CN202995014U - Residual field quantity measuring system based on Zeeman frequency - Google Patents
Residual field quantity measuring system based on Zeeman frequency Download PDFInfo
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- CN202995014U CN202995014U CN 201220606052 CN201220606052U CN202995014U CN 202995014 U CN202995014 U CN 202995014U CN 201220606052 CN201220606052 CN 201220606052 CN 201220606052 U CN201220606052 U CN 201220606052U CN 202995014 U CN202995014 U CN 202995014U
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Abstract
The utility model discloses a residual field quantity measuring system based on Zeeman frequency. The residual field quantity measuring system based on Zeeman frequency includes a light source, a microprocessor, a filtering unit, a resonance absorbing module, a photoelectric detecting unit, a microwave source, a magnetic field control module and a current control module, wherein the light source is connected with the filtering unit; the filtering unit is connected with the resonance absorbing module; the resonance absorbing module is sequentially connected with the microwave source, the magnetic field control module and the photoelectric detecting module; the microprocessor is sequentially connected with the microwave source, the magnetic field control module and the current control module; and the current control module is connected with the magnetic field control module. According to the utility model, current direction of magnetic field current in the magnetic field control module is changed through the current control module and microwave source output signal frequency is controlled through the microprocessor, and then the frequency sweeping of whole atomic spectra is realized. At the same time, an amplitude value V of optical signals output by the resonance absorbing module and a frequency value F of signals of the microwave source in the whole process are recorded, and the residual field quantity absolute value measurement and calculation are realized finally.
Description
Technical field
The utility model relates to the design of measuring system field, particularly a kind of surplus system for measuring quantity based on the Zeeman frequency.
Background technology
In existing atomic spectral line detection application field (as atomic clock), physical system provides a frequency stabilization, the narrower atomic resonance Absorption Line of live width, and atomic clock is locked in by the output frequency with VCXO just and obtains high frequency stabilization rate output on the atomic resonance absorption peak.Fill in physical system the element atom at ordinary times energy level be degeneracy, want to realize above-mentioned application function, need to apply corresponding magnetic field to whole system, be referred to as the C field.The effect of C field coil is to produce a weak static magnetic field that parallels with the microwave magnetic field direction, make atomic ground state hyperfine structure generation Zeeman splitting, and for atomic transition provides the quantization axle, simultaneously by regulating the size of C field current, change the intensity in magnetic field, the output frequency of micro-tensioning system.
The C field of more than referring to is the people for being added in system, but system itself exists various forms of interference, and they produce a certain amount of remnant field by closed circuit electromagnetism exchanging form.The existence in these magnetic fields is very complexes, is that " Zeeman splitting " reaches " quantization axle " with the complementary field outside C field.Under surplus field action, due to Zeeman effect, atomic energy level is moved, and finally causes output frequency to change.
The utility model content
Technical problem to be solved in the utility model be to provide a kind of can accurate measuring systems surplus amount absolute value measuring system of inner remnant field intensity.
for solving the problems of the technologies described above, the utility model provides a kind of surplus system for measuring quantity based on the Zeeman frequency, comprise light source, microprocessor, be used for the filter unit that the light beam to described radiation of light source filters, be used to the light beam of processing through described filter unit optical filtering to complete the resonance absorption module of resonant transition, be used for the photodetector unit that the light signal to described resonance absorption module output detects, be used to described resonance absorption module that the microwave source of energy is provided, being used to described resonance absorption module to complete former quantum splitting and quantization axle provides the magnetic field control module in magnetic field and is used for regulating the current control module of controlling described magnetic field control module, described light source is connected with described filter unit, described filter unit is connected with described resonance absorption module, described resonance absorption module is connected with described microwave source, described magnetic field control module, described photodetector unit successively, described microprocessor is connected with described microwave source, described magnetic field control module, described current control module successively, and described current control module is connected with described magnetic field control module.
Further, described filter unit is the blister cavity body structure, and the element that described light source is used for radiation laser beam is M, and in described filter unit, operation material is the isotope N element of described M element; The light beam of described radiation of light source is by the processing that filters of described filter unit, and is sent to described resonance absorption module by described filter unit.
