CN203037512U - Two-grade type single-grain sampler - Google Patents
Two-grade type single-grain sampler Download PDFInfo
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- CN203037512U CN203037512U CN 201320047657 CN201320047657U CN203037512U CN 203037512 U CN203037512 U CN 203037512U CN 201320047657 CN201320047657 CN 201320047657 CN 201320047657 U CN201320047657 U CN 201320047657U CN 203037512 U CN203037512 U CN 203037512U
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Abstract
The utility model relates to a two-grade type single-grain sampler comprising a single-grain sampling head, wherein the single-grain sampling head comprises an air inlet (1), an air outlet (2) and a two-grade sampling structure, wherein the sampling structure comprises a first-grade sampling section and a second-grade sampling section, which are connected in sequence. The two-grade type single-grain sampler disclosed by the utility model is used for sampling a gas sample, and has the advantage that single-grain substances with the different grain diameters can be collected by one-time sampling.
Description
Technical field
The utility model relates to a kind of two-stage type individual particle sampling thief, belongs to environmental analysis and atmospheric sampling technical field.
Background technology
Along with the atmospheric aerosol admixture to weather and health affected, increasingly important in the status in atmospheric science field to the understanding of individual particle.Research report shows that atmosphere individual particle such as sulfate, organic particulate matter, heavy metal particles and flue dust (being also referred to as black wood charcoal) etc. are mixed into the internal mix particle mutually, brings a lot of negative effects for environment and human health.
In the prior art, utility model patent CN201120182972.9 discloses a kind of individual particle sampling thief, as illustrated in fig. 1 and 2, sample gas enters accelerating cavity 103 via air intake opening 110, snorkel 111, because accelerating cavity 103 is infundibulate, sample gas is played the effect of acceleration, and the flow velocity that sample gas arrives sampling film 108 places significantly increases.Sampling air flow is at a high speed beaten on sampling film 108, and individual particle is enriched on the sampling film 108, and then finishes once the sampling to the atmosphere individual particle.
Yet, above-mentioned individual particle sampling thief still has some shortcomings, for example: sample arrives sampling film 108 places by accelerating cavity 103 backs, gather at this place, obviously, once sampling can only be gathered a kind of individual particle thing of particle diameter, can't collect the individual particle thing of multiple different-grain diameter at same sample once.
Summary of the invention
At the deficiencies in the prior art, the utility model provides a kind of two-stage type individual particle sampling thief, and it has the advantage that once sampling can collect the particle of different-grain diameter.
For achieving the above object, the utility model adopts following technical scheme:
A kind of two-stage type individual particle sampling thief comprises the individual particle sampling head, and the individual particle sampling head comprises admission piece, outlet nozzle and two-stage sampling structure, and sampling structure comprises first order sampling section and the second level sampling section that order links to each other.First order sampling section comprises first accelerating cavity, first acquisition cavity and the first sample platform, admission piece links to each other by O-ring seal with the upper end of first accelerating cavity, first accelerating cavity is connected by the sampling thief first cutting aperture with first acquisition cavity, first accelerating cavity is infundibulate, have the first sample platform relative with the first cutting aperture in first acquisition cavity, the upper surface of the first sample platform is provided with first sampling film.Second level sampling section comprises second accelerating cavity, second acquisition cavity and the second sample platform, second accelerating cavity is connected by first air hole on the first sample platform with the lower end of first acquisition cavity, the lower end of second accelerating cavity is connected by the sampling thief second cutting aperture with the upper end of second acquisition cavity, second accelerating cavity is infundibulate, in second acquisition cavity, there is the second sample platform relative with the second cutting aperture, the upper surface of the second sample platform is provided with second sampling film, and outlet nozzle links to each other by O-ring seal with the lower end of second acquisition cavity.
Preferably, the first sample platform comprises round platform and first time round platform on first, the diameter of round platform is greater than the diameter in sampling thief first cutting aperture and less than the internal diameter of first acquisition cavity on first, the diameter of round platform is less than the diameter of first time round platform on first, first time round platform is provided with first air hole, and first air hole is connected with second accelerating cavity.
