CN202915881U - Thickness measuring instrument for non-metallic coating layer on metallic substrate - Google Patents

Thickness measuring instrument for non-metallic coating layer on metallic substrate Download PDF

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Publication number
CN202915881U
CN202915881U CN 201220566297 CN201220566297U CN202915881U CN 202915881 U CN202915881 U CN 202915881U CN 201220566297 CN201220566297 CN 201220566297 CN 201220566297 U CN201220566297 U CN 201220566297U CN 202915881 U CN202915881 U CN 202915881U
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China
Prior art keywords
module
thicknessmeter
detection probe
magnetic induction
high frequency
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Expired - Fee Related
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CN 201220566297
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Chinese (zh)
Inventor
张文灿
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ZHANGZHOU DONGFANG INTELLIGENT INSTRUMENT CO Ltd
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ZHANGZHOU DONGFANG INTELLIGENT INSTRUMENT CO Ltd
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Abstract

The utility model relates to a thickness measuring instrument for a non-metallic coating layer on a metallic substrate. The thickness measuring instrument is characterized in that the thickness measuring instrument comprises an MCU master control module that is connected with a display module, a key module, a battery low-voltage detection module, a power supply module, a high-frequency alternating-current signal feedback module, a magnetic induction signal amplification module and an adjustable reference voltage module. The output terminal of the adjustable reference voltage module is connected with the control terminal of the magnetic induction signal amplification module; the input terminals of the high-frequency alternating-current signal feedback module and the magnetic induction signal amplification module are connected with an output terminal of a detection probe; and an input terminal of the detection probe is connected with a high-frequency alternating current signal generation module. According to the utility model, the measurement precision is high; and the thickness of the non-metallic coating layer on the metallic substrate can be measured. Especially, a single-coil inductance scheme is employed for detection; and the instrument with advantages of reasonable structure, simple circuit, convenient usage, good performance and low manufacturing cost can be popularized and used easily.