Further, described resonance absorption unit is the blister cavity body structure, and the cylindrical cavity body structure of described resonator cavity, described resonance absorption unit are placed in described intra resonant cavity, are used to the light beam after described filter unit filters to complete resonant transition.
Further, described magnetic field control module comprises: enameled wire, current switch; Described enameled wire is wrapped on described resonator cavity outer wall, and is connected with described current control module by described current switch.
Further, described current control module output current is constant current, and described microprocessor is regulated by described current control module and controlled described magnetic field control module magnetic field intensity.
Further, described microwave source output signal frequency is regulated control by described microprocessor, and described microwave source output signal frequency is controlled near described M element atomic ground state hyperfine structure transition centre frequency.
Further, described M element is
87Rb, described N element is
85Rb.
A kind of surplus system for measuring quantity based on the Zeeman frequency that the utility model provides comprises light source, microprocessor, filter unit, resonance absorption module, photodetector unit, microwave source, magnetic field control module and current control module.Wherein, light source is connected with filter unit, filter unit is connected with the resonance absorption module, the resonance absorption module is connected with microwave source, magnetic field control module, photodetector unit successively, microprocessor is connected with microwave source, magnetic field control module, current control module successively, and current control module is connected with the magnetic field control module.The utility model changes the direction of current of field supply in the control module of magnetic field by current control module, and control the microwave source output signal frequency by microprocessor, and then complete the frequency sweep of whole atomic spectral line, record simultaneously the optical signal magnitude value V of resonance absorption module output in whole process and the signal frequency value F of microwave source, the final realization calculated the measurement of surplus amount absolute value.The utlity model has characteristics simple in structure, easy to operate, that measuring accuracy is high.
Description of drawings
Surplus the system for measuring quantity structural principle block diagram based on the Zeeman frequency that Fig. 1 provides for the utility model embodiment.
The principle of work structural representation based on magnetic field control module in surplus system for measuring quantity of Zeeman frequency that Fig. 2 provides for the utility model embodiment.
Fig. 3 is
87Rb atomic energy level schematic diagram.
Fig. 4 for the utility model embodiment provide based on 7 jump frequency peak curve schematic diagram in surplus the system for measuring quantity measuring process of Zeeman frequency.
Wherein, 1-resonator cavity, 2-enameled wire, 201-light source, 202-filter unit, 203-resonance absorption module, 204-microwave source, 205-magnetic field control module, 206-photodetector unit, 207-microcontroller, 208-current control module.
Embodiment
Below in conjunction with specific embodiment, the embodiment that the utility model is provided is described in further detail.
referring to Fig. 1, 2, a kind of surplus system for measuring quantity based on the Zeeman frequency that the utility model embodiment provides, comprise light source 201, microprocessor 207, be used for the filter unit 202 that the light beam to described light source 201 radiation filters, be used to the light beam that filters processing through described filter unit 202 to complete the resonance absorption module 203 of resonant transition, be used for the photodetector unit 206 that the light signal to described resonance absorption module 203 outputs detects, be used to described resonance absorption module 203 that the microwave source 204 of energy is provided, being used to described resonance absorption module 203 to complete former quantum splitting and quantization axle provides the magnetic field control module 205 in magnetic field and is used for regulating the current control module 208 of controlling described magnetic field control module 205.Wherein, light source 201 is connected with filter unit 202, filter unit 202 is connected with resonance absorption module 203, resonance absorption module 203 is connected with microwave source 204, magnetic field control module 205, photodetector unit 206 successively, microprocessor 207 is connected with microwave source 204, magnetic field control module 205, current control module 208 successively, and current control module 208 is connected with magnetic field control module 205.
In the present embodiment, preferred, filter unit 202 is the blister cavity body structure.The element that light source 201 is used for radiation laser beam is M, and in filter unit, operation material is the isotope N element of described M element.Wherein, the light beam of light source 201 radiation is by filter unit 202 processing that filters, and the light beam after processing is sent to resonance absorption module 203.
