CN201927496U - Aging test fixture for inner core of capacitor - Google Patents
Aging test fixture for inner core of capacitor Download PDFInfo
- Publication number
- CN201927496U CN201927496U CN 201020693190 CN201020693190U CN201927496U CN 201927496 U CN201927496 U CN 201927496U CN 201020693190 CN201020693190 CN 201020693190 CN 201020693190 U CN201020693190 U CN 201020693190U CN 201927496 U CN201927496 U CN 201927496U
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- inner core
- capacitor
- capacitor inner
- bottom electrode
- ageing test
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Abstract
The utility model discloses an aging test fixture for an inner core of a capacitor, wherein a plurality of electric conduction upper electrode plates are arranged below an upper bracket plate, pole pressing blocks turning down are arranged at two ends of the electric conduction upper electrode plates, cylindrical springs are respectively arranged between the electric conduction upper electrode plates and the upper bracket plate, each cylindrical spring is internally provided with a capacitor inner core locating rod, the upper end of the capacitor inner core locating rod upwards penetrates through the upper bracket plate freely, a lifting block is arranged at the upper end part of the capacitor inner core locating rod, the lower end part of the locating rod downwards penetrates through the electric conduction upper electrode plate, the lower end face of the lower end is lower than the electrode compressing joint surface of the upper electrode plate, a lower electrode conducting plate is arranged below the electric conduction upper electrode plates, and the lower electrode conducting plate is provided with a lower electrode protruding the lower electrode conducting plate, and the height value of the lower electrode upwards protruding the lower electrode conducting plate is greater than the bulging height of the locating core hole of the capacitor inner disc end face. The capacitor inner disc is located exactly, and the ageing power supply is connected to the capacitor inner core end face, so that the aging test fixture is beneficial to protect the capacitor inner core, is rapid, has high efficiency and is beneficial to improve the aging quality.
Description
Technical field
The utility model relates to a kind of capacitor aging equipment, especially relates to a kind of use in to capacitor
Core carries out the capacitor inner core ageing test anchor clamps of ageing test.
Background technology
In order to improve the quality of capacitor product, can carry out the ageing test processing to capacitor or capacitor inner core usually, capacitor wears out a period of time under certain condition, guarantees the product quality of capacitor; And in normally used capacitor aging equipment, easy appearance clamps the damage phenomenon to clamping inconvenient operation or clamping loose contact or be easy to generate of capacitor, or complex structure cost of manufacture height, states such as troublesome maintenance cause producing ageing efficiency and aging quality reduces.
The day for announcing is that the granted patent ZL200720063618.8 on September 10th, 2008 discloses the anchor clamps that a kind of weld tabs formula aging aluminium electrolysis capacitor is used, and comprises cover plate, base plate, spring, dividing plate, and the metal pole piece that is located on the base plate is formed.Two groups of separate little spring crosswise fixed are on base plate, and dividing plate is spaced laterally apart it, and the sheet metal of two isolation is fixed on the base plate positive/negative plate as anchor clamps, connect with lead between the little spring metal pole piece corresponding with this group.When anchor clamps were put into ageing oven, the two metal sheets of base plate just in time was crimped on the power positive cathode, need not manual connection.These anchor clamps contact, and the reliability height uses volume little, the ageing efficiency height.But these anchor clamps by spring to pin carry out the contact of direct electrode clamp aging, spring reduce get off after, the aging effect that clamps of anchor clamps just further reduces, and can not clamp aging to the capacitor inner core that does not have the installing electrodes pin.
The utility model content
The utility model carries out occurring easily in the ageing test clamping inconvenient operation or clamping loose contact or be easy to generate and clamp the damage phenomenon capacitor for solving existing capacitor inner core, or complex structure cost of manufacture height, present situation such as states such as troublesome maintenance and provide a kind of simple in structure effectively, easy to operate, quick, can carry out fast the capacitor inner core is clamped aging and takes off, improve aging production
The capacitor ageing test anchor clamps of efficient and the aging quality of better control.
