CN203502525U - IC card chip testing device with vertical lifting type multi-reading and writing card seat structure - Google Patents
IC card chip testing device with vertical lifting type multi-reading and writing card seat structure Download PDFInfo
- Publication number
- CN203502525U CN203502525U CN201320656307.8U CN201320656307U CN203502525U CN 203502525 U CN203502525 U CN 203502525U CN 201320656307 U CN201320656307 U CN 201320656307U CN 203502525 U CN203502525 U CN 203502525U
- Authority
- CN
- China
- Prior art keywords
- card
- vertical
- plc
- groove
- draw
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Landscapes
- Credit Cards Or The Like (AREA)
Abstract
Provided in the utility model is an IC card chip testing device with a vertical lifting type multi-reading and writing card seat structure. The testing device comprises a card entrance groove, a horizontal motion servo motor, a horizontal card feeding track, at least two vertically lifting multi-card groove structures, a vertical motion servo motor, a vertical motion lead screw, a reject card slot, a finished card receiving slot, a programmable logic controller (PLC), and an industrial personal computer. According to the testing device, more than two groups of vertical lifting type multi-IC card reading and writing card seats are used as card feeding mechanisms and are in neighbor-to-neighbor connection mode at the track for IC card conveying. The reject card receiving slot is used for receiving a card that does not pass the IC card chip test successfully. And the IC card with successful testing or personalization enters a platform for automatic card receiving belt rotation by a conveying mechanism, wherein the platform is perpendicular to the horizontal card feeding track. With the testing device, the human error caused by the manual testing can be minimized and the misjudgment rate can be controlled to be below 0.3%; the labor production rate is substantially improved; the automation degree is high; and the cost is low.
Description
Technical field
The utility model relates to the test correlative technology field of non-contact IC card, relates in particular to a kind of parallel double vertical lift type mutiread and writes the parallel contact of deck and Circuit for Non-contact IC Chip test (individualizing) equipment.
Background technology
Iso standard contact has at present been widely used in the fields such as transportation card, access control card, mobile communication card, bank card with contactless IC card; Meanwhile, before application, all kinds of contacts or contactless IC card all must be written into data, and these data can be the identical data of a certain class card, can be also that in a certain class card, every card has different data (title personal data).The current minute two kinds of methods that write to these data:
1), with single card reader/writer, in artificial mode, write one by one;
Inventor finds that the shortcoming of this mode is: labor intensive is large, and data fail to write and wrongly write frequent generation.
2), adopt a plurality of read-write decks of external import to enter card parallel test contact and Circuit for Non-contact IC Chip (individualizing) equipment automatically with disk;
Inventor finds that the shortcoming of this mode is: a plurality of read-write deck disks enter card parallel test contact and Circuit for Non-contact IC Chip (individualizing) equipment automatically; manufacturer has applied for multiple patent protection; so this device sales price is high; from more than 200 ten thousand Renminbi to six; not etc., domestic IC-card manufacturer is not difficult to bear such price to seven million people people's coin.
Utility model content
The purpose of this utility model is, overcomes the above-mentioned deficiency of prior art, provides that a kind of automaticity is high, low price, False Rate are low has the IC-card chip testing equipment that lift mutiread is write deck.
