CN203479984U - Diode testing device - Google Patents
Diode testing device Download PDFInfo
- Publication number
- CN203479984U CN203479984U CN201320612591.9U CN201320612591U CN203479984U CN 203479984 U CN203479984 U CN 203479984U CN 201320612591 U CN201320612591 U CN 201320612591U CN 203479984 U CN203479984 U CN 203479984U
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- CN
- China
- Prior art keywords
- diode
- groove
- lower plate
- detection device
- clamping board
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn - After Issue
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- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The utility model discloses a diode testing device which comprises an upper clamping board (1), a lower clamping board (2) and two metal electrodes (3). The two metal electrodes (3) are connected two terminals at the left end of the lower clamping board (2). A spring (6) and supporting columns (8) are arranged between the upper clamping board and the lower clamping board. The diode testing device is characterized in that: the right end of the lower clamping board (2) is provided with a groove (9); the right end of the upper clamping board (1) is provided with two projections (5); and the projections (5) are placed in the groove (9). The diode testing device settles the following problems in performing routine clamping mode or pressing test mode in testing of diode which is axially packaged by ultrathin pins: mechanical damage, inferior contact, low fixing firmness, easy larger test data error, etc.
Description
Technical field
The utility model belongs to Test Diode technical field, relates in particular to a kind of superfine pin diodes proving installation.
Background technology
Superfine pin is the diode of encapsulation axially, has the pin of 2 diameters below 0.2mm, and pin is many to be manufactured by flexible metallic material, very easily damages.The diode that this superfine pin of test axially encapsulates at present mainly contains two kinds of methods, a kind of is with common alligator forceps, directly to clamp diode two ends pin to test, because this kind of diode pin is superfine and softer, the method easily causes even fracture of pin damage.Another kind method is that two pins are pressed together on level and smooth metal electrode and are tested, although this kind of method is less to pin damage, but because this kind of diode pin mostly is bending, often there is diode pin and metal electrode loose contact, cause the problem that test parameter is overproof.And the testing efficiency of these two kinds of test modes is not high, is not suitable for large batch of test.
Summary of the invention
The technical problems to be solved in the utility model: a kind of diode detection device is provided, while axially encapsulating Test Diode to solve superfine pin, adopt mechanical damage that conventional clamping or pressing test mode brought, loose contact, fixing not firm, easily cause the larger problems such as test data error.
Technical solutions of the utility model:
A kind of diode detection device, it comprises train wheel bridge, lower plate and two metal electrodes, two metal electrodes are connected with two binding posts of lower plate left end, between upper lower plate, there are spring and support column, lower plate right-hand member has groove, train wheel bridge right-hand member has two projections, and projection is placed in groove.
Groove is circular arc, and convex shape is corresponding with groove shapes.
Projection is elastic caoutchouc projection.
Recess width is 10-15 times of measured diode shell diameter, and the degree of depth is 3-5 times of measured diode shell diameter.
The width of metal electrode is half of measured diode pin length, and length is consistent with lower plate length.
Train wheel bridge, lower plate and support column are made by electrician's bakelite.
The two ends of spring are fixed in draw-in groove.
The beneficial effects of the utility model:
While adopting the utility model test diode, diode can directly fall in groove, the movement before and after can not occurring, and diode pin is that face contacts with the metal electrode in groove, has greatly reduced the damage of proving installation to diode pin; Together with the elastic caoutchouc of train wheel bridge right-hand member projection fits like a glove with the groove of lower plate simultaneously, under elastic rubber effect, can closely diode pin be pressed together on metal electrode, strengthen the electrical contact between diode and metal electrode, make the data stabilization of test reliable; Employing elastic caoutchouc projection, can guarantee that the pin of measured diode is not damaged guaranteeing to contact between metal electrode and measured diode pin in fastening.Relative prior art, the utility model has improved the testing reliability that diode especially superfine pin axially encapsulates diode, improved testing efficiency, solved when the especially superfine pin of diode axially encapsulates Test Diode the mechanical damage that adopts conventional clamping or pressing test mode to bring, loose contact, fixing not firm, easily cause the larger problems such as test data error.
accompanying drawing explanation:
Fig. 1 is the utility model structural representation;
Fig. 2 is the utility model train wheel bridge elevational schematic view;
Fig. 3 is the utility model lower plate schematic top plan view.
embodiment:
A kind of diode detection device, it comprises train wheel bridge 1, lower plate 2 and two metal electrodes 3, two metal electrodes 3 are electrically connected with two binding posts of lower plate 2 left ends, between upper lower plate, there are spring 6 and support column 8, lower plate 2 right-hand members have groove 9, train wheel bridge 1 right-hand member has two projections 5, and projection 5 is placed in groove 9
.