Description

Nonmetallic coating thicknessmeter on a kind of metallic matrix
Technical field
The utility model relates to nonmetallic coating thicknessmeter on a kind of metallic matrix.
Background technology
The method that present cladding thickness measurer generally uses has:
The magnetic attraction cladding thickness measurer: suction between permanent magnet (detection probe) and magnetic conduction steel size be between the two apart from proportion relation, this is apart from being exactly the thickness of coating.The thicknessmeter that utilizes this principle to make, easy and simple to handle, price is also lower, but be subject to the impact of parent metal magnetic and measurement environment changes of magnetic field, measuring error is large, and can only measure the non-magnetic coating thickness on the magnetic conduction steel matrix.
Magnetic induction cladding thickness measurer: when adopting magnetic induction principle, utilize the size that flows into the magnetic flux of ferromagnet substrate from detection probe through non-ferromagnetic coating, measure coating thickness.Also can measure the size of corresponding with it magnetic resistance, represent its coating thickness.Coating is thicker, and then magnetic resistance is larger, and magnetic flux is less.The thicknessmeter that utilizes this principle to make, measuring accuracy is higher, but can only measure the non-magnetic coating thickness on the magnetic conduction matrix, and is subjected to the impact of parent metal heat treatment can produce larger measuring error.
The current vortex cladding thickness measurer: high frequency ac signal generates an electromagnetic field in the detection probe coil, during the close conductor of detection probe, just forms therein eddy current.Close to detection probe healed from conducting base, then eddy current was larger, and reflected impedance is also larger.This retroactive effect scale has been levied the size of distance between detection probe and the conducting base, namely the size of non-conductive coating thickness on the conducting base.The thicknessmeter that utilizes this principle to make, measuring accuracy is higher, but the impact that changed by the conductance of conducting base can produce measuring error greatly.
The cladding thickness measurer of FN type: (F represents ferrous ferromagnetism matrix to the FN type, N represents Non-ferrous nonferromagnetic matrix) cladding thickness measurer both adopted electromagnetic induction principle, adopting again eddy current principle, is the two-in-one type cladding thickness measurer of F type and N-type.This cladding thickness measurer is with F type probe and N-type probe, and measuring accuracy is higher, can measure nonmetallic coating thickness on the metallic matrix.But two different probes of this appliance requires, and complicated signal processing circuit, sonde configuration is complicated, and line cost is higher.
Summary of the invention
The purpose of this utility model provides nonmetallic coating thicknessmeter on a kind of metallic matrix, can measure nonmetallic coating thickness on the metallic matrix.
The utility model adopts following scheme to realize: nonmetallic coating thicknessmeter on a kind of metallic matrix is characterized in that: comprise the MCU main control module; Described MCU main control module is connected with display module, key-press module, battery low-voltage detection module, power module, high frequency ac signal feedback module, magnetic induction signal amplification module and adjustable reference voltage module and connects; The output terminal of described adjustable reference voltage module is connected with the control end of magnetic induction signal amplification module, the input end of described high frequency ac signal feedback module, magnetic induction signal amplification module all is connected with the output terminal of a detection probe, and the input end of described detection probe is connected with a high frequency ac signal generation module.
In the utility model one embodiment, described MCU main control module is a single-chip minimum system circuit, and this single-chip microcomputer is embedded with the ADC unit.
In the utility model one embodiment, described key-press module is made of free-standing button, and this stand alone type button connects the I/O pin of described single-chip microcomputer.
In the utility model one embodiment, described display module comprises a liquid crystal display, the indication of LED lamp or hummer audio alarm cue circuit.
In the utility model one embodiment, described high frequency ac signal generation module and high frequency ac signal feedback module are comprised of a binary counter and oscillator integrated circuit, and this binary counter is connected with the coil of described detection probe with the oscillator integrated circuit.
In the utility model one embodiment, described detection probe is a unicoil inductance.
Compared with prior art, the beneficial effects of the utility model are as follows:
1. the utility model measuring accuracy is higher, uses simple, easy to maintenance.
2. the utility model adopts non-destructive measuring method neither to destroy coating and does not also destroy base material, and detection speed is fast, and a large amount of coating thickness testings is carried out economically.
3. the utility model can be realized for the nonmetallic coating on the metallic matrix of different materials, different-thickness the accurate measurement of thickness, and measurement range is wide.
4. the utility model can be realized the measurement environment adaptive calibration, has effectively suppressed temperature and has floated, and is adapted at detecting in the complex environment.
The utility model detection probe adopts single coil inductance scheme, and technique is simple, and measuring circuit is simple, and low cost of manufacture is beneficial to batch production, can be widely used in the detection fields such as manufacturing industry, metal-processing industry, chemical industry, commodity inspection, very easily promotes the use of.
Description of drawings
Fig. 1 is the utility model hardware principle block diagram.
Embodiment
Below in conjunction with drawings and Examples the utility model is described further.
As shown in Figure 1, the present embodiment provides nonmetallic coating thicknessmeter on a kind of metallic matrix, it is characterized in that: comprise MCU main control module 5; Described MCU main control module 5 is connected with display module 1, key-press module 2, battery low-voltage detection module 3, power module 4, high frequency ac signal feedback module 7, magnetic induction signal amplification module 8 and adjustable reference voltage module 9 and connects; The output terminal of described adjustable reference voltage module 9 is connected with the control end of magnetic induction signal amplification module 8, the input end of described high frequency ac signal feedback module 7, magnetic induction signal amplification module 8 all is connected with the output terminal of a detection probe 10, and the input end of described detection probe 10 is connected with a high frequency ac signal generation module 6.
Better, in the present embodiment, described MCU main control module 5 is the single-chip minimum system circuit, wherein single-chip microcomputer adopts and has the functions such as ADC, PWM and external interrupt input.Described display module 1 comprises the indication of a liquid crystal display, LED lamp or hummer audio alarm cue circuit, and this liquid crystal display is directly driven by the built-in LCD control signal of single-chip microcomputer, and whole circuit more simple reduces and show power consumption.
In the present embodiment, described key-press module 2 adopts free-standing button, mainly finishes function and switches instrument switch machine function.Wherein free-standing button can directly connect the I/O pin of single-chip microcomputer, single-chip microcomputer obtains the key information practical function by the level state that reads independent button and switches, independent button can be connected with power module 4 by resistance simultaneously, by pressing key level change triggers power-on module 4, the simultaneously I/O pin control by single-chip microcomputer makes power supply maintain opening.
In the present embodiment, described battery low-voltage detection module 3 adopts the ADC pin of single-chip microcomputer to be connected with power-supply battery, gather, analyze the ADC value by the single-chip microcomputer analog-digital conversion function, when the power-supply battery undertension, the low-voltage designated symbol that single-chip microcomputer output LCD control signal drives on the liquid crystal display shows.
In the present embodiment, described power module 4 adopts the integrated circuit that boosts to boost and processes to the whole system circuit supply, and the I/O pin by independent button and single-chip microcomputer carries out break-make control simultaneously.
In the present embodiment, described high frequency ac signal generation module 6 is connected with the high frequency ac signal feedback detection module and is adopted binary counter to be connected with detection probe 10 with the oscillator integrated circuit, produce the high frequency ac signal that is used for the excitation detection probe, by single-chip microcomputer collection, analysis of high frequency AC signal feedback data.
In the present embodiment, described magnetic induction signal amplification module 8 is connected with adjustable reference voltage module 9, detection probe 10, by single-chip microcomputer collection, analysis of magnetic induced signal data, simultaneously in conjunction with the high frequency ac signal feedback data, obtain the measured value of degree of precision, and display module 1 shows.
In the present embodiment, described adjustable reference voltage module 9 employings arrange the SCM PWM output signal and adjust the reference voltage that offers magnetic induction signal amplification module 8, realization has effectively suppressed temperature and has floated the measurement environment adaptive calibration, is adapted at detecting in the complex environment.
In the present embodiment, described detection probe 10 adopts single coil inductance scheme, and the detection signal in high frequency ac signal generation module 6 and the magnetic induction signal amplification module 8 is all directly provided by same coil inductance, technique is simple, measuring circuit is simple, and low cost of manufacture is beneficial to batch production.
The above; only as exemplary description is newly carried out in this practicality; but protection domain of the present utility model is not limited to this; any various improvement of having adopted method design of the present utility model and technical scheme to carry out; or directly apply to other occasion without improvement, all should be encompassed in the protection domain of the present utility model.

