CN202720317U - Bouncing test device used for single coil magnetic latching relay - Google Patents
Bouncing test device used for single coil magnetic latching relay Download PDFInfo
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- CN202720317U CN202720317U CN201220415463.0U CN201220415463U CN202720317U CN 202720317 U CN202720317 U CN 202720317U CN 201220415463 U CN201220415463 U CN 201220415463U CN 202720317 U CN202720317 U CN 202720317U
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Abstract
The utility model discloses a bouncing test device used for a single coil magnetic latching relay, which comprises a MCU micro-control unit connected to a host computer, the MCU micro-control unit are respectively connected to a relay drive circuit and a detection circuit, the relay to be tested is respectively connected to the relay drive circuit and the detection circuit; and the relay drive circuit is connected to a dc source. The bouncing test device used for the single coil magnetic latching relay has the following beneficial effects that when the bouncing test device is used, the driving voltage and the driving pulse width of the relay to be tested can be adjusted, bouncing tests of relays with different rated parameters under different control requirements of the relay can be reached, the cost is low, and the bouncing test device is suitable for batch detection requirements during actual production.
Description
Technical field
The utility model relates to the magnetic latching relay field tests in the device for switching field, particularly a kind of unicoil magnetic latching relay spring proving installation.
Background technology
Traditional DC relay of comparing, magnetic latching relay only need to add a pulse at control end can be so that its action, and the permanent magnet in the relay can make operating state keep, and namely is that power down can not reset yet.Such control mode has been brought the reduction of power and the increase of reliability.Therefore, the DC magnetic guard relay is applied in the every field of electrical equipment as a kind of low-voltage electrical apparatus commonly used.
But the intrinsic spring problem of mechanical switch affects the use of magnetic latching relay always, and its topmost reason is exactly that spring can cause in the input process and inevitably acutely shoves.This surge current can directly cause the damage that can't heal to switch and subordinate's load.
Therefore low voltage electrical equipment producer often all needed to carry out certain screening operation before using relay, picked out the relay that is fit to product demand.At present paying close attention to less, commonly used relay spring equipment for the testing apparatus of relay spring is based on laser displacement sensor or the CCD first-class photoinduction principle of making a video recording more and detects.This equipment also is not suitable for doing large batch of detection, only is only applicable to laboratory study.
The utility model content
The utility model purpose: technical problem to be solved in the utility model is for the deficiencies in the prior art, and a kind of unicoil magnetic latching relay spring proving installation is provided.
In order to solve the problems of the technologies described above, the utility model discloses a kind of unicoil magnetic latching relay spring proving installation, comprise the MCU micro-control unit that connects host computer, the MCU micro-control unit connects respectively relay drive circuit and testing circuit, and tested relay is connected respectively testing circuit and is connected with relay drive circuit; Described relay drive circuit connects direct supply.
In the utility model, described relay drive circuit comprises the first triode, the second triode, the 3rd triode, the 4th triode, the 5th triode, the 6th triode, the first diode, the second diode, the 3rd diode and the 4th diode;
Wherein, the base stage of the first triode, the second triode, the 4th triode and the 6th triode connects respectively the MCU micro-control unit separately;
The first transistor emitter ground connection, collector connects the base stage of the 3rd triode; The emitter of the 3rd triode connects the negative pole of direct supply and the first diode, and collector connects the collector of the second triode, the positive pole of the first diode, the negative pole of the second diode and an end of tested relay; The positive pole of the grounded emitter of the second triode and the second diode;
The 6th transistor emitter ground connection, collector connect base stage and the direct supply of the 5th triode; The emitter of the 5th triode connects the negative pole of direct supply and the 3rd diode, and collector connects the collector of the 4th triode, the positive pole of the 3rd diode, the negative pole of the 4th diode and the other end of tested relay; The positive pole of the grounded emitter of the 4th triode and the 4th diode.
In the utility model, described testing circuit comprises resistance and the signal output part that connects respectively tested relay switch, another termination power of resistance, and it is control module that signal output part connects MCU.
Host computer and carry out communication as the MCU micro-control unit of slave computer in the utility model transmits test command and test result, and described host computer can adopt common industrial computer or computer.MCU can drag that some group relay driving circuits are tested simultaneously or respectively test.According to present design, a MCU is with 6 groups of test circuits.Each group driving circuit drives a relay and carries out switching, and testing circuit then is responsible for detecting spring and the on off state of relay, and feeds back to MCU.MCU packs the spring data of this relay, is uploaded to host computer again.Host computer generates the spring test waveform, and judges according to the previous spring decision rule of formulating whether relay is qualified.During this equipment of use, the driving voltage of relay, driving pulse width all can be regulated, with the test that reaches different nominal parameter relays and different control requires lower spring to relay.
