CN201527306U - Dynamically detecting system for infrared focal plane detector component - Google Patents
Dynamically detecting system for infrared focal plane detector component Download PDFInfo
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- CN201527306U CN201527306U CN2009202225790U CN200920222579U CN201527306U CN 201527306 U CN201527306 U CN 201527306U CN 2009202225790 U CN2009202225790 U CN 2009202225790U CN 200920222579 U CN200920222579 U CN 200920222579U CN 201527306 U CN201527306 U CN 201527306U
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Abstract
The utility model discloses a dynamically detecting system for an infrared focal plane detector component, which specifically comprises a testing main system, a testing slave system and an environmental testing box, wherein the environmental testing box is internally provided with at least one group of infrared focal plane detector components consisting of an infrared focal plane detector, a refrigerating machine and a dewar; the testing main system, the testing slave system and the environmental testing box are connected with one another; the testing main system is responsible for giving out power control parameters to the testing slave system, monitoring working state parameters of the environmental testing box, sending a driving pulse signal to the infrared detector in the environmental testing box and receiving a measuring signal back feed by the infrared detector; and the testing slave system is responsible for providing a working power supply for the infrared detector in the environmental testing box and monitoring the working parameters of the refrigerating machine and the dewar. The system better realizes the dynamic detection on the infrared focal plane detector component.
Description
Technical Field
The utility model relates to an infrared focal plane test field especially relates to an infrared focal plane detector subassembly dynamic verification system.
Background
The infrared focal plane detector component relates to a plurality of technical fields, such as microelectronics, precision machinery, optics, refrigeration and the like, and has the advantages of complex structure, more components and high precision requirement, so that the reliability test technology is more difficult than the traditional electronic components. The European and American countries invest a great amount of technical force in the reliability of military products, research reliability evaluation methods, strengthen reliability design and verify work, and effectively improve product quality. At present, the performance indexes of partial domestic detectors are close to or even better than those of similar products abroad, but certain difference exists in reliability, and the practical application of the assembly is restricted. The reasons are mainly 2: firstly, the existing process level is limited, and secondly, the reliability test work is not in place. The reliability test of the domestic infrared focal plane detector basically adopts a method for quality consistency test in a pre-research or type spectrum project identification stage, the key point is environmental adaptability examination (high-temperature storage, low-temperature storage, temperature shock, vibration, shock and the like), and the reliability test belongs to a static test (non-powered operation) for a detector assembly. Therefore, it is urgently needed to develop a reliability test, i.e. a dynamic test, capable of simulating the actual working state of the component. Because the infrared focal plane detector assembly has a relatively complex structure, a wide technical scope, and a high price and a small quantity, the dynamic test and the test evaluation of the infrared focal plane detector assembly have higher technical difficulty. The dynamic test is greatly different from the static test in test conditions and test methods, and because the assembly is in a working state, the test and test are relatively complex and cannot be completed by common traditional test equipment, and the research work of the dynamic test and the test technology is required.
In order to better verify reliability design and improve product reliability, an application is used as a guide to develop a dynamic reliability test of the infrared focal plane detector assembly, a corresponding dynamic test and a corresponding test platform are established, and the reliability problem of the assembly in the application is exposed and analyzed through a careful and deep reliability test so as to guide the reliability design and process control of the infrared focal plane assembly and enable the production quality of a core assembly of military equipment to reach a practical level.
SUMMERY OF THE UTILITY MODEL
The utility model provides an infrared focal plane detector subassembly dynamic verification system for solve the problem that can not be fine among the prior art realize the dynamic reliability test of infrared focal plane detector subassembly.
Specifically, the utility model provides a pair of infrared focal plane detector subassembly dynamic verification system, include: a test master system, a test slave system and an environmental test chamber,
at least one group of infrared focal plane detector components consisting of an infrared focal plane detector, a refrigerator and a Dewar are arranged in the environment test chamber;
the test master system comprises: the system comprises system monitoring equipment, infrared focal plane detector testing equipment, a collection card adapter box, a pulse adapter box and infrared focal plane detector driving circuits which correspond to the infrared focal plane detector components one by one;
the test slave system includes: the infrared focal plane detector assembly power supply controller, the infrared focal plane detector assembly driving power supply and the refrigerator power supply;
the test main system is respectively connected with the test slave system and the environmental test box through the system monitoring equipment and is used for issuing power supply control parameters to the test slave system, monitoring working state parameters of the environmental test box, sending driving pulse signals to the infrared focal plane detector in the environmental test box through the infrared focal plane detector test equipment, the pulse switching box and the infrared focal plane detector driving circuit in sequence when the detection preparation work of the detection system is finished, and receiving measurement signals fed back by the infrared focal plane detector through the infrared focal plane detector driving circuit, the acquisition card switching box and the infrared focal plane detector test equipment in sequence;
the test slave system is connected with the system monitoring equipment of the test master system through the power controller of the infrared focal plane detector assembly, the drive power supply of the infrared focal plane detector assembly is respectively connected with the detector drive circuit in the test master system and the Dewar and the refrigerator in the environmental test chamber, and the infrared focal plane detector assembly is used for providing a working power supply when receiving the power control parameters sent by the test master system.
