CN201561803U - Infrared double-wave length non-contact temperature measuring device - Google Patents
Infrared double-wave length non-contact temperature measuring device Download PDFInfo
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- CN201561803U CN201561803U CN2009201453732U CN200920145373U CN201561803U CN 201561803 U CN201561803 U CN 201561803U CN 2009201453732 U CN2009201453732 U CN 2009201453732U CN 200920145373 U CN200920145373 U CN 200920145373U CN 201561803 U CN201561803 U CN 201561803U
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Abstract
The utility model provides an infrared double-wave length non-contact temperature measuring device with high precision capable of getting rid of the effect of space absorption and environmental factor fluctuation, which comprises a signal collecting system, a light splitting system, a signal amplifying circuit and a data processing system, wherein received signals are divided into two beams by a beam divider arranged tipsily or wedge beam divider prism in the light splitting system; one beam passes through a lam1 narrow-belt filtering sheet, and the other beam passes through a lam2 narrow-belt filtering sheet; or the received signals are divided into two beams by a narrow-belt filtering sheet arranged tipsily, and a narrow-belt filtering sheet with the same wave length on a reflecting optical path is used for filtering, so only two narrow-belt filtering sheets in the same kind are needed, and double-wave length filtration is realized; then, temperature is measured by the ratio value of two signals received by an optical probe, and a measuring system is fixedly aimed; the temperature of a utility site is corrected by a high-precision temperature meter, so emissivity correction does not need, and high precision measurement is realized.
Description
Technical field
The utility model belongs to infrared temperature-test technology, is specifically related to a kind of high-precision infrared dual wavelength contactless temperature-measuring device, and this device is widely used in the measuring process to solid-state, liquid, gaseous state and plasma state temperature.
Background technology
As everyone knows, infrared temperature measurement apparatus almost is applied to each corner in the modern industrial society, has obtained huge achievement.But, mostly being single wavelength infrared temperature measurement apparatus at infrared temperature measurement apparatus in the market, test result is relevant with the radiation intensity that receives.Because actual measurement has very big difference with " black matrix ", thereby causes measurement result to have certain error liking " grey body ".Must carry out error correction this moment to measurement result, and therein " emissivity correction " is the main factor of considering, but be still a difficult problem that does not thoroughly solve as yet in infrared measurement of temperature field in present " emissivity correction ".
Common way in the actual measurement process is to get a fixed value as " emissivity correction ", but will cause very big error like this.In addition, because the in-site measurement complicated condition, such as atmosphere, Ambient etc., measurement result is subjected to the environmental fluctuating influence to a great extent, thereby causes the measurement result deviation.Therefore, the infrared thermometer kind on the market is single, has different errors more or less, and is not applicable to solid-state, liquid, gaseous state and the thermometric instrument of plasma state jointly.
Along with, industrial scale, become more meticulous, need a kind of simple in structure, temperature measuring equipment that measuring accuracy is high at present, and the device that overcomes " emissivity correction " problem of existing temperature measuring equipment.
The utility model content
Deficiency at existing temperature measuring equipment, the utility model technological invention people repeatedly tests and has studied and proposed brand-new dual wavelength filtering infrared radiation temperature device, be specially a kind of high-precision infrared dual wavelength contactless temperature-measuring device, this device is widely used in the measuring process to solid-state, liquid, gaseous state and plasma state temperature.
According to infrared dual wavelength contactless temperature-measuring device of the present utility model, comprise signal acquiring system, beam splitting system, signal amplification circuit and data handling system; It is characterized in that beam splitting system will receive light signal through signal acquiring system and be divided into two-beam, this two-beam carries out filtering by different narrow band filter slices respectively, then after signal amplification circuit is handled, what the photelectric receiver in Usage data collection and the display system received handles latter two signal through signal amplification circuit, utilizes the ratio of two signals that data handling system receives according to photelectric receiver to measure temperature at last.
Preferably, beam splitting system adopts semi-transparent semi-reflecting divided beam system or adopts the narrow band filter slice filtering system or adopt the prism wedge beam splitting system.