In the present embodiment, resonance absorption module 203 comprises: resonance absorption unit, resonator cavity.Preferably, the resonance absorption unit is the blister cavity body structure, the cylindrical cavity body structure of resonator cavity.Simultaneously, the resonance absorption unit is placed in intra resonant cavity, is used to the light beam after described filter unit filters to complete resonant transition.
In the present embodiment, preferred, magnetic field control module 205 comprises: enameled wire, current switch 209.Wherein, enameled wire is wrapped on the resonator cavity outer wall, and is connected with current control module 208 by current switch 209.
In the present embodiment, current control module 208 output currents are constant current, and microprocessor 207 is controlled current control module 208 output current intensities and then regulated controlling magnetic field control module 205 magnetic field intensitys by adjusting.
In the present embodiment, microwave source 204 output signal frequencies are regulated control by microprocessor 207, and microwave source 204 output signal frequencies are controlled near M element atomic ground state hyperfine structure transition centre frequency, complete the frequency sweep of whole atomic spectral line.
Preferably, the M element is
87Rb, the N element is
85Rb.
The measuring system that the present embodiment provides is before measuring surplus field amount absolute value, and first the concise and to the point design theory foundation of the embodiment of the present invention of setting forth is so that the Comprehension and Implementation of the embodiment of the present invention.
Magnetic frequency shift is that the Zeeman effect due to atomic energy level causes, for
87Its Zeeman splitting of the hyperfine energy level of the ground state of Rb atom is:
E(F,M
F)=E
0(f)+A
1H+A
2H
2+A
3H
3+… （1）
Shown in Figure 3
87Rb atomic energy level figure is carrying out
87When the resonant transition of Rb atomic ground state hyperfine structure is surveyed, 7 transition are arranged, comprising a 0-0 transition, be in ground state level＜F=2, mF=0〉and＜F=1, mF=0〉exact value of jump frequency is 6834.68XXXX MHz (external magnetic field H=0) between these two energy levels, rear 4-digit number is determined by the perturbation of magnetic field and buffer gas.This is so-called quantum frequency discrimination frequency values namely.
By formula (1) as can be known: for non-zero-0 transition of atomic ground state hyperfine structure, its frequency is comparatively responsive to magnetic field H, and for the 0-0 transition, its frequency only is directly proportional to the quadratic power of H, and irrelevant with the first power of H, magnetic field is more insensitive to external world.So magnetic field changes in system, what stand in the breach is to cause that non-zero-0 jump frequency significantly changes.But for using better the present invention, improve measuring accuracy, therefore also will study the 0-0 transition.
87The Rb atom 0-0 jump frequency susceptibility in magnetic field to external world is low more than other transition, but magnetic field is still very important on the impact of 0-0 jump frequency.
The experience formula is arranged:
f＝f
0+574H
2 (2)
F in formula
0Frequency when being zero for external magnetic field, f is the frequency of external magnetic field when being H.H(magnetic field in formula (2)) unit is " Gauss ", the f(resonant frequency) unit be " hertz ".Can be got the relation of Δ f and Δ H by formula (2):
Δf=1148.28HΔH （3）
Formula (3) both sides are divided by atomic resonance centre frequency f
0(get f
0=6834.6875MHz) have:
Δf/f
0=1.68*10
-7HΔH （4）
Formula (4) shows changes of magnetic field and atom 0-0 transition relation.
Based on above-mentioned theory, design a kind of surplus system for measuring quantity based on the Zeeman frequency provided by the invention.