Claims (6)

1. nonmetallic coating thicknessmeter on the metallic matrix is characterized in that: comprise the MCU main control module; Described MCU main control module is connected with display module, key-press module, battery low-voltage detection module, power module, high frequency ac signal feedback module, magnetic induction signal amplification module and adjustable reference voltage module and connects; The output terminal of described adjustable reference voltage module is connected with the control end of magnetic induction signal amplification module, the input end of described high frequency ac signal feedback module, magnetic induction signal amplification module all is connected with the output terminal of a detection probe, and the input end of described detection probe is connected with a high frequency ac signal generation module.
2. nonmetallic coating thicknessmeter on the metallic matrix according to claim 1, it is characterized in that: described MCU main control module is a single-chip minimum system circuit, and this single-chip microcomputer is embedded with the ADC unit.
3. nonmetallic coating thicknessmeter on the metallic matrix according to claim 2, it is characterized in that: described key-press module is made of free-standing button, and this stand alone type button connects the I/O pin of described single-chip microcomputer.
4. nonmetallic coating thicknessmeter on the metallic matrix according to claim 1 is characterized in that: described display module comprises a liquid crystal display, the indication of LED lamp or hummer audio alarm cue circuit.
5. nonmetallic coating thicknessmeter on the metallic matrix according to claim 1, it is characterized in that: described high frequency ac signal generation module and high frequency ac signal feedback module are comprised of a binary counter and oscillator integrated circuit, and this binary counter is connected with the coil of described detection probe with the oscillator integrated circuit.
6. nonmetallic coating thicknessmeter on the metallic matrix according to claim 1, it is characterized in that: described detection probe is a unicoil inductance.
CN 201220566297 2012-10-31 2012-10-31 Thickness measuring instrument for non-metallic coating layer on metallic substrate Expired - Fee Related CN202915881U (en)

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Application Number Priority Date Filing Date Title
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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103499272A (en) * 2013-10-10 2014-01-08 南昌航空大学 Wide-range magnetic thickness measuring device for non-magnetic coating of ferromagnetic component and detection method of wide-range magnetic thickness measuring device
CN104954965A (en) * 2015-05-08 2015-09-30 华为技术有限公司 Headset button detection method and device
CN111649662A (en) * 2020-06-17 2020-09-11 深圳市林上科技有限公司 Coating thickness gauge and coating thickness detection method
CN111928767A (en) * 2020-01-08 2020-11-13 南京信息工程大学 Paint film thickness tester and implementation method

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103499272A (en) * 2013-10-10 2014-01-08 南昌航空大学 Wide-range magnetic thickness measuring device for non-magnetic coating of ferromagnetic component and detection method of wide-range magnetic thickness measuring device
CN104954965A (en) * 2015-05-08 2015-09-30 华为技术有限公司 Headset button detection method and device
CN104954965B (en) * 2015-05-08 2018-08-21 华为技术有限公司 The detection method and device of earphone keystroke
CN111928767A (en) * 2020-01-08 2020-11-13 南京信息工程大学 Paint film thickness tester and implementation method
CN111649662A (en) * 2020-06-17 2020-09-11 深圳市林上科技有限公司 Coating thickness gauge and coating thickness detection method
CN111649662B (en) * 2020-06-17 2022-06-03 深圳市林上科技有限公司 Coating thickness gauge and coating thickness detection method

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Granted publication date: 20130501

Termination date: 20151031

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