Preferably, data handling system comprises data acquisition and display system.
This infrared dual wavelength contactless temperature-measuring device utilizes the dual wavelength light path system to avoid " emissivity correction " problem in traditional infrared field, having solved measurement result absorbed by the space and environmental factor fluctuates and causes the problem of measurement result deviation, just broken away from " emissivity correction " problem that existing apparatus can't thoroughly overcome, improved measuring accuracy simultaneously, this contrive equipment can be widely used in solid-state simultaneously, liquid, in the measuring process of gaseous state and plasma state temperature, can realize solid, gas, the high-acruracy survey of multiple states of matter temperature such as liquid and plasma state.
Brief Description Of Drawings
Fig. 1 is the synoptic diagram according to semi-transparent semi-reflecting divided beam system of the present utility model.
Fig. 2 is the physical construction stereographic map of the semi-transparent semi-reflecting divided beam system of realization Fig. 1.
Fig. 3 is the signal amplification circuit figure that realizes according to the semi-transparent semi-reflecting divided beam system among Fig. 1.
Fig. 4 is the synoptic diagram according to narrow band filter slice filtering system of the present utility model.
Fig. 5 is the physical construction stereographic map of the narrow band filter slice divided beam system of realization Fig. 4.
Fig. 6 is the synoptic diagram according to prism wedge beam splitting system of the present utility model.
Fig. 7 is the physical construction stereographic map of the prism wedge beam splitting system of realization Fig. 6.
Fig. 8 is the one-piece construction synoptic diagram that utilizes the test macro of the beam splitting system formation among Fig. 1,4,6.
Fig. 9 (a) and Fig. 9 (b) are respectively pictorial diagram and the corresponding structural representations according to the utility model proving installation.
Embodiment
Below in conjunction with accompanying drawing, the infrared dual wavelength contactless temperature-measuring device that the utility model proposes is described in detail.
In order to adapt to industry spot measuring condition relative complex but the fixing situation of condition, temperature measuring equipment of the present utility model adopts infrared dual wavelength filtering to measure light path system.This temperature measuring equipment principle is to come thermometric according to the infrared source spectral power distribution characteristic of measurand (being different from " standard black matrix ") and the relation between its temperature, therefore, the power because of environment and the affected thermal radiation signal of fluctuation thereof that the measurement result of dual wavelength signal ratio and instrument receive is irrelevant, thereby has guaranteed the precision of thermometric.
Thermometric object in actual thermometric process is not " absolute black body ", obtain the problem that its actual temperature has " emissivity ", multiply by corresponding coefficient (less than 1) exactly on blackbody radiation formula basis." emissivity " is defined as the ratio of normal direction radiance with the normal direction radiance of the black matrix of same temperature of an object." emissivity " of object is general to have relation with thermometric object temperature and infrared radiation wavelength, so the problem of one " emissivity " correction is arranged for different thermometric objects.Adopt of infrared thermometer given " emissivity " fixing value more in the past, " yet emissivity " is the value that changes within the specific limits, so this has just caused traditional temperature measurer " emissivity " to revise this difficult problem of difficulty, thereby makes the traditional infrared temperature measurer that bigger measuring error be arranged.
Heat radiation power and the actual function between temperature that the utilization of this temperature measuring equipment is found out known radiation object according to experimental data concern, sum up the actual heat radiation rule of this object; And then utilize this relation to go to survey the radiation temperature of same object under equivalent environment; Promptly measure the infrared temperature of object according to contrast relationship.Do not need " emissivity " to revise, solved infrared measurement of temperature and can not improve the problem that essence (really) is spent for a long time, thus possessed than traditional infrared temperature measurer good be better than 1% high measurement accuracy.
Fig. 1 is the synoptic diagram according to semi-transparent semi-reflecting divided beam system of the present utility model; It has adopted semi-transparent semi-reflecting beam-splitting method.
