CN201655740U - Ion source extraction device - Google Patents
Ion source extraction device Download PDFInfo
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- CN201655740U CN201655740U CN2010201119227U CN201020111922U CN201655740U CN 201655740 U CN201655740 U CN 201655740U CN 2010201119227 U CN2010201119227 U CN 2010201119227U CN 201020111922 U CN201020111922 U CN 201020111922U CN 201655740 U CN201655740 U CN 201655740U
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- radio frequency
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- ion source
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- multistage bar
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Abstract
The utility model discloses an ion source extraction device, relates to a mass spectrometer, and provides an ion source extraction device which does not need a sampling cone, has high sampling ion extraction efficiency and low use cost, can effectively enhance the sensitivity of the mass spectrometer, and is suitable for the direct ionization of solid samples. The ion source extraction device is provided with a detachable sample target, a radio frequency multi-level bar, a radio frequency multi-level bar fixing base and an intercepting cone, wherein the detachable sample target, the radio frequency multi-level bar, the radio frequency multi-level bar fixing base and the intercepting cone have the same axial lead, the detachable sample target faces the radio frequency multi-level bar in the forward direction, the radio frequency multi-level bar is arranged in the radio frequency multi-level bar fixing base, the radio frequency multi-level bar fixing base is connected with the intercepting cone, and the intercepting cone is arranged in an external ion source chamber. The intercepting cone is provided with an iron exit slit and at least one radial background gas inlet hole, and the ion exit slit is positioned in the center of the intercepting cone.
Description
Technical field
The utility model relates to a kind of mass spectrometer, especially relates to a kind of mass spectrometric ion source ejector that is suitable for the solid sample direct ionization.
Background technology
Mass spectrometer is one of most important member in the modern science field of analytic instrument, is one of state-of-the-art means of modern analysis science.It is earlier with sample ionsization, and sample ions is again by behind predefined electric field or the magnetic field, realize that mass-to-charge ratio separates, and it is strong to detect its respective peaks, thereby reaches a kind of modern precision analytical instrument to qualitative, the quantitative analysis of sample.Mass spectrography has become the indispensable analyzing and testing means in many aspects such as chemistry, geology, biochemistry, materia medica, medical science, petrochemical industry, the energy, environmental protection and food processing till now gradually from initial isotope analysis.
No matter be the mass spectrometer of which kind of type, its basic composition all is identical.It all comprises sampling system, ion source, mass analyzer, ion detection system, vacuum system, power supply and control system six major parts.Ion source is mass spectrometric primary link, and it is to make the neutral atom of sample or molecular ionization become ion, and draws the device of ion beam by the electromagnetism principle.Ionogenic of a great variety, wherein be suitable for the direct ion source of analyzing of solid sample and mainly comprise spark source, fast particle bombardment source, field-ionization source, field desorptiion ionization source, laser resonant ionization source, laser splash radiation ionization source, laser splash inductance coupling high ion source and glow discharge ion source.
The ion beam ejection efficiency of ionization source is one of leading indicator of weighing an ion source quality.Be used for the ionogenic ion beam ejector of solid sample direct ionization at present and all adopt vertebra shape plate or the flat board that has tiny circular hole (general diameter is less than 1mm), be referred to as sampling spiroid usually.The defective of this mode is: on the one hand owing to the sample ions that can only gather the part, so the sample ions ejection efficiency is low; On the other hand, because the sampling vertebra is apart from the ionization surface of solid very nearly (usually less than 10mm), sampling vertebra surface is easy to contaminated, not only causes the ion ejection efficiency to descend, and the memory effect that has increased sample is polluted.Therefore, in order to guarantee the repeatability of Instrumental Analysis, often need regularly to clean sampling spiroid, and also require periodic replacement as the quick-wear part of instrument.This has increased the use cost of mass spectrometer inevitably.
Publication number is a kind of laser splash radiation ionization cold focusing right crossing flying time mass spectrograph for the CN101170042 application for a patent for invention discloses, and relates to a kind of mass spectrometer.A kind of laser ionization source and mass spectrometer coupling of making is provided, removes Interference Peaks, spectrogram is clear, and solid sample is not had the laser splash radiation ionization cold focusing right crossing flying time mass spectrograph that standard specimen is analyzed.If laser, focus lens group, sample introduction feeler lever, two-dimentional mobile platform, ion source cavity, main cavity, sampling spiroid, the multipole bar of radio frequency, intercepting awl, ion lens group and time of flight mass analyzer.It is external that laser and condenser lens are mounted on ion source chamber, and sample introduction feeler lever, two-dimentional mobile platform and sampling spiroid are located in the ion source cavity; The ion source chamber body lumen wall is provided with quartz window, vacuum pumping port and valve; Establish vacuum pumping port on the wall of main cavity chamber, intercepting awl, the multistage bar of radio frequency and ion lens are mounted in the main cavity; Sample introduction feeler lever, two-dimentional mobile platform and sampling spiroid are coaxial with intercepting awl, the multistage bar of radio frequency and ion lens group.