In the actual measurement process, measure in accordance with the following steps operation by a kind of surplus system for measuring quantity based on the Zeeman frequency provided by the invention:
Step S1: the field supply of regulating controlling magnetic field control modules 205 by current control module 208 and current switch 209 is positive dirction, and then a magnetic field intensity to be provided for resonance absorption module 203 for " former quantum splitting and quantization axle " by magnetic field control module 205 be the magnetic field of C;
Step S2: control microwave source 204 output signal frequencies by microprocessor 207, and then control resonance absorption module 203 and complete the photoresonance absorption process one time;
Step S3: detect the optical signal magnitude value V of resonance absorption modules 203 outputs by photodetector unit 206, and described V value is transferred to microprocessor 207 store, microprocessor 207 records microwave source 204 output signal frequency value F at this moment simultaneously;
Step S4: regulate by microprocessor 207 and control microwave source 204 output signal frequencies, complete the atomic spectral line frequency sweep, and draw V-F relation curve according to recording numerical value, as shown in Figure 4, in seven peak values, find out peak F 1, F2, F3;
Step S5: the field supply of regulating controlling magnetic field control module 205 by current control module 208 and current switch 209 is negative direction, obtains peak F 4, F5, F6 according to above-mentioned steps S2-step S4 operation;
Step S6: calculate successively peak F 1, the corresponding frequency difference F21=F2 of peak F 2-F1; Peak F 2, the corresponding frequency difference F32=F3 of peak F 3-F2; Peak F 5, the corresponding frequency difference F54=F5 of peak F 4-F4; Peak F 5, the corresponding frequency difference F65=F6 of peak F 6-F5; And to define corresponding frequency difference be the Zeeman frequency;
Step S7: calculate successively both mean value F7 of F21, F32; Calculate both mean value F8 of F54, F65; And then calculate the field supply direction change before and after the signal frequency variable quantity △ F=│ F8-F7 │ of microwave source 204 outputs;
Step S8: according to the frequency relation numerical value A at amount Atomic absorption peak, traditional magnetic field, calculate surplus amount absolute value B=△ F/A.
Preferably, obtain one group of measurement data according to above-mentioned measuring process:
Peak 2(MHz) peak 1(MHz) peak 3(MHz)
Field supply positive dirction 6834.33890 (F1) 6834.41217(F2) 6834.48558 (F3)
Field supply negative direction 6834.34086 (F4) 6834.41216 (F5) 6834.48348 (F6)
Therefore obtain field supply direction Zeeman frequency before and after changing and be respectively (F21=73.27KHz, F32=73.41KHz), (F54=71.30KHz, F65=71.32KHz), respectively F21, F32 are both averaged and after F54, F65 both averaged, obtaining field supply direction Zeeman frequency variation before and after changing was △ F=2.03KHz.
because measuring system provided by the invention is in measuring process, do not change the sizes values of field supply, just field supply has been carried out reverse process, that is to say that the former quantum splitting of artificial generation and the magnetic field intensity that the quantization axle is used can not change, be that size variation should be unable to occur for Zeeman frequency in accompanying drawing 4, but by embodiment provided by the invention, the Zeeman frequency that reverse fore-and-aft survey acquisition occurs at field supply but differs △ F=2.03KHz, this difference is exactly the contribution of surplus field in system, according to the frequency relation numerical value A(magnetic strength intensity at amount Atomic absorption peak, traditional magnetic field and the relation between the Zeeman frequency), preferably, A=0.7KHz/1mG, relatively the Zeeman frequency changes the value of front and back in the field supply direction, the big or small absolute value that just can estimate surplus is 2.03KHz/ (0.7KHz/1mG)=2.9mG.
A kind of surplus system for measuring quantity based on the Zeeman frequency that the utility model provides comprises light source 201, microprocessor 207, filter unit 202, resonance absorption module 203, photodetector unit 206, microwave source 204, magnetic field control module 205 and current control module 208.Wherein, light source 201 is connected with filter unit 202, filter unit 202 is connected with resonance absorption module 203, resonance absorption module 203 is connected 206 with microwave source 204, magnetic field control module 205, photodetector unit successively, microprocessor 207 is connected with microwave source 204, magnetic field control module 205, current control module 208 successively, and current control module 208 is connected with magnetic field control module 205.The utility model changes the direction of current of field supply in the control module 205 of magnetic field by current control module 208, and control microwave source 204 output signal frequencies by microprocessor 207, and then complete the frequency sweep of whole atomic spectral line, record simultaneously the optical signal magnitude value V of resonance absorption module 203 outputs in whole process and the signal frequency value F of microwave source 204, the final realization calculated the measurement of surplus amount absolute value.The utlity model has characteristics simple in structure, easy to operate, that measuring accuracy is high.
