CN202661173U - System for automatically measuring influence of target to polarization state of single photon - Google Patents

System for automatically measuring influence of target to polarization state of single photon Download PDF

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CN202661173U
CN202661173U CN 201220104025 CN201220104025U CN202661173U CN 202661173 U CN202661173 U CN 202661173U CN 201220104025 CN201220104025 CN 201220104025 CN 201220104025 U CN201220104025 U CN 201220104025U CN 202661173 U CN202661173 U CN 202661173U
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photon
single photon
polarization
rotating machine
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杨世骥
王建宇
贾建军
舒嵘
何志平
吴金才
江昊
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Shanghai Institute of Technical Physics of CAS
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Abstract

The utility model discloses a system for automatically measuring influence of a target to a polarization state of a single photon. The system comprises a high-repetition frequency and narrow-pulse laser source, an attenuating sheet, a beam splitter prism, a transmission type target module, a reflecting type target module, a polarization detector and rotating motor assembly, a first single-photon detector, a first-dimensional electric platform, a second single-photon detector, a single-photon counter, a motor controller and a computer; and the system is specifically applicable to a situation requiring for automatic measuring. According to the system disclosed by the utility model, a reasonable and feasible optical-mechanical structure is designed by utilizing a double beam path compensation technology and a single-photon detection technology and the like based on the optical polarization principle, and each rotating motor and the electric platform are automatically controlled through the computer, therefore, the purpose of automatically measuring the influence of the target to the polarization state of the single photon can be achieved.

