CN202256398U - Test fixture for crystal resonator - Google Patents
Test fixture for crystal resonator Download PDFInfo
- Publication number
- CN202256398U CN202256398U CN2011203630796U CN201120363079U CN202256398U CN 202256398 U CN202256398 U CN 202256398U CN 2011203630796 U CN2011203630796 U CN 2011203630796U CN 201120363079 U CN201120363079 U CN 201120363079U CN 202256398 U CN202256398 U CN 202256398U
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- test
- crystal resonator
- pcb board
- test fixture
- board
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Abstract
The utility model relates to a test fixture for a crystal resonator, which comprises a PCB (Printed Circuit Board) board, a cover board, an upper cover and a shielding box, wherein a through hole for welding a test probe is arranged on the PCB board, and two ports of a transmission microstrip line on the PCB board are respectively welded with SMA joints of a tester. Two grooves for placing tested devices are arranged on the cover board, namely a first groove and a second groove. A shielding chamber is arranged in the shielding box, and the middle is provided with a metal ridge for shielding signal leak between input and output of the crystal resonator. The PCB board is fixed on the shielding box, and the cover board is fixed on the PCB board. The upper cover and the cover board are connected through a connecting shaft and are fixed through screws. The test fixture can test a plurality of parameters of the crystal resonator, and the operation is simple and convenient. Therefore, the test fixture overcomes the defects of the traditional test fixture for the crystal resonator that the tested parameters are simplex and the test uncertainty is large and the like. The test fixture can be used for testing various co-packaged crystal resonators.
Description
Technical field
The utility model relates to two-port chip testing anchor clamps, relates in particular to a kind of crystal resonator test fixture, is directed against the test of surface acoustic wave (SAW) resonator especially.
Background technology
Common two-port chip testing anchor clamps are sandwiched in range upon range of formation in the metallic shield box for adopting pcb board, and the probe of corresponding chip bonding pad is arranged in the anchor clamps.Test places resonator on the probe during crystal resonator, adopts certain measure to make it fixing and contacts with test probe, has avoided when directly testing with pcb board need crystal to be measured being repeated the problem of welding and taking off.But this anchor clamps are often tested the two-port simple parameter of resonator only, and the resonator placement need be artificial fixing, possibly cause testing uncertain increase.
Summary of the invention
The purpose of the utility model is to overcome the uncertain defective such as big of the single and test of conventional crystal resonator test fixture test parameter, designs a kind of crystal resonator test fixture especially.
The utility model for realizing the technical scheme that above-mentioned purpose is taked is: a kind of crystal resonator test fixture; It is characterized in that comprise pcb board, cover plate, loam cake and shielding box, said pcb board is provided with the via hole that is used to weld test probe; Two ports of transmission microstrip line on the pcb board weld the sub-miniature A connector that is used to connect testing tool respectively; Cover plate is provided with two grooves that are used to place measured device, is respectively first groove and second groove, is provided with shielding cavity in the shielding box; The centre is provided with the metal ridge that is used to shield leakage signal between crystal resonator input and the output together; Pcb board is fixed on the shielding box, and cover plate is fixed on the pcb board, and loam cake is connected through coupling shaft with cover plate and by screw retention.
The beneficial effect that the utility model produced is: adopt this test fixture can test a plurality of parameters of crystal resonator, and also simple to operate.Thereby overcome the uncertain defective such as big of the single and test of conventional crystal resonator test fixture test parameter.This test fixture can be used for the test of the various crystal resonators of same package dimension.
Description of drawings
Fig. 1 is a crystal resonator test fixture perspective view.
Fig. 2 is a crystal resonator test fixture assembling exploded view.