For reaching above-mentioned purpose, the utility model provides a kind of IC-card chip testing equipment that vertical lift type mutiread is write deck that has, and it comprises: enter draw-in groove, tangential movement servomotor, horizontal card feed track, at least two the many notchs of VTOL (vertical take off and landing), vertical movement servomotor, vertical movement leading screw, useless draw-in groove, finished product cards are received draw-in groove, Programmable Logic Controller PLC and industrial computer;
Described tangential movement servomotor, respectively with describedly enter draw-in groove, described horizontal card feed track is connected with described PLC, for entering draw-in groove and obtain the IC-card a plurality of to be tested of storage from described under the control of described PLC, and drive described horizontal card feed track to transport described a plurality of IC-card to be tested;
The many notchs of described at least two VTOL (vertical take off and landing), be connected with described industrial computer respectively, and be connected to described vertical movement servomotor by described vertical movement leading screw, for make vertical displacement movement under the drive of described vertical movement servomotor and described vertical movement leading screw, from described horizontal card feed track, obtain successively IC-card to be tested; On the many notchs of each VTOL (vertical take off and landing), be provided with a plurality of embedded IC card reading and writing machine of vertical distribution, described a plurality of embedded IC card reading and writing machine is connected with described industrial computer by serial ports respectively, and each embedded IC card reading and writing machine is carried out read-write card operation to the IC-card in it;
Described vertical movement servomotor, is connected with described PLC, under the control of described PLC, drive described vertical movement leading screw drive described at least two many notchs of VTOL (vertical take off and landing) do elevating movement;
Described industrial computer, is connected with described PLC, for monitoring and the running status of control PLC, controls described IC card reading and writing machine IC-card to be tested is carried out to test processes, to described PLC, sends the test result signal for each IC-card to be tested;
Described PLC, be connected with described industrial computer, described vertical movement servomotor, described tangential movement servomotor, for controlling the operation of described horizontal card feed track, and described in controlling at least two many notchs of VTOL (vertical take off and landing) a plurality of IC card reading and writing machine by first in first out order, a plurality of IC-cards to be tested are tested, the test result signal that described in Real-time Collection, industrial computer sends, test is successfully blocked by horizontal card feed track described in described tangential movement driven by servomotor and deposits into described finished product card and receive draw-in groove, and the card of test crash is deposited into described useless draw-in groove.
As preferably, described have vertical lift type mutiread and write the IC-card chip testing equipment of deck and also can comprise: receive useless treibgas cylinder, be connected with described PLC, while being close to useless draw-in groove for the card when test crash, under the control of described PLC and start, the card of described test crash is taken in to described useless draw-in groove.
As preferably, described have the IC-card chip testing equipment that vertical lift type mutiread is write deck, also can comprise: touch LCD display, be connected, for showing the running status of described PLC with described PLC.
As preferably, it is the terminal that is arranged at described horizontal card feed track that described finished product card is received draw-in groove, vertical with described horizontal card feed track.
As preferably, on the many notchs of described VTOL (vertical take off and landing), vertical distribution has a plurality of decks, and an IC card reading and writing machine is set on each deck.
As preferably, described IC-card can be contact or non-contact IC card.
As preferably, described serial ports can be RS-232 interface, RS-422 interface or RS-485 interface.
As preferably, the many notchs of described at least two VTOL (vertical take off and landing) are parallel to each other.
The useful technique effect of technique scheme of the present utility model is:
This test or personalization data equipment are to adopt vertical lifting platform, each vertical lifting platform includes a plurality of embedded IC read-write heads of vertical distribution, thereby solved the long problem of length of using a plurality of read-write headses and make production line on a production line, the length of having saved conveyance IC-card line at this vertical lifting platform of the utility model.
The utility model embodiment has also solved well at parallel two or above VTOL (vertical take off and landing) multiple fastening seat and has entered the problem of the first in first out in card system.
Accompanying drawing explanation
In order to be illustrated more clearly in the utility model embodiment or technical scheme of the prior art, by the accompanying drawing of required use in embodiment or description of the Prior Art being done to one, introduce simply below, apparently, accompanying drawing in the following describes is only embodiment more of the present utility model, for those of ordinary skills, do not paying under the prerequisite of creative work, can also obtain according to these accompanying drawings other accompanying drawing.
Fig. 1 is the general structure schematic diagram that a kind of parallel double vertical lift type mutiread of the utility model embodiment is write deck IC-card chip testing equipment;
Fig. 2 is the schematic diagram of the many notchs of VTOL (vertical take off and landing) of the utility model embodiment.
Embodiment
For making object, technical scheme and the advantage of the utility model embodiment clearer, below in conjunction with the accompanying drawing in the utility model embodiment, technical scheme in the utility model embodiment is clearly and completely described, obviously, described embodiment is the utility model part embodiment, rather than whole embodiment.Embodiment based in the utility model, those of ordinary skills are not making the every other embodiment obtaining under creative work prerequisite, all belong to the scope of the utility model protection.