Wherein, infrared focal plane detector test equipment includes: an upper computer interface, a pulse output card, a data acquisition card and a switch card,
the infrared focal plane detector testing equipment is connected with the system monitoring equipment through the upper computer interface and is used for receiving a control instruction sent by the system monitoring equipment;
the infrared focal plane detector testing equipment is connected with the pulse switching box through a pulse output card and is used for sending a driving pulse signal to the pulse switching box;
the data acquisition card and the switch card in the infrared focal plane detector testing equipment are respectively connected with the acquisition card adapter box, receive the multi-path acquisition measurement signals sent by the acquisition card adapter box through the switch card, and select one path of acquisition measurement signals in a time-sharing manner to be sent to the fast data acquisition card through the acquisition card adapter box.
Furthermore, the infrared focal plane detector testing equipment further comprises a reserved slot position, and the reserved slot position is used for detecting the function expansion of the system.
Further, the infrared focal plane detector driving circuit includes: the infrared focal plane detector comprises a drive circuit output interface, an infrared focal plane detector drive pulse interface, an infrared focal plane detector drive power supply interface and an input/output interface of the infrared focal plane detector;
the infrared focal plane detector driving pulse interface is connected with the pulse switching box and used for receiving a driving pulse signal sent by the pulse switching box;
the infrared focal plane detector driving power supply interface is connected with an infrared focal plane detector assembly driving power supply in the test slave system and used for receiving driving voltage sent by the infrared focal plane detector assembly driving power supply;
the input/output interface of the infrared focal plane detector is connected with the infrared focal plane detector in the environmental test chamber and used for sending the pulse signal and the driving voltage to the infrared focal plane detector and receiving a measurement signal fed back by the infrared focal plane detector;
and the drive circuit output interface is connected with the acquisition card adapter box and is used for sending the measurement signal fed back by the infrared focal plane detector to the acquisition card adapter box.
Further, the power controller of the infrared focal plane detector assembly comprises: the remote control system comprises an upper computer interface, a refrigerator power supply monitoring interface and an infrared focal plane detector assembly driving power supply remote control interface;
infrared focal plane detector subassembly power controller pass through host computer interface with system monitoring equipment in the test main system links to each other, through refrigerator power monitoring interface with the refrigerator power links to each other, through infrared focal plane detector subassembly drive power supply remote control interface with infrared focal plane detector subassembly drive power supply links to each other for receive the power control parameter that test main system passed through system monitoring equipment and sent, control infrared focal plane detector subassembly drive power supply and refrigerator power do infrared focal plane detector subassembly provides working power supply.
Further, the infrared focal plane detector assembly driving power supply comprises: the system comprises a refrigerator power interface, a program control interface and an infrared focal plane detector assembly power output interface;
infrared focal plane detector subassembly drive power supply pass through refrigerator power interface with the refrigerator power links to each other, through program control interface with infrared focal plane detector subassembly power controller links to each other, through infrared focal plane detector subassembly power output interface respectively with infrared focal plane detector drive circuit with dewar, refrigerator in the environmental test case link to each other for to infrared focal plane detector subassembly provides working power supply.
Compared with the prior art, the utility model has the advantages of it is following:
(1) the test main system is controlled by a computer, a PXI (PCI eXtensions for Instrumentation) acquisition subsystem stably and reliably operates independently and is monitored by a refrigerator specially, the whole equipment hardware protection system effectively avoids the loss caused by unexpected conditions in the control process, the automation of the operation of the whole set of equipment is realized, and the personnel attendance is not needed;
(2) the system provided by the utility model can stably and reliably monitor various parameters of the component in the working state for a long time, has the functions of parameter setting, state monitoring, index testing and abnormity alarming, and can independently complete the refrigeration cycle test and long-term work examination of the detector;
(3) the system provided by the utility model can test a plurality of components at the same time, and can realize the independent control and operation of any test component in the test process, thereby having great flexibility and adaptability;
(4) the utility model provides a sufficient interface has been reserved to the system, and the extensible ability is strong.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
FIG. 1 is a structural diagram of a dynamic detection system of an infrared focal plane detector assembly provided by the present invention;
fig. 2 is a structural diagram of a dynamic detection system of an infrared focal plane detector assembly provided by an embodiment of the present invention;
FIG. 3 is a view of an embodiment of the present invention illustrating a layout of an infrared focal plane detector assembly;
fig. 4 is a schematic structural diagram of a slave system in an embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
The utility model provides an infrared focal plane detector subassembly dynamic verification system for solve the problem that can not be fine among the prior art realize the dynamic reliability test of infrared focal plane detector subassembly.