The second sample platform comprises round platform and second time round platform on second, the diameter of round platform is greater than the diameter in sampling thief second cutting aperture and less than the internal diameter of second acquisition cavity on second, the diameter of round platform is less than the diameter of second time round platform on second, second time round platform is provided with second air hole, and second air hole is connected with outlet nozzle.
Preferably, admission piece links to each other by O-ring seal with the upper end of first accelerating cavity, and outlet nozzle links to each other by O-ring seal with the lower end of second acquisition cavity.
Preferably, first accelerating cavity is infundibulate wide at the top and narrow at the bottom, and second accelerating cavity is infundibulate wide at the top and narrow at the bottom.
Preferably, the individual particle sampling head also comprises a cushion chamber, and cushion chamber is arranged between the upper end of admission piece and first accelerating cavity.
As shown from the above technical solution, the utility model compared with prior art has tangible advantage and beneficial effect, owing to adopted the two-stage sampling structure, can only once sample and namely can collect the particle of different-grain diameter to same sample.
Description of drawings
For more clearly setting forth the technical solution of the utility model and technique effect, below in conjunction with accompanying drawing preferred embodiment of the present utility model is elaborated.
Fig. 1 is the structural representation of individual particle sampling thief in the prior art;
Fig. 2 is the longitudinal sectional view of individual particle sampling head in the prior art;
Fig. 3 is the longitudinal sectional view of individual particle sampling head in the utility model;
Wherein, among Fig. 1, Fig. 2,101, admission piece; 102, outlet nozzle; 103, accelerating cavity; 104, acquisition cavity; 105, sampling thief cutting aperture; 106, the last round platform of sample platform; 107, the following round platform of sample platform; 108, sampling film; 109, air hole; 110, air intake opening; 111, snorkel; 112, gas outlet; 113, air pump; 114, switch valve; 115, direct supply; 116, pilot lamp; 117, power switch; 118, flowmeter; 119, collection head sidewall; 120, O-ring seal; 121, individual particle sampling head.
Among Fig. 3,1, admission piece; 2 outlet nozzles; 3, first accelerating cavity; 4, first acquisition cavity; 5, the first cutting aperture; 6, the last round platform of the first sample platform; 7, the following round platform of the first sample platform; 8, first sampling film; 9, first air hole; 13, second accelerating cavity; 14, second acquisition cavity; 15, the second cutting aperture; 16, the last round platform of the second sample platform; 17, the following round platform of the second sample platform; 18, second sampling film; 19, second air hole.
Embodiment
Below in conjunction with preferred embodiment and Figure of description the utility model is described in detail, but the utility model is not limited thereto.
Two-stage type individual particle sampling thief of the present utility model comprises the individual particle sampling head, and the individual particle sampling head comprises admission piece 1, outlet nozzle 2 and two-stage sampling structure, and sampling structure comprises first order sampling section and the second level sampling section that order links to each other.First order sampling section comprises first accelerating cavity 3, first acquisition cavity 4 and the first sample platform.Admission piece 1 links to each other by O-ring seal with the upper end of first accelerating cavity 3.First accelerating cavity 3 is infundibulate wide at the top and narrow at the bottom, and its lower end is connected by the sampling thief first cutting aperture 5 with first acquisition cavity 4.Be placed with the first sample platform relative with the first cutting aperture 5 in first acquisition cavity 4, the upper surface of the first sample platform is provided with first sampling film, 8, the first sampling films 8 and is positioned under the first cutting aperture 5.Second level sampling section is positioned at first order sampling section below, and it comprises second accelerating cavity 13, second acquisition cavity 14 and the second sample platform.The upper end of second accelerating cavity 13 is connected by first air hole 9 on the first sample platform bottom with the lower end of first acquisition cavity 4.Second accelerating cavity 13 is infundibulate wide at the top and narrow at the bottom, and the upper end of its lower end and second acquisition cavity 14 is connected by the sampling thief second cutting aperture 15, and the diameter in the second cutting aperture 15 is less than the diameter in the first cutting aperture 5.Be placed with the second sample platform relative with the second cutting aperture 15 in second acquisition cavity 14.The upper surface of the second sample platform is provided with second sampling film, 18, the second sampling films 18 and is positioned under the second cutting aperture 15, and the sampling particle diameter of second sampling film 18 is less than the sampling particle diameter of first sampling film 8.Outlet nozzle 2 links to each other by O-ring seal with the lower end of second acquisition cavity 14.
