CN203132919U - Intelligent foundation coefficient (i)K(/i)30 testing system - Google Patents
Intelligent foundation coefficient (i)K(/i)30 testing system Download PDFInfo
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- CN203132919U CN203132919U CN 201320069595 CN201320069595U CN203132919U CN 203132919 U CN203132919 U CN 203132919U CN 201320069595 CN201320069595 CN 201320069595 CN 201320069595 U CN201320069595 U CN 201320069595U CN 203132919 U CN203132919 U CN 203132919U
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Abstract
The utility model discloses an intelligent foundation coefficient (i)K(/i)30 testing system. The conventional common foundation coefficient K30 flat plate load tester is large in measurement error, and the construction quality is influenced. The system comprises a shell (1), wherein a display screen and a control key are arranged on the shell; the display screen is connected with a colored liquid crystal display circuit (2); the control key is connected with a key control circuit (3); the colored liquid crystal display circuit and the key control circuit are respectively connected with a central processing unit (4); the central processing unit is respectively connected with an analog/digital converter (5), a ferroelectric memory (6), an electrically-erasable programmable read only memory (7), an SD card (8), a clock chip (9), a mini printer (10), a general packet radio service (GPRS) module (11), a global position system (GPS) module (12), a universal serial bus (USB) interface circuit (13) and a power circuit (14); and the analog/digital converter is connected with a signal conditioning circuit (15). The system is used for detecting the roadbed foundation coefficient K30.
Description
Technical field:
The utility model relates to a kind of foundation coefficient
K 30Intelligent test system.
Background technology:
Foundation coefficient
K 30Be one of leading indicator of high-speed railway control roadbed filling compaction quality,
K 30Dull and stereotyped load test instrument is for detection of the roadbed foundation coefficient
K 30The present foundation coefficient that generally uses
K 30Dull and stereotyped load test instrument adopts artificial reading and recording rate of loading, manually reads the heavy amount of noting, and manual delineation load intensity and deflection relation curve, manually calculates foundation coefficient
K 30, on the one hand, because human factor causes detecting error, the measuring error of existence is bigger, influences construction quality; On the other hand, because manually-operated causes work efficiency low, influence construction speed.
Summary of the invention:
The purpose of this utility model provide a kind of can realize automatic reading and recording rate of loading, automatically the reading and recording deflection, automatically describe load intensity-deflection curve, calculate foundation coefficient automatically
K 30Foundation coefficient
K 30Intelligent test system is to improve foundation coefficient
K 30Accuracy of detection, and increase work efficiency.
Above-mentioned purpose realizes by following technical scheme:
A kind of foundation coefficient
K 30Intelligent test system, its composition comprises: housing, has display screen on the described housing, the control button, described display screen is connected with the Color Liquid Crystal Display circuit, described control button is connected with key control circuit, described Color Liquid Crystal Display circuit, described key control circuit is connected with central processing unit respectively, described central processing unit respectively with A/D converter, ferroelectric memory, EEPROM (Electrically Erasable Programmable Read Only Memo), the SD card, clock chip, mini-printer, the GPRS module, the GPS module, usb circuit, power circuit connects, and described A/D converter is connected with signal conditioning circuit.
Described foundation coefficient
K 30Intelligent test system, described central processing unit is the RAM series monolithic, the model STM32F103VET6 of described single-chip microcomputer, the model of described ferroelectric memory is FM22L16, the model of described A/D converter is ADS8364, the model of described colorized lcd display model is DMT64480S057_03WNZ, the model of described GPS module is Jupiter30, the model of described GPRS module is MC55, the model of described clock chip is DS1302, and the model of described EEPROM (Electrically Erasable Programmable Read Only Memo) is AT24C64A.
Beneficial effect:
1. the utility model can read storage load intensity signal and deflection signal automatically; According to load intensity signal and the deflection signal of storage, draw load intensity and deflection relation curve automatically; Automatically calculate foundation coefficient according to the load intensity of describing and deflection relation curve
K 30, on the one hand, reduce artificial factor, improved accuracy of detection; On the other hand, data are handled automatically, have improved work efficiency.
2. the utility model adopts big capacity SD card storage of collected signal data and testing result, can avoid that paper record exists easily along bad, deficiency such as lose.
3. the utility model can be sent to PC with gathering signal data and testing result by USB interface, realizes gathering gathering of signal data and testing result, and can utilize PC to be further analyzed processing to gathering signal data.