Beneficial effect: the beneficial effects of the utility model are: when using the utility model, the driving voltage of tested relay, driving pulse width all can be regulated, with the test that reaches different nominal parameter relays and different control requires lower spring to relay, and cost is low, batch detection requirement in the time of being fit to actual production.
Description of drawings
Below in conjunction with the drawings and specific embodiments the utility model is done further to specify, above-mentioned and/or otherwise advantage of the present utility model will become apparent.
Fig. 1 is the utility model fundamental diagram.
Fig. 2 is driving and the testing circuit synoptic diagram of the utility model repeat circuit.
Fig. 3 is method of testing process flow diagram in the utility model.
Embodiment
As shown in Figure 1, the utility model discloses a kind of unicoil magnetic latching relay spring proving installation, comprise the MCU micro-control unit that connects host computer, the MCU micro-control unit connects respectively relay drive circuit and testing circuit, and tested relay is connected respectively testing circuit and is connected with relay drive circuit; Described relay drive circuit connects direct supply.
As shown in Figure 2, relay drive circuit described in the utility model comprises the first triode, the second triode, the 3rd triode, the 4th triode, the 5th triode, the 6th triode, the first diode, the second diode, the 3rd diode and the 4th diode; Wherein, the base stage of the first triode, the second triode, the 4th triode and the 6th triode connects respectively the MCU micro-control unit separately; The first transistor emitter ground connection, collector connects the base stage of the 3rd triode; The emitter of the 3rd triode connects the negative pole of direct supply and the first diode, and collector connects the collector of the second triode, the positive pole of the first diode, the negative pole of the second diode and an end of tested relay; The positive pole of the grounded emitter of the second triode and the second diode; The 6th transistor emitter ground connection, collector connect base stage and the direct supply of the 5th triode; The emitter of the 5th triode connects the negative pole of direct supply and the 3rd diode, and collector connects the collector of the 4th triode, the positive pole of the 3rd diode, the negative pole of the 4th diode and the other end of tested relay; The positive pole of the grounded emitter of the 4th triode and the 4th diode.Described testing circuit comprises resistance and the signal output part that connects respectively tested relay switch, another termination power of resistance, and it is control module that signal output part connects MCU.
As shown in Figure 3, the invention also discloses a kind of method of testing, may further comprise the steps:
After the MCU micro-control unit is received test command, begin to read the gating pulse width parameter that host computer sends;
Switching control: MCU micro-control unit time-delay 5s, send relay on gating pulse, catch within the 1000us, rise each time and the negative edge moment, with first negative edge, last negative edge and middle 3 maximum subpulse width, send to host computer according to the time order and function order; MCU micro-control unit time-delay 5s sends relay off gating pulse;
The time result that the host computer receiving relay is uploaded draws out the level diagram of signal, and exports total pulse bounce time and maximum pulsatile once bounce time;
The MCU micro-control unit is above-mentioned switching control step several times repeatedly;
After switching control step all finishes, export above-mentioned total pulse bounce time and maximum pulsatile once bounce time separately maximum once, thereby finish test.
Embodiment
As shown in Figure 1, host computer and slave computer equipment MCU carry out communication, transmit test command and test result.MCU can drag that some group relay driving circuits are tested simultaneously or respectively test.According to present design, a MCU can be with 6 groups of test circuits.Each group driving circuit drives a relay and carries out switching, and testing circuit then is responsible for detecting spring and the on off state of relay, and feeds back to MCU.MCU packs the spring data of this relay, is uploaded to host computer again.Host computer generates the spring test waveform, and judges according to the previous spring decision rule of formulating whether relay is qualified.
As shown in Figure 2, the driving circuit of relay adopts bridge circuit.Relay adopts bridge circuit to drive, and four triodes of Q2 ~ Q5 form brachium pontis, and Q1 and Q6 provide brachium pontis to drive logic.Relay drive circuit comprises triode Q1 ~ Q6, diode D1 ~ D4; Wherein, the base stage of triode D1, D2, D4, D6 connects respectively the MCU micro-control unit separately, and the trigger pip of triode D1 and D4 is identical, and the trigger pip of triode D2 and D6 is identical.Triode Q1 grounded emitter, the base stage of collector connecting transistor Q3; The emitter of triode Q3 connects the negative pole of direct supply VCC and diode D1, the negative pole of the collector of the collector connecting transistor Q2 of triode Q3, the positive pole of diode D1, diode D2 and an end of tested relay.The positive pole of the grounded emitter of triode Q2 and diode D2.Triode Q6 grounded emitter, the base stage of collector connecting transistor Q5 and direct supply VCC.The emitter of triode Q5 connects the negative pole of direct supply VCC and diode D2, the positive pole of the collector of collector connecting transistor Q4, diode D3, the negative pole of diode D4 and the other end of tested relay.The positive pole of the grounded emitter of triode Q4 and diode D4.Described testing circuit comprises resistance R 7 and the signal output part detect that connects respectively tested relay switch, another termination of resistance+5v power supply, and it is control module that signal output part connects MCU.