Publication number relates to a kind of mass spectrometer for the CN101465261 application for a patent for invention discloses a kind of high power density laser sputtering ionization time-of-flight mass spectrometer and application thereof.A kind of high power density laser sputtering ionization time-of-flight mass spectrometer and application thereof are provided.Be provided with vacuum cavity, LASER Light Source, laser focusing lens, sampling spiroid, ion transfer device, intercepting awl and time of flight mass analyzer; LASER Light Source and laser focusing lens are located at the vacuum cavity outside, and sampling spiroid, ion transfer device, intercepting awl and time of flight mass analyzer are located in the vacuum cavity successively.Vacuum cavity is provided with three grades of vacuum chambers, and the one-level vacuum chamber is located at before the sampling spiroid, and the secondary vacuum chamber is located between sampling spiroid and the intercepting awl, and three grades of vacuum chambers are located at after the intercepting awl.By with ion source in the collision of auxilliary gas molecule (atom), the kinetic energy of sample ions is reduced, favourable sampling and transmission; Multivalent ion is made a price reduction and is converted to monovalention, can remove the Interference Peaks of multivalent ion, makes the clear readability of spectrogram, and resolution capability is strong.
Summary of the invention
The purpose of this utility model provides a kind of sampling spiroid that need not, sample ions ejection efficiency height, and use cost reduces, and can effectively improve the mass spectrometric ion source ejector that is suitable for the solid sample direct ionization of mass spectrometer sensitivity.
The utility model is provided with removable sample target, the multistage bar of radio frequency, the multistage bar holder of radio frequency and intercepting awl, detachable sample target, the multistage bar of radio frequency, the multistage bar holder of radio frequency and intercepting awl coaxial inner conductor, detachable sample target forward is in the face of the multistage bar of radio frequency, the multistage bar of radio frequency is installed in the multistage bar holder of radio frequency, the multistage bar holder of radio frequency is connected with the intercepting awl, the intercepting awl is installed in the external ion source cavity, intercepting awl is provided with radially background gas air admission hole of ion exit slit and at least 1, and the ion exit slit is positioned at the awl center that intercepts.
Described detachable sample target is made of sample feeding rod, sample holder and sample target gland, the front end of sample feeding rod embeds the rear end of sample holder, sample target gland embeds the front end of sample holder, sample feeding rod, sample holder and sample target gland removable each other.During use, sample places between sample feeding rod and the sample target gland.Sample feeding rod is a stainless steel and other metal materials.Sample holder and sample target gland can adopt high pure metals such as aluminium, copper to make, and also can adopt high temperature resistant nonmetallic materials such as glass or pottery to make.
The bar number of the multistage bar of radio frequency is 2 integral multiple, and described integral multiple is at least 2 times.The bar of the multistage bar of radio frequency can be made by the 316L stainless steel, and shank diameter is 2～6mm, length 60～100mm.When the multistage bar of described radio frequency is the level Four bar, the ratio of the inscribed circle radius that the multistage bar of the radius of single bar and radio frequency constitutes preferably 0.872; When the multistage bar of described radio frequency is six grades of bars, the ratio of the inscribed circle radius that the multistage bar of the radius of single bar and radio frequency constitutes preferably 0.5375; When the multistage bar of described radio frequency is eight grades of bars, the ratio of the inscribed circle radius that the multistage bar of the radius of single bar and radio frequency constitutes preferably 0.355.The power supply frequency of selecting for use of the multistage bar of described radio frequency is 100kHz～5MHz, and voltage (peak value) is 0～1000V.The axial line of the multistage bar of described radio frequency also is the axis at excited particles bundle focus point place.
The multistage bar holder of described radio frequency can adopt material such as polytetrafluoroethylene, polyether-ether-ketone or pottery.