Description

A kind of automatic measurement target is on the system of Single Photon Polarization impact
Technical field
This patent relates to optical detective technology, refers in particular to a kind of high-precision automatic measuring target to the system of Single Photon Polarization impact.
Background technology
Polarization is a specific character of light, by the research to the light polarization phenomenon, polarization technology widely English in a plurality of subjects such as biology, chemistry, engineerings: utilize the solution such as sucrose to have measurement solution pol that optical activity makes with the saccharometer of the maturity of judging fruit etc.; Utilization has the image beam of mutual vertical polarization and the stereogram pictures such as three-dimensional film that form; Utilize and apply the engineering detecting method etc. that external force can produce the photoelastic effect of proportional birefringent phenomenon on the homogeneous materials such as glass.
Along with people's understanding and deepening continuously of studying, the single photon polarization is used beginning and is concerned about by people gradually.Traditional secret mode has been proved under superfast Computing no longer safe, and quantum communications have the property of being kept absolutely secret owing to the sub-mechanical characteristic of indivisible, not reproducible equivalent of photon, and it is pursued by global scientists.The scientists of China, Europe and the U.S. is just being planned the secret communication network take satellite-ground quantum communication and optical fiber quantum communications as the fundamental construction whole world.And the very-long-range space communtication of single photon polarization encoder is also verified by countries in the world gradually and push gradually application to.
In the application of single photon polarization and research process thereof, for obtaining different target to the influencing characteristic of polarized light, must be to measuring through the single photon polarization characteristic behind the interacting goals.Original polarization state detection system all has certain limitation: " a kind of novel quick-speed elliptical polarized light measurement instrument " of number of patent application 200520040201.0, it in use adopts combination analyzer and two-dimensional CCD detector to obtain the optical parametric of material, considered and detected target to the impact of light polarization, but in use still have some problems: 1, still adopt the mode of single channel direct current on measurement means, the precision of detection is not high; When 2, goal in research is on the affecting of light polarization, can only finish the polarimetry of one-dimensional, can not measure the isotropy homogeneous material, can not satisfy the needs of using fully.For solving the limitation of above system, we have developed such as patent 200910049106.X " a kind of high-precision automatic measuring target is to the system of transmitting beam effect of polarization " and have obtained the authorization, but the impact that this system detects still is in the high light level, can not satisfy the demand of the Single Photon Polarization impact that reaches now in using in the future." a kind of apparatus and method of real-time detection single photon polarization quantum state " of number of patent application 201010565062, its in use the stated accuracy of the polarization measuring sensor such as retardation plate require very high, the cumulative error of test macro will be exaggerated in the result, the most at last the measurement result of system produced uncertain measuring error impact and precise decreasing, and regulate test structure according to the characteristic needs of test target.
This patent takes into full account the demand that actual polarization is used, based on polarization theory, adopt the technology such as double light path compensation, single photon detection, feasible mechanical-optical setup reasonable in design, utilize each electric rotating machine of computer controlled automatic and electric platforms, realize that finally the automatic measurement target is on the purpose of Single Photon Polarization impact.
Summary of the invention
The purpose of this patent is, on the basis of existing polarized light detection pattern, the demand in conjunction with single photon polarization is now used adopts the new techniques such as single photon detection, proposes the system that a kind of automatic measurement Multidimensional object affects Single Photon Polarization.
The technical scheme of whole polarization state detection system is:
Detect target to the system principle schematic diagram of effect of polarization as shown in Figure 1, it is by high repetition narrow-pulse laser source 1, attenuator 2, Amici prism 3, transmission-type object module 4, reflective object module 5, analyzer and electric rotating machine assembly 6, the first single-photon detector 7, one dimension electric platforms 8, the second single-photon detector 9, single photon counter 10, electric machine controller 11 and computing machine 12 form, it is characterized in that: via attenuator 2 every pulse energy is decayed to the single photon level by high repetition narrow-pulse laser source 1 emitting laser, be divided into the two ways of optical signals of determining energy Ratios through Amici prism 3 again: the one tunnel is directly surveyed by the second single-photon detector 9, counts to get reference value by single photon counter 10 again; The optical propagation direction characteristic of another road optical signals target material determines to adopt transmission-type object module 4, and this moment, light signal passed through transmission target 13 again through first polarizer and electric rotating machine assembly 4.1 first; Perhaps reflective object module 5, this moment, light signal became first the first catoptron 5.1 and 5.2 reflections of the second catoptron of 45 degree with incident ray through two reflectings surface, reflect on the 3rd catoptron 5.4 surfaces parallel with target surface again, inclined to one side through second polarizer and 5.5 of electric rotating machine assemblies, reflect on target 13 surfaces at last; Then after passing through analyzer and 6 analyzings of electric rotating machine assembly, surveyed by the first single-photon detector 7, count to get actual measured value by single photon counter 10 again.
The design of single-photon light source always is the key issue that single photon is used.The real single-photon source such as quantum dot light source since volume, performance, strict restrictions such as application conditions in engineering is used, be not widely adopted.The source of adopting in the native system design is accurate single-photon source popular in the practical application, namely utilizes attenuator that every pulse energy of high repetition narrow-pulse laser source outgoing is decayed to the single photon level.
In the process of measuring polarization state, adopt the double light path penalty method.By Amici prism accurate single photon signal is divided into two-way, the one tunnel is used for actual measuring polarization state, and another road is used for reference value and measures; When data are processed, the result of actual measurement divided by reference value, is obtained the result of relative measurement, thereby reduces the unstable impact that brings of accurate single-photon source energy.In testing process, during processing, can also adopt by software that many groups are measured, abandoned being worth most, the data processing method of calculating mean value, drop to the impact of source energy stability minimum.
The secret mark number always is the major influence factors of signal to noise ratio (S/N ratio) in the single photon detection.Trigger pip with high repetition narrow-pulse laser source in system is transferred to single photon counter, as gate pulse control secret mark number.Only the single photon pulses in the pulse thresholding is only real signal, and the outer secret mark number of thresholding all will be abandoned.This technology will greatly improve the single photon detection performance of system.
According to the needs that polarization is used, in detecting, reality wishes can obtain target to the multidimensional information of single photon polarization impact, and the data of actual acquisition are larger.So during to the measuring system layout of multidimensional, simultaneously rational design has been carried out in computer automation control.
According to detecting the difference of light through optical propagation direction behind the target material, system transmission-type object module 4 and reflective object module 5.In the transmission-type object module, target 13 to be measured is placed on the first three-D electric platform 4.2, the first three-D electric platform 4.2 can be with moving-target 13 to realize rotating at surface level, and translation in level and vertical plane makes the part to be measured that can be radiated at target in the variation range of incidence point.With three catoptrons, the reflecting surface of the first catoptron 5.1 and the second catoptron 5.2 becomes 45 degree with incident ray, make the light of incident that one section translation occur in the horizontal direction in the reflective object module; The reflecting surface keeping parallelism of the 3rd catoptron 5.4 and target 16 is 45 degree with second polarizer and electric rotating machine assembly 5.5; The 3rd catoptron, second polarizer and electric rotating machine assembly and target are placed on the second three-D electric platform 5.3, the second three-D electric platform 5.3 can drive catoptron 5.4, second polarizer and electric rotating machine assembly 5.5 and target 13 and rotate at surface level, in level and vertical plane translation make in the variation range of incidence point can coverage goal part to be measured.Although it is many that such design is wanted on the use device than usual, can guarantee that rear light path only need to one-dimensional translation occur in level, just can realize the aligning of light path, in fact mechanical-optical setup has obtained simplifying greatly.
Ray machine part in system, all adjust electric rotating machine and comment platform that structure all adopts motor controller controls, thereby guarantee the robotization of mechanical adjustment process.
System controls whole measuring process by computer programming, obtain angle and the displacement information of motor from electric machine controller, obtain the actual measured value of Photoelectric Detection from lock-in amplifier, and control signal is transferred to electric machine controller the motor adjustment process is carried out robotization control.The signal that utilization obtains is processed through the data that programming is finished, and just can obtain the polarization information of being concerned about in the application such as extinction ratio and polarization rotation angle.This patent has the characteristics of robotization multidimensional measure, can provide target to the multidimensional information of Single Photon Polarization impact.
Description of drawings
Fig. 1 is the system principle schematic diagram.
Fig. 2 is system's control and Measurement Algorithm process flow diagram.
Number in the figure: 1 is high repetition narrow-pulse laser source, 2 is attenuator, 3 is Amici prism, 4 is that (4.1 is first polarizer and electric rotating machine assembly to the transmission-type object module, 13 is target, 4.2 be the first three-D electric platform), 5 is that (5.1 and 5.2 is reflecting surface becomes 45 degree with incident ray the first catoptron and the second catoptrons to reflective object module, 5.3 be the second three-D electric platform, 5.4 be the 3rd catoptron, 5.5 be second polarizer and electric rotating machine assembly, 13 is target), 6 is analyzer and electric rotating machine assembly, 7 is the first single-photon detector, 8 is the one dimension electric platforms, 9 is the second single-photon detector, 10 is single photon counter, 11 is electric machine controller, and 12 is computing machine.Thick line is light path among Fig. 1, and fine rule is circuit.
Embodiment
This patent system schematic as shown in Figure 1, via attenuator 2 every pulse energy is decayed to the single photon level by high repetition narrow-pulse laser source 1 emitting laser, be divided into the two paths of signals of determining energy Ratios through Amici prism 3 again: the one tunnel is directly surveyed by the second single-photon detector 9, counts to get reference value by single photon counter 10 again; Another road signal is determined to adopt transmission-type object module 4(to pass through transmission target 13 through first polarizer and electric rotating machine assembly 4.1 first by the optical propagation direction characteristic of target material again) or reflective object module 5(become the first catoptrons 5.1 of 45 degree and the second catoptron 5.2 to reflect with incident ray through two reflectings surface first, reflect on the 3rd catoptron 5.4 surfaces parallel with target surface again, inclined to one side through second polarizer and 5.5 of electric rotating machine assemblies, reflect on target 13 surfaces at last), then after passing through analyzer and 6 analyzings of electric rotating machine assembly, surveyed by the first single-photon detector 7, count to get actual measured value by single photon counter 10 again.
This patent system further describes as follows:
1) main devices
A) laser instrument: Hamamastu company product, model are M10306-18;
B) polarizer/analyzer: the product of Thorlabs company, model are LPVIS100;
C) Amici prism: Thorlabs company product, model are BS011;
D) single-photon detector: PerkinElmer company product, model are SPCM-AQRH-16;
E) single photon counter: ORTEC company product, model are MCS-PCI;
F) electric rotating machine and translation motor: Shanghai friendship ties optical-fiber laser apparatus factory product, model is TRB-m-1-1, ALB-m-50-2X, ALB-m-75-2XY or its combination.
2) software section
The one-dimensional rotation motor of electric machine controller 11 control first polarizers and electric rotating machine assembly 4.1, second polarizer and electric rotating machine assembly 5.5, analyzer and electric rotating machine assembly 6 and the first three-D electric platform 4.2, the second three-D electric platform 5.3, one dimension electric platforms 8, and obtain angle and the positional information of rotary electric machine and electric platforms.Computing machine according to automated procedures setting issue the motor controller controls signal, and from electric machine controller and lock-in amplifier reading information, according to the program of setting, calculate, thereby obtain net result.
The computer controlled measurement algorithm flow chart is as shown in Figure 2:
1, program brings into operation, initialization the first three-D electric platform 4.2 or the second three-D electric platform 5.3;
2, mobile one dimension electric platforms 8 is until light path is aligned (rise in the equidirectional situation of inclined to one side analyzing, measure light intensity and reach maximum);
3, rotate first polarizer and electric rotating machine assembly 4.1 or second polarizer and 5.5 to initial angles of electric rotating machine assembly, rotate analyzer and 6 to initial angles of electric rotating machine assembly, finish 10 groups of measurements, then rotate 6 one low-angles of analyzer and electric rotating machine assembly (general precision can be made as 0.2 degree), each surveying work that repeats 10 groups (every batch total is counted 1s) is until analyzer and electric rotating machine assembly 6 are finished the rotation of half cycle;
4, analyzer and electric rotating machine assembly 6 are measured 50 groups of data to measuring to get the angle of minimum value, and 90-degree rotation (being defaulted as the maximal value angle) is finished 50 groups of measurements, and computing machine calculates and store results;
5, rotation first polarizer and electric rotating machine assembly 4.1 or second polarizer and 5.5 1 low-angles of electric rotating machine assembly (general precision can be made as 1 degree), repeat 3,4 steps, until rotate the rotation that first polarizer and electric rotating machine assembly 4.1 or second polarizer and electric rotating machine assembly 5.5 are finished half cycle;
6, rotation the first three-D electric platform 4.2 or 5.3 1 low-angles of the second three-D electric platform (general precision can be made as 1 degree) repeat 2,5 steps, until finish the ranges of incidence angles that needs measurement;
7, translation the first three-D electric platform 4.2 or little translational movements of 5.3 1 low-angles of the second three-D electric platform (general precision can be made as 1cm) repeat 6 steps, until finish the two-dimensional translation scanning of target 13 surface range to be measured;
8, complete measuring process finishes.
In the situation that target surface is determined incidence point, incident angle and incident light polarization direction, obtain the polarizing angle degree θ of polarizer slice; Measuring the analyzing angle θ of least count value Min, obtain 50 groups of meter numerical value, remove 5 minimum value of 5 maximal values, calculate mean value N Min, obtain the count value that 50 groups of reference paths detect, remove 5 minimum value of 5 maximal values, calculating with reference to mean value is N Min'; Analyzing angle θ at 90-degree rotation Min+ 90 ° (being defaulted as the angle that detects maximum count value) obtains 50 groups of meter numerical value, removes 5 minimum value of 5 maximal values, calculates mean value N Max, obtain the count value that 50 groups of reference paths detect, remove 5 minimum value of 5 maximal values, calculating with reference to mean value is N Max'.
The relative value of minimum voltage:
Figure DEST_PATH_GDA00002165533500071
The relative value of maximum voltage:
The final polarization extinction ratio of measuring:
Figure DEST_PATH_GDA00002165533500073
The Orientation of polarized main axis rotation angle:
Figure DEST_PATH_GDA00002165533500081
Through the perfect measurement process, finally can obtain the target surface each point to the situation that affects of the Single Photon Polarization of different incidence angles degree different polarization light direction.

