CN202393415U - 小物件测试仪 - Google Patents
小物件测试仪 Download PDFInfo
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- CN202393415U CN202393415U CN 201120533695 CN201120533695U CN202393415U CN 202393415 U CN202393415 U CN 202393415U CN 201120533695 CN201120533695 CN 201120533695 CN 201120533695 U CN201120533695 U CN 201120533695U CN 202393415 U CN202393415 U CN 202393415U
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Application Number | Priority Date | Filing Date | Title |
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CN 201120533695 CN202393415U (zh) | 2011-12-19 | 2011-12-19 | 小物件测试仪 |
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CN 201120533695 CN202393415U (zh) | 2011-12-19 | 2011-12-19 | 小物件测试仪 |
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CN202393415U true CN202393415U (zh) | 2012-08-22 |
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CN 201120533695 Expired - Lifetime CN202393415U (zh) | 2011-12-19 | 2011-12-19 | 小物件测试仪 |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102445235A (zh) * | 2011-12-19 | 2012-05-09 | 深圳市华测检测技术股份有限公司 | 小物件测试仪 |
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2011
- 2011-12-19 CN CN 201120533695 patent/CN202393415U/zh not_active Expired - Lifetime
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102445235A (zh) * | 2011-12-19 | 2012-05-09 | 深圳市华测检测技术股份有限公司 | 小物件测试仪 |
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Legal Events
Date | Code | Title | Description |
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C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
CP01 | Change in the name or title of a patent holder | ||
CP01 | Change in the name or title of a patent holder |
Address after: 518057 Guangdong, Shenzhen Province, Baoan District District, Wei Wei Industrial Park, building C, 70 Patentee after: CENTRE TESTING INTERNATIONAL GROUP Co.,Ltd. Address before: 518057 Guangdong, Shenzhen Province, Baoan District District, Wei Wei Industrial Park, building C, 70 Patentee before: Centre Testing International (Shenzhen) Co.,Ltd. |
|
TR01 | Transfer of patent right | ||
TR01 | Transfer of patent right |
Effective date of registration: 20170629 Address after: 2 121 building, 450001 Indus street, hi tech Industrial Development Zone, Henan, Zhengzhou Patentee after: HENAN HUACE TESTING TECHNOLOGY CO.,LTD. Address before: 518057 Guangdong, Shenzhen Province, Baoan District District, Wei Wei Industrial Park, building C, 70 Patentee before: CENTRE TESTING INTERNATIONAL GROUP Co.,Ltd. |
|
CX01 | Expiry of patent term | ||
CX01 | Expiry of patent term |
Granted publication date: 20120822 |