CN203259741U - Detection circuit structure, display panel and display device, - Google Patents
Detection circuit structure, display panel and display device, Download PDFInfo
- Publication number
- CN203259741U CN203259741U CN 201320148606 CN201320148606U CN203259741U CN 203259741 U CN203259741 U CN 203259741U CN 201320148606 CN201320148606 CN 201320148606 CN 201320148606 U CN201320148606 U CN 201320148606U CN 203259741 U CN203259741 U CN 203259741U
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- detection line
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- line structure
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Abstract
The utility model discloses a detection circuit structure, a display panel and a display device. The detection circuit structure comprises a cell test circuit, a conductive area, a first fan area and a second fan area, wherein the conductive area is connected with the cell test circuit. The detection circuit structure further comprises an electrical test area which is located in the cell test detection circuit. The display panel comprises the detection circuit structure. The display device comprises the display panel. According to the detection circuit structure, the display panel and the display device, the signal disconnection caused when the electrical test area is scratched in the electrical test process can be avoided.
Description
Technical field
The utility model relates to the array base palte technology, relates in particular to a kind of detection line structure, display panel and display device.
Background technology
In the manufacturing process of array base palte, usually after being completed, box to carry out cutting twice to one whole display panel, for product quality is monitored, the middle sheet (Q-panel) that forms after cutting is for the first time tested for the first time, namely box technique is detected (cell test, CT), immediately the display panel unit (single panel) that forms after cutting is for the second time tested for the second time, be electrical detection (Electrical test, ET).
In order to reduce costs, available liquid crystal shows that industry adopts the capable driving of array base palte (Gate Drive on Array, GOA) technology more, in this technology, as shown in Fig. 1 a, Fig. 1 b, wherein, after being amplified, the structure shown in the empty frame in the upper left corner in Fig. 1 a is the structure shown in Fig. 1 b; Via area 9 is arranged in conductive region 2, and by described via area 9, CT circuit 1 is connected with conductive region 2, electrical testing (test pad) zone 5 is arranged in conductive region 2, and by described test pad zone 5, described conductive region 2 fan-shaped with first (fan-out) regional 3 is connected.
When the single panel that forms after cutting is for the second time carried out ET, test pad zone 5 is designed usually at integrated circuit (IC) chip (Integrated Circuit, IC) 7 lead in the circuit in GOA zone 8, but, because the probe of the checkout equipment that carries out ET is too sharp-pointed, single panel slides in testing process, is easy to scratch test pad zone 5, and this can cause opening circuit of follow-up module signal transmission.Concrete, detection signal when module detects is sent to test pad zone 5 through a fan-out zone 3, with be sent to GOA zone 8 by the 2nd fan-out zone 4, like this, if during ET, test pad zone 5 is scratched, can affect carrying out smoothly of module testing, for follow-up work brings very large trouble and loss.
The utility model content
In view of this, fundamental purpose of the present utility model is to provide a kind of detection line structure, display panel and display device, can avoid opening circuit because electrical testing zone in the electrical detection process is scratched the signal that causes.
For achieving the above object, the technical solution of the utility model is achieved in that
The utility model provides a kind of detection line structure, comprising: to box technique detection line, with the conductive region that box technique detection line is connected, the first sector region and the second sector region; Wherein, described detection line structure also comprises electrical testing zone, and described electrical testing zone is arranged in box technique detection line.
Wherein, described conductive region is connected box technique detection line with described by described electrical testing is regional.
In such scheme, described detection line structure also comprises via area, by described via area, described conductive region is connected with the first sector region.
In such scheme, described box technique detection line is connected with the first sector region by conductive region, described the first sector region is connected with the second sector region.
In such scheme, described the first sector region is connected with integrated circuit (IC) chip; Described the second sector region is connected with array base palte capable drive area.
The utility model also provides a kind of display panel, comprises above-described any detection line structure.
The utility model also provides a kind of display device, comprises display panel recited above.