Specifically, the utility model provides a pair of infrared focal plane detector subassembly dynamic verification system, as shown in FIG. 1, include: test master system 110, test slave system 120 and environmental test chamber 130,
at least one group of infrared focal plane detector components consisting of an infrared focal plane detector 131, a refrigerator 132 and a Dewar 133 are arranged in the environmental test chamber 130;
testing the host system 110 includes: the system comprises a system monitoring device 111, an infrared focal plane detector testing device 112, an acquisition card adapter 113, a pulse adapter 114 and infrared focal plane detector driving circuits 115 corresponding to the infrared focal plane detector components one by one;
the test slave system 120 includes: an infrared focal plane detector assembly power supply controller 121, an infrared focal plane detector assembly driving power supply 122 and a refrigerator power supply 123;
specifically, the test master system 110 is connected to the test slave system 120 and the environmental test chamber 130 through the system monitoring device 111, and is configured to issue power control parameters to the test slave system 120, monitor working state parameters of the environmental test chamber 130, and when the detection preparation work of the detection system is completed, send a driving pulse signal to the infrared focal plane detector 131 in the environmental test chamber 130 sequentially through the infrared focal plane detector testing device 112, the pulse adapter box 114, and the infrared focal plane detector driving circuit 115, and receive a measurement signal fed back by the infrared focal plane detector 131 sequentially through the infrared focal plane detector driving circuit 115, the acquisition card adapter box 113, and the infrared focal plane detector testing device 112;
the test slave system 120 is connected to the system monitoring device 111 of the test master system 110 through the power controller 121 of the infrared focal plane detector assembly, and is connected to the infrared focal plane detector driving circuit 115 of the test master system 110 and the dewar 133 and the refrigerator 132 in the environmental test chamber 130 through the infrared focal plane detector assembly driving power supply 122, respectively, so as to provide a working power supply for the infrared focal plane detector assembly when receiving the power control parameter sent by the test master system 110.
Wherein the infrared focal plane detector test equipment 112 includes: the device comprises an upper computer interface, a pulse output card, a data acquisition card and a switch card;
specifically, the infrared focal plane detector test device 112 is connected to the system monitoring device 111 through an upper computer interface, and is configured to receive a control instruction issued by the system monitoring device 111;
the infrared focal plane detector testing equipment 112 is connected with the pulse adapter 114 through a pulse output card and is used for sending a driving pulse signal to the pulse adapter 114;
the data acquisition card and the switch card in the infrared focal plane detector testing device 112 are respectively connected with the acquisition card adapter 113, and receive the multiple paths of acquisition measurement signals sent by the acquisition card adapter 113 through the switch card, and select one path of acquisition measurement signal in time division and send the signal to the data acquisition card through the acquisition card adapter 113.
Further, the infrared focal plane detector testing device 112 further includes a reserved slot position, and the reserved slot position is used for detecting the function expansion of the system.
Further, the utility model provides an in the system, infrared focal plane detector drive circuit 115 includes: the infrared focal plane detector comprises a drive circuit output interface, an infrared focal plane detector drive pulse interface, an infrared focal plane detector drive power supply interface and an input/output interface of the infrared focal plane detector;
the infrared focal plane detector driving pulse interface is connected with the pulse adapter 114 and used for receiving a driving pulse signal sent by the pulse adapter 114;
the infrared focal plane detector driving power supply interface is connected with an infrared focal plane detector assembly driving power supply 122 in the test slave system 120 and is used for receiving driving voltage sent by the infrared focal plane detector assembly driving power supply 122;
an input/output interface of the infrared focal plane detector is connected with an infrared focal plane detector 131 in the environmental test chamber 130, and is used for sending the pulse signal and the driving voltage to the infrared focal plane detector 131 and receiving a measurement signal fed back by the infrared focal plane detector 131;
the output interface of the driving circuit is connected to the adapter box 113 of the acquisition card, and is configured to send the measurement signal fed back by the infrared focal plane detector 131 to the adapter box 113 of the acquisition card.
Further, the utility model provides an in the system, infrared focal plane detector subassembly power supply controller 121 includes: the remote control system comprises an upper computer interface, a refrigerator power supply monitoring interface and an infrared focal plane detector assembly driving power supply remote control interface;
infrared focal plane detector subassembly power controller 121 links to each other through upper computer interface and system monitoring device 111 in the test main system 110, link to each other through refrigerator power monitoring interface and refrigerator power 123, link to each other through infrared focal plane detector subassembly drive power remote control interface and infrared focal plane detector subassembly drive power 122, a power control parameter for receiving test main system 110 and pass through system monitoring device 111 and send, control infrared focal plane detector subassembly drive power 122 and refrigerator power 123 provide working power for infrared focal plane detector subassembly.