The Relay on and the relay off signal that are sent by MCU send positive negative pulse stuffing by bridge circuit, and pilot relay closes a floodgate or separating brake.The deration of signal that drives relay can be regulated according to the control command of host computer by MCU, to adapt to the control needs of different relays.VCC among the figure is provided by adjustable D. C regulated, and scope is 10 ~ 30V.The purpose that why adopts adjustable D.C. regulated power supply is the situation of bouncing under different rated voltages and the different operating voltage in order to measure.
The driving circuit of this form can be driven by MCU control the pulse width of relay, the driving voltage that adjustable direct supply then can the regulating relay coil.
Triode Q3, Q5 are the PNP triode in the present embodiment, and model BC807, all the other triodes are the NPN triode, and model is BC817, and diode D1 ~ D4 is that fly-wheel diode is model 1N4007.
The relay test circuit then is to be made of direct supply of pull-up resistor series connection, and the detect signal is connected to MCU timer capture pin.In the time of relay contact closure, the detect signal is low level; And the contact is when disconnecting, and the detect signal then is high level.High-low level all is the TTL level of standard.Among the process that relay closes a floodgate, be a negative edge in theory, separating brake then is a rising edge.But because the existence of spring, the waveform of combined floodgate is the square wave of a series of different in width, and each ripple has represented once spring.
Relay on and relay off are the signals of the pilot relay switching that sends of single-chip microcomputer, and the former high level represents to drop into, and latter's high level represents excision.Drop under the order, relay on signal is high level, and relay off signal is low level, and above level signal width can be by the host computer procedure setting.Under the control of this level, Q1, Q4 base stage obtain electric current and conducting, and the collector current of Q1 makes the Q3 conducting as the base current of Q3, so relay obtains positive drive voltage and drops into.After Relay on level signal removed, the electric energy that stores in the relay coil discharged by diode.In the relay permanent magnet guarantee electric energy discharge complete after the guard relay closing of contact still, unless single-chip microcomputer sends the excision signal.
Under the excision order, relay on signal is low level, and relay off signal is high level.Under the control of this level, Q6, Q2 base stage obtain electric current and conducting, and the collector current of Q6 makes the Q5 conducting as the base current of Q5, so relay obtains positive drive voltage and drops into.After Relay off level signal removed, the electric energy that stores in the relay coil discharged by diode.Permanent magnet guarantees still guard relay contact disconnection after electric energy release is complete in the relay.
When relay on and relay off signal when all being low level, relay is kept original state.Never allow the two to be simultaneously high level in the control, with power-free VCC short circuit.
Diode is fly-wheel diode, and when relay on or relay off signal are become low level the time by high level, the electric energy that relay coil stores discharges fast by fly-wheel diode.
In the time of the triode conducting, antiparallel diode is current flowing not with it.After triode turn-offed, coil passed through with it antiparallel diode continuousing flow.After afterflow finishes, there has not been electric current in the diode yet.
After Relay on level signal removed, the electric energy that stores in the relay coil discharged by diode D1, D4.
After Relay off level signal removed, the electric energy that stores in the relay coil discharged by diode D2, D3.
The MCU model is STM8S207RB in the present embodiment.
As shown in Figure 3, the MCU main task a bit is exactly to be responsible for making progress communication with host computer except providing for tested relay to drive signal and detect the on off state of relay, also having.The RS485 mode is adopted in communication between the two.Host computer carries out man-machine interaction by program interface.The testing staff issues steering order by program, makes a certain relay begin to detect.
The method of testing of present embodiment is as follows: after MCU receives test command, begin to read the gating pulse width parameter, the 5s that then delays time opens the corresponding port and catches, output relay on signal, catch within the 1000us, rise each time and the negative edge moment, with first negative edge, last negative edge and middle 3 times main spring data, send to host computer according to sequencing, the 5s that delays time again sends relay off gating pulse, and above-mentioned switching process is 5 times repeatedly.Host computer is waited for the time result that acknowledging relay is uploaded at last, and this result is resolved, and draws out the level diagram of signal signal, and exports total bounce time and maximum bounce time, and this is and the relay relevant parameter of shoving.After 5 switchings finish, export above-mentioned two parameters detect for 5 times in separately maximum once.