Detection line structure provided by the utility model, display panel and display device, electrical testing zone design during no longer with electrical detection is led in the circuit of the capable drive area of array base palte in integrated circuit (IC) chip, but the electrical testing zone design during with electrical detection is outside integrated circuit (IC) chip is led to the circuit of the capable drive area of array base palte, so, the detection signal that can avoid being scratched when causing module to detect because of electrical testing zone in the electrical detection process can not normal transmission, is laying the foundation smoothly of subsequent detection work.
Description of drawings
Fig. 1 a and b are detection line structural representation in prior art;
Fig. 2 is the utility model detection line structural representation.
Description of reference numerals
1, CT circuit, the 2, conductive region, the 3, the one fan-out zone, the 4, the 2nd fan-out zone, 5, test pad zone, 6, via hole, 7, IC, 8, the GOA zone, 9, via area
Embodiment
Below in conjunction with specific embodiment and accompanying drawing, embodiment of the present utility model is described in detail.
A kind of detection line structure comprises: to box technique detection line, with the conductive region that box technique detection line is connected, the first sector region and the second sector region; Wherein, described detection line structure also comprises electrical testing zone, and described electrical testing zone is arranged in box technique detection line.
Wherein, described conductive region is connected box technique detection line with described by described electrical testing is regional.
Further, described detection line structure also comprises via area, by described via area, described conductive region is connected with the first sector region.
Further, described box technique detection line is connected with the first sector region by conductive region, described the first sector region is connected with the second sector region.
Concrete, described the first sector region is connected with integrated circuit (IC) chip; Described the second sector region is connected with array base palte capable drive area.
The utility model also provides a kind of display panel, comprises the above any detection line structure.
The utility model provides again a kind of display device, comprises display panel recited above.
Here, it should be noted that the material that described conductive region adopts can be the good film of any electric conductivity, as transparent oxide films such as indium tin oxide (ITO) or indium-zinc oxides (IZO).
Embodiment 1
Fig. 2 is the utility model detection line structural representation, as shown in Figure 2, a kind of detection line structure comprises: to box technique detection line (CT circuit) 1, the conductive region 2 that is connected with CT circuit 1, a fan-out zone 3 and the 2nd fan-out zone 4; Wherein, described test pad zone 5 is arranged in described CT circuit 1;
Here, described CT circuit 1 is connected with a fan-out zone 3 by conductive region 2, and described conductive region 2 with the equitant part of CT circuit 1 greater than conductive region 2 and the regional 3 equitant parts of a fan-out; Further, described conductive region 2 interconnects by via hole 6 with the equitant part of CT circuit 1, and described conductive region 2 is connected by via hole 6 with CT circuit 1 and equitant part forms test pad zone 5, described test pad zone 5 detection during for ET;
Described conductive region 2 and fan-out zone 3 equitant parts are formed with via area 9, and described via area 9 is used for connecting described conductive region 2 and a fan-out zone 3;
A described fan-out regional 3 is connected with IC, is used for receiving the IC signal;
Described the 2nd fan-out zone 4 and GOA joint area is used for the regional input signal to GOA;
A described fan-out regional 3 is connected with described the 2nd fan-out regional 4; Further, a described fan-out zone 3 connects the GOA zone by the 2nd fan-out zone 4, is used for the signal to GOA zone input IC.
When carrying out ET, test probe stretches in via hole 6 in described test pad zone 5 and detects, therefore, via hole 6 in described test pad zone 5 is used on the one hand conductive region 2 and is connected with CT circuit 1, when being used on the other hand the ET detection, probe stretches into wherein, to guarantee carrying out smoothly of ET testing.The stretching into of probe during for ease of ET, the via hole number in described test pad zone 5, with and closeness all greater than the via hole number in via area 9, with and closeness.