The testing apparatus of the utility model embodiment adopts many IC-card read-write decks of two groups of above (can be one or more groups) VTOL (vertical take off and landing) (to claim afterwards the many notchs of VTOL (vertical take off and landing), VTOL (vertical take off and landing) platform, every group of VTOL (vertical take off and landing) platform can comprise more than one deck) as chart feeder structure, on the adjacent track (horizontal card feed track) that is connected to a conveyance IC-card; It also has one and enters draw-in groove, and the useless draw-in groove (or platform) of receipts that place a certain position after two groups of VTOL (vertical take off and landing) platforms, is used for collecting the unsuccessful card of IC-card chip testing; Test or individualized successful IC-card are entered to the platform that by automatic receipts card belt rotated perpendicular with horizontal card feed track by carrying mechanism (as belt and servomotor).
Fig. 1 is the general structure schematic diagram that a kind of parallel double vertical lift type mutiread of the utility model embodiment is write deck IC-card chip testing equipment.As shown in Figure 1, this testing apparatus 100 comprises:
Enter draw-in groove 102, tangential movement servomotor 104, horizontal card feed track 106, at least two the many notchs 108 of VTOL (vertical take off and landing), vertical movement servomotor 110, vertical movement leading screw 112, industrial computer 114, Programmable Logic Controller PLC116, finished product cards are received draw-in groove 118 and useless draw-in groove 120;
At least two many notchs 108 of VTOL (vertical take off and landing), be connected with industrial computer 114 respectively, and be connected to vertical movement servomotor 110 by vertical movement leading screw 112, for make vertical displacement movement under the drive of vertical movement servomotor 110 and vertical movement leading screw 112, from horizontal card feed track, 106 obtain IC-card to be tested successively; On the many notchs 108 of each VTOL (vertical take off and landing), be provided with a plurality of embedded IC card reading and writing machine of vertical distribution, a plurality of embedded IC card reading and writing machine are connected with industrial computer 114 by serial ports respectively, and each embedded IC card reading and writing machine is carried out read-write card operation to the IC-card in it;
PLC116, be connected with industrial computer 114, vertical movement servomotor 110, tangential movement servomotor 104, operation for level of control card feed track 106, and control a plurality of IC card reading and writing machine at least two many notchs 108 of VTOL (vertical take off and landing) and by first in first out order, a plurality of IC-cards to be tested are tested, the test result signal that Real-time Collection industrial computer 114 sends, test is successfully blocked by the horizontal card feed track 106 of tangential movement servomotor 104 driving and deposits into finished product card and receive draw-in groove 118, and the card of test crash is deposited into useless draw-in groove 120.
As preferably, this has vertical lift type mutiread and writes the IC-card chip testing equipment 100 of deck and also can comprise: receive useless treibgas cylinder 122, be connected with PLC116, while being close to useless draw-in groove 120 for the card when test crash, under the control of PLC116 and start, the card of test crash is taken in to useless draw-in groove 120.
As preferably, this has vertical lift type mutiread and writes the IC-card chip testing equipment 100 of deck and also can comprise: touch LCD display (not illustrating), be connected, for showing the running status of PLC116 with PLC116.
As preferably, it is the terminals that are arranged at horizontal card feed track 106 that this finished product card is received draw-in groove 118, vertical with horizontal card feed track 106.
As preferably, on the many notchs 108 of this VTOL (vertical take off and landing), vertical distribution has a plurality of decks, and an IC card reading and writing machine is set on each deck.
As preferably, IC-card can be contact or non-contact IC card.
As preferably, serial ports can be RS-232 interface, RS-422 interface or RS-485 interface.
This test or personalization data equipment are owing to being employing vertical lifting platform, each vertical lifting platform includes a plurality of IC read-write headses (embedded read-write heads) of vertical distribution in this vertical plane, thereby solved the long problem of length of using a plurality of read-write headses and make production line on a production line, in the utility model, this vertical lifting platform has been saved the length of conveyance IC-card line.
The utility model embodiment has also solved well at parallel two or above VTOL (vertical take off and landing) multiple fastening seat and has entered the problem of the first in first out in card system.
Fig. 2 is the schematic diagram of the many notchs 108 of the VTOL (vertical take off and landing) of the utility model embodiment.Fig. 2 shows many notchs figure that two parallel vertical lift mutireads are write the VTOL (vertical take off and landing) platform of the parallel contact of deck and Circuit for Non-contact IC Chip test (individualizing) equipment.In Fig. 2, in A (B) 1, A represents VTOL (vertical take off and landing) platform A; B represents VTOL (vertical take off and landing) platform B; 1-8: represent respectively embedded IC card reading and writing machine No. one to No. eight.