The first sample platform comprises all last round platform 6 and the following round platform 7 of cylindrical formula, the diameter of last round platform 6 is greater than sampling thief first cutting aperture 5 diameters and less than the internal diameter of first acquisition cavity 4, last round platform 6 diameters are less than the diameter of following round platform 7, following round platform 7 is provided with first air hole, 9, the first air holes 9 and is connected with second accelerating cavity 13.
The second sample platform comprises all last round platform 16 and the following round platform 17 of cylindrical formula, the diameter of last round platform 16 is greater than sampling thief second cutting aperture 15 diameters and less than the internal diameter of second acquisition cavity 14, last round platform 16 diameters are less than the diameter of following round platform 17, following round platform 17 is provided with second air hole, 19, the second air holes 19 and is connected with outlet nozzle 2.
The process of utilizing two-stage type individual particle sampling thief of the present utility model to sample is as follows:
Sample gas enters first accelerating cavity 3 by admission piece 1, because first accelerating cavity 3 is infundibulate, sample gas arrives the flow velocity at first sampling film, 8 places much larger than the flow velocity of admission piece 1 place's gas, sample gas after the acceleration by first 5 dozens in the aperture of cutting on first sampling film 8, individual particle is enriched on first sampling film 8, first sampling film, 8 collection particle diameters are 10 microns individual particle, remaining gas enters second accelerating cavity 13 along the air hole 9 on the following round platform 7 of the first sample platform, the acceleration effect of second accelerating cavity, 13 to the first accelerating cavities 3 is more obvious, sample gas at a high speed by 15 dozens in the second cutting aperture on second sampling film 18, individual particle is enriched on second sampling film 18, and second sampling film, 18 collection particle diameters are 0.1 micron individual particle.Remaining gas is discharged along the air hole 19 on the following round platform 17 of the second sample platform, outlet nozzle 2, and then finishes once the double sampling to the atmosphere individual particle.
Though the individual particle sampling head comprises the two-stage sampling structure in the utility model, be not limited to, also can be more than three grades.The quantitative variation that every foundation technical spirit of the present utility model is done sampling structure all belongs in the scope of technical solutions of the utility model.
Preferably, can increase a cushion chamber between the admission piece 1 of individual particle sampling head and the two-stage sampling structure, cushion chamber is arranged between the upper end of admission piece and first accelerating cavity, with in the precipitation sample gas greater than 10 microns particle.
The above, it only is preferred embodiment of the present utility model, be not that technical scope of the present utility model is imposed any restrictions, so every foundation technical spirit of the present invention all still belongs in the scope of technical solutions of the utility model any trickle modification, equivalent variations and modification that above embodiment makes.
Claims (6)
1. two-stage type individual particle sampling thief, described two-stage type individual particle sampling thief comprises the individual particle sampling head, it is characterized in that, described individual particle sampling head comprises admission piece (1), outlet nozzle (2) and two-stage sampling structure, described sampling structure comprises first order sampling section and the second level sampling section that order links to each other, described first order sampling section comprises first accelerating cavity (3), first acquisition cavity (4) and the first sample platform, described admission piece (1) links to each other with the upper end of described first accelerating cavity (3), described first accelerating cavity (3) is connected by the sampling thief first cutting aperture (5) with described first acquisition cavity (4), it is interior and relative with the described first cutting aperture (5) that the described first sample platform is arranged at described first acquisition cavity (4), the upper surface of the described first sample platform is provided with first sampling film (8), described second level sampling section comprises second accelerating cavity (13), second acquisition cavity (14) and the second sample platform, the upper end of described second accelerating cavity (13) is connected by first air hole (9) on the described first sample platform with the lower end of described first acquisition cavity (4), the lower end of described second accelerating cavity (13) is connected by the sampling thief second cutting aperture (15) with the upper end of described second acquisition cavity (14), it is interior and relative with the described second cutting aperture (15) that the described second sample platform is arranged at described second acquisition cavity (14), the upper surface of the described second sample platform is provided with second sampling film (18), and described outlet nozzle (2) links to each other with the lower end of described second acquisition cavity (14).