4. the utility model can be realized the monitoring to the working-yard by GPS and GPRS module, improves administrative authority to the management level of working-yard.
5. the utility model utilizes mini-printer can directly print testing result, can in time instruct site operation.
6. the utility model adopts colorized lcd display model and keyboard to realize man-machine interaction, and friendly interface is simple to operate, intuitive and convenient.
7. the utlity model has measuring accuracy height, good stability, characteristics that antijamming capability is strong.
Description of drawings:
Accompanying drawing 1 is structural representation of the present utility model.
Accompanying drawing 2 is circuit theory diagrams of the utility model single-chip microcomputer.
Accompanying drawing 3 is circuit theory diagrams of the utility model power circuit.
Accompanying drawing 4 is circuit theory diagrams of the utility model clock chip.
Accompanying drawing 5 is circuit theory diagrams of the utility model SD card.
Accompanying drawing 6 is circuit theory diagrams of the utility model Color Liquid Crystal Display circuit.
Accompanying drawing 7 is circuit theory diagrams of the utility model EEPROM (Electrically Erasable Programmable Read Only Memo).
Accompanying drawing 8 is circuit theory diagrams of the utility model keyboard circuit.
Accompanying drawing 9 is circuit theory diagrams of the utility model ferroelectric memory.
Accompanying drawing 10 is circuit theory diagrams of the utility model mini-printer.
Accompanying drawing 11 is circuit theory diagrams of the utility model GPS module.
Accompanying drawing 12 is circuit theory diagrams of the utility model GPRS module.
Accompanying drawing 13 is circuit theory diagrams of the utility model signal conditioning circuit.
Accompanying drawing 14 is circuit theory diagrams of the utility model A/D converter.
Accompanying drawing 15 is circuit theory diagrams of USB interface.
Among the figure: have annexation between the same-sign circuit.
Embodiment:
Embodiment 1:
A kind of foundation coefficient
K 30Intelligent test system, its composition comprises: housing 1, has display screen on the described housing, the control button, described display screen is connected with key control circuit 3 with Color Liquid Crystal Display circuit 2 described control buttons, described Color Liquid Crystal Display circuit, described key control circuit is connected with central processing unit 4 respectively, described central processing unit respectively with A/D converter 5, ferroelectric memory 6, EEPROM (Electrically Erasable Programmable Read Only Memo) 7, SD card 8, clock chip 9, mini-printer 10, GPRS module 11, GPS module 12, usb circuit 13, power circuit 14 connects, and described A/D converter is connected with signal conditioning circuit 15.
Above-mentioned foundation coefficient
K 30Intelligent test system, its composition comprises: RAM series monolithic (STM32F103VET6), single-chip microcomputer by data bus and address bus and control bus form respectively with ferroelectric RAM storer (FM22L16), A/D converter (ADS8364), colorized lcd display model (DMT64480S057_03WNZ), GPS module (Jupiter30), mini-printer (WH-C03), GPRS module (MC55), clock (DS1302), EEPROM(AT24C64A), SD card (Kingston 8G), USB interface and button etc. be connected.
Embodiment 2:
According to embodiment 1 described foundation coefficient
K 30Intelligent test system, described central processing unit is the RAM series monolithic, the model STM32F103VET6 of described single-chip microcomputer, the model of described ferroelectric memory is FM22L16, the model of described A/D converter is ADS8364, the model of described colorized lcd display model is DMT64480S057_03WNZ, the model of described GPS module is Jupiter30, the model of described GPRS module is MC55, the model of described clock chip is DS1302, and the model of described EEPROM (Electrically Erasable Programmable Read Only Memo) is AT24C64A.
Embodiment 3:
According to embodiment 1 or 2 described foundation coefficient
K 30Intelligent test system, working power is DC12V, power consumption is less than 15W.
Embodiment 4:
According to embodiment 1 or 2 described foundation coefficient
K 30Intelligent test system, the input of load intensity signal is taken from the d. c. voltage signal of pressure transducer output, and the signal amplitude scope is 0-5V, and in range ability, rate of loading signal measurement precision reaches 0.001 MPa; The deflection signal is taken from the d. c. voltage signal of displacement transducer output, and the signal amplitude scope is 0-5V, and in range ability, deflection signal measurement precision reaches 0.01mm.