In Fig. 1, Reference numeral 101 expression adjustable focus imaging lens, 102 expression collimation lenses, the semi-transparent semi-reflecting lens of 103 expressions, 104 expression arrowband rate wave plate λ, 1,105 expression arrowband rate wave plate λ, 2,106 expression photoelectric cells.Wherein data processing equipment adopts computer data acquiring and temperature demonstration or single-chip microcomputer and digital display direct-reading output.
Fig. 2 is the physical construction stereographic map of the semi-transparent semi-reflecting divided beam system of realization Fig. 1.This temperature measuring equipment utilizes semi-transparent semi-reflecting lens to realize the filtering of beam split dual wavelength.This temperature measuring equipment comprises that mainly light path beam split opto-electronic conversion, signal amplify, data acquisition process display system three parts.In Fig. 2, Reference numeral 201 expression adjustable focus imaging lens, 202 expression collimation lenses, the semi-transparent semi-reflecting lens of 203 expressions, 204 expression arrowband rate wave plate λ
1, 205 expression arrowband rate wave plate λ
2, 206 expression photoelectric cells, 207 expression signal amplifiers, 208 expression computing machines.Wherein collimation lens 202, semi-transparent semi-reflecting lens 203, arrowband rate wave plate λ
1204, arrowband rate wave plate λ
2205, photoelectric cell 206 corresponds respectively to collimation lens 102, semi-transparent semi-reflecting lens 103, the arrowband rate wave plate λ among Fig. 1
1104, arrowband rate wave plate λ
2105, photoelectric cell 106.
Fig. 3 is the signal amplification circuit figure that realizes according to the semi-transparent semi-reflecting divided beam system among Fig. 1.
Fig. 4 is the synoptic diagram according to narrow band filter slice filtering system of the present utility model; In Fig. 4, Reference numeral 401 expression adjustable focus imaging lens, 402 expression collimation lenses, 403 expression arrowband rate wave plate λ
1, 404 expression photoelectric cells.Wherein data processing equipment adopts computer data acquiring and temperature demonstration or single-chip microcomputer and digital display direct-reading output.
Fig. 5 is the physical construction stereographic map of the narrow band filter slice divided beam system of realization Fig. 4.Utilize light beam oblique incidence narrow band filter slice and the long minute differences of vertical incidence time institute filtering, realize beam splitting and filtering.Wherein be divided into light path and comprise that mainly beam split opto-electronic conversion, signal amplify, data acquisition process display system three parts.Reference numeral 501 expression adjustable focus imaging lens, 502 expression collimation lenses, 503 expression arrowband rate wave plate λ
1, 504 expression photoelectric cells, 505 expression signal amplification circuits.
Fig. 6 is the signal reason figure according to the prism wedge beam splitting system method of the utility model the 3rd embodiment.In Fig. 6, Reference numeral 601 expression adjustable focus imaging lens, 602 expression collimation lenses, 603 expression arrowband rate wave plate λ
1, 604 expression arrowband rate wave plate λ
2, 605 expression photoelectric cells, 606 expression wedge shape reflecting prisms.Wherein data processing equipment adopts computer data acquiring and temperature demonstration or single-chip microcomputer and digital display direct-reading output.
Fig. 7 is the physical construction stereographic map of the prism wedge beam splitting system of realization Fig. 6, this temperature measuring equipment utilizes the prism wedge that can finely tune that the incoming signal light beam is divided into two-way, realize dual wavelength filtering, this temperature measuring equipment system comprises that light path beam split opto-electronic conversion, signal amplify, data acquisition process display system three parts.Wherein Reference numeral 701 is represented the adjustable focus imaging lens, 702 expression collimation lenses, 703 expression arrowband rate wave plate λ
1, 704 expression arrowband rate wave plate λ
2, 705 expression photoelectric cells, 706 expression wedge shape reflecting prisms, 707 expression signal amplification circuits.