It should be noted last that, above embodiment is only unrestricted in order to the technical solution of the utility model to be described, although with reference to example, the utility model is had been described in detail, those of ordinary skill in the art is to be understood that, can modify or be equal to replacement the technical solution of the utility model, and not breaking away from the spirit and scope of technical solutions of the utility model, it all should be encompassed in the middle of claim scope of the present utility model.
Claims (7)
1. surplus system for measuring quantity based on the Zeeman frequency, comprise light source (201), microprocessor (207), it is characterized in that, also comprise: be used for the filter unit (202) that the light beam to described light source (201) radiation filters, be used to the resonance absorption module (203) of completing resonant transition through the light beam of described filter unit (202) optical filtering processing, be used for the photodetector unit (206) that the light signal to described resonance absorption module (203) output detects, be used to described resonance absorption module (203) that the microwave source (204) of energy is provided, being used to described resonance absorption module (203) to complete former quantum splitting and quantization axle provides the magnetic field control module (205) in magnetic field and is used for regulating the current control module (208) of controlling described magnetic field control module (205),
Described light source (201) is connected with described filter unit (202), described filter unit (202) is connected with described resonance absorption module (203), described resonance absorption module (203) is connected with described microwave source (204), described magnetic field control module (205), described photodetector unit (206) successively, described microprocessor (207) is connected with described microwave source (204), described magnetic field control module (205), described current control module (208) successively, and described current control module (208) is connected with described magnetic field control module (205).
2. according to claim 1 based on surplus system for measuring quantity of Zeeman frequency, it is characterized in that:
Described filter unit (202) is the blister cavity body structure, and the element that described light source (201) is used for radiation laser beam is M, and in described filter unit (202), operation material is the isotope N element of described M element;
The light beam of described light source (201) radiation is by described filter unit (202) processing that filters, and is sent to described resonance absorption module (203) by described filter unit (202).
3. according to claim 2 based on surplus the system for measuring quantity of Zeeman frequency, it is characterized in that, described resonance absorption module (203) comprising: resonance absorption unit, resonator cavity (1);
Described resonance absorption unit is the blister cavity body structure, and the cylindrical cavity body structure of described resonator cavity (1), described resonance absorption unit are placed in described resonator cavity (1) inside, are used to the light beam after described filter unit (202) filters to complete resonant transition.
4. according to claim 3 based on surplus system for measuring quantity of Zeeman frequency, it is characterized in that, described magnetic field control module (205) comprising: enameled wire (2), current switch (209);
Described enameled wire (2) is wrapped on described resonator cavity (1) outer wall, and is connected with described current control module (208) by described current switch (209).
5. according to claim 4 based on surplus system for measuring quantity of Zeeman frequency, it is characterized in that:
Described current control module (208) output current is constant current, and described microprocessor (207) is regulated by described current control module (208) and controlled described magnetic field control module (205) magnetic field intensity.
6. according to claim 5 based on surplus system for measuring quantity of Zeeman frequency, it is characterized in that:
Described microwave source (204) output signal frequency is regulated control by described microprocessor (207), and described microwave source (204) output signal frequency is controlled near described M element atomic ground state hyperfine structure transition centre frequency.
7. described surplus the system for measuring quantity based on the Zeeman frequency of according to claim 2-6 any one is characterized in that:
Described M element is
87Rb, described N element is
85Rb.
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| CN 201220606052 CN202995014U (en) | 2012-11-16 | 2012-11-16 | Residual field quantity measuring system based on Zeeman frequency |
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| CN 201220606052 CN202995014U (en) | 2012-11-16 | 2012-11-16 | Residual field quantity measuring system based on Zeeman frequency |
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| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20130612 Termination date: 20141116 |
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| EXPY | Termination of patent right or utility model |