CN203551606U - Test fixture - Google Patents
Test fixture Download PDFInfo
- Publication number
- CN203551606U CN203551606U CN201320693649.7U CN201320693649U CN203551606U CN 203551606 U CN203551606 U CN 203551606U CN 201320693649 U CN201320693649 U CN 201320693649U CN 203551606 U CN203551606 U CN 203551606U
- Authority
- CN
- China
- Prior art keywords
- socket connector
- test fixture
- test
- pcb board
- optoelectronic switch
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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- 230000005693 optoelectronics Effects 0.000 claims description 12
- 230000007423 decrease Effects 0.000 abstract 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 230000008054 signal transmission Effects 0.000 description 1
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- Details Of Connecting Devices For Male And Female Coupling (AREA)
Abstract
The utility model discloses a test fixture, comprising a Socket connector and a PCB, wherein one of the PCB and the Socket connector is provided with a photoelectric switch for sensing the opening-closing states of the Socket connector. When the Socket connector is closed, the test fixture transmits signals to testing software through the photoelectric switch, the software automatically launches the chip tests, the test fixture is short in time consumption, labor saving, high in efficiency, decreases the test cost, and improves corporate profit margin.
Description
Technical field
The utility model relates to image sensor dice field tests, relates to specifically a kind of test fixture.
Background technology
Under the situation of rising in this world in current image sensor dice, big and small image sensor dice manufacturing enterprise, its chip testing used must start as early as possible testing software after closure test clamps Socket connector.But current vast image sensor is tested producer when using Socket connector test, the start key that needs manually to press computer test software after closed Socket connector, employee's operation steps is many, wastes time and energy, and efficiency is low, make testing cost high.And semicon industry is the industry of a sufficient competition, the high-performance low price namely product of high performance-price ratio is the trump card that enterprise gets the upper hand of in the dog-eat-dog competition of market.Reduce costs be all companies all in the problem of considering, how by low cost, to bring the high yield pursuit of enterprise especially.
Summary of the invention
In order to overcome above-mentioned defect, the utility model provides a kind of test fixture, can realize the quick startup of image sensor dice test, thereby increase work efficiency, and reduces enterprise cost.
The utility model for the technical scheme that solves its technical matters and adopt is: a kind of test fixture, comprise Socket connector and pcb board, at described Socket connector and pcb board, be provided with for responding to the optoelectronic switch of this Socket connector open and-shut mode on one of them.
As further improvement of the utility model, described optoelectronic switch is located on the groove of described Socket connector.
As further improvement of the utility model, described optoelectronic switch is located on described pcb board.
The beneficial effects of the utility model are: this test fixture by installing an optoelectronic switch on Socket connector or pcb board, after Socket connector closure, by this optoelectronic switch transmission of signal to testing software, the automatic opening chip test of software, not only consuming time short, save manpower, and efficiency is high, reduce testing cost, enterprise profit margin.
Accompanying drawing explanation
Fig. 1 is the utility model structural representation.
By reference to the accompanying drawings, make the following instructions:
1---Socket connector 2---pcb board
3---optoelectronic switch 11---groove
Embodiment
By reference to the accompanying drawings; the utility model is elaborated; but protection domain of the present utility model is not limited to following embodiment, the simple equivalence of in every case being done with the utility model claim and description changes and modifies, within all still belonging to the utility model patent covering scope.
As shown in Figure 1, structural representation for a kind of test fixture, comprise Socket connector 1 and pcb board 2, Socket connector 1 is placed in pcb board 2 tops, and be electrically connected to, simultaneously on the groove 11 of Socket connector 1 or pcb board 2, be provided with an optoelectronic switch 3, in this example, optoelectronic switch is located on pcb board, and this optoelectronic switch can be responded to the open and-shut mode of Socket connector.When test, image sensor dice is placed in Socket connector, when this Socket connector is not closed when opening, the Interface status that pcb board connects is high level, when Socket connector is closed, the Interface status that pcb board connects becomes low level, testing software senses after this pcb board interface level variation from high to low simultaneously, start immediately testing software and carry out product test, tested into, taking-up chip, interface level becomes again high level, waits for test action next time.Like this, by the cooperation of optoelectronic switch and testing software, after the Socket of test fixture connector closure, start immediately testing software, do not need manually to press again start key, reduce operation steps, save the test duration, improve testing efficiency simultaneously, significantly reduce enterprise's testing cost, improve the enterprise competitiveness of company.
Claims (3)
1. a test fixture, comprises Socket connector (1) and pcb board (2), it is characterized in that: at described Socket connector and pcb board, be provided with for responding to the optoelectronic switch (3) of this Socket connector open and-shut mode on one of them.
2. test fixture according to claim 1, is characterized in that: described optoelectronic switch is located on the groove (11) of described Socket connector.
3. test fixture according to claim 1, is characterized in that: described optoelectronic switch is located on described pcb board.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320693649.7U CN203551606U (en) | 2013-11-05 | 2013-11-05 | Test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320693649.7U CN203551606U (en) | 2013-11-05 | 2013-11-05 | Test fixture |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203551606U true CN203551606U (en) | 2014-04-16 |
Family
ID=50469703
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201320693649.7U Expired - Lifetime CN203551606U (en) | 2013-11-05 | 2013-11-05 | Test fixture |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203551606U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104459219A (en) * | 2013-11-05 | 2015-03-25 | 昆山西钛微电子科技有限公司 | Testing clamp |
-
2013
- 2013-11-05 CN CN201320693649.7U patent/CN203551606U/en not_active Expired - Lifetime
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104459219A (en) * | 2013-11-05 | 2015-03-25 | 昆山西钛微电子科技有限公司 | Testing clamp |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CP03 | Change of name, title or address |
Address after: 215300 No. 112, Longteng Road, Kunshan Development Zone, Suzhou, Jiangsu Patentee after: HUATIAN TECHNOLOGY (KUNSHAN) ELECTRONICS Co.,Ltd. Address before: 215300 the east side of longitudinal four road and the north side of Tong Feng Road, Kunshan Development Zone, Suzhou, Jiangsu. Patentee before: KUNSHAN XITAI MICROELECTRONICS TECHNOLOGY Co.,Ltd. |
|
| CP03 | Change of name, title or address | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20190111 Address after: 710018 123 Fengcheng No. 5 Road, Xi'an Economic and Technological Development Zone, Shaanxi Province Patentee after: HUATIAN HUICHUANG TECHNOLOGY (XI'AN) Co.,Ltd. Address before: 215300 No. 112, Longteng Road, Kunshan Development Zone, Suzhou, Jiangsu Patentee before: HUATIAN TECHNOLOGY (KUNSHAN) ELECTRONICS Co.,Ltd. |
|
| TR01 | Transfer of patent right | ||
| CX01 | Expiry of patent term |
Granted publication date: 20140416 |
|
| CX01 | Expiry of patent term |