As shown in Figure 2, the design feature of two many notchs of parallel vertical lifting (hereinafter to be referred as VTOL (vertical take off and landing) platform) first in first out is described below:
One by PLC(Programmable Logic Controller) vertical lift device (platform) controlled with vertical movement servomotor is conventionally with 8 embedded IC card reading and writing machine independently, and 8 independently embedded IC card reading and writing machine and upper many serial ports industry control PC are connected.A plurality of IC card reading and writing machine in VTOL (vertical take off and landing) platform complete after read-write card operation IC-card wherein, by the serial ports of industry control PC, notify PLC by the fixedly deposit position of good card and bad card, to handle card well and badly block simultaneously by the principle of first in first out.Iterative cycles is until handle definite plan amount.
When entering card for the first time VTOL (vertical take off and landing) platform below, it is A1 (B1) position, the A1 completing (B1) position enter card, VTOL (vertical take off and landing) platform rises one and arrives by that analogy A8 (B8) to A2 (B2) position, now the highest for being raised to, after completing test, drop to again the end etc. by A1 (B1), A2 (B2) ... the order card release of .A8 (B8), enters second simultaneously and circulates into card at once.
In conjunction with consulting Fig. 1-Fig. 2, the principle of work/process of two a plurality of IC card reading and writing machine parallel data of parallel vertical lift processing IC the core of the card built-in testing equipment of the utility model embodiment comprises:
(1) card tested or personalization data is pulled out from " entering draw-in groove " bottom by the principle of first in first out, by tangential movement servomotor, through level run belt, is passed in and out successively in a plurality of IC card reading and writing machine in two parallel vertical lifting tables, processes concurrently.
Embedded IC card reading and writing machine in (2) two parallel VTOL (vertical take off and landing) platforms (for example 8 every group) is tested by the principle of first in first out or read-write card operation, and upper industry control PC knows that by the cartoon that completes test or personalization data the PLC that controls this testing apparatus carries out the processing of belt conveyance card.In this step, upper industry control PC carries out the data processing of parallel IC chip to entering card in IC card reading and writing machine, by the result notice PLC, that is: the A1 that handle; A2; A3........; B1; B2; The test result of the card B3...... " by " or " not passing through ".
(3) PLC that controls this testing apparatus operation is by receiving test that industry control PC sends or the personalized success of the data signal with unsuccessful card, will test or personalized complete card is sent into and received draw-in groove or useless draw-in groove is processed in order.This step is specially, PLC level of control track and a plurality of IC card reading and writing machine of two parallel vertical lifting tables are by the principle operation of first in first out, control the work of the cylinder of receiving useless card simultaneously, during the data processed result of the IC-card that each IC card reading and writing machine of beaming back to upper industry control PC when PLC Real-time Collection is corresponding, that is: A1; A2; A3........; B1; B2; The test result of the card B3...... " by " or " not passing through ".By good card, by tangential movement servomotor operation level conveyance belt, will stick into well and receive card platform (groove); When useless while snapping into useless card platform (groove), PLC starts and receives method that useless treibgas cylinder takes in useless draw-in groove by useless card and process and tested or the card of personalization data.
(4) PLC control two parallel VTOL (vertical take off and landing) platforms when entering card for the first time VTOL (vertical take off and landing) platform always below enter card successively after towards rising, the utility model embodiment can carry out conveyance IC-card in order by a kind of following method by first in first out, be specially: screens is entered in two (N) parallel vertical lifting table parallel liftings one simultaneously, and the method that horizontal position is transferred two cards completes.That is: A1 (K1), B1 (K2) → A2 (K3), B2 (K4) → A3 (K5), B3 (K6) etc...
Note: A1(K0) represent no card of A1 draw-in groove; A2 (K1) represents that A2 draw-in groove is No. 1 card; B1(K8) represent that B1 draw-in groove is No. 8 cards; N represents a plurality of.
Compared with prior art, the utlity model has following advantage:
One, reduce to greatest extent the mistake that manual test or personalized IC-card chip bring, controlled False Rate below 3/1000ths, greatly improved labour productivity.
