CN202305670U - Multipath resistor rapid test system - Google Patents
Multipath resistor rapid test system Download PDFInfo
- Publication number
- CN202305670U CN202305670U CN2011203018403U CN201120301840U CN202305670U CN 202305670 U CN202305670 U CN 202305670U CN 2011203018403 U CN2011203018403 U CN 2011203018403U CN 201120301840 U CN201120301840 U CN 201120301840U CN 202305670 U CN202305670 U CN 202305670U
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- resistance
- multipath
- utility
- model
- resistor
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Abstract
The utility model provides a multipath resistor rapid test system, comprising a computer used for storing measured resistance values; a DC low resistance tester used for testing resistance values and transmitting the resistance values to the computer connected with the DC low resistance tester at the same time; and also a multipath resistor rapid test controller connected with the DC low resistance tester, used for controlling the circuit switching connected with the multipath resistors, and comprising a microcontroller, and a relay array and a measurement signal controller connected with the microcontroller. The multipath resistor rapid test system of the utility model is simple in structure, convenient in use, can measure as many as a hundred of circuits in dozens of seconds, can measure the multipath resistors well rapidly at low and high temperatures, and enables the purpose of improving the resistor production technology to be achieved.
Description
Technical field
The utility model relates to a kind of electric resistance measuring apparatus, particularly relates to a kind of system and device that multichannel resistance is tested fast.
Background technology
Under when measuring resistance, recording the value of measuring with notes usually; This method test speed is slow; Existing resistance test instrument can deposit the resistance value of measuring in computing machine automatically, has improved test speed like this, and is convenient to measured resistance value statistics and screening etc.
In existing resistive element test experiments, some need be when high temperature or low temperature measured resistance value, and the time ratio that high temperature and low temperature stop is shorter, has only a few minutes, and the sample that will test has a plurality ofly, is generally tens, even up to a hundred.Certainly can't measure in a short period of time with common method, so just can't be at the trial between in obtain resistance value, the experiment effect that also just can't obtain to expect can't improve the resistance production technology, improves the quality that resistance is produced.Therefore, the test of how in official hour, accomplishing multichannel resistance becomes this technical field problem demanding prompt solution.
The utility model content
Can't accomplish the problem that the multichannel resistance is measured fast at short notice for solving, the utility model provides following technical scheme:
A kind of multichannel resistance fast testing system comprises computing machine, is used to store the resistance value that records; The Estimate of Resistance for DC Low Resistance tester is used for measured resistance value, is transferred to simultaneously in the connected computing machine; This system also comprises the quick test controller of multichannel resistance; This controller is connected in the Estimate of Resistance for DC Low Resistance tester; Be used to control the circuit that is connected with multichannel resistance and switch relay array and measuring-signal controller that the quick test controller of this circuit comprises microcontroller and is connected in microcontroller.
As a kind of preferred version of the utility model, said microcontroller is used for the contact of transfer relay and is ready to signal for the measuring-signal controller circuitry.
As the another kind of preferred version of the utility model, said measuring-signal controller transtation mission circuit is ready to signal to Estimate of Resistance for DC Low Resistance tester.
As another preferred version of the utility model, said relay array is used to connect the batch resistance that needs are measured, and the resistance that needs are measured switches fast.
The utility model has following advantage: the utility model is simple in structure, and is easy to use, can accomplish the nearly measurement of hundred road resistance in tens seconds, can under high low temperature, realize the quick measurement of multichannel resistance well, to reach the purpose of improving the resistance production technology.
Description of drawings
Fig. 1 the utility model system architecture synoptic diagram.
Embodiment
Do to set forth in detail in the face of this process implementing example down, thereby the protection domain of the utility model is made more explicit defining so that advantage of the utility model and characteristic can be easier to it will be appreciated by those skilled in the art that.
Shown in Fig. 1 the utility model system architecture synoptic diagram, present embodiment multichannel resistance fast testing system comprises computing machine, is used to store the resistance value that records; The Estimate of Resistance for DC Low Resistance tester is used for measured resistance value, is transferred to simultaneously in the connected computing machine; Also comprise the quick test controller of multichannel resistance; This controller is connected in the Estimate of Resistance for DC Low Resistance tester; Be used to control the circuit that is connected with multichannel resistance and switch relay array and measuring-signal controller that the quick test controller of this circuit comprises microcontroller and is connected in microcontroller.
