CN201562037U - A/D chip conversion error detection device - Google Patents
A/D chip conversion error detection device Download PDFInfo
- Publication number
- CN201562037U CN201562037U CN2009202416783U CN200920241678U CN201562037U CN 201562037 U CN201562037 U CN 201562037U CN 2009202416783 U CN2009202416783 U CN 2009202416783U CN 200920241678 U CN200920241678 U CN 200920241678U CN 201562037 U CN201562037 U CN 201562037U
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- sampling
- detection device
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- microprocessor
- error detection
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Abstract
An A/D chip conversion error detection device is characterized in that a standard signal source is connected with an A/D sampling chip which is connected with a microprocessor, and the microprocessor is respectively connected with a display system and a PC computer. The detection device has the technical advantages that the detection device is used for error detection by means of batch selection before the A/D sampling chip is used by batch for production, thereby greatly increasing precision of an ordinary testing instrument and accuracy of a control system, for high precision watches with design required precision above 0.1 grade, each chip is calibrated by the detection device, and errors generated from sampling zero shift can be precisely calibrated.
Description
Technical field
The utility model relates to a kind of error-tested device, relates in particular to a kind of AD chip transformed error verifying attachment.
Background technology
AD sample conversion chip is the bridge that connects mimic channel and digital circuit, can be converted to the corresponding digital amount to analog quantity by sampling A, and handles back acquisition data or make corresponding work by CPU.But because manufacture craft or precision, all AD chips all drift can occur basically.If it is do not detect the precision that then is easy to have influence on data acquisition, more obvious for high-precision instrument.
Summary of the invention
The purpose of this utility model is to provide a kind of AD chip transformed error verifying attachment, this device can be rapid, check out easily the zero point drift of various AD sampling A and each batch chip, be under the situation of the minimum analog input amount of digital conversion of chip regulation and the highest analog input amount promptly in the analog input amount, detect the bias size of digital output, can provide precise number for the calibration of software algorithm, improve the precision of analog sampling.
The utility model is achieved like this, it comprises standard signal source, A/D sampling A, microprocessor, display system, PC, it is characterized in that standard signal source connects the A/D sampling A, the A/D sampling A connects microprocessor, and microprocessor connects display system and PC respectively.
Technique effect of the present utility model is: in the production the AD sampling A drop into batch use before, carry out error-tested with the mode of batch extraction by this device, can improve the accuracy of the precision and the control system of common test instrument greatly; For the designing requirement precision the high-precision kilsyth basalt more than 0.1 grade then each chip all pass through the calibration of this equipment, then can to since the sampling error that drift produced accurately calibrate.
Description of drawings
Fig. 1 is a fundamental diagram of the present utility model.
Embodiment
As shown in Figure 1, the utility model is achieved like this, it comprises standard signal source 1, A/D sampling A 2, microprocessor 3, display system 4, PC 5, it is characterized in that standard signal source 1 connects A/D sampling A 2, A/D sampling A 2 connects microprocessor 3, and microprocessor 3 connects display system 4 and PC 5 respectively.Ultimate principle is exactly to visit tested AD sampling A 2 by microprocessor 3, the standard input value is input in the passage of AD sampling A 2, then its value is shown in display system 4, its value is analyzed again, thereby is carried out the chip calibration.
Claims (1)
1. AD chip transformed error verifying attachment, it comprises standard signal source, A/D sampling A, microprocessor, display system, PC, it is characterized in that standard signal source connects the A/D sampling A, the A/D sampling A connects microprocessor, and microprocessor connects display system and PC respectively.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN2009202416783U CN201562037U (en) | 2009-12-09 | 2009-12-09 | A/D chip conversion error detection device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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CN2009202416783U CN201562037U (en) | 2009-12-09 | 2009-12-09 | A/D chip conversion error detection device |
Publications (1)
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CN201562037U true CN201562037U (en) | 2010-08-25 |
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CN2009202416783U Expired - Fee Related CN201562037U (en) | 2009-12-09 | 2009-12-09 | A/D chip conversion error detection device |
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CN (1) | CN201562037U (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104215863A (en) * | 2014-09-30 | 2014-12-17 | 无锡康柏斯机械科技有限公司 | Testing method of AD port of 1U controller of grinding machine |
CN106199309A (en) * | 2016-07-06 | 2016-12-07 | 南京国电南自电网自动化有限公司 | A kind of loop self-checking circuit for ADC sampled data and method |
CN106970312A (en) * | 2016-01-14 | 2017-07-21 | 北京君正集成电路股份有限公司 | A kind of chip detecting method and device |
CN112782559A (en) * | 2020-12-31 | 2021-05-11 | 南京国电南自电网自动化有限公司 | AD chip testing device and testing method thereof |
-
2009
- 2009-12-09 CN CN2009202416783U patent/CN201562037U/en not_active Expired - Fee Related
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104215863A (en) * | 2014-09-30 | 2014-12-17 | 无锡康柏斯机械科技有限公司 | Testing method of AD port of 1U controller of grinding machine |
CN106970312A (en) * | 2016-01-14 | 2017-07-21 | 北京君正集成电路股份有限公司 | A kind of chip detecting method and device |
CN106199309A (en) * | 2016-07-06 | 2016-12-07 | 南京国电南自电网自动化有限公司 | A kind of loop self-checking circuit for ADC sampled data and method |
CN106199309B (en) * | 2016-07-06 | 2019-01-18 | 南京国电南自电网自动化有限公司 | A kind of circuit self-checking circuit and method for ADC sampled data |
CN112782559A (en) * | 2020-12-31 | 2021-05-11 | 南京国电南自电网自动化有限公司 | AD chip testing device and testing method thereof |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20100825 Termination date: 20171209 |
|
CF01 | Termination of patent right due to non-payment of annual fee |