CN201477155U - Crystal oscillator frequency tester - Google Patents
Crystal oscillator frequency tester Download PDFInfo
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- CN201477155U CN201477155U CN2009201955989U CN200920195598U CN201477155U CN 201477155 U CN201477155 U CN 201477155U CN 2009201955989 U CN2009201955989 U CN 2009201955989U CN 200920195598 U CN200920195598 U CN 200920195598U CN 201477155 U CN201477155 U CN 201477155U
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Priority Applications (1)
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CN2009201955989U CN201477155U (en) | 2009-09-25 | 2009-09-25 | Crystal oscillator frequency tester |
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CN2009201955989U CN201477155U (en) | 2009-09-25 | 2009-09-25 | Crystal oscillator frequency tester |
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CN201477155U true CN201477155U (en) | 2010-05-19 |
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CN2009201955989U Expired - Fee Related CN201477155U (en) | 2009-09-25 | 2009-09-25 | Crystal oscillator frequency tester |
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Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103105530A (en) * | 2013-01-08 | 2013-05-15 | 河北远东通信***工程有限公司 | Detection method for frequency hopping changes of crystal oscillator |
CN103698603A (en) * | 2013-12-27 | 2014-04-02 | 深圳芯邦科技股份有限公司 | Chip, chip clock testing method and chip clock testing system |
CN104849544A (en) * | 2015-02-02 | 2015-08-19 | 天津必利优科技发展有限公司 | Multipath pai network quartz crystal test system and test method |
CN109975617A (en) * | 2019-04-23 | 2019-07-05 | 晶晨半导体(上海)股份有限公司 | A kind of the test circuit and test method of matched crystal load capacitance |
CN112684216A (en) * | 2020-12-29 | 2021-04-20 | 北京无线电计量测试研究所 | Temperature compensation crystal oscillator debugging clamp |
-
2009
- 2009-09-25 CN CN2009201955989U patent/CN201477155U/en not_active Expired - Fee Related
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103105530A (en) * | 2013-01-08 | 2013-05-15 | 河北远东通信***工程有限公司 | Detection method for frequency hopping changes of crystal oscillator |
CN103698603A (en) * | 2013-12-27 | 2014-04-02 | 深圳芯邦科技股份有限公司 | Chip, chip clock testing method and chip clock testing system |
CN103698603B (en) * | 2013-12-27 | 2017-03-15 | 深圳芯邦科技股份有限公司 | A kind of chip and its clock test methodology and chip clock test system |
CN104849544A (en) * | 2015-02-02 | 2015-08-19 | 天津必利优科技发展有限公司 | Multipath pai network quartz crystal test system and test method |
CN109975617A (en) * | 2019-04-23 | 2019-07-05 | 晶晨半导体(上海)股份有限公司 | A kind of the test circuit and test method of matched crystal load capacitance |
CN112684216A (en) * | 2020-12-29 | 2021-04-20 | 北京无线电计量测试研究所 | Temperature compensation crystal oscillator debugging clamp |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
C56 | Change in the name or address of the patentee | ||
CP02 | Change in the address of a patent holder |
Address after: 516002 Guangdong City, Huizhou Digital Industrial Park, No. 4, South District, building 1, floor 2 Patentee after: Huizhou Unionman Technology Co., Ltd. Address before: 516007, Huicheng District, Guangdong Province, Huizhou Road, No. 8 Huayang Building No. 8, 14, 18 floor Patentee before: Huizhou Unionman Technology Co., Ltd. |
|
C56 | Change in the name or address of the patentee |
Owner name: GUANGDONG UNIONMAN TECHNOLOGY CO., LTD. Free format text: FORMER NAME: HUIZHOU UNIONMAN TECHNOLOGY CO., LTD. |
|
CP01 | Change in the name or title of a patent holder |
Address after: 516002 Guangdong City, Huizhou Digital Industrial Park, No. 4, South District, building 1, floor 2 Patentee after: Guangdong Unionman Technology Co., Ltd. Address before: 516002 Guangdong City, Huizhou Digital Industrial Park, No. 4, South District, building 1, floor 2 Patentee before: Huizhou Unionman Technology Co., Ltd. |
|
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20100519 Termination date: 20140925 |
|
EXPY | Termination of patent right or utility model |