Described intercepting awl by 304 or the 316L stainless steel make, described ion exit slit is a circular port, diameter is 0.1～1mm.The diameter of ion exit slit can require according to the vacuum degree of ion source cavity to determine.Described radially background gas air admission hole preferably is provided with 2,2 background gas air admission hole symmetric arrangement radially.Described background gas can adopt helium, hydrogen, nitrogen or argon gas.The air pressure of described background gas can be 10～10000 Pascals, or even atmospheric pressure.
Described sample feeding rod by 304 or the 316L stainless steel make, the sample feeding rod front end has pressure cap, is convenient to fixed sample.
Principle of the present utility model is: the utility model is installed in the mass spectrometric ion source cavity, radially background gas air admission hole by the intercepting awl charges into background gas, under the low pressure background gas condition of setting, energetic particle beam is through after focusing on, be radiated on the solid sample surface, sample ionization is become ion, and form the ion cloud cluster.The main shaft of gas ions cloud cluster is perpendicular to the ionization surface.Because ion has certain initial kinetic energy, they will directly enter in the rf electric field of multipole bar; Under the acting in conjunction of hypobaric background gas and rf electric field, ion constantly bumps with the background gas molecule, and the initial ion cloud of dispersing is focused on the axis of multipole bar; By the exit slit hole, enter mass spectrometer through the ion beam that focuses on (beam diameter can less than 1mm) at last.
This shows, the utility model has been broken away from traditional sampling spiroid mode, and directly use the multistage bar cooling technology of radio frequency under the low pressure, the ion that ionization goes out directly enters multistage bar and focuses on collection, not only both broken away from the easy pollution problems of traditional sampling spiroid, improved ion extraction rate and utilance again greatly, strengthened mass spectrometric sensitivity, and prolongation instrument long service life, the use cost of lowering apparatus.The utility model goes for fast atom bombardment source, laser resonant ionization source, laser splash radiation ionization source and secondary ion ionization source.So long as utilize the excitaton source of energetic particle beam, can adopt this technology as ionization source.
Description of drawings
Fig. 1 is the structural representation of the utility model embodiment.
Embodiment
Referring to Fig. 1, the utility model is located in the mass spectrometric ion source cavity (not drawing among Fig. 1).Be provided with removable sample target (constituting), the multistage bar 5 of radio frequency, the multistage bar holder 6 of radio frequency and intercepting awl 7 by sample feeding rod 1, sample holder 2 and sample target gland 3.Removable sample target, the multistage bar 5 of radio frequency, the multistage bar holder 6 of radio frequency and intercepting awl 7 are coaxial inner conductor.Removable sample target front end face is to multistage bar 5 one ends of radio frequency, and the multistage bar 5 of radio frequency is installed in the multistage bar holder 6 of radio frequency, and the multistage bar holder of radio frequency 6 bottoms are connected with intercepting awl 7.Intercepting awl 7 is installed in the external ion source cavity, and intercepting awl 7 is provided with radially background gas air admission hole 72 and 73 of ion exit slit 71 and 2, and ion exit slit 71 is positioned at intercepting awl 7 centers.Solid sample P1 places between sample feeding rod 1 and the sample target gland 3.Mist cloud among Fig. 1 is represented ion cloud.
The excitaton source that is used for solid sample P1 direct ionization is laser beam P2 with certain energy (also electron beam, ion beam or atomic beam), and incident angle is 0 °～90 °.
The front end of described sample feeding rod 1 embeds the rear end of sample holder 2, and sample target gland 3 embeds the front end of sample holders 2, sample feeding rod 1, sample holder 2 and sample target gland 3 removable each other.Sample feeding rod 1 is the stainless steel sample feeding rod, and sample holder 2 and sample target gland 3 adopt aluminium (also can be high temperature resistant nonmetallic materials such as high pure metal, glass or pottery such as copper) to make.Sample feeding rod 1 front end has pressure cap, is convenient to fixed solid sample P 1.
The multistage bar 5 of radio frequency is six grades of bars (also can be the level Four bar, eight grades of multistage bars such as bar, but the bar number of the multistage bar of radio frequency should be two integral multiple, described integral multiple is at least 2 times).The ratio of the inscribed circle radius that multistage bar 5 each bar of the radius of the single bar of the multistage bar 5 of radio frequency and radio frequency constitute is 0.5375.The bar of the multistage bar 5 of radio frequency is made by the 316L stainless steel, and shank diameter is 2～6mm, length 60～100mm.The power supply frequency that the multistage bar 5 of radio frequency is selected for use is 100kHz～5MHz, and voltage (peak value) is 0～1000V.The axial line of the multistage bar 5 of described radio frequency also is the axis at laser beam P2 (excited particles bundle) focus point place.The multistage bar holder 6 of radio frequency adopts polytetrafluoroethylene (also can be polyether-ether-ketone or pottery etc.) to make.