Embodiment 5:
According to embodiment 1 or 2 described foundation coefficient
K 30Intelligent test system, loading plate to diameter 300mm, thick 25mm loads step by step, record the size of load intensity and deflection under every grade of load, utilize the quadratic equation match according to load intensity and deflection data, describe load intensity and deflection relation curve, the load intensity of recycling deflection reference value correspondence and deflection reference value are calculated foundation coefficient
K 30, deflection signal measurement precision reaches 0.01MPa/m.
Embodiment 6:
Above-mentioned foundation coefficient
K 30Intelligent test system, Fig. 1 signal conditioning circuit carries out filtering to remove interference to load intensity signal and the deflection signal of input, carry out linear transformation to satisfy mould/number conversion to the requirement of input signal amplitude range, signal conditioning circuit, A/D converter are gathered load signal and deflection under the control of CPU.Fig. 1 ferroelectric memory under the control of CPU, the storage of collected signal data, after gather finishing, CPU utilizes stored signal data to describe load intensity signal and deflection signal relation curve, and then utilizes the curve calculation foundation coefficient
K 30, and result of calculation is stored in ferroelectric memory.Fig. 1 EEPROM is under CPU control, and storage characterizes the information such as sensitivity of the sensor of load intensity and deflection, and calls when the signal digital amount is converted to actual signal will gathering.Fig. 1 SD is stuck under the control of CPU, and signal data and the result of calculation of gathering is stored in the SD card with the form of file together, also related data and the result of calculation of SD card storage can be accessed demonstration and printing.Fig. 1 clock is under CPU control, and record detects foundation coefficient
K 30Temporal information.Fig. 1 GPS module is under CPU control, and record detects foundation coefficient
K 30Address information.Fig. 1 GPRS module can radio to relevant departments with signal data and the testing result of gathering under CPU control.Fig. 1 USB interface can be transferred to PC with signal data and the testing result of the collection in storage and the SD card under CPU control.Fig. 1 button and colorized lcd display model are realized man-machine interaction under CPU control.Fig. 1 mini-printer can be printed testing result under CPU control.
Embodiment 7:
Accompanying drawing 2 central processor CPU partial circuit figure.CPU partly is described foundation coefficient
K 30The core of intelligent test system.Fig. 2 U1 51,52,53,54,63,64,65,66, pin links to each other with 1,2,3,4,5,6,7 pins of the J_KL of Fig. 8 respectively.23,24,33,34,35,36 pins of Fig. 2 U1 link to each other with 1,2,3,4,5,6 pins of the J_K of Fig. 8 respectively.Fig. 2 U1 61,62,81,82, the 38-41 pin respectively with the 2-9 pin of the U5 of Fig. 9, the 48-41 pin of the U8 of the 7-10 of U7,13-16 pin and Figure 14 links to each other.The 42-46 of Fig. 2 U1,55,56,57 pins respectively with the 2-9 pin of the U6 of Fig. 9, the 40-33 pin of the U8 of the 29-32 of U7,35-38 pin and Figure 14 links to each other.The 58-60 of Fig. 2 U1,85,86 pins link to each other respectively with 19,18,6,41,17 pins of the U7 of Fig. 9.72,95,96,2,80 pins of Fig. 2 U1 link to each other with 51,28,58,31,27 pins of the U8 of Figure 14 respectively.3,4 pins of Fig. 2 U1 link to each other with 5,6 pins of the U7 of Fig. 9 respectively.90,91,92 pins of Fig. 2 U1 link to each other with 5,6,7 pins of the U2 of Fig. 4 respectively.The 29-32 pin of Fig. 2 U1 links to each other with 1,5,7,2 pins of the SD_CARD of Fig. 5 respectively.70,71 pins of Fig. 2 U1 link to each other with U15R18, the R19 of Fig. 7 respectively.47,48 pins of Fig. 2 U1 link to each other with 10,9 pins of the U4 of Fig. 6 respectively.25,26 pins of Fig. 2 U1 link to each other with 2,8 pins of the U14 of Figure 12 respectively.68 pins of Fig. 2 U1 link to each other with 4 pins of the P3 of Figure 11.69 pins of Fig. 2 U1 link to each other with the R108 of Figure 11.15,16 pins of Fig. 2 U1 link to each other with 41,32 pins of the P2 of Figure 12 respectively.7 pins of Fig. 2 U1 link to each other with 1 pin of the G2 of Figure 12.5 pins of Fig. 2 U1 link to each other with 12 pins of the U13 of Figure 10.Fig. 2 UV_LIGHT, R_LIGHT, P_LIGHT link to each other with 16,14,12 pins of the J_KL of Fig. 8 respectively.93 pins of Fig. 2 U1 link to each other with 1 pin of the G3 of Fig. 9.Realize the control of various pieces such as the A/D converter of CPU, ferroelectric memory, eeprom memory, SD card, clock, GPS module, GPRS module, USB interface, button, colorized lcd display model and mini-printer by above-mentioned connection.
