CN202442978U - Long-distance material component analysis device - Google Patents
Long-distance material component analysis device Download PDFInfo
- Publication number
- CN202442978U CN202442978U CN2012200488079U CN201220048807U CN202442978U CN 202442978 U CN202442978 U CN 202442978U CN 2012200488079 U CN2012200488079 U CN 2012200488079U CN 201220048807 U CN201220048807 U CN 201220048807U CN 202442978 U CN202442978 U CN 202442978U
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- component analysis
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- 239000000463 material Substances 0.000 title claims abstract description 25
- 238000004458 analytical method Methods 0.000 title abstract description 11
- 239000004065 semiconductor Substances 0.000 claims abstract description 16
- 239000000203 mixture Substances 0.000 claims description 13
- 239000007788 liquid Substances 0.000 abstract description 6
- 230000009931 harmful effect Effects 0.000 abstract description 5
- 239000000126 substance Substances 0.000 abstract description 3
- 238000001228 spectrum Methods 0.000 abstract 1
- 231100000331 toxic Toxicity 0.000 abstract 1
- 230000002588 toxic effect Effects 0.000 abstract 1
- 239000000523 sample Substances 0.000 description 13
- 239000000843 powder Substances 0.000 description 5
- 231100000614 poison Toxicity 0.000 description 4
- 230000007096 poisonous effect Effects 0.000 description 4
- JEIPFZHSYJVQDO-UHFFFAOYSA-N ferric oxide Chemical compound O=[Fe]O[Fe]=O JEIPFZHSYJVQDO-UHFFFAOYSA-N 0.000 description 3
- 238000000441 X-ray spectroscopy Methods 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 239000011324 bead Substances 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000004566 building material Substances 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000005272 metallurgy Methods 0.000 description 1
- 230000001915 proofreading effect Effects 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000004611 spectroscopical analysis Methods 0.000 description 1
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- Analysing Materials By The Use Of Radiation (AREA)
- Measurement Of Radiation (AREA)
Abstract
The utility model relates to a long-distance material component analysis device. The device comprises an industrial X-ray transmitter (1), a semiconductor detector (2), an amplifier (3), a multi-channel pulse analyzer (4) and a computer (5), wherein the industrial X-ray transmitter is used for transmitting X rays to a test sample which is tested, and the secondary X rays which are reflected by the test sample which is tested are received by the semiconductor detector (2), so that a series of pulses having amplitude which is in direct proportion with photon energy are obtained, and a distribution curve of counting rate along with the changes in the photon energy, namely an X light energy spectrum, is obtained, further corrected by a computer and then displayed. Therefore, long-distance material component analysis can be performed the test sample which is tested. The long-distance material component analysis can be realized through the device, and material components can be accurately analyzed against a member which is arranged in a small equipment space and incapable of realizing near-distance contact; and simultaneously, the device can accurately judge the components of a plurality of toxic and harmful power, liquid and other substances, which are incapable of realizing the near-distance contact. The device disclosed by the utility model is suitable for long-distance material component analysis.
Description
Technical field
The utility model relates to a kind of remote material composition analytical equipment, belongs to the material analysis equipment technical field.
Background technology
When X-ray tube produces incident X-rays (primary X-ray), excite sample, each element in the sample that is stimulated can radiate secondary x rays, and the different secondary x rays that element radiated has specific energy response.Detection system is measured the energy and the quantity of these secondary x rays that radiate out.Then, the instrument software information translation that detection system is collected becomes the kind and the content of various elements in the sample.In recent years; The X fluorescent spectroscopy is constantly expanded in the every profession and trade range of application; A kind of every field such as metallurgy, geology, coloured, building materials, commodity inspection, environmental protection, health that are widely used in have been become; All available its of most of analytical elements analyzed, and can analyze samples such as solid, powder, bead, liquid, and has the advantages that analysis speed is fast, measurement range is wide, interference is little.
Now the most of spectrometric instrument on the market can only be analyzed material closely; Material substance such as powder, liquid to member that can not close contact in the equipment small space and some poisonous and harmfuls can not close contacts can not be confirmed accurately and effectively; Main cause is the characteristic X-ray that inspires material element; During operate as normal, about 0.2% of X-ray tube institute consumed power changes X-radiation into, and all the other all become heat energy; The big more X ray of distance decay more severe makes secondary x rays energy shortage that semiconductor detector receives to analyze.This device utilizes the industrial X-ray transmitter to continue strong X ray by emitted energy, through detector, amplifier, multichannel analyzer, Computer Analysis, realizes that remote material composition detects.
Summary of the invention
The purpose of the utility model is; Can only analyze material closely according to existing spectrometric instrument; And the problem that can not confirm accurately and effectively the material substance such as powder, liquid that member that can not close contact in the equipment small space and some poisonous and harmfuls can not close contacts; The utility model discloses a kind of remote material composition analyzer, can accurately analyze its material composition to member that can not close contact in the equipment small space; Simultaneously, to some poisonous and harmfuls can not close contact material such as powder, liquid also can make accurate judgement to its composition.