The utility model is to solve the problems of the technologies described above the concrete technical scheme that is adopted to be: a kind of capacitor inner core ageing test anchor clamps, comprise the upper bracket plate, it is characterized in that: upper bracket plate below is provided with several conduction top crowns, each conduction top crown two ends has the pressure utmost point piece that turns over down, be respectively equipped with cylindrical spring between each conduction top crown and the upper bracket plate, establish capacitor inner core backstay in the cylindrical spring, the upper end freedom of each capacitor inner core backstay upwards passes the upper bracket plate and is provided with in upper end carries piece, the bottom of capacitor inner core backstay passes the conduction top crown downwards, the lower surface of bottom is lower than the electrode crimping face of top crown, conduction top crown below is provided with the bottom electrode conductive plate, the bottom electrode conductive plate is provided with the bottom electrode that protrudes the bottom electrode conductive plate, and the height value of bottom electrode bottom electrode conductive plate protruding upward is greater than core hole, the location protrusion height of capacitor inner core end.The bottom of capacitor inner core backstay can accurately be located the capacitor inner core, be crimped onto the inner core upper end surface of capacitor will conducting electricity top crown, realize the access of the aging power supply of electrode, spring upwards pushes the downward pressure of generation and the action of gravity of electrode assemblie itself simultaneously, further improve to core electrode in the capacitor with the reliable conduction that contacts of conduction top crown, and be difficult for the electrode inner core produced and damage phenomenon; Install to place and take to unload and take off the capacitor inner core and can easily mention and press-fit downwards by carrying piece, simple to operate, quick, improve aging production efficiency and clamp aging mass effect, improve the aging quality of aging operation convenience of capacitance core inner core and capacitor inner core.
As preferably, described capacitor inner core backstay adopts has externally threaded screw rod, and the conduction top crown is provided with screwed hole, and the conduction top crown is connected by the external screw thread of screwed hole with capacitor inner core backstay.Be threaded the conduction top crown more can be adapted to have wider differing heights capacitor inner core effectively press-fit contact force, adjust the height and position of conduction top crown, can adjust better and can press-fit aging capacitor inner core height at capacitor inner core backstay lower end.
As preferably, described bottom electrode adopts circle or rectangle copper stick.Possesses excellent conductive performance and useful life.
As preferably, described bottom electrode adopts two copper sticks that diameter is H, and the standoff distance of two copper sticks is L, and wherein: the outside dimension value of outside dimension value＜L＜capacitor inner core is protruded in the core hole, location of capacitor inner core end.Electric conductivity is good, and core hole, the location protrusion height part that the capacitor inner core that effectively staggers itself has improves security reliability; For avoiding adding the capacitor inner core on aging test bed the time, because of core hole, location protrusion height part is directly withstood bottom electrode, electrode damage of bringing and short circuit problem are simultaneously also with the reliable contact that has better improved bottom electrode and capacitor inner core lower surface.
As preferably, described conduction top crown is connected with the external circuits of bottom electrode conductive plate with the capacitor ageing test.The power supply that directly will wear out inserts in the conduction top crown, mounting and dismounting when taking down the capacitor inner core, does not influence operation.
As preferably, described capacitor inner core backstay inner core external diameter is less than the inner core internal diameter size of ageing test capacitor.Capacitor inner core backstay can freedom stretch out up and down in the inner core aperture of capacitor, both has been beneficial to the location and has taken down by being beneficial to dismounting.
As preferably, described pressure utmost point piece is provided with at least 1 electrode crimping face.Raising is provided with 2-3 electrode crimping face certainly usually to the reliable contact of capacitor inner core upper surface.
The beneficial effects of the utility model are: the bottom of capacitor inner core backstay can accurately be located the capacitor inner core, be crimped onto the inner core upper end surface of capacitor will conducting electricity top crown, realize the access of the aging power supply of electrode, spring upwards pushes the downward pressure of generation and the action of gravity of electrode assemblie itself simultaneously, further improve to core electrode in the capacitor with the reliable conduction that contacts of conduction top crown, and be difficult for the electrode inner core produced and damage phenomenon; Install to place and take to unload and take off the capacitor inner core and can easily mention and press-fit downwards by carrying piece, simple to operate, quick, improve aging production efficiency and clamp aging mass effect, improve the aging quality of aging operation convenience of capacitance core inner core and capacitor inner core.
Description of drawings:
Below in conjunction with the drawings and specific embodiments the utility model is described in further detail.
Fig. 1 is single group clamp structure schematic diagram of the utility model capacitor inner core ageing test anchor clamps.