Groove 9 is circular arc, and protruding 5 shapes are corresponding, measure-alike with groove 9 shapes, guarantee projection 5 can with groove 9 close contacts.
Groove 9 width are 10-15 times of measured diode shell diameter, and the degree of depth is 3-5 times of measured diode shell diameter.
The width of metal electrode 3 is half of measured diode pin length, length is consistent with lower plate 2 length, the width of metal electrode 3 be made as measured diode pin length half be mainly while guaranteeing to test when reliable contact, save again cost, the too wide meeting of width causes metal electrode 3 costs to increase.Distance between two metal electrodes must not be greater than the distance between two pins of measured diode.
Respectively there are two support columns 8 on lower plate 2 and train wheel bridge 1 upper and lower both sides, middle part, and support column 8 links together by metal screw, can rotate.
Upper lower plate postmedian has measure-alike and corresponding spring card slot 7, and its diameter is identical with spring diameter, and the two ends of spring 6 are fixed in draw-in groove 7.
Train wheel bridge 1, lower plate 2 and support column 8 are made by electrician's bakelite, and it is lightweight that described device adopts electrician's bakelite to make to have, good insulating, the advantage such as easy to process.
During actual use, by the p-wire of diode tester and two binding post 4 electrical connections, by lower device left end, by clamping plate, open, measured diode is put into groove, releasing device left end, makes projection 5 push down diode pin, guarantees that pin contacts with metal electrode.
Claims (7)
1. a diode detection device, it comprises train wheel bridge (1), lower plate (2) and two metal electrodes (3), two metal electrodes (3) are connected with two binding posts (4) of lower plate (2) left end, between upper lower plate, there are spring (6) and support column (8), it is characterized in that: lower plate (2) right-hand member has groove (9), train wheel bridge (1) right-hand member has two projections (5), and projection (5) is placed in groove (9)
.
2. a kind of diode detection device according to claim 1, is characterized in that: groove (9) is circular arc, and projection (5) shape is corresponding with groove (9) shape.
3. a kind of diode detection device according to claim 1 and 2, is characterized in that: projection (5) is elastic caoutchouc projection.
4. a kind of diode detection device according to claim 1 and 2, is characterized in that: groove (9) width is 10-15 times of measured diode shell diameter, and the degree of depth is 3-5 times of measured diode shell diameter.
5. a kind of diode detection device according to claim 1, is characterized in that: the width of metal electrode (3) is half of measured diode pin length, and length is consistent with lower plate (2) length.
6. a kind of diode detection device according to claim 1, is characterized in that: train wheel bridge (1), lower plate (2) and support column (8) are made by electrician's bakelite.
7. a kind of diode detection device according to claim 1, is characterized in that: the two ends of spring (6) are fixed in draw-in groove (7).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320612591.9U CN203479984U (en) | 2013-09-30 | 2013-09-30 | Diode testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320612591.9U CN203479984U (en) | 2013-09-30 | 2013-09-30 | Diode testing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203479984U true CN203479984U (en) | 2014-03-12 |
Family
ID=50228292
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201320612591.9U Withdrawn - After Issue CN203479984U (en) | 2013-09-30 | 2013-09-30 | Diode testing device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203479984U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103499783A (en) * | 2013-09-30 | 2014-01-08 | 贵州航天计量测试技术研究所 | Diode testing device and use method thereof |
| CN110320390A (en) * | 2019-08-08 | 2019-10-11 | 郑州威科特电子科技有限公司 | A kind of pin protection type Test Diode clamping tooling |
-
2013
- 2013-09-30 CN CN201320612591.9U patent/CN203479984U/en not_active Withdrawn - After Issue
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103499783A (en) * | 2013-09-30 | 2014-01-08 | 贵州航天计量测试技术研究所 | Diode testing device and use method thereof |
| CN103499783B (en) * | 2013-09-30 | 2016-05-11 | 贵州航天计量测试技术研究所 | A kind of diode detection device and using method thereof |
| CN110320390A (en) * | 2019-08-08 | 2019-10-11 | 郑州威科特电子科技有限公司 | A kind of pin protection type Test Diode clamping tooling |
| CN110320390B (en) * | 2019-08-08 | 2021-12-10 | 深圳市研测科技有限公司 | Clamping tool for pin protection type diode test |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| AV01 | Patent right actively abandoned |
Granted publication date: 20140312 Effective date of abandoning: 20160511 |
|
| AV01 | Patent right actively abandoned |
Granted publication date: 20140312 Effective date of abandoning: 20160511 |
|
| C25 | Abandonment of patent right or utility model to avoid double patenting |