Embodiment
Below in conjunction with accompanying drawing the utility model is described further.See figures.1.and.2; The crystal resonator test fixture comprises pcb board 1, cover plate 5, loam cake 6 and shielding box 8; Pcb board 1 is provided with the via hole that is used to weld test probe 9, and two ports of the transmission microstrip line on the pcb board 1 weld the sub-miniature A connector 2 that is used to connect testing tool respectively, and cover plate 5 is provided with two grooves that are used to place measured device; Be respectively first groove 3 and second groove 4; Be provided with shielding cavity 11 in the shielding box 8, the centre is provided with the metal ridge 12 that is used to shield leakage signal between crystal resonator input and the output together, and pcb board 1 is screwed on shielding box 8; Cover plate 5 is screwed on pcb board 1, and loam cake 6 is connected through coupling shaft 7 with cover plate 5 and is fixing by screw 10.
Be provided with the position (first groove 3 and second groove 4) of two placement components and parts in the above-mentioned test fixture, one is used for placing test and use crystal resonator, and one is used for placing and tests required other capacitance resistance ware of resonator parameter etc.This other test that is designed to outside the crystal resonator two-port measuring transmission loss provides convenience.The tester can select different test blocks as required, draws the parameter that needs.After test was put into test position with various devices, loam cake 6 was depressed and is fixed.
Whole test pcb board places between cover plate 5 and the metallic shield box 8, is convenient to protect measurement circuit.Cover plate 5 is a moulding with loam cake 6; First groove 3 that cover plate 5 is provided with and second groove 4 can be protected the test probe 9 that is welded on the pcb board on the one hand, on the other hand can be with crystal resonator to be tested and test suite location; After putting into tested crystal resonator and test suite; Loam cake 6 is turned down, and two projections that loam cake 6 is provided with are pushed down test block, prevent that contact is bad between crystal resonator and the test probe.Cover plate 5 directly is connected handled easily with loam cake 6 with coupling shaft 7.Shielding box 8 adopts metal material, in metallic shield box 8, is provided with shielding cavity 11, and the centre is provided with metal ridge 12 one, has shielded the leakage signal between crystal input and the output effectively.Whole test fixture is fixing with screw 10.
In test process, whole test fixture is equivalent to a black box, and the corresponding recesses that the tester only needs device under test to be put into cover plate 5 gets final product, and pcb board and other circuit can not seen outside, have protected relevant design effectively.
Claims (1)
1. crystal resonator test fixture; It is characterized in that comprise pcb board (1), cover plate (5), loam cake (6) and shielding box (8), said pcb board (1) is provided with the via hole that is used to weld test probe (9); Two ports of transmission microstrip line on the pcb board (1) weld the sub-miniature A connector (2) that is used to connect testing tool respectively; Cover plate (5) is provided with two grooves that are used to place measured device, is respectively first groove (3) and second groove (4), is provided with shielding cavity (11) in the shielding box (8); The centre is provided with the metal ridge (12) that is used to shield leakage signal between crystal resonator input and the output together; Pcb board (1) is fixed on the shielding box (8), and cover plate (5) is fixed on the pcb board (1), and loam cake (6) is connected through coupling shaft (7) with cover plate (5) and is fixing by screw (10).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011203630796U CN202256398U (en) | 2011-09-26 | 2011-09-26 | Test fixture for crystal resonator |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011203630796U CN202256398U (en) | 2011-09-26 | 2011-09-26 | Test fixture for crystal resonator |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN202256398U true CN202256398U (en) | 2012-05-30 |