The technical scheme of the utility model is that the utility model device is made up of industrial X-ray transmitter 1, semiconductor detector 2, amplifier 3, multichannel analyzer 4, computing machine 5; Semiconductor detector 2 connects multichannel analyzer 4 through amplifier 3; Multichannel analyzer 4 connects computing machine 5; Industrial X-ray transmitter emission X ray is to seized sample, and the secondary x rays of seized sample reflection is received by semiconductor detector 2.
Industrial X-ray transmitter 1 is used to launch X ray, because its energy is big, the X ray of its emission can excite element generation secondary x rays in the sample to be detected, and each element is different with pulse to the energy of the secondary x rays of X ray reflection formation; Semiconductor detector is used to receive secondary x rays; Amplifier is used for that semiconductor detector is received the signal that obtains and amplifies; Multichannel analyzer is added up umber of pulse by the size of pulse amplitude and is obtained distribution curve-ability spectrogram that counting rate changes with photon energy amplified pulse signal; Computing machine is used for proofreading and correct by spectrogram.
Because the industrial X-ray transmitter has enough big energy; The industrial X-ray transmitter excites element generation secondary x rays in the sample to be detected behind seized sample emissions X ray, semiconductor detector receives secondary x rays; Obtain the pulse that a series of amplitudes are directly proportional with photon energy; After amplifier amplifies, deliver to multichannel analyzer, add up umber of pulse respectively by the size of pulse amplitude, pulse height can be used the energy scale of X-ray; Thereby obtain the distribution curve that counting rate changes with photon energy, i.e. x-ray spectroscopy figure.Can proofread and correct through computing machine by spectrogram, show then.Thereby realize at a distance seized sample material being carried out constituent analysis.
The beneficial effect of the utility model and prior art comparison is, can realize remote material composition analysis through this device, can be in the equipment small space and member that can not close contact is accurately analyzed its material composition; Simultaneously, to some poisonous and harmfuls can not close contact material such as powder, liquid also can make accurate judgement to its composition.
The utility model is applicable to remote material composition analysis.
Description of drawings
Fig. 1 is the utility model structural arrangement synoptic diagram; Among the figure, the 1st, the industrial X-ray source; The 2nd, semiconductor detector; The 3rd, amplifier; The 4th, multichannel analyzer; The 5th, computing machine; The 6th, seized sample.
Embodiment
The embodiment of the utility model is as shown in Figure 1.
The remote material composition analytical equipment of present embodiment is made up of industrial X-ray transmitter 1, semiconductor detector 2, amplifier 3, multichannel analyzer 4, computing machine 5.
The industrial X-ray transmitter emission X ray of the remote material composition analytical equipment of present embodiment is to seized sample, and the secondary x rays of seized sample reflection is received by semiconductor detector 2.
The industrial X-ray transmitter produces enough big energy, excites element generation secondary x rays in the sample to be detected, through semiconductor detector; Obtain the pulse that a series of amplitudes are directly proportional with photon energy; After amplifier amplifies, deliver to multichannel analyzer, add up umber of pulse respectively by the size of pulse amplitude, pulse height is with the energy scale of X-ray; Thereby obtain the distribution curve that counting rate changes with photon energy, i.e. x-ray spectroscopy figure.Can proofread and correct through computing machine by spectrogram, show then.
Claims (1)
1. a remote material composition analytical equipment is characterized in that, said device is by being made up of industrial X-ray transmitter (1), semiconductor detector (2), amplifier (3), multichannel analyzer (4), computing machine (5); Semiconductor detector (2) connects multichannel analyzer (4) through amplifier (3); Multichannel analyzer (4) connects computing machine (5); Industrial X-ray transmitter emission X ray is to seized sample, and the secondary x rays of seized sample reflection is received by semiconductor detector (2).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2012200488079U CN202442978U (en) | 2012-02-16 | 2012-02-16 | Long-distance material component analysis device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2012200488079U CN202442978U (en) | 2012-02-16 | 2012-02-16 | Long-distance material component analysis device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN202442978U true CN202442978U (en) | 2012-09-19 |
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ID=46824422
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2012200488079U Expired - Fee Related CN202442978U (en) | 2012-02-16 | 2012-02-16 | Long-distance material component analysis device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN202442978U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2014047995A1 (en) * | 2012-09-29 | 2014-04-03 | 深圳市华星光电技术有限公司 | Image capturing device and detection device |
-
2012
- 2012-02-16 CN CN2012200488079U patent/CN202442978U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2014047995A1 (en) * | 2012-09-29 | 2014-04-03 | 深圳市华星光电技术有限公司 | Image capturing device and detection device |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| ASS | Succession or assignment of patent right |
Owner name: STATE GRID CORPORATION OF CHINA Effective date: 20121205 |
|
| C41 | Transfer of patent application or patent right or utility model | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20121205 Address after: 330009 No. 88 min Qiang Road, private science and Technology Park, Jiangxi, Nanchang Patentee after: Jiangxi Electric Power Science Academy Patentee after: State Grid Corporation of China Address before: 330009 No. 88 min Qiang Road, private science and Technology Park, Jiangxi, Nanchang Patentee before: Jiangxi Electric Power Science Academy |
|
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20120919 Termination date: 20180216 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |