CN202494701U - 一种用于集成电路测试的装置 - Google Patents
一种用于集成电路测试的装置 Download PDFInfo
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- CN202494701U CN202494701U CN2011205156592U CN201120515659U CN202494701U CN 202494701 U CN202494701 U CN 202494701U CN 2011205156592 U CN2011205156592 U CN 2011205156592U CN 201120515659 U CN201120515659 U CN 201120515659U CN 202494701 U CN202494701 U CN 202494701U
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- 238000012360 testing method Methods 0.000 title claims abstract description 32
- 239000000523 sample Substances 0.000 claims abstract description 69
- 238000001746 injection moulding Methods 0.000 claims abstract description 4
- 238000000034 method Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 2
- 238000010276 construction Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000003754 machining Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
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CN2011205156592U CN202494701U (zh) | 2011-12-12 | 2011-12-12 | 一种用于集成电路测试的装置 |
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CN2011205156592U CN202494701U (zh) | 2011-12-12 | 2011-12-12 | 一种用于集成电路测试的装置 |
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CN202494701U true CN202494701U (zh) | 2012-10-17 |
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CN2011205156592U Expired - Fee Related CN202494701U (zh) | 2011-12-12 | 2011-12-12 | 一种用于集成电路测试的装置 |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102495248A (zh) * | 2011-12-12 | 2012-06-13 | 段超毅 | 一种用于集成电路测试的装置 |
CN113075430A (zh) * | 2021-03-30 | 2021-07-06 | 云谷(固安)科技有限公司 | 针卡结构和测试设备 |
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2011
- 2011-12-12 CN CN2011205156592U patent/CN202494701U/zh not_active Expired - Fee Related
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102495248A (zh) * | 2011-12-12 | 2012-06-13 | 段超毅 | 一种用于集成电路测试的装置 |
CN113075430A (zh) * | 2021-03-30 | 2021-07-06 | 云谷(固安)科技有限公司 | 针卡结构和测试设备 |
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Legal Events
Date | Code | Title | Description |
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C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
EE01 | Entry into force of recordation of patent licensing contract |
Assignee: Shenzhen Kaizhi Tong micro electronic te Co., Ltd. Assignor: Duan Chaoyi Contract record no.: 2012440020300 Denomination of utility model: Device for integrated circuit testing Granted publication date: 20121017 License type: Exclusive License Record date: 20121121 |
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LICC | Enforcement, change and cancellation of record of contracts on the licence for exploitation of a patent or utility model | ||
EE01 | Entry into force of recordation of patent licensing contract |
Assignee: Shenzhen Kaizhi Tong micro electronic te Co., Ltd. Assignor: Duan Chaoyi Contract record no.: 2012440020300 Denomination of utility model: Device for integrated circuit testing Granted publication date: 20121017 License type: Exclusive License Record date: 20121121 |
|
LICC | Enforcement, change and cancellation of record of contracts on the licence for exploitation of a patent or utility model | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20121017 Termination date: 20171212 |
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CF01 | Termination of patent right due to non-payment of annual fee |