The utility model provides a kind of unicoil magnetic latching relay spring proving installation and method of testing thereof; method and the approach of this technical scheme of specific implementation are a lot; the above only is preferred implementation of the present utility model; should be understood that; for those skilled in the art; under the prerequisite that does not break away from the utility model principle, can also make some improvements and modifications, these improvements and modifications also should be considered as protection domain of the present utility model.In the present embodiment not clear and definite each ingredient all available prior art realized.
Claims (3)
1. a unicoil magnetic latching relay is with the spring proving installation, it is characterized in that, comprise the MCU micro-control unit that connects host computer, the MCU micro-control unit connects respectively relay drive circuit and testing circuit, and tested relay is connected respectively testing circuit and is connected with relay drive circuit; Described relay drive circuit connects direct supply.
2. a kind of unicoil magnetic latching relay according to claim 1 is with the spring proving installation, it is characterized in that described relay drive circuit comprises the first triode, the second triode, the 3rd triode, the 4th triode, the 5th triode, the 6th triode, the first diode, the second diode, the 3rd diode and the 4th diode;
Wherein, the base stage of the first triode, the second triode, the 4th triode and the 6th triode connects respectively the MCU micro-control unit separately;
The first transistor emitter ground connection, collector connects the base stage of the 3rd triode; The emitter of the 3rd triode connects the negative pole of direct supply and the first diode, and collector connects the collector of the second triode, the positive pole of the first diode, the negative pole of the second diode and an end of tested relay; The positive pole of the grounded emitter of the second triode and the second diode;
The 6th transistor emitter ground connection, collector connect base stage and the direct supply of the 5th triode; The emitter of the 5th triode connects the negative pole of direct supply and the 3rd diode, and collector connects the collector of the 4th triode, the positive pole of the 3rd diode, the negative pole of the 4th diode and the other end of tested relay; The positive pole of the grounded emitter of the 4th triode and the 4th diode.
3. a kind of unicoil magnetic latching relay according to claim 1 is with the spring proving installation, it is characterized in that, described testing circuit comprises resistance and the signal output part that connects respectively tested relay switch, another termination power of resistance, and it is control module that signal output part connects MCU.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201220415463.0U CN202720317U (en) | 2012-08-21 | 2012-08-21 | Bouncing test device used for single coil magnetic latching relay |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201220415463.0U CN202720317U (en) | 2012-08-21 | 2012-08-21 | Bouncing test device used for single coil magnetic latching relay |
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| Publication Number | Publication Date |
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| CN202720317U true CN202720317U (en) | 2013-02-06 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201220415463.0U Expired - Lifetime CN202720317U (en) | 2012-08-21 | 2012-08-21 | Bouncing test device used for single coil magnetic latching relay |
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| CN (1) | CN202720317U (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102830348A (en) * | 2012-08-21 | 2012-12-19 | 江苏华德电力科技有限公司 | Bounce testing device for single-coil magnetic-latching relay and test method of bounce testing device |
| CN103165347A (en) * | 2013-03-15 | 2013-06-19 | 南京大学 | Outage holding relay and drive circuit thereof |
| CN104267334A (en) * | 2014-02-27 | 2015-01-07 | 何均匀 | Switch bouncing tester |
| CN104730454A (en) * | 2015-03-28 | 2015-06-24 | 安徽阿瑞特汽车电子科技有限公司 | Automatic detection circuit for digital switch circuit |
-
2012
- 2012-08-21 CN CN201220415463.0U patent/CN202720317U/en not_active Expired - Lifetime
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102830348A (en) * | 2012-08-21 | 2012-12-19 | 江苏华德电力科技有限公司 | Bounce testing device for single-coil magnetic-latching relay and test method of bounce testing device |
| CN103165347A (en) * | 2013-03-15 | 2013-06-19 | 南京大学 | Outage holding relay and drive circuit thereof |
| CN104267334A (en) * | 2014-02-27 | 2015-01-07 | 何均匀 | Switch bouncing tester |
| CN104730454A (en) * | 2015-03-28 | 2015-06-24 | 安徽阿瑞特汽车电子科技有限公司 | Automatic detection circuit for digital switch circuit |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CX01 | Expiry of patent term | ||
| CX01 | Expiry of patent term |
Granted publication date: 20130206 |