Fig. 2 is single group clamp structure schematic diagram that the utility model capacitor inner core ageing test anchor clamps are equipped with the capacitor inner core.
Fig. 3 is the pressure utmost point block structure schematic diagram of top electrode in the utility model capacitor inner core ageing test anchor clamps.
Embodiment
Among the embodiment shown in Figure 1, a kind of capacitor inner core ageing test anchor clamps, comprise upper bracket plate 50, upper bracket plate 50 belows are equipped with 20 conduction top crowns 10, certainly can also be according to the actual production conditions of demand, select the more a plurality of conduction top crowns 10 of design to improve aging production efficiency, 10 conductions of every row top crown 10, each conduction top crown 10 two ends has the pressure utmost point piece 11 that turns over down, be separately installed with cylindrical spring 30 between each conduction top crown 10 and the upper bracket plate 50, cover capacitor inner core backstay 20 in the cylindrical spring 30, capacitor inner core backstay 20 adopts the screw rod with external screw thread 201, have screwed hole 12 on the conduction top crown 10, conduction top crown 10 is seen Fig. 3 by screwed hole 12() be connected with the external screw thread of capacitor inner core backstay 20; Upper end 22 freedom of each capacitor inner core backstay 20 upwards pass upper bracket plate 50 and 22 places are mounted with and carry piece 40 in the upper end, the bottom 21 of capacitor inner core backstay 20 passes conduction top crown 10 downwards, the lower surface 211 of bottom 21 is lower than the electrode crimping face 111 of top crown 10, conduction top crown 10 belows are equipped with bottom electrode conductive plate 70, be welded with the bottom electrode 71 that protrudes bottom electrode conductive plate 70 on the bottom electrode conductive plate 70, bottom electrode 71 adopts circular copper stick, and the height value H of bottom electrode 71 bottom electrode conductive plates 70 protruding upward is greater than core hole, the location protrusion height H1 of capacitor inner core end.Bottom electrode 71 adopts two copper sticks that diameter is H, also promptly is equivalent to the height value H of bottom electrode 71 bottom electrode conductive plates 70 protruding upward, and the standoff distance of two copper sticks is L.Standoff distance L between two bottom electrodes 71 is chosen as capacitor 60(and sees Fig. 2) the core hole, location of inner core end 61 protrudes the outside dimension value L1 of outside dimension value L2＜L＜capacitor inner cores.Conduction top crown 10 is connected with the external circuits of bottom electrode conductive plate 70 with the capacitor ageing test.Conduction top crown 10 inserts aging positive source, and bottom electrode conductive plate 70 is connected with aging power ground, and capacitor inner core backstay 20 inner core external diameters are less than the inner core internal diameter size of ageing test capacitor.Have 2 electrode crimping face 111(on the pressure utmost point piece 11 and see Fig. 3), have a recess that makes progress between 2 electrode crimping faces 111.
During use, when needs ageing test capacitor inner core, mention piece 40, conduction top crown 10 upwards compresses cylindrical spring 30 along with the rising of capacitor inner core backstay 20, after drive conduction top crown 10 upwards rises to certain position, 60(sees Fig. 2 with the capacitor inner core) be placed on the aging test bed aging bottom electrode 71 after, make the core hole, location 61 of capacitor 60 inner core ends protrude the middle place (see figure 2) that external diameter end face 611 is positioned at the standoff distance L of two copper sticks, and after making capacitor inner chip hole 61 contraposition capacitor inner core backstays 20 location, put down and carry piece 40, conduction top crown 10 is along with the resilience of cylindrical spring 30 presses against downwards on the capacitor inner core upper surface, reach the external power supply that inserts the capacitor ageing test, carry out capacitor inner core ageing test, 20 aging upper/lower electrodes ageing test when realizing 20 capacitor inner cores is set on aging test bed, and the situation quantity of expanding aging upper/lower electrode 10 satisfies the needs of bigger production ageing efficiency according to actual needs certainly; And after ageing test finishes, mention piece 40 can easily the capacitor inner core be taken off from aging test bed, simple and convenient.