Two, on this equipment, a plurality of IC card reading and writing machine of parallel running are simultaneously tested or personalization data chip, and this has greatly improved performance in the unit interval.
Three, usable range is wide: can test or personal data writes all kinds of chips of iso standard Contact Type Ic Card or non-contact IC card.
Four, automaticity is high: the present embodiment is controlled the situation that completes of the reading and writing data success or not of a plurality of IC card reading and writing machine in testing apparatus with industrial PC (PC), and utilize industrial PC (PC) to monitor the running status of PLC, as: a certain IC-card is residing position in testing apparatus, the disposition of the successful card of reading and writing data and unsuccessful card etc., utilize PLC according to the requirement of first in first out, by completing test or personalized IC-card, automatically enter receipts card platform in order, IC chip testing or individualized unsuccessful card are delivered to useless draw-in groove simultaneously.This has realized turnover card and the test of robotization, and automaticity is high, and efficiency greatly improves, simultaneously cost.
Above embodiment only, in order to the technical scheme of the utility model embodiment to be described, is not intended to limit; Although the utility model embodiment is had been described in detail with reference to previous embodiment, those of ordinary skill in the art is to be understood that: its technical scheme that still can record aforementioned each embodiment is modified, or part technical characterictic is wherein equal to replacement; And these modifications or replacement do not make the essence of appropriate technical solution depart from the spirit and scope of each embodiment technical scheme of the utility model embodiment.
Claims (8)
1. one kind has the IC-card chip testing equipment that vertical lift type mutiread is write deck, it is characterized in that, described testing apparatus comprises: enter draw-in groove, tangential movement servomotor, horizontal card feed track, at least two the many notchs of VTOL (vertical take off and landing), vertical movement servomotor, vertical movement leading screw, useless draw-in groove, finished product cards are received draw-in groove, Programmable Logic Controller PLC and industrial computer;
Described tangential movement servomotor, respectively with describedly enter draw-in groove, described horizontal card feed track is connected with described PLC, for entering draw-in groove and obtain the IC-card a plurality of to be tested of storage from described under the control of described PLC, and drive described horizontal card feed track to transport described a plurality of IC-card to be tested;
The many notchs of described at least two VTOL (vertical take off and landing), be connected with described industrial computer respectively, and be connected to described vertical movement servomotor by described vertical movement leading screw, for make vertical displacement movement under the drive of described vertical movement servomotor and described vertical movement leading screw, from described horizontal card feed track, obtain successively IC-card to be tested; On the many notchs of each VTOL (vertical take off and landing), be provided with a plurality of embedded IC card reading and writing machine of vertical distribution, described a plurality of embedded IC card reading and writing machine is connected with described industrial computer by serial ports respectively, and each embedded IC card reading and writing machine is carried out read-write card operation to the IC-card in it;
Described vertical movement servomotor, is connected with described PLC, under the control of described PLC, drive described vertical movement leading screw drive described at least two many notchs of VTOL (vertical take off and landing) do elevating movement;
Described industrial computer, is connected with described PLC, for monitoring and the running status of control PLC, controls described IC card reading and writing machine IC-card to be tested is carried out to test processes, to described PLC, sends the test result signal for each IC-card to be tested;
Described PLC, be connected with described industrial computer, described vertical movement servomotor, described tangential movement servomotor, for controlling the operation of described horizontal card feed track, and described in controlling at least two many notchs of VTOL (vertical take off and landing) a plurality of IC card reading and writing machine by first in first out order, a plurality of IC-cards to be tested are tested, the test result signal that described in Real-time Collection, industrial computer sends, test is successfully blocked by horizontal card feed track described in described tangential movement driven by servomotor and deposits into described finished product card and receive draw-in groove, and the card of test crash is deposited into described useless draw-in groove.
2. according to claim 1 have the IC-card chip testing equipment that vertical lift type mutiread is write deck, it is characterized in that, also comprises:
Receive useless treibgas cylinder, is connected with described PLC, for the card when test crash, be close to while giving up draw-in groove, under the control of described PLC and start, the card of described test crash is taken in to described useless draw-in groove.
3. according to claim 1 have the IC-card chip testing equipment that vertical lift type mutiread is write deck, it is characterized in that, also comprises:
Touch LCD display, be connected with described PLC, for showing the running status of described PLC.