Further, the utility model provides an in the system, infrared focal plane detector subassembly drive power supply 122 includes: the system comprises a refrigerator power interface, a program control interface and an infrared focal plane detector assembly power output interface;
infrared focal plane detector subassembly drive power supply 122 links to each other with refrigerator power supply 123 through refrigerator power interface, links to each other with infrared focal plane detector subassembly power controller 121 through program control interface, links to each other with dewar 133, refrigerator 132 in infrared focal plane detector drive circuit 115 and the environmental test case 130 respectively through infrared focal plane detector subassembly power output interface for provide working power supply to infrared focal plane detector subassembly.
A preferred embodiment of the invention is given below with reference to fig. 2 to 4, and the technical details of the invention are further given in conjunction with the description of the embodiment, so that the structural and functional features of the invention can be better explained.
As shown in fig. 2, for the embodiment of the present invention provides a structural schematic diagram of a dynamic detection system for an infrared focal plane detector assembly, which specifically includes: a master system, a slave system and an environmental test chamber, wherein,
at least one group of infrared focal plane detector assemblies are arranged in the environmental test chamber, and the infrared focal plane detector assemblies mainly comprise three parts: infrared focal plane detector, refrigerator and dewar. Specifically, the deployment diagram of the three parts is shown in fig. 3, wherein the infrared focal plane detector is a core component, and the refrigerator and the dewar jointly provide a deep low temperature environment for the infrared focal plane detector, which is about 77k absolute temperature; a Dewar temperature measuring diode is also arranged in the Dewar. This embodiment uses four groups of infrared focal plane detector assemblies as an example to illustrate the specific structure of the system provided by the present invention.
A host system, comprising: the upper monitoring computer 100, the infrared focal plane detector testing system 200, the acquisition card adapter box 300, the pulse adapter box 400 and the infrared focal plane detector driving circuits 500 which are in one-to-one correspondence with the infrared focal plane detector components; it should be noted that only one general driving circuit of the infrared focal plane detector is shown in fig. 2, but it should be understood that the driving circuit of the infrared focal plane detector includes a plurality of driving circuits of the infrared focal plane detector connected to the infrared focal plane detector assemblies one by one.
The upper monitoring computer 100 has the maximum authority to control all parts of the whole system, monitor all signals of the infrared focal plane detector assembly, automatically complete a preset experimental process and record process data.
A slave system, comprising: an infrared focal plane detector assembly power supply controller 600, an infrared focal plane detector assembly drive power supply 700, and a chiller power supply 800.
The power controller 600 of the infrared focal plane detector assembly monitors performance parameters of the refrigerator and the temperature in the dewar, can autonomously judge whether the working state of the refrigerator is normal or not, and protects the working environment of the infrared focal plane detector within a normal range.
The following describes the components of the master system and the slave system, and the connection relationship and specific functions between the components in detail.
(I) host System
(1) The upper monitoring computer 100 comprises an RS232 serial interface 101, an infrared focal plane detector testing system communication card 102 and an infrared focal plane detector assembly power supply controller communication interface 103, wherein,
the RS232 serial interface 101 is connected with the environmental test chamber and is used as a communication interface between the upper monitoring computer 100 and the environmental test chamber, and the upper monitoring computer 100 can monitor working parameters in the environmental test chamber through the interface;
the infrared focal plane detector testing system communication card 102 is connected with the infrared focal plane detector testing system 200 and serves as a communication interface between the upper monitoring computer 100 and the infrared focal plane detector testing system 300, and the upper monitoring computer 100 sends a control instruction to the infrared focal plane detector testing system 300 through the interface;
the power supply controller communication interface 103 of the infrared focal plane detector assembly is connected with the power supply controller 600 of the infrared focal plane detector assembly in the slave system, and is used as a communication interface between the upper monitoring computer 100 and the slave system, and the upper monitoring computer 100 transmits power supply control parameters to the slave system through the interface and monitors the working parameters of the slave system in real time.
(2) An infrared focal plane detector testing system 200, comprising: an upper computer interface 210, a pulse output card 220, a data acquisition card 230, a switch card 240, a reserved slot position 250, wherein,
the upper computer interface 210 is connected with the infrared focal plane detector test system communication card 102 and is responsible for receiving a control instruction sent by the upper monitoring computer 100;
the pulse output card 220 is connected to an input port of the pulse adaptor box 400, and is responsible for transmitting a driving pulse signal to the pulse adaptor box 400;
the switch card 240 is connected to the output port of the acquisition card adapter 300 and the output port of the pulse adapter 400, and is configured to output a signal in a time-sharing manner according to the multiple collected measurement signals sent by the acquisition card adapter 300 and the synchronous signal output by the pulse adapter 400, and send the signal to the data acquisition card 230 through the acquisition card adapter 300;
the data acquisition card 230 is connected with the acquisition card adapter box 300 and is responsible for receiving a measurement signal sent by the acquisition card adapter box 300;
a slot 250 is reserved for subsequent function expansion.