Wherein, microcontroller is used for the contact of transfer relay and is ready to signal for the measuring-signal controller circuitry.Measuring-signal controller transtation mission circuit is ready to signal to Estimate of Resistance for DC Low Resistance tester.Relay array is used to connect the batch resistance that needs are measured, and the resistance that needs are measured switches fast.
Multichannel resistance fast testing system can carry out the resistance measurement to 32 road resistance simultaneously in the present embodiment, and the deadline was less than 30 seconds.
The above; Be merely one of embodiment of the utility model; But the protection domain of the utility model is not limited thereto; Any those of ordinary skill in the art are in the technical scope that the utility model disclosed, and variation or the replacement that can expect without creative work all should be encompassed within the protection domain of the utility model.Therefore, the protection domain of the utility model should be as the criterion with the protection domain that claims were limited.
Claims (1)
1. a multichannel resistance fast testing system comprises computing machine, is used to store the resistance value that records; The Estimate of Resistance for DC Low Resistance tester is used for measured resistance value, is transferred to simultaneously in the connected computing machine; It is characterized in that: this system also comprises the quick test controller of multichannel resistance; This controller is connected in the Estimate of Resistance for DC Low Resistance tester; Be used to control the circuit that is connected with multichannel resistance and switch relay array and measuring-signal controller that the quick test controller of this circuit comprises microcontroller and is connected in microcontroller.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011203018403U CN202305670U (en) | 2011-08-18 | 2011-08-18 | Multipath resistor rapid test system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011203018403U CN202305670U (en) | 2011-08-18 | 2011-08-18 | Multipath resistor rapid test system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN202305670U true CN202305670U (en) | 2012-07-04 |
Family
ID=46374542
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2011203018403U Expired - Fee Related CN202305670U (en) | 2011-08-18 | 2011-08-18 | Multipath resistor rapid test system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN202305670U (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104897965A (en) * | 2015-06-10 | 2015-09-09 | 中国电力科学研究院 | Automatic test system for resistor |
| CN106824833A (en) * | 2017-02-28 | 2017-06-13 | 中国振华集团云科电子有限公司 | Resistor screening technology method |
| CN109061305A (en) * | 2018-08-27 | 2018-12-21 | 常州星宇车灯股份有限公司 | A kind of array electric resistance measuring apparatus |
| CN110082597A (en) * | 2019-04-11 | 2019-08-02 | 安徽信息工程学院 | A kind of single channel multichannel resistance test control system |
| CN111983491A (en) * | 2020-08-12 | 2020-11-24 | 安徽信息工程学院 | Multi-path resistance testing system and method for battery module |
| CN117214536A (en) * | 2023-09-06 | 2023-12-12 | 河南工业大学 | Testing device and testing method for multipath parallel impedance suitable for high temperature condition |
-
2011
- 2011-08-18 CN CN2011203018403U patent/CN202305670U/en not_active Expired - Fee Related
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104897965A (en) * | 2015-06-10 | 2015-09-09 | 中国电力科学研究院 | Automatic test system for resistor |
| CN106824833A (en) * | 2017-02-28 | 2017-06-13 | 中国振华集团云科电子有限公司 | Resistor screening technology method |
| CN109061305A (en) * | 2018-08-27 | 2018-12-21 | 常州星宇车灯股份有限公司 | A kind of array electric resistance measuring apparatus |
| CN110082597A (en) * | 2019-04-11 | 2019-08-02 | 安徽信息工程学院 | A kind of single channel multichannel resistance test control system |
| CN111983491A (en) * | 2020-08-12 | 2020-11-24 | 安徽信息工程学院 | Multi-path resistance testing system and method for battery module |
| CN117214536A (en) * | 2023-09-06 | 2023-12-12 | 河南工业大学 | Testing device and testing method for multipath parallel impedance suitable for high temperature condition |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| DD01 | Delivery of document by public notice |
Addressee: Shanghai Failure Analysis Laboratory Co., Ltd. Document name: Notification of Termination of Patent Right |
|
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20120704 Termination date: 20130818 |