CN202003002U

CN202003002U - Intelligent digital inter-turn voltage endurance integrated test system

Info

Publication number: CN202003002U
Application number: CN2010206384981U
Authority: CN
Inventors: 韩庆江; 陈胡明
Original assignee: QINGDAO AIPU INTELLIGENT INSTRUMENT CO Ltd
Current assignee: QINGDAO AIPU INTELLIGENT INSTRUMENT CO Ltd
Priority date: 2010-12-02
Filing date: 2010-12-02
Publication date: 2011-10-05
Anticipated expiration: 2020-12-02

Abstract

The present utility model discloses an intelligent digital inter-turn voltage endurance integrated test system. The system comprises an ARM mainboard, a high speed sampling module, a current sampling module, a high speed switching module, an amplification boost module and an input/output module. The amplification boost module comprises a D/A converting circuit, a power amplifier circuit and a booster. One end of the current sampling module is connected with the ARM mainboard, the other end of the current sampling module is connected with the booster, one end of the high speed sampling module is connected with the ARM mainboard, the other end of the high speed sampling module is connected with a test coil, one end of the high voltage switching module is connected with the ARM mainboard, and the other end of the high voltage switching module is connected with a pulse coil in series and then connected with the booster. The system has the following advantages, (1) compared with the prior simulation tester, the test outcome of the system is high in precision, reliability and efficiency; (2) the system has improved functions by not only realizing a test of an AC voltage endurance function, but also realizing a test of inter-turn pulse voltage.

Description

The withstand voltage integrated test system of a kind of intelligent digital turn-to-turn

Technical field

The utility model relates to a kind of insulativity tester of electric product, the withstand voltage integrated test system of particularly a kind of intelligent digital turn-to-turn, be mainly used between electric product coil sections circle such as motor, electric tool, transformer and the circle and layer with layer between the test of insulating property.

Background technology

At present, existing Hi-pot Tester mainly is an analogue instrument, and this analogue instrument when in use, need measure specification product and product to be checked simultaneously, and need artificial naked eyes to differentiate, thus poor reliability, inefficiency, simultaneously, this analogue instrument function singleness, or can only realize the ac voltage withstanding test, or can only the turn-to-turn pulse voltage test, use, very inconvenience.

Summary of the invention

Problem to be solved in the utility model is: a kind of withstand voltage integrated test system of intelligent digital turn-to-turn that had not only had the ac voltage withstanding test function but also had turn-to-turn pulse voltage test function is provided.

In order to solve the problems of the technologies described above, the withstand voltage integrated test system of intelligent digital turn-to-turn of the present utility model, comprise ARM mainboard, high-speed sampling module, current sample module, high speed handover module, amplify boost module and input/output module, described amplification boost module comprises D/A change-over circuit, power amplifier and stepup transformer; Described current sample module one end links to each other with the ARM mainboard, and the other end links to each other with stepup transformer, and described high-speed sampling module one end links to each other with the ARM mainboard, and the other end links to each other with test coil; Described high pressure handover module one end links to each other with the ARM mainboard, links to each other with stepup transformer after the series connection of an other end and pulsed coil again.

For the ease of the input and output of tester data, the withstand voltage integrated test system of intelligent digital turn-to-turn of the present utility model, described input/output module comprises button, communication module, Serial E EP and LCD.

In order to improve the precision of sampled data, the withstand voltage comprehensive tester of intelligent number of the present utility model is in series with a ghyristor circuit and a RC circuit between described high-speed sampling module and the test coil.

In order to improve the precision of output voltage, the withstand voltage integrated test system of intelligent digital turn-to-turn of the present utility model, described ARM mainboard and amplify the amplifier that is parallel with a feedback usefulness between the boost module.

The beneficial effect that the utility model is obtained is: (1) is compared with existing simulation test instrument, test result precision height, reliability height, efficient height; (2) test of ac voltage withstanding function can be realized, the test of turn-to-turn pulse voltage can be realized again, thereby more perfect functions.

Description of drawings

Fig. 1 is a structured flowchart of the present utility model.

Among the figure: 1, button, 2, the ARM mainboard, 3, amplifier, 4, the D/A change-over circuit, 5, power amplifier,

6, amplify boost module, 7, stepup transformer, 8, ghyristor circuit, 9, test coil, 10, pulsed coil,

11, RC circuit, 12, the current sample module, 13, the high pressure handover module, 14, the high-speed sampling module,

15, communication module, 16, Serial E EP, 17, LCDs, 18, input/output module.

Embodiment

As shown in Figure 1, the withstand voltage integrated test system of intelligent digital turn-to-turn of the present utility model, comprise ARM mainboard 2, high-speed sampling module 14, current sample module 12, high speed handover module 13, amplify boost module 6 and input/output module 18, described amplification boost module 6 comprises D/A change-over circuit 4, power amplifier 5 and stepup transformer 7; Described current sample module 12 1 ends link to each other with ARM mainboard 2, and the other end links to each other with stepup transformer 7, and described high-speed sampling module 14 1 ends link to each other with ARM mainboard 2, and the other end links to each other with test coil 9; Described high pressure handover module 13 1 ends link to each other with ARM mainboard 2, link to each other with stepup transformer 7 after 10 series connection of an other end and pulsed coil again; Described input/output module 18 comprises button 1, communication module 15, Serial E EP 16 and LCD 17; Be in series with a ghyristor circuit 8 and a RC circuit 11 between described high-speed sampling module 14 and the test coil 9; Be parallel with the amplifier 3 of a feedback usefulness between described ARM mainboard 2 and the amplification boost module 6.

In the time of concrete the use, if need carry out the ac voltage withstanding test, then by the switch opens of high speed handover module 13 with pulsed coil 10, produce voltage this moment is the 5000V high pressure, can carry out the ac voltage withstanding test; If need carry out the test of turn-to-turn pulse voltage, then pass through high speed handover module 13 with pulsed coil 10 closures, then produce the high voltage pulse of 5000V, can carry out the test of turn-to-turn pulse voltage, very convenient.

In addition, the withstand voltage integrated test system of intelligent digital turn-to-turn of the present utility model, the signal of its input and output is digital signal, than existing simulating signal, its measuring accuracy height, good reliability, high efficiency.

Claims

1. withstand voltage integrated test system of intelligent digital turn-to-turn, it is characterized in that: comprise ARM mainboard (2), high-speed sampling module (14), current sample module (12), high speed handover module (13), amplify boost module (6) and input/output module (18), described amplification boost module (6) comprises D/A change-over circuit (4), power amplifier (5) and stepup transformer (7); Described current sample module (12) one ends link to each other with ARM mainboard (2), and the other end links to each other with stepup transformer (7), and described high-speed sampling module (14) one ends link to each other with ARM mainboard (2), and the other end links to each other with test coil (9); Described high pressure handover module (13) one ends link to each other with ARM mainboard (2), link to each other with stepup transformer (7) after the series connection of an other end and pulsed coil (10) again.

2. the withstand voltage integrated test system of intelligent digital turn-to-turn according to claim 1 is characterized in that: described input/output module (18) comprises button (1), communication module (15), Serial E EP (16) and LCD (17).

3. the withstand voltage integrated test system of intelligent digital turn-to-turn according to claim 1 is characterized in that: be in series with a ghyristor circuit (8) and a RC circuit (11) between described high-speed sampling module (14) and the test coil (9).

4. the withstand voltage integrated test system of intelligent digital turn-to-turn according to claim 1 is characterized in that: the amplifier (3) that is parallel with a feedback usefulness between described ARM mainboard (2) and the amplification boost module (6).