(3) An acquisition card adapter box 300, comprising: an input port 301, an input output port 302, and an output port 303, wherein,
the input port 301 is connected with the infrared focal plane detector driving circuit 500 and is responsible for receiving a plurality of paths of collected measurement signals sent by the infrared focal plane detector driving circuit 500;
the input/output port 302 is connected with the switch card 240 of the infrared focal plane detector testing system 200;
the output port 303 is connected to the data acquisition card 230.
(4) A pulse junction box 400, comprising: an input port 401 and an output port 402, wherein the input port 401 is connected to the pulse output card 220 of the infrared focal plane detector testing system 200, and the output port 402 is connected to the infrared focal plane detector driving circuit 500;
(5) infrared focal plane detector drive circuit 500, including four interfaces, is respectively: a driving circuit output interface 501, an infrared focal plane detector driving pulse interface 502, an infrared focal plane detector driving power supply interface 503, and an infrared focal plane detector input/output interface 504; wherein,
the driving circuit output interface 501 is connected with the input port 301 of the acquisition card adapter box 300 and is responsible for transmitting a plurality of paths of acquired measurement signals transmitted by the infrared focal plane detector to the acquisition card adapter box 300;
the infrared focal plane detector driving pulse interface 502 is connected with the output port 402 of the pulse transfer box 400 and is responsible for receiving a driving pulse signal sent by the pulse transfer box 400;
the infrared focal plane detector driving power supply interface 503 is connected with a corresponding output interface of the infrared focal plane detector assembly driving power supply 700 and is responsible for receiving the infrared focal plane detector driving voltage sent by the infrared focal plane detector assembly driving power supply 700;
the input/output interface 504 of the infrared focal plane detector is connected with the infrared focal plane detector in the environmental test chamber, and is responsible for sending a driving pulse signal and driving voltage to the infrared focal plane detector and receiving a plurality of paths of acquisition measurement signals sent by the infrared focal plane detector;
the utility model discloses in, infrared focal plane detector during operation needs different signals such as a plurality of DC power supply and a plurality of high-speed or low-speed pulses, so the utility model discloses infrared focal plane detector drive circuit 500 has been designed specially, and this circuit not only provides the pulse and the DC power supply of low noise for infrared focal plane detector, simultaneously, to the output signal plastic of infrared focal plane detector and increase the driving force to back collection system gathers the measurement.
Further, the utility model provides a but the many sets of infrared focal plane detector subassemblies of system concurrent test, this embodiment adopt 4 sets of infrared focal plane detector subassemblies to explain for the example, and the infrared focal plane detector of every set of subassembly will have multichannel signal output, need to reach tens way, tens way AD collection even like this altogether, consequently this system design is AD all the way for multichannel signal timesharing sharing. The output interface 501 of the driving circuit 500 of the infrared focal plane detector is connected to the adapter 300 of the acquisition card through a shielded cable, and then switched and gated by the switch card 240 of the testing system 200 of the infrared focal plane detector to be output.
Further, different infrared focal plane detectors require different driving pulse signals, and even if the same infrared focal plane detector needs different pulses according to different requirements, the pulses are different. Therefore the utility model provides a system design is programmable pulse output, can send different drive pulse signal respectively according to the infrared focal plane detector of difference, and the pulse output card 220 of infrared focal plane detector test system 200 truns into the BNC after pulse switching box 400 to connect promptly.
(II) Slave system
(1) Infrared focal plane detector assembly power supply controller 600, comprising: a manual operation interface 601, an upper computer interface 602, a refrigerator power monitoring interface 603 and 606, and an infrared focal plane detector component driving power remote control interface 607, wherein,
the upper computer interface 602 is connected with the communication interface 103 of the upper monitoring computer 100;
the refrigerator power monitoring interfaces 603 and 606 are respectively connected with the refrigerator power 800;
the remote control interface 607 of the driving power supply of the infrared focal plane detector assembly is connected with the program control interface 725 of the driving power supply 700 of the infrared focal plane detector assembly.