2. two-stage type individual particle sampling thief as claimed in claim 1, it is characterized in that, the described first sample platform comprises round platform on first (6) and first time round platform (7), the diameter of round platform on described first (6) is greater than the diameter in sampling thief first cutting aperture (5) and less than the internal diameter of described first acquisition cavity (4), the diameter of round platform on described first (6) is less than the diameter of first time round platform (7), described first time round platform (7) is provided with first air hole (9), and described first air hole (9) is connected with second accelerating cavity (13).
3. two-stage type individual particle sampling thief as claimed in claim 1, it is characterized in that, the described second sample platform comprises round platform on second (16) and second time round platform (17), the diameter of round platform on described second (16) is greater than the diameter in the described sampling thief second cutting aperture (15) and less than the internal diameter of described second acquisition cavity (14), the diameter of round platform on described second (16) is less than the diameter of described second time round platform (17), described second time round platform (17) is provided with second air hole (19), and described second air hole (19) is connected with described outlet nozzle (2).
4. two-stage type individual particle sampling thief as claimed in claim 1, it is characterized in that, described admission piece (1) links to each other by O-ring seal with the upper end of described first accelerating cavity (3), and described outlet nozzle (2) links to each other by O-ring seal with the lower end of described second acquisition cavity (14).
5. two-stage type individual particle sampling thief as claimed in claim 1 is characterized in that, described first accelerating cavity (3) is infundibulate wide at the top and narrow at the bottom, and described second accelerating cavity (13) is infundibulate wide at the top and narrow at the bottom.
6. two-stage type individual particle sampling thief as claimed in claim 1 is characterized in that, described individual particle sampling head also comprises a cushion chamber, and described cushion chamber is arranged between the upper end of described admission piece (1) and described first accelerating cavity (3).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201320047657 CN203037512U (en) | 2013-01-28 | 2013-01-28 | Two-grade type single-grain sampler |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201320047657 CN203037512U (en) | 2013-01-28 | 2013-01-28 | Two-grade type single-grain sampler |
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| Publication Number | Publication Date |
|---|---|
| CN203037512U true CN203037512U (en) | 2013-07-03 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201320047657 Expired - Fee Related CN203037512U (en) | 2013-01-28 | 2013-01-28 | Two-grade type single-grain sampler |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109342671A (en) * | 2018-12-05 | 2019-02-15 | 武汉凯特复兴科技有限责任公司 | A kind of simple grain formula Grain Moisture Analyzer |
| CN112985929A (en) * | 2021-03-09 | 2021-06-18 | 浙江大学 | Intelligent full-automatic continuous single-particle sampling device |
-
2013
- 2013-01-28 CN CN 201320047657 patent/CN203037512U/en not_active Expired - Fee Related
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109342671A (en) * | 2018-12-05 | 2019-02-15 | 武汉凯特复兴科技有限责任公司 | A kind of simple grain formula Grain Moisture Analyzer |
| CN109342671B (en) * | 2018-12-05 | 2024-01-23 | 武汉三环新创科技有限公司 | Single grain type grain moisture meter |
| CN112985929A (en) * | 2021-03-09 | 2021-06-18 | 浙江大学 | Intelligent full-automatic continuous single-particle sampling device |
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| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20130703 Termination date: 20140128 |