Accompanying drawing 3 power unit circuit diagrams.Fig. 3 J_Power connects outside DC12V power supply, through E1, E2, E3 conversion obtain 3.3V, ± voltage of different brackets such as 5V, 5V, for Fig. 2, Fig. 4, Fig. 5, Fig. 6,
The relevant components and parts of Fig. 7, Fig. 8, Fig. 9, Figure 10, Figure 11, Figure 12, Figure 13, Figure 14 and Figure 15 provide operating voltage.
Accompanying drawing 4 is that clock chip DS 1302 links to each other with CPU with the spi bus form.
Accompanying drawing 7 is that EEPROM (Electrically Erasable Programmable Read Only Memo) EEPROM links to each other with CPU with the iic bus form.
Accompanying drawing 5 is that the SD card links to each other with CPU with the spi bus form.Colorized lcd display model links to each other with CPU serial ports 3 through MAX232, and MAX232 realizes the conversion of TTL and RS232 level.
Accompanying drawing 15 is that USB interface links to each other with CPU with the iic bus form, and is connected with external unit by J-UP.
Accompanying drawing 8 is that keyboard is connected with key panel with J-K by J-KL.
Accompanying drawing 9 is by two 74HC573 extended address lines, the control ferroelectric memory.
Accompanying drawing 11 is that GPS directly links to each other with the serial ports 1 of CPU.Printer and GPRS share the serial ports 2 of CPU, under the control of EN-GP signal, select printer and GPRS by 74HC125, and MAX232 realizes the conversion of TTL and RS232 level.
Accompanying drawing 13 signal conditioning circuit figure.By circuit load signal and deflection signal are carried out filtering to remove interference, carry out linear transformation to satisfy the A/D conversion to the requirement of input signal amplitude range.1 pin of Figure 13 U9 links to each other with the AC4 of Figure 14.1 pin of Figure 13 U10 links to each other with the AC3 of Figure 14.1 pin of Figure 13 U11 links to each other with the AC2 of Figure 14.1 pin of Fig. 7 U13 links to each other with the AC1 of Figure 14.
Accompanying drawing 14 is mould/number conversion partial circuit figure.Consideration is adopted 16 bit parallel A/D conversion chips to the requirement of rate of loading signal and deflection signal accuracy.
Embodiment 8:
Above-mentioned foundation coefficient
K 30Intelligent test system, principle of work: the loading plate that adopts diameter 300mm, thick 25mm, loading plate is loaded step by step, record the size of load intensity and deflection under every grade of load, utilize the quadratic equation match according to load intensity and deflection data, describe load intensity and deflection relation curve, the load intensity of recycling deflection reference value correspondence and deflection reference value are calculated foundation coefficient
K 30
The course of work: foundation coefficient
K 30The course of work of intelligent test system mainly comprises three parts such as system's installation, load test and data processing, is illustrated respectively below:
1, system installs
(1) test surfaces should carry out smoothly, sweeps off with hairbrush and to loosen the soil, and test surfaces is made level;
(2) loading plate is positioned on the test surfaces, loading plate should contact fully with ground, can lay dry sand or the gypsum putty of the about 2mm ~ 3mm of a bed thickness in case of necessity, utilizes on the loading plate air level or spirit-leveling instrument to adjust the loading plate level simultaneously.
(3) counterforce device is placed the bearing part be placed in the loading plate top, and braked.The distance of the strong point of counterforce device and loading plate outer rim must not be less than 1m;
(4) lifting jack is positioned on the loading plate below the counterforce device, utilizes extension rod and regulate leading screw, lifting jack top ball pivot seat is close on the counterforce device loading plate position.