The power controller 600 of the infrared focal plane detector assembly controls the refrigerator power 800 and the driving power 700 of the infrared focal plane detector assembly to provide working voltage for the infrared focal plane detector assembly;
(2) chiller power supply 800 comprising: program control interface 811-814, power output interface 821-824; wherein,
the program control interface 811-814 is connected with the refrigerator power monitoring interface 603-606 in the power controller 600 of the infrared focal plane detector assembly; the power output interfaces 821 and 824 are connected with the driving power supply 700 of the infrared focal plane detector assembly;
(3) infrared focal plane detector assembly drive power supply 700, comprising: a manual operation interface 710, a component power output interface 711 and 714, a refrigerator power interface 721 and 724, and a program control interface 725. Wherein,
the refrigerator power interfaces 721-724 are connected with the power output interface 824-821 in the refrigerator power 800;
the component power output interface 711 and 714 are respectively connected with the infrared focal plane detector driving power interface 503 of the infrared focal plane detector driving circuit 500 and the refrigerator and the Dewar inside the environmental test chamber;
the program control interface 725 is connected to the remote control interface 607 of the infrared focal plane detector module driving power supply in the infrared focal plane detector module power supply controller 600.
The above is a structural block diagram of the slave system, and the working principle of the slave system is further explained by a structural schematic diagram of the slave system as follows: as shown in figure 4 of the drawings,
the power controller 600 of the infrared focal plane detector assembly specifically includes: a programmable controller PLC 610, an analog-to-digital conversion module AD 620, a digital-to-analog conversion module DA 630, a switching value input and output DO 640, a manual operation interface 601 and four interface circuits 650, wherein,
the PLC 610 is the core of the power controller 600 of the infrared focal plane detector assembly;
the interface 655 in the interface circuit 650 is a refrigerator power supply monitoring interface; the set of the interface 654 and the interface 656 in the interface circuit 650 is a remote control interface of the driving power supply of the infrared focal plane detector assembly.
All analog quantity switching values entering the slave system are respectively transmitted to the refrigerator power supply 800 and the drive board power supply after being switched and adjusted by the interface circuit 650, and the switching and working states of all the power supplies are monitored and controlled.
With regard to the system provided by the present invention, the detailed description is provided for the specific process of dynamic detection of the infrared focal plane detector assembly.
After the tested infrared focal plane detector assembly is installed in the environment test box, the three groups of connecting lines of the connecting assembly are connected with the infrared focal plane detector, the dewar and the refrigerator. After the tested component is installed, starting the control software in the main control computer 100, and entering a detection work preparation stage, wherein the specific steps are as follows:
the first step is to carry out the power-on self-test of the system, check whether the communication between each module instrument and the main control computer 100 is normal, and check whether the state of the instrument is correct, and only if all the instruments pass through, the next step of the program can be carried out.
And secondly, waiting for the operator to set the parameters of the environmental test chamber, comparing the parameters of the environmental test chamber set by the operator with the parameters preset in the system, forcibly setting the working mode of the environmental test chamber after the operator confirms that the parameters are correct, and entering the next step after the operator sets the parameters to be correct.
And thirdly, setting the working parameters of the refrigerator and downloading the working parameters to the slave system.
And fourthly, setting the type and the operation parameters of the infrared focal plane detector, driving the infrared focal plane detector to normally work and checking whether the output of the infrared focal plane detector is normal.
And fifthly, setting the process parameters of the experiment and opening or closing the infrared focal plane detector assembly according to the working state and the operation parameters of the environmental test chamber.
The first five steps set a plurality of parameters for the experiment operation, and the experiment can be started after the experiment is completed correctly.
After the test is started, the main system automatically starts the operation environment test box, and then reads the state parameters of the environment test box and the state parameters of the slave system (namely the refrigerator parameters and the Dewar temperature). And judging to execute different subroutines such as starting and closing the components according to the read parameters and the set experimental parameters. The state parameters of the entire system were recorded about 1 minute during the experiment, including: the operation state of the environmental test chamber, the temperature and humidity value, alarm information, the refrigerator state parameters (power supply voltage, current and the like) of the components of each station, the temperature value in the Dewar, the basic performance parameters of the infrared focal plane detector and the like. The main control computer 100 monitors all parameters of the whole experimental system and strictly monitors the state of the components, so that the supervision of workers is basically not needed in the experimental process.
Independent monitoring of the temperature within the refrigerator and dewar is accomplished from the system. First, the design purpose and meaning of the slave system will be described. It can be seen from the above that the whole experimental system is very large, and there are many parameters to be monitored, which will bring heavy burden to the main system if the main control computer 100 in the main system completes the operation, and meanwhile, since the state of the refrigerator and the temperature in the dewar are also necessary conditions for the normal operation of the infrared focal plane detector, the normal operation of the refrigerator is directly related to whether the infrared focal plane detector will be damaged, so that it is very important, and the real-time requirement is also very high. In summary, the work is proposed independently to form an independent slave system, which works independently from the master system, and can process itself when the state of the refrigerator is abnormal, and the master system can change the set value and other parameters of the slave system and read the state parameters of the slave system, so that the flow of the whole experiment is met. After the parameters of the refrigerator are set, the refrigerator can be started to operate, the system can constantly monitor each parameter of the refrigerator and the Dewar temperature to determine whether the power supply of the infrared focal plane detector can be started or closed (in a manual mode, the power supply of the detector is manually started, and in a remote control mode, the power supply of the infrared focal plane detector can be automatically started after the temperature of the refrigerator is controlled), but the power supply of the infrared focal plane detector can be closed whenever any alarm is abnormal, so that the components are protected, and loss is reduced.