Detection line structure provided by the utility model; Display panel and display device; No longer test pad zone design is led in the circuit in GOA zone at the IC signal; But with test pad zone design outside IC leads to the circuit in GOA zone; So; Even test pad zone is scratched; When follow-up module detects; Its module signal directly is sent to the 2nd fan-out zone through a fan-out zone; No longer through test pad zone; Therefore; Can avoid being scratched because of test pad zone in the ET process signal Transmission that causes; Be laying the foundation smoothly of subsequent detection work.
The above is only preferred embodiment of the present utility model, is not be used to limiting protection domain of the present utility model.
Claims (8)
1. detection line structure comprises: to box technique detection line, with the conductive region that box technique detection line is connected, the first sector region and the second sector region; It is characterized in that, described detection line structure comprises that also electrical testing is regional; Wherein, described electrical testing zone is arranged in box technique detection line.
2. detection line structure according to claim 1, is characterized in that, described conductive region is connected box technique detection line with described by described electrical testing is regional.
3. detection line structure according to claim 1, is characterized in that, described detection line structure also comprises via area, by described via area, described conductive region is connected with the first sector region.
4. the described detection line structure of according to claim 1 to 3 any one, is characterized in that, described box technique detection line is connected with the first sector region by conductive region, and described the first sector region is connected with the second sector region.
5. the described detection line structure of according to claim 1 to 3 any one, is characterized in that, described the first sector region is connected with integrated circuit (IC) chip.
6. the described detection line structure of according to claim 1 to 3 any one, is characterized in that, described the second sector region is connected with array base palte capable drive area.
7. a display panel, is characterized in that, described display panel comprises the described detection line structure of claim 1 to 6 any one.
8. a display device, is characterized in that, described display device comprises display panel claimed in claim 7.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201320148606 CN203259741U (en) | 2013-03-28 | 2013-03-28 | Detection circuit structure, display panel and display device, |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201320148606 CN203259741U (en) | 2013-03-28 | 2013-03-28 | Detection circuit structure, display panel and display device, |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203259741U true CN203259741U (en) | 2013-10-30 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201320148606 Expired - Fee Related CN203259741U (en) | 2013-03-28 | 2013-03-28 | Detection circuit structure, display panel and display device, |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203259741U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104570421A (en) * | 2014-12-31 | 2015-04-29 | 上海天马微电子有限公司 | Display panel and display device |
| CN107068046A (en) * | 2017-04-19 | 2017-08-18 | 京东方科技集团股份有限公司 | Display panel and display device |
-
2013
- 2013-03-28 CN CN 201320148606 patent/CN203259741U/en not_active Expired - Fee Related
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104570421A (en) * | 2014-12-31 | 2015-04-29 | 上海天马微电子有限公司 | Display panel and display device |
| CN104570421B (en) * | 2014-12-31 | 2017-07-21 | 上海天马微电子有限公司 | A kind of display panel and display device |
| CN107068046A (en) * | 2017-04-19 | 2017-08-18 | 京东方科技集团股份有限公司 | Display panel and display device |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| ASS | Succession or assignment of patent right |
Owner name: BEIJING BOE PHOTOELECTRICITY SCIENCE + TECHNOLOGY Effective date: 20150713 Owner name: JINGDONGFANG SCIENCE AND TECHNOLOGY GROUP CO., LTD Free format text: FORMER OWNER: BEIJING BOE PHOTOELECTRICITY SCIENCE + TECHNOLOGY CO., LTD. Effective date: 20150713 |
|
| C41 | Transfer of patent application or patent right or utility model | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20150713 Address after: 100015 Jiuxianqiao Road, Beijing, No. 10, No. Patentee after: BOE TECHNOLOGY GROUP Co.,Ltd. Patentee after: BEIJING BOE OPTOELECTRONICS TECHNOLOGY Co.,Ltd. Address before: 100176 Beijing city in Western Daxing District economic and Technological Development Zone, Road No. 8 Patentee before: BEIJING BOE OPTOELECTRONICS TECHNOLOGY Co.,Ltd. |
|
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20131030 |