(5) settle the survey bridge, the distance of surveying bridge bearing seat and loading plate outer rim, counterforce device supporting-point is not less than 1m.Displacement transducer should be arranged along branches such as loading plate peripheries, and keep equidistant with the loading plate center.
2, load test
(1) preload
Loading plate preload for diameter 300mm is 0.04MPa, removal behind the preload 30s, and then after waiting for 30s, read the deflection data as initial reading.
(2) load step by step
With the increment of 0.04MPa, load step by step.Every increase one-level load, the settling amount of 1min are not more than 1% o'clock of settling amount that this grade load produces, read load intensity and deflection reading, increase the next stage load then, and must not be less than 3 minutes the stabilization time of every grade of load.When having applied than the high load of original payload values in the test, should keep this load, and the deflection reading under record this load of storage and this load.
When (3) reaching one of following condition, test can stop
1. total deflection surpasses specified reference value (1.25mm), and loads at least 5 grades of progression;
2. load intensity is greater than 1.3 times of the corresponding payload values of design standards, and loads at least 5 grades of progression;
3. load intensity reaches the ground yield point.
3, data analysis
(1) draws out load intensity and deflection relation curve according to test result, adopt the quadratic equation match, to improve precision;
(2) utilize in load intensity and the deflection relation curve and draw the corresponding load intensity of deflection reference value (1.25mm), and be calculated as follows foundation coefficient:
In the formula,
For the deflection reference value (
M);
For with the deflection reference value
Corresponding load intensity (MPa).
Claims (2)
1. foundation coefficient K
30Intelligent test system, its composition comprises: housing, it is characterized in that: have display screen on the described housing, the control button, described display screen is connected with the Color Liquid Crystal Display circuit, described control button is connected with key control circuit, described Color Liquid Crystal Display circuit, described key control circuit is connected with central processing unit respectively, described central processing unit respectively with A/D converter, ferroelectric memory, EEPROM (Electrically Erasable Programmable Read Only Memo), the SD card, clock chip, mini-printer, the GPRS module, the GPS module, usb circuit, power circuit connects, and described A/D converter is connected with signal conditioning circuit.
2. foundation coefficient K according to claim 1
30Intelligent test system, it is characterized in that: described central processing unit is the RAM series monolithic, the model STM32F103VET6 of described single-chip microcomputer, the model of described ferroelectric memory is FM22L16, the model of described A/D converter is ADS8364, the model of described colorized lcd display model is DMT64480S057_03WNZ, the model of described GPS module is Jupiter30, the model of described GPRS module is MC55, the model of described clock chip is DS1302, and the model of described EEPROM (Electrically Erasable Programmable Read Only Memo) is AT24C64A.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201320069595 CN203132919U (en) | 2013-02-06 | 2013-02-06 | Intelligent foundation coefficient (i)K(/i)30 testing system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201320069595 CN203132919U (en) | 2013-02-06 | 2013-02-06 | Intelligent foundation coefficient (i)K(/i)30 testing system |
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| Publication Number | Publication Date |
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| CN203132919U true CN203132919U (en) | 2013-08-14 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201320069595 Expired - Fee Related CN203132919U (en) | 2013-02-06 | 2013-02-06 | Intelligent foundation coefficient (i)K(/i)30 testing system |
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| CN (1) | CN203132919U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104612123A (en) * | 2015-02-11 | 2015-05-13 | 中铁第五勘察设计院集团有限公司 | Automatic checking device used for foundation coefficient tester |
| CN113373764A (en) * | 2021-04-20 | 2021-09-10 | 黑龙江工程学院 | Pavement continuous compaction quality monitoring method, acquisition terminal, monitoring terminal and system |
-
2013
- 2013-02-06 CN CN 201320069595 patent/CN203132919U/en not_active Expired - Fee Related
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104612123A (en) * | 2015-02-11 | 2015-05-13 | 中铁第五勘察设计院集团有限公司 | Automatic checking device used for foundation coefficient tester |
| CN104612123B (en) * | 2015-02-11 | 2016-03-23 | 中铁第五勘察设计院集团有限公司 | For the automatic check device of foundation coefficient tester |
| CN113373764A (en) * | 2021-04-20 | 2021-09-10 | 黑龙江工程学院 | Pavement continuous compaction quality monitoring method, acquisition terminal, monitoring terminal and system |
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| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20130814 Termination date: 20140206 |