Three kinds of technical schemes that technical matters adopted that the utility model solves are: one, the signal that will from imaging lens, collect (or collimation back), utilize semi-transparent semi-reflecting to be divided into two bundles, then, in the two-beam road, add the narrow band filter slice filtering of different wave length respectively, behind two filter plates, utilize photoelectric cell to carry out input.Its two, the signal that will collect from imaging lens (or collimation back) utilizes a narrow band filter slice to be divided into reflection and transmission two bundles, then, the narrow band filter slice filtering of the identical wavelength of adding in reflected light path; Behind filter plate, utilize photoelectric cell to carry out input.Because when narrow band filter slice tilt to be placed, the filter wavelength of transmission peak wavelength during with vertical transmission has skew, thereby utilizes the filter plate of two identical filtering bands to realize the purpose of dual wavelength filtering.They are three years old, the signal that will from imaging lens, collect (or collimation back), be divided into two bundles by the wedge shape reflecting prism, then, the narrow band filter slice filtering that in the two-beam road, adds different wave length respectively, utilize photoelectric cell to carry out input behind two filter plates, the wedge shape reflecting prism is convenient to little moving, to reach the purpose of the branch light energy beam ratio of regulating two-beam.
Above-mentioned three kinds of technical schemes all finally obtain voltage V
1With voltage V
2, just can obtain the temperature of the object of this signal correspondence at last by the ratio of two voltages.When temperature one timing, when causing radiation signal to be absorbed to weaken owing to space absorption and environmental fluctuating, but signal is differed very little (about tens nanometers) by the two-way filter wavelength of beam splitting, being surely belonged to geometric ratio by the two-way radiation signal of beam splitting absorbs, the ratio that has so just guaranteed two output voltage is constant, so measurement result is not absorbed by or not the space and the influence of environmental fluctuating.
Fig. 8 is the one-piece construction synoptic diagram that utilizes the test macro of the beam splitting system formation among Fig. 1,4,6.In test macro illustrated in Figure 8, can adopt the beam splitting system among Fig. 1,4,6 respectively.
In the temperature measuring equipment in adopting the foregoing description, can be for the fixing aiming of actual measuring system, under actual operating conditions, use standard thermometer (for example platinum-resistance thermometer) field calibration, revise thereby just need not carry out " emissivity ", and then solved the difficult problem that " emissivity " that the infrared measurement of temperature field midium or long term fails to solve revised.
Fig. 9 (a) and Fig. 9 (b) are respectively pictorial diagram and the corresponding structural representations according to proving installation of the present utility model.In Fig. 9, Reference numeral 901 expression adjustable focus imaging lens, 902 expression collimation lenses, 903 expression semi-transparent semi-reflecting lens, 904 expression arrowband rate wave plate λ
1, 905 expression arrowband rate wave plate λ
2, 906 expression photoelectric cells, 907 expression signal amplification circuits, 908 expression seal boxes.
In addition, although the clear in conjunction with the accompanying drawings technical scheme that the utility model proposes that described in detail, but with reference to preferred embodiment of the present utility model, this area those skilled in the art be appreciated that, under the situation of the spirit and scope of the present utility model that do not deviate from the claims definition, can in form and details, make various modifications.Therefore, all should fall within the protection domain of the present utility model with reference to the various modifications that technical solutions of the utility model are made.
Claims (5)
1. one kind infrared dual wavelength contactless temperature-measuring device comprises signal acquiring system, beam splitting system, signal amplification circuit and data handling system; It is characterized in that beam splitting system will receive light signal through signal acquiring system and be divided into two-beam, this two-beam carries out filtering by different narrow band filter slices respectively, then after signal amplification circuit is handled, what the photelectric receiver in Usage data collection and the display system received handles latter two signal through signal amplification circuit, utilizes the ratio of two signals that data handling system receives according to photelectric receiver to measure temperature at last.
2. according to the infrared dual wavelength contactless temperature-measuring device of claim 1, it is characterized in that beam splitting system adopts semi-transparent semi-reflecting divided beam system.
3. according to the infrared dual wavelength contactless temperature-measuring device of claim 1, it is characterized in that beam splitting system adopts the narrow band filter slice filtering system.
4. according to the infrared dual wavelength contactless temperature-measuring device of claim 1, it is characterized in that beam splitting system adopts the prism wedge beam splitting system.