Intercepting awl 7 is made by 304 (or 316L) number stainless steel, and ion exit slit 71 is circular ports, and diameter is 0.1～1mm.The diameter of ion exit slit 71 can require according to the vacuum degree of ion source cavity to determine.2 radially background gas air admission hole 72 and 73 symmetric arrangement.
Background gas adopts helium (also can be hydrogen, nitrogen or argon gas etc.), and the air pressure of background gas is 10～10000 Pascals.
Claims (10)
1. an ion source ejector is characterized in that being provided with removable sample target, the multistage bar of radio frequency, the multistage bar holder of radio frequency and intercepting awl; Detachable sample target, the multistage bar of radio frequency and intercepting awl coaxial inner conductor; Detachable sample target forward is in the face of the multistage bar of radio frequency; The multistage bar of radio frequency is installed in the multistage bar holder of radio frequency, and the multistage bar holder of radio frequency is connected with the intercepting awl; Intercepting awl is installed in the external ion source chamber, and the intercepting awl is provided with radially background gas air admission hole of ion exit slit and at least 1; The ion exit slit is positioned at intercepting awl center.
2. a kind of ion source ejector as claimed in claim 1, it is characterized in that described detachable sample target is made of sample feeding rod, sample holder and sample target gland, the front end of sample feeding rod embeds the rear end of sample holder, sample target gland embeds the front end of sample holder, can dismantle mutually between sample feeding rod, sample holder and the sample target gland.
3. a kind of ion source ejector as claimed in claim 1, the bar number that it is characterized in that the multistage bar of described radio frequency are 2 integral multiple.
4. a kind of ion source ejector as claimed in claim 3 is characterized in that described integral multiple is at least 2 times.
5. a kind of ion source ejector as claimed in claim 1, the diameter that it is characterized in that the multistage bar of described radio frequency is 2～6mm, the length of bar is 60～100mm.
6. a kind of ion source ejector as claimed in claim 1, when it is characterized in that the multistage bar of described radio frequency is the level Four bar, the ratio of the inscribed circle radius that the multistage bar of the radius of single bar and radio frequency constitutes is 0.872; When the multistage bar of described radio frequency was six grades of bars, the ratio of the inscribed circle radius that the multistage bar of the radius of single bar and radio frequency constitutes was 0.5375; When the multistage bar of described radio frequency was eight grades of bars, the ratio of the inscribed circle radius that the multistage bar of the radius of single bar and radio frequency constitutes was 0.355.
7. a kind of ion source ejector as claimed in claim 1, the power supply frequency that it is characterized in that the multistage bar of described radio frequency is 100kHz～5MHz, voltage is 0～1000V.
8. a kind of ion source ejector as claimed in claim 1, the axial line that it is characterized in that the multistage bar of described radio frequency are the axis at external excitation particle beams focus point place.
9. a kind of ion source ejector as claimed in claim 1 is characterized in that described ion exit slit is a circular port, and the diameter of circular port is 0.1～1mm.
10. a kind of ion source ejector as claimed in claim 1 is characterized in that described radially background gas air admission hole is provided with 2,2 background gas air admission hole symmetric arrangement radially.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010201119227U CN201655740U (en) | 2010-02-05 | 2010-02-05 | Ion source extraction device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010201119227U CN201655740U (en) | 2010-02-05 | 2010-02-05 | Ion source extraction device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN201655740U true CN201655740U (en) | 2010-11-24 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2010201119227U Expired - Fee Related CN201655740U (en) | 2010-02-05 | 2010-02-05 | Ion source extraction device |
Country Status (1)
| Country | Link |
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| CN (1) | CN201655740U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101872708B (en) * | 2010-02-05 | 2013-03-27 | 厦门大学 | Ion source extraction device suitable for direct ionization of solid sample |
-
2010
- 2010-02-05 CN CN2010201119227U patent/CN201655740U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101872708B (en) * | 2010-02-05 | 2013-03-27 | 厦门大学 | Ion source extraction device suitable for direct ionization of solid sample |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20101124 Termination date: 20130205 |