CN203287404U

CN203287404U - Probe jig

Info

Publication number: CN203287404U
Application number: CN2013202304784U
Authority: CN
Inventors: 周建荣
Original assignee: Suzhou Jinniu Precision Machinery Co Ltd
Current assignee: Suzhou Jinniu Precision Machinery Co Ltd
Priority date: 2013-05-02
Filing date: 2013-05-02
Publication date: 2013-11-13
Anticipated expiration: 2023-05-02

Abstract

The utility model relates to a probe jig. The probe jig comprises a base, and a supporting table which is arranged on the base. A clamping board is installed on the supporting table, and at least one clamping hole is formed in the clamping board. According to the utility model, a probe can be clamped firmly through the clamping hole of the clamping board, and at the same time, the probe is fixed on a working table through an installation hole and a fixation hole, so that the probe will not shake during tests, so the advantage of good test precision can be realized, and the working efficiency is improved.

Description

The probe tool

Technical field

The utility model relates to a kind of probe tool, relates in particular to a kind of probe tool of the circuit board electric conductivity be used to utilizing ito thin film.

Background technology

Touch-screen (TP, Touch Panel), it is a kind of induction type liquid crystal indicator that receives the input signals such as contact, when having touched the image button on the screen, haptic feedback system on screen can be according to the various coupling arrangements of driven by program of programming in advance, produce lively visual and sound effects by liquid crystal display picture, be widely used in the fields such as panel computer, PDA, smart mobile phone, air-conditioning, refrigerator.

The major part of touch-screen is a resistance film layer that coordinates very much with display screen surface, it uses one deck glass or duroplasts flat board as basic unit, surface scribbles the layer of transparent conductive coating, the material of this conductive coating generally adopts the ITO(indium oxide), but ITO is easily damaged before use, after being coated in basic unit, easily cause the capacitance plate cisco unity malfunction, need to again do over again and even directly scrap.Need check to utilize the electric conductivity of the circuit board of ito thin film, have now and utilize hand to take probe to identify,, because manual test is also inhomogeneous because of the power that operator's difference applies, the excessive phenomenon of exerting oneself occurs sometimes, the damage circuit board, increased the production cost of enterprise.Therefore, but be badly in need of a kind of tool of clamping probe.

The utility model content

The utility model has overcome the deficiencies in the prior art, and a kind of probe tool simple in structure is provided.

For achieving the above object, the technical solution adopted in the utility model is: a kind of probe tool, and comprise base, be located at the brace table on described base, on described brace table, grip block is installed, have at least one clamping hole on described grip block.

In preferred embodiment of the utility model, the probe tool comprises that further described grip block vertically arranges, and described grip block longitudinally is provided with two described clamping holes.

In preferred embodiment of the utility model, the probe tool comprises that further two described clamping holes are located along the same line.

In preferred embodiment of the utility model, the probe tool further comprises on described brace table and has two mounting holes, the parallel two row's fixed orifices that are provided with between two described mounting holes.

In preferred embodiment of the utility model, the probe tool comprises that further the quantity of the described fixed orifice of every row is two.

In preferred embodiment of the utility model, the probe tool comprises that further described base comprises the first pedestal, the second pedestal, and described the first pedestal, the second pedestal are separated from one another.

In preferred embodiment of the utility model, the probe tool further comprises on the angle of described the first pedestal, the second pedestal and is provided with chamfer, and the width of described the first pedestal is greater than the width of described the second pedestal.

The utility model has solved the defect that exists in the background technology, the clamping hole of the utility model by grip block can be firm the clamping probe, be fixed on worktable by mounting hole, fixed orifice simultaneously, probe can not rock when test, measuring accuracy is high, has improved work efficiency.

Description of drawings

Below in conjunction with drawings and Examples, the utility model is further illustrated.

Fig. 1 is the front view of preferred embodiment of the present utility model;

Fig. 2 is the left view of preferred embodiment of the present utility model;

Fig. 3 is the vertical view of preferred embodiment of the present utility model;

In figure: 1, base, 2, brace table, 3, grip block, 4, clamping hole, 5, mounting hole, 6, fixed orifice, the 7, first pedestal, the 8, second pedestal, 9, chamfer.

Embodiment

In conjunction with the accompanying drawings and embodiments the utility model is described in further detail now, these accompanying drawings are the schematic diagram of simplification, basic structure of the present utility model only is described in a schematic way, so it only show the formation relevant with the utility model.

As shown in Figure 1, Figure 2, Figure 3 shows, a kind of probe tool, comprise base 1, be located at the brace table 2 on base 1, and grip block 3 is installed on brace table 2, has at least one clamping hole 4 on grip block 3.

The preferred grip block 3 of the utility model vertically arranges, and grip block 3 longitudinally is provided with 4, two clamping holes 4 of two clamping holes and is located along the same line, once can two probes of clamping, improved the efficiency of test.

For fear of the movement of avoiding tool, brace table 2 is horizontally disposed with, have two mounting holes 5 on brace table 2, the parallel two row's fixed orifices 6 that are provided with between two mounting holes 5, the quantity of every row's fixed orifice 6 is two, and the distance between horizontally disposed two fixed orifices 6 is greater than the distance between two fixed orifices 6 that vertically arrange.

The preferred base 1 of the utility model comprises that the first pedestal 7, the second pedestal 8, the first pedestals 7, the second pedestal 8 are separated from one another.Be provided with chamfer 9 on the angle of the first pedestal 7, the second pedestal 8, the width of the first pedestal 7 is greater than the width of the second pedestal 8, and the rear end face of the rear end face of the first pedestal 7 and brace table 2 at grade, and the front end face of the front end face of the second pedestal 8 and brace table 2 at grade.

The utility model in use, two probes are inserted respectively in two clamping holes 4 of grip block 3, by mounting hole 5, fixed orifice 6, tool is fixed on worktable simultaneously, drives circuit board under test by driving mechanism and move to probe, but the whether conducting of the circuit of testing circuit board.

Above foundation desirable embodiment of the present utility model is enlightenment, and by above-mentioned description, the related personnel can in the scope that does not depart from this utility model technological thought, carry out various change and modification fully.The technical scope of this utility model is not limited to the content on instructions, must determine technical scope according to the claim scope.

Claims

1. a probe tool, is characterized in that: comprise base, be located at the brace table on described base, on described brace table, grip block is installed, have at least one clamping hole on described grip block.

2. probe tool according to claim 1, it is characterized in that: described grip block vertically arranges, and described grip block longitudinally is provided with two described clamping holes.

3. probe tool according to claim 2, it is characterized in that: two described clamping holes are located along the same line.

4. probe tool according to claim 1, is characterized in that: have two mounting holes on described brace table, the parallel two row's fixed orifices that are provided with between two described mounting holes.

5. probe tool according to claim 4, it is characterized in that: the quantity of the described fixed orifice of every row is two.

6. probe tool according to claim 1, it is characterized in that: described base comprises the first pedestal, the second pedestal, described the first pedestal, the second pedestal are separated from one another.

7. probe tool according to claim 6, it is characterized in that: be provided with chamfer on the angle of described the first pedestal, the second pedestal, the width of described the first pedestal is greater than the width of described the second pedestal.