5. according to the infrared dual wavelength contactless temperature-measuring device one of among the claim 2-4, it is characterized in that data handling system comprises data acquisition and display system.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN2009201453732U CN201561803U (en) | 2009-03-20 | 2009-03-20 | Infrared double-wave length non-contact temperature measuring device |
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| CN2009201453732U CN201561803U (en) | 2009-03-20 | 2009-03-20 | Infrared double-wave length non-contact temperature measuring device |
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| CN201561803U true CN201561803U (en) | 2010-08-25 |
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Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102207407A (en) * | 2011-01-18 | 2011-10-05 | 燕山大学 | Temperature on-line measuring device in process of forging large-scale forge pieces |
| CN102252757A (en) * | 2011-06-14 | 2011-11-23 | 山东大学 | Double-color infrared thermometer applied to testing of cutting temperature of machine tool |
| CN102620833A (en) * | 2011-02-01 | 2012-08-01 | 田乃良 | Infrared temperature measurement method and infrared temperature measurement system |
| CN103427897A (en) * | 2012-05-23 | 2013-12-04 | 信泰光学(深圳)有限公司 | Light splitting detection system |
| CN103837237A (en) * | 2012-11-23 | 2014-06-04 | 哈尔滨市三和佳美科技发展有限公司 | Dual-color infrared thermometer special for measuring train axle temperature |
| WO2015081727A1 (en) * | 2013-12-06 | 2015-06-11 | 北京智朗芯光科技有限公司 | Self-calibration apparatus and method for real-time temperature measurement system of mocvd device |
| CN105527024A (en) * | 2016-02-04 | 2016-04-27 | 北京理工大学 | Temperature measurement device, system and method based on optical radiation |
| CN109556730A (en) * | 2018-12-05 | 2019-04-02 | 南京沪友冶金机械制造有限公司 | A kind of coke oven temperature measuring device |
| CN112212977A (en) * | 2020-09-22 | 2021-01-12 | 北京理工大学 | High-speed high-resolution high-precision ultrahigh-temperature molten pool temperature field online monitoring device and method |
-
2009
- 2009-03-20 CN CN2009201453732U patent/CN201561803U/en not_active Expired - Fee Related
Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102207407A (en) * | 2011-01-18 | 2011-10-05 | 燕山大学 | Temperature on-line measuring device in process of forging large-scale forge pieces |
| CN102620833A (en) * | 2011-02-01 | 2012-08-01 | 田乃良 | Infrared temperature measurement method and infrared temperature measurement system |
| CN102252757A (en) * | 2011-06-14 | 2011-11-23 | 山东大学 | Double-color infrared thermometer applied to testing of cutting temperature of machine tool |
| CN103427897A (en) * | 2012-05-23 | 2013-12-04 | 信泰光学(深圳)有限公司 | Light splitting detection system |
| CN103837237A (en) * | 2012-11-23 | 2014-06-04 | 哈尔滨市三和佳美科技发展有限公司 | Dual-color infrared thermometer special for measuring train axle temperature |
| WO2015081727A1 (en) * | 2013-12-06 | 2015-06-11 | 北京智朗芯光科技有限公司 | Self-calibration apparatus and method for real-time temperature measurement system of mocvd device |
| CN105527024A (en) * | 2016-02-04 | 2016-04-27 | 北京理工大学 | Temperature measurement device, system and method based on optical radiation |
| CN105527024B (en) * | 2016-02-04 | 2019-04-19 | 北京理工大学 | Temperature measuring equipment, system and method based on light radiation |
| CN109556730A (en) * | 2018-12-05 | 2019-04-02 | 南京沪友冶金机械制造有限公司 | A kind of coke oven temperature measuring device |
| CN112212977A (en) * | 2020-09-22 | 2021-01-12 | 北京理工大学 | High-speed high-resolution high-precision ultrahigh-temperature molten pool temperature field online monitoring device and method |
| CN112212977B (en) * | 2020-09-22 | 2022-02-08 | 北京理工大学 | High-speed high-resolution high-precision ultrahigh-temperature molten pool temperature field online monitoring device and method |
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Granted publication date: 20100825 Termination date: 20110320 |