Claims (1)

1. an automatic measurement target is on the system of Single Photon Polarization impact, it is by high repetition narrow-pulse laser source (1), attenuator (2), Amici prism (3), transmission-type object module (4), reflective object module (5), analyzer and electric rotating machine assembly (6), the first single-photon detector (7), one dimension electric platforms (8), the second single-photon detector (9), single photon counter (10), electric machine controller (11) and computing machine (12) form, it is characterized in that: via attenuator (2) every pulse energy is decayed to the single photon level by high repetition narrow-pulse laser source (1) emitting laser, pass through Amici prism (3) again and be divided into the two ways of optical signals of determining energy Ratios: the one tunnel is directly surveyed by the second single-photon detector (9), counts to get reference value by single photon counter (10) again; The optical propagation direction characteristic of another road optical signals target material determines to adopt transmission-type object module (4), and this moment, light signal passed through transmission target (13) again through first polarizer and electric rotating machine assembly (4.1) first; Perhaps reflective object module (5), this moment, light signal became first the first catoptron (5.1) and the second catoptron (5.2) reflection of 45 degree with incident ray through two reflectings surface, reflect on the 3rd catoptron (a 5.4) surface parallel with target surface again, rise partially through second polarizer and electric rotating machine assembly (5.5), reflect on target (13) surface at last; Then after passing through analyzer and electric rotating machine assembly (6) analyzing, surveyed by the first single-photon detector (7), count to get actual measured value by single photon counter (10) again.
CN 201220104025 2012-03-19 2012-03-19 System for automatically measuring influence of target to polarization state of single photon Expired - Lifetime CN202661173U (en)

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102589704A (en) * 2012-03-19 2012-07-18 中国科学院上海技术物理研究所 System and method for automatically measuring influence of target on single photon polarization state
CN103115683A (en) * 2013-01-22 2013-05-22 黑龙江工程学院 Method of measuring monochromatic light polarization state
CN103414512A (en) * 2013-08-27 2013-11-27 华南师范大学 Extinction ratio measuring method and system
CN108107004A (en) * 2017-12-19 2018-06-01 长春理工大学 Narrow-pulse laser target polarization reflection characteristic test method

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102589704A (en) * 2012-03-19 2012-07-18 中国科学院上海技术物理研究所 System and method for automatically measuring influence of target on single photon polarization state
CN103115683A (en) * 2013-01-22 2013-05-22 黑龙江工程学院 Method of measuring monochromatic light polarization state
CN103414512A (en) * 2013-08-27 2013-11-27 华南师范大学 Extinction ratio measuring method and system
CN103414512B (en) * 2013-08-27 2016-12-28 华南师范大学 The measuring method of a kind of extinction ratio and system
CN108107004A (en) * 2017-12-19 2018-06-01 长春理工大学 Narrow-pulse laser target polarization reflection characteristic test method

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