CN202066911U - Rapid and portable resistivity testing apparatus of semiconductor raw materials - Google Patents
Rapid and portable resistivity testing apparatus of semiconductor raw materials Download PDFInfo
- Publication number
- CN202066911U CN202066911U CN2011201641071U CN201120164107U CN202066911U CN 202066911 U CN202066911 U CN 202066911U CN 2011201641071 U CN2011201641071 U CN 2011201641071U CN 201120164107 U CN201120164107 U CN 201120164107U CN 202066911 U CN202066911 U CN 202066911U
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- China
- Prior art keywords
- circuit
- source material
- semiconductor source
- raw materials
- testing apparatus
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Abstract
The utility model provides a rapid and portable resistivity testing apparatus of semiconductor raw materials, wherein the testing apparatus is of a pen type, the testing apparatus comprises a pen casing and a testing circuit, the testing circuit is arranged in the pen casing, the testing circuit comprises a bleeder circuit, a comparison amplification circuit, and an indication circuit, a power supply terminal is connected with the calibration terminal of the comparison amplification circuit via the bleeder circuit, a contact terminal electrically contacted with to-be-detected semiconductor raw materials is connected with the testing terminal of the comparison amplification circuit, the contact terminal is exposed out of the pen casing, and the output terminal of the comparison amplification circuit is connected with the indication circuit. The rapid and portable resistivity testing apparatus of the semiconductor raw materials reduces cost, has good expandability, and is convenient in usage.
Description
Technical field
The utility model belongs to a kind of resistivity measurement instrument.
Background technology
The semiconductor source material resistivity measurement instrument device of Cun Zaiing adopts control chip to realize usually in the market, and its measuring accuracy is very high.For the not high occasion of some accuracy requirement, for example semiconductor source material screening, but the defective of its existence is: cost costliness, extensibility are not strong, and desktop instrument form basically, and portability is strong inadequately.
Summary of the invention
Strong for the cost costliness, the extensibility that overcome existing semiconductor source material resistivity measurement instrument device, use inconvenient deficiency, the utility model to provide a kind of and reduce cost, have excellent extensibility, the quick portable testing set of semiconductor source material resistivity easy to use.
The technical scheme that its technical matters that solves the utility model adopts is:
The quick portable testing set of a kind of semiconductor source material resistivity, described testing tool is the form of a stroke or a combination of strokes, described testing tool comprises a shell and test circuit, described test circuit is positioned at described shell, described test circuit comprises bleeder circuit, compare amplifying circuit and indicating circuit, power end is connected with the described relatively demarcation end of amplifying circuit by bleeder circuit, be connected with the described relatively test lead of amplifying circuit with the contact jaw that semiconductor source material to be detected electrically contacts, described contact jaw is exposed at outward outside described the shell, and the described relatively output terminal of amplifying circuit is connected with described indicating circuit.
Further, described indicating circuit is first current-limiting resistance and light emitting diode.
Described indicating circuit is current-limiting resistance and hummer.
Described test circuit also comprises reduction voltage circuit, and the input end of described reduction voltage circuit is connected with power light with second current-limiting circuit.
The beneficial effects of the utility model mainly show: reduce cost, have excellent extensibility, easy to use.
Description of drawings
Fig. 1 is the outside synoptic diagram of the quick portable testing set of semiconductor source material resistivity;
Fig. 2 is the circuit diagram of the quick portable testing set of semiconductor source material resistivity.
Embodiment
Below in conjunction with accompanying drawing the utility model is further described.
See figures.1.and.2, the quick portable testing set of a kind of semiconductor source material resistivity, described testing tool is the form of a stroke or a combination of strokes, described testing tool comprises a shell 1 and test circuit, described test circuit is positioned at described shell 1, described test circuit comprises bleeder circuit, compare amplifying circuit and indicating circuit, power end is connected with the described relatively demarcation end of amplifying circuit by bleeder circuit, be connected with the described relatively test lead of amplifying circuit with the contact jaw 2 that semiconductor source material to be detected electrically contacts, described contact jaw 2 outer being exposed at outside described the shell 1, the described relatively output terminal of amplifying circuit is connected with described indicating circuit.
Further, described indicating circuit is first current-limiting resistance and light emitting diode.
Described indicating circuit is current-limiting resistance and hummer.
Described test circuit also comprises reduction voltage circuit, and the input end of described reduction voltage circuit is connected with power light with second current-limiting circuit.
Use microelectric technique, with semiconductor source material resistivity measurement instrument, microminiaturized, facilitation.
Described contact jaw 2 is a probe, promptly use probe method,, utilize the resistance collocation of divider resistance with comparator circuit actual measurement examination semiconductor resistor rate, respectively different resistivity is demarcated, whether what adopt LED light and hummer prompting user institute test sample product is qualified demarcation resistivity.The design of employing pen type is convenient for carrying.
If the voltage ratio of test lead is demarcated the height of end, represent that then semiconductor source material resistivity is too high, undesirable, the comparer output HIGH voltage, light emitting diode is for brightening and hummer sounds the alarm; Otherwise, the comparer output LOW voltage, indicating circuit is not worked.
When power supply had electricity, the light emitting diode of power supply indication usefulness can brighten, and alert normally use test instrument is carried out test job.
Claims (4)
1. quick portable testing set of semiconductor source material resistivity, it is characterized in that: described testing tool is the form of a stroke or a combination of strokes, described testing tool comprises a shell and test circuit, described test circuit is positioned at described shell, described test circuit comprises bleeder circuit, compare amplifying circuit and indicating circuit, power end is connected with the described relatively demarcation end of amplifying circuit by bleeder circuit, be connected with the described relatively test lead of amplifying circuit with the contact jaw that semiconductor source material to be detected electrically contacts, described contact jaw is exposed at outward outside described the shell, and the described relatively output terminal of amplifying circuit is connected with described indicating circuit.
2. the quick portable testing set of semiconductor source material resistivity as claimed in claim 1 is characterized in that: described indicating circuit is first current-limiting resistance and light emitting diode.
3. the quick portable testing set of semiconductor source material resistivity as claimed in claim 1 is characterized in that: described indicating circuit is current-limiting resistance and hummer.
4. as the quick portable testing set of the described semiconductor source material resistivity of one of claim 1～3, it is characterized in that: described test circuit also comprises reduction voltage circuit, and the input end of described reduction voltage circuit is connected with power light with second current-limiting circuit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011201641071U CN202066911U (en) | 2011-05-24 | 2011-05-24 | Rapid and portable resistivity testing apparatus of semiconductor raw materials |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011201641071U CN202066911U (en) | 2011-05-24 | 2011-05-24 | Rapid and portable resistivity testing apparatus of semiconductor raw materials |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN202066911U true CN202066911U (en) | 2011-12-07 |
Family
ID=45060771
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2011201641071U Expired - Fee Related CN202066911U (en) | 2011-05-24 | 2011-05-24 | Rapid and portable resistivity testing apparatus of semiconductor raw materials |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN202066911U (en) |
-
2011
- 2011-05-24 CN CN2011201641071U patent/CN202066911U/en not_active Expired - Fee Related
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20111207 Termination date: 20120524 |