Family
ID=46117617
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2011203630796U Expired - Lifetime CN202256398U (en) | 2011-09-26 | 2011-09-26 | Test fixture for crystal resonator |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN202256398U (en) |
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103674485A (en) * | 2013-12-25 | 2014-03-26 | 中国电子科技集团公司第四十一研究所 | Photoelectric detector parameter testing fixture and testing method |
| CN105093035A (en) * | 2015-09-06 | 2015-11-25 | 歌尔声学股份有限公司 | Antenna test device |
| CN107367648A (en) * | 2017-06-23 | 2017-11-21 | 中国电子科技集团公司第十三研究所 | Microwave monolithic circuit immunity to interference test fixture |
| CN109490586A (en) * | 2018-11-01 | 2019-03-19 | 北京无线电计量测试研究所 | A kind of π network fixture and test method for quartz crystal parameter test system |
| CN109490663A (en) * | 2018-10-26 | 2019-03-19 | 北京无线电计量测试研究所 | A kind of crystal resonator test macro and calibration method |
| CN109507455A (en) * | 2018-11-23 | 2019-03-22 | 四川九洲空管科技有限责任公司 | A kind of new component test fixture |
| CN113589087A (en) * | 2021-08-25 | 2021-11-02 | 深圳市恒宝通光电子股份有限公司 | Three temperature test fixture of CFP2 encapsulation optical module |
| WO2022000591A1 (en) * | 2020-06-30 | 2022-01-06 | 瑞声声学科技(深圳)有限公司 | Test tool for dielectric waveguide filter |
| WO2024031978A1 (en) * | 2022-08-12 | 2024-02-15 | 中兴通讯股份有限公司 | Test clamp and test apparatus |
-
2011
- 2011-09-26 CN CN2011203630796U patent/CN202256398U/en not_active Expired - Lifetime
Cited By (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103674485A (en) * | 2013-12-25 | 2014-03-26 | 中国电子科技集团公司第四十一研究所 | Photoelectric detector parameter testing fixture and testing method |
| CN103674485B (en) * | 2013-12-25 | 2015-12-02 | 中国电子科技集团公司第四十一研究所 | Photodetector parameter testing jig and method of testing |
| CN105093035A (en) * | 2015-09-06 | 2015-11-25 | 歌尔声学股份有限公司 | Antenna test device |
| CN107367648A (en) * | 2017-06-23 | 2017-11-21 | 中国电子科技集团公司第十三研究所 | Microwave monolithic circuit immunity to interference test fixture |
| CN107367648B (en) * | 2017-06-23 | 2023-07-04 | 中国电子科技集团公司第十三研究所 | Microwave monolithic circuit immunity test fixture |
| CN109490663A (en) * | 2018-10-26 | 2019-03-19 | 北京无线电计量测试研究所 | A kind of crystal resonator test macro and calibration method |
| CN109490663B (en) * | 2018-10-26 | 2021-03-19 | 北京无线电计量测试研究所 | Crystal resonator test system and calibration method |
| CN109490586A (en) * | 2018-11-01 | 2019-03-19 | 北京无线电计量测试研究所 | A kind of π network fixture and test method for quartz crystal parameter test system |
| CN109507455A (en) * | 2018-11-23 | 2019-03-22 | 四川九洲空管科技有限责任公司 | A kind of new component test fixture |
| WO2022000591A1 (en) * | 2020-06-30 | 2022-01-06 | 瑞声声学科技(深圳)有限公司 | Test tool for dielectric waveguide filter |
| CN113589087A (en) * | 2021-08-25 | 2021-11-02 | 深圳市恒宝通光电子股份有限公司 | Three temperature test fixture of CFP2 encapsulation optical module |
| WO2024031978A1 (en) * | 2022-08-12 | 2024-02-15 | 中兴通讯股份有限公司 | Test clamp and test apparatus |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C56 | Change in the name or address of the patentee | ||
| CP01 | Change in the name or title of a patent holder |
Address after: 100084 Haidian District, Tsinghua Road, Tsinghua Science and Technology Park, Beijing science and technology building, building C, block 28 Patentee after: Beijing Hualongtong Technology Co., Ltd. Patentee after: Tianjin 712 Communications Broadcasting Limited by Share Ltd Address before: 100084 Haidian District, Tsinghua Road, Tsinghua Science and Technology Park, Beijing science and technology building, building C, block 28 Patentee before: Beijing Hualongtong Technology Co., Ltd. Patentee before: Tianjin 712 Communication Broadcast Co., Ltd. |
|
| CX01 | Expiry of patent term |
Granted publication date: 20120530 |
|
| CX01 | Expiry of patent term |