The slave system can work independently from the master system, so that a manual function is reserved during design, and before the experiment is started, the slave system can be operated manually to verify whether the connection of each part is normal or not, and even to finish some simple small experiments, such as a normal-temperature component switch experiment and the like.
In the system provided by the utility model, the main system is controlled by a computer, the PXI acquisition subsystem is stable and reliable and operates independently with the special monitoring of the refrigerator, the whole equipment hardware protection system effectively avoids the loss caused by unexpected conditions in the control process, realizes the automation of the operation of the whole set of equipment, and does not need to be attended by personnel; the applicable component is wide in variety range; a plurality of components can be tested; enough interfaces are reserved, and the extensible capability is strong.
It will be apparent to those skilled in the art that various changes and modifications may be made without departing from the spirit and scope of the invention. Thus, if such modifications and variations of the present invention fall within the scope of the claims and their equivalents, the present invention is also intended to include such modifications and variations.
Claims (6)
1. An infrared focal plane detector assembly dynamic inspection system, comprising: a test master system, a test slave system and an environmental test chamber,
at least one group of infrared focal plane detector components consisting of an infrared focal plane detector, a refrigerator and a Dewar are arranged in the environment test chamber;
the test master system comprises: the system comprises system monitoring equipment, infrared focal plane detector testing equipment, a collection card adapter box, a pulse adapter box and infrared focal plane detector driving circuits which correspond to the infrared focal plane detector components one by one;
the test slave system includes: the infrared focal plane detector assembly power supply controller, the infrared focal plane detector assembly driving power supply and the refrigerator power supply;
the test main system is respectively connected with the test slave system and the environmental test box through the system monitoring equipment and is used for issuing power supply control parameters to the test slave system, monitoring working state parameters of the environmental test box, sending driving pulse signals to the infrared focal plane detector in the environmental test box through the infrared focal plane detector test equipment, the pulse switching box and the infrared focal plane detector driving circuit in sequence when the detection preparation work of the detection system is finished, and receiving measurement signals fed back by the infrared focal plane detector through the infrared focal plane detector driving circuit, the acquisition card switching box and the infrared focal plane detector test equipment in sequence;
the test slave system is connected with the system monitoring equipment of the test master system through the power controller of the infrared focal plane detector assembly, the drive power supply of the infrared focal plane detector assembly is respectively connected with the detector drive circuit in the test master system and the Dewar and the refrigerator in the environmental test chamber, and the infrared focal plane detector assembly is used for providing a working power supply when receiving the power control parameters sent by the test master system.
2. The infrared focal plane detector assembly dynamic detection system of claim 1, wherein the infrared focal plane detector testing device comprises: an upper computer interface, a pulse output card, a data acquisition card and a switch card,
the infrared focal plane detector testing equipment is connected with the system monitoring equipment through the upper computer interface and is used for receiving a control instruction sent by the system monitoring equipment;
the infrared focal plane detector testing equipment is connected with the pulse switching box through a pulse output card and is used for sending a driving pulse signal to the pulse switching box;
the data acquisition card and the switch card in the infrared focal plane detector testing equipment are respectively connected with the acquisition card adapter box, receive the multi-path acquisition measurement signals sent by the acquisition card adapter box through the switch card, and select one path of acquisition measurement signals in a time-sharing manner to be sent to the fast data acquisition card through the acquisition card adapter box.
3. The dynamic infrared focal plane detector package inspection system of claim 2, wherein the infrared focal plane detector test equipment further comprises a pre-reserved slot for detecting functional expansion of the system.
4. The dynamic infrared focal plane detector assembly detection system of claim 1 or 2, wherein the infrared focal plane detector drive circuit comprises: the infrared focal plane detector comprises a drive circuit output interface, an infrared focal plane detector drive pulse interface, an infrared focal plane detector drive power supply interface and an input/output interface of the infrared focal plane detector;
the infrared focal plane detector driving pulse interface is connected with the pulse switching box and used for receiving a driving pulse signal sent by the pulse switching box;
the infrared focal plane detector driving power supply interface is connected with an infrared focal plane detector assembly driving power supply in the test slave system and used for receiving driving voltage sent by the infrared focal plane detector assembly driving power supply;
the input/output interface of the infrared focal plane detector is connected with the infrared focal plane detector in the environmental test chamber and used for sending the pulse signal and the driving voltage to the infrared focal plane detector and receiving a measurement signal fed back by the infrared focal plane detector;
and the drive circuit output interface is connected with the acquisition card adapter box and is used for sending the measurement signal fed back by the infrared focal plane detector to the acquisition card adapter box.