Claims (7)
1. capacitor inner core ageing test anchor clamps, comprise upper bracket plate (50), it is characterized in that: upper bracket plate (50) below is provided with several conduction top crowns (10), each conduction top crown (10) two ends has the pressure utmost point piece (11) that turns over down, be respectively equipped with cylindrical spring (30) between each conduction top crown (10) and the upper bracket plate (50), establish capacitor inner core backstay (20) in the cylindrical spring (30), upper end (22) freedom of each capacitor inner core backstay (20) upwards pass upper bracket plate (50) and in the upper end (22) locate to be provided with and carry piece (40), the bottom (21) of capacitor inner core backstay (20) passes conduction top crown (10) downwards, the lower surface (211) of bottom (21) is lower than the electrode crimping face (111) of top crown (10), conduction top crown (10) below is provided with bottom electrode conductive plate (70), bottom electrode conductive plate (70) is provided with the bottom electrode (71) that protrudes bottom electrode conductive plate (70), and the height value (H) of bottom electrode (71) bottom electrode conductive plate protruding upward (70) is greater than core hole, the location protrusion height (H1) of capacitor inner core end.
2. according to the described capacitor inner core of claim 1 ageing test anchor clamps, it is characterized in that: described capacitor inner core backstay (20) adopts the screw rod with external screw thread (201), conduction top crown (10) is provided with screwed hole (12), and conduction top crown (10) is connected by the external screw thread of screwed hole (12) with capacitor inner core backstay (20).
3. according to the described capacitor inner core of claim 1 ageing test anchor clamps, it is characterized in that: described bottom electrode (71) adopts circle or rectangle copper stick.
4. according to claim 1 or 3 described capacitor inner core ageing test anchor clamps, it is characterized in that: described bottom electrode (71) adopts two copper sticks that diameter is H, the standoff distance of two copper sticks is L, and wherein the outside dimension value (L1) of outside dimension value (L2)＜L＜capacitor inner core is protruded in the core hole, location (61) of capacitor (60) inner core end.
5. according to claim 1 or 2 described capacitor inner core ageing test anchor clamps, it is characterized in that: described conduction top crown (10) is connected with the external circuits of capacitor ageing test, and bottom electrode conductive plate (70) is connected with the external circuits ground wire of capacitor ageing test.
6. according to claim 1 or 2 described capacitor inner core ageing test anchor clamps, it is characterized in that: described capacitor inner core backstay (20) inner core external diameter is less than the inner core internal diameter size of ageing test capacitor.
7. according to the described capacitor inner core of claim 1 ageing test anchor clamps, it is characterized in that: described pressure utmost point piece (11) is provided with at least 1 electrode crimping face (111).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201020693190 CN201927496U (en) | 2010-12-31 | 2010-12-31 | Aging test fixture for inner core of capacitor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201020693190 CN201927496U (en) | 2010-12-31 | 2010-12-31 | Aging test fixture for inner core of capacitor |
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| Publication Number | Publication Date |
|---|---|
| CN201927496U true CN201927496U (en) | 2011-08-10 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN 201020693190 Expired - Fee Related CN201927496U (en) | 2010-12-31 | 2010-12-31 | Aging test fixture for inner core of capacitor |
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| CN (1) | CN201927496U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103344861A (en) * | 2013-07-03 | 2013-10-09 | 指月集团有限公司 | Metallization power capacitor rapid aging testing device |
| CN110320429A (en) * | 2019-07-11 | 2019-10-11 | 南通海美电子有限公司 | A kind of fuse ageing and screening method |
| CN110837021A (en) * | 2012-07-10 | 2020-02-25 | 慧萌高新科技有限公司 | Method and apparatus for inspecting chip electronic component |
-
2010
- 2010-12-31 CN CN 201020693190 patent/CN201927496U/en not_active Expired - Fee Related
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110837021A (en) * | 2012-07-10 | 2020-02-25 | 慧萌高新科技有限公司 | Method and apparatus for inspecting chip electronic component |
| CN103344861A (en) * | 2013-07-03 | 2013-10-09 | 指月集团有限公司 | Metallization power capacitor rapid aging testing device |
| CN103344861B (en) * | 2013-07-03 | 2016-04-13 | 指月集团有限公司 | A kind of Metallized power capacitor Accelarated aging test device |
| CN110320429A (en) * | 2019-07-11 | 2019-10-11 | 南通海美电子有限公司 | A kind of fuse ageing and screening method |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20110810 Termination date: 20141231 |
|
| EXPY | Termination of patent right or utility model |