferably, in described test panel main body, radially also offer a circle and pick and place hole.
Pass through technique scheme, the voltage tester dish of the stamp-mounting-paper diode p-wire that the utility model provides, it is by arranging backing metal in test panel main body cylindrical circumference lateral location, and the arc outward flange of backing metal is concordant with test panel main body cylindrical circumference, therefore the existence of backing metal has greatly improved the abrasion resistance properties of test panel, and backing metal only needs the corresponding backing metal of local replacing after long-term use wearing and tearing, without integral replacing test panel, use cost significantly reduces.
Accompanying drawing explanation
In order to be illustrated more clearly in the utility model embodiment or technical scheme of the prior art, will the accompanying drawing of required use in embodiment or description of the Prior Art be briefly described below.
Fig. 1 is the main TV structure schematic diagram of voltage tester dish of the stamp-mounting-paper diode p-wire of prior art;
Fig. 2 is the main TV structure schematic diagram of the voltage tester dish of the disclosed stamp-mounting-paper diode p-wire of the utility model embodiment.
Numeral in figure:
11. test panel main body 12. diode locating slot 13. bolts
14. backing metals 15. pick and place hole
Embodiment
Below in conjunction with the accompanying drawing in the utility model embodiment, the technical scheme in the utility model embodiment is clearly and completely described.
With reference to figure 2, the utility model provides a kind of voltage tester dish of stamp-mounting-paper diode p-wire, comprise test panel main body 11, on the cylindrical circumference side central ring of test panel main body 11, be provided with one week equally distributed diode locating slot 12 for the location of same stamp-mounting-paper diode and the interval of adjacent patch diode; The cylindrical circumference lateral location of test panel main body 11 is also provided with symmetrical backing metal 14, the arc outward flange of backing metal 14 is concordant with the cylindrical circumference side of test panel main body 11, and be locked in test panel main body 11 by bolt 13, backing metal 14 and diode locating slot 12 corresponding setting one by one, and in test panel main body 11, radially also offer a circle and pick and place hole 15 the picking and placeing of test panel when being convenient for changing.
The voltage tester dish of the stamp-mounting-paper diode p-wire that the utility model provides, it is by arranging backing metal 14 in test panel main body 11 cylindrical circumference lateral location, and the arc outward flange of backing metal 14 is concordant with test panel main body 11 cylindrical circumference, and therefore the existence of backing metal 14 has greatly improved the abrasion resistance properties of test panel; Because backing metal 14 is locked in test panel main body 11 by bolt 13, therefore, backing metal 14 only needs the corresponding backing metal of local replacing 14 after long-term use wearing and tearing, and without integral replacing test panel, use cost significantly reduces.
To the above-mentioned explanation of the disclosed embodiments, make professional and technical personnel in the field can realize or use the utility model.To the multiple modification of above-described embodiment, will be apparent for those skilled in the art, General Principle as defined herein can, in the situation that not departing from spirit or scope of the present utility model, realize in other embodiments.Therefore, the utility model will can not be restricted to these embodiment shown in this article, but will meet the widest scope consistent with principle disclosed herein and features of novelty.
Claims (3)
1. a voltage tester dish for stamp-mounting-paper diode p-wire, is characterized in that, comprises test panel main body, on the cylindrical circumference side central ring of described test panel main body, is provided with one week equally distributed diode locating slot;
The cylindrical circumference lateral location of described test panel main body is also provided with symmetrical backing metal, and the arc outward flange of described backing metal is concordant with the cylindrical circumference of described test panel main body, and by bolt-locking in described test panel main body.
2. the voltage tester dish of stamp-mounting-paper diode p-wire according to claim 1, is characterized in that, described backing metal is corresponding one by one with described diode locating slot.
3. the voltage tester dish of stamp-mounting-paper diode p-wire according to claim 1, is characterized in that, radially also offers a circle and pick and place hole in described test panel main body.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320618625.5U CN203572922U (en) | 2013-10-08 | 2013-10-08 | Voltage test panel for surface mount diode test wires |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320618625.5U CN203572922U (en) | 2013-10-08 | 2013-10-08 | Voltage test panel for surface mount diode test wires |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203572922U true CN203572922U (en) | 2014-04-30 |
Family
ID=50540649
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201320618625.5U Expired - Fee Related CN203572922U (en) | 2013-10-08 | 2013-10-08 | Voltage test panel for surface mount diode test wires |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203572922U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103576184A (en) * | 2013-10-11 | 2014-02-12 | 赵明 | Impact type earthquake wave generator |
-
2013
- 2013-10-08 CN CN201320618625.5U patent/CN203572922U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103576184A (en) * | 2013-10-11 | 2014-02-12 | 赵明 | Impact type earthquake wave generator |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20140430 Termination date: 20151008 |
|
| EXPY | Termination of patent right or utility model |