5. The dynamic infrared focal plane detector system of claim 1, wherein the power controller for the infrared focal plane detector assembly comprises: an upper computer interface, a refrigerator power supply monitoring interface and an infrared focal plane detector component driving power supply remote control interface,
infrared focal plane detector subassembly power controller pass through host computer interface with system monitoring equipment in the test main system links to each other, through refrigerator power monitoring interface with the refrigerator power links to each other, through infrared focal plane detector subassembly drive power supply remote control interface with infrared focal plane detector subassembly drive power supply links to each other for receive the power control parameter that test main system passed through system monitoring equipment and sent, control infrared focal plane detector subassembly drive power supply and refrigerator power do infrared focal plane detector subassembly provides working power supply.
6. The dynamic infrared focal plane detector assembly detection system of claim 1 or 5, wherein the infrared focal plane detector assembly drive power supply comprises: a power interface of the refrigerator, a program control interface, a power output interface of the infrared focal plane detector component,
infrared focal plane detector subassembly drive power supply pass through refrigerator power interface with the refrigerator power links to each other, through program control interface with infrared focal plane detector subassembly power controller links to each other, through infrared focal plane detector subassembly power output interface respectively with infrared focal plane detector drive circuit with dewar, refrigerator in the environmental test case link to each other for to infrared focal plane detector subassembly provides working power supply.
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| CN2009202225790U CN201527306U (en) | 2009-09-27 | 2009-09-27 | Dynamically detecting system for infrared focal plane detector component |
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Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN103245859A (en) * | 2013-04-26 | 2013-08-14 | 中国科学院上海技术物理研究所 | Improved testing system and method for focal plane detector chip |
| CN104833430A (en) * | 2015-04-17 | 2015-08-12 | 国家电网公司 | Infrared imaging monitoring system based on uncooled infrared detector |
| CN105092054A (en) * | 2015-07-28 | 2015-11-25 | 昆明物理研究所 | Testing evaluation device for pyroelectric non-refrigeration infrared focal plane detector |
| CN108896190A (en) * | 2018-08-16 | 2018-11-27 | 电子科技大学 | Infrared test system and its test method on piece correction |
| CN109029734A (en) * | 2018-06-28 | 2018-12-18 | 电子科技大学 | Infrared focal plane detector multicore test device and test method |
| CN109583018A (en) * | 2018-10-26 | 2019-04-05 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | The sensitive parameter monitoring method and device of infrared focus plane component |
| CN112630679A (en) * | 2020-11-03 | 2021-04-09 | 武汉高芯科技有限公司 | Device and method for testing refrigeration performance of refrigeration assembly of infrared focal plane detector |
| CN114244978A (en) * | 2021-11-25 | 2022-03-25 | 中国空间技术研究院 | Reliability management system and method for infrared camera with infrared refrigerator |
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- 2009-09-27 CN CN2009202225790U patent/CN201527306U/en not_active Expired - Lifetime
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN103245859A (en) * | 2013-04-26 | 2013-08-14 | 中国科学院上海技术物理研究所 | Improved testing system and method for focal plane detector chip |
| CN103245859B (en) * | 2013-04-26 | 2015-03-25 | 中国科学院上海技术物理研究所 | Improved testing system and method for focal plane detector chip |
| CN104833430A (en) * | 2015-04-17 | 2015-08-12 | 国家电网公司 | Infrared imaging monitoring system based on uncooled infrared detector |
| CN105092054A (en) * | 2015-07-28 | 2015-11-25 | 昆明物理研究所 | Testing evaluation device for pyroelectric non-refrigeration infrared focal plane detector |
| CN109029734A (en) * | 2018-06-28 | 2018-12-18 | 电子科技大学 | Infrared focal plane detector multicore test device and test method |
| CN108896190A (en) * | 2018-08-16 | 2018-11-27 | 电子科技大学 | Infrared test system and its test method on piece correction |
| CN109583018A (en) * | 2018-10-26 | 2019-04-05 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | The sensitive parameter monitoring method and device of infrared focus plane component |
| CN109583018B (en) * | 2018-10-26 | 2023-04-18 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | Method and device for monitoring sensitive parameters of infrared focal plane assembly |
| CN112630679A (en) * | 2020-11-03 | 2021-04-09 | 武汉高芯科技有限公司 | Device and method for testing refrigeration performance of refrigeration assembly of infrared focal plane detector |
| CN114244978A (en) * | 2021-11-25 | 2022-03-25 | 中国空间技术研究院 | Reliability management system and method for infrared camera with infrared refrigerator |
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