4. according to claim 1 have the IC-card chip testing equipment that vertical lift type mutiread is write deck, it is characterized in that:
It is the terminal that is arranged at described horizontal card feed track that described finished product card is received draw-in groove, vertical with described horizontal card feed track.
5. according to claim 1 have the IC-card chip testing equipment that vertical lift type mutiread is write deck, it is characterized in that:
On the many notchs of described VTOL (vertical take off and landing), vertical distribution has a plurality of decks, and an IC card reading and writing machine is set on each deck.
6. according to claim 1 have the IC-card chip testing equipment that vertical lift type mutiread is write deck, it is characterized in that: described IC-card is contact or non-contact IC card.
7. according to claim 1 have the IC-card chip testing equipment that vertical lift type mutiread is write deck, it is characterized in that: described serial ports is RS-232 interface, RS-422 interface or RS-485 interface.
8. according to claim 1 have the IC-card chip testing equipment that vertical lift type mutiread is write deck, it is characterized in that: the many notchs of described at least two VTOL (vertical take off and landing) are parallel to each other.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320656307.8U CN203502525U (en) | 2013-10-23 | 2013-10-23 | IC card chip testing device with vertical lifting type multi-reading and writing card seat structure |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320656307.8U CN203502525U (en) | 2013-10-23 | 2013-10-23 | IC card chip testing device with vertical lifting type multi-reading and writing card seat structure |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203502525U true CN203502525U (en) | 2014-03-26 |
Family
ID=50333495
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201320656307.8U Expired - Fee Related CN203502525U (en) | 2013-10-23 | 2013-10-23 | IC card chip testing device with vertical lifting type multi-reading and writing card seat structure |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203502525U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104459418A (en) * | 2014-12-27 | 2015-03-25 | 宁夏大学 | IC card service life testing method and device |
-
2013
- 2013-10-23 CN CN201320656307.8U patent/CN203502525U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104459418A (en) * | 2014-12-27 | 2015-03-25 | 宁夏大学 | IC card service life testing method and device |
| CN104459418B (en) * | 2014-12-27 | 2017-09-05 | 宁夏大学 | A kind of IC-card service life method of testing and device |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN203562005U (en) | IC card chip testing system with vertical lift multi-read-write card bases | |
| CN103592898B (en) | A kind of electronic product manufacture automatic control system and method | |
| CN112151106B (en) | SSD aging test method and device, storage medium and electronic equipment | |
| JP4202498B2 (en) | Parts handling device | |
| CN108447806B (en) | Chip automatic production equipment, system and method thereof | |
| JPH1045251A (en) | High-speed personalization machine | |
| CN203502525U (en) | IC card chip testing device with vertical lifting type multi-reading and writing card seat structure | |
| CN109462842B (en) | Automatic control method for downloading and testing Bluetooth SIM card | |
| CN105032791A (en) | Method for utilizing battery automatic testing and sorting device to perform battery testing and sorting | |
| CN106583275A (en) | Device and method for controlling flow direction of detected plate and visual detection equipment | |
| CN203737616U (en) | Book sorting device | |
| JP4104792B2 (en) | Linear individualization device | |
| CN206601720U (en) | A kind of traffic IC card batch read-write equipment | |
| JP3639802B2 (en) | Sample transport system | |
| US9696716B2 (en) | Method for serial personalization of smart cards | |
| CN111229617B (en) | Automatic classification intelligent RFID (radio frequency identification) channel machine and automatic classification method thereof | |
| CN202939701U (en) | Multi-card operation equipment and automatic teller machine | |
| CN114116463A (en) | Test system and method for reader-writer of automatic ticket selling and checking system | |
| ITMI20100022A1 (en) | INTEGRATED SYSTEM FOR TESTING ELECTRONIC DEVICES | |
| CN109848071A (en) | Smart card authentication system and method | |
| CN105652819A (en) | Product processing quality monitoring system of mechanical processing line | |
| CN202995764U (en) | 24-module non-contact IC card INLAY testing system | |
| CN204965469U (en) | IC -card information detection system | |
| KR200454706Y1 (en) | card acceptance device | |
| CN214718474U (en) | Intelligent watch function test system |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20140326 Termination date: 20211023 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |