CN201378581Y - 动态离子迁移谱的高透过率、快速离子门 - Google Patents
动态离子迁移谱的高透过率、快速离子门 Download PDFInfo
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- CN201378581Y CN201378581Y CN200920088953U CN200920088953U CN201378581Y CN 201378581 Y CN201378581 Y CN 201378581Y CN 200920088953 U CN200920088953 U CN 200920088953U CN 200920088953 U CN200920088953 U CN 200920088953U CN 201378581 Y CN201378581 Y CN 201378581Y
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102903598A (zh) * | 2012-10-24 | 2013-01-30 | 公安部第三研究所 | 一种用于提高传统离子迁移管灵敏度的方法 |
CN104392889A (zh) * | 2014-12-14 | 2015-03-04 | 中国科学院合肥物质科学研究院 | 一种利用交流叠加方法控制离子门的离子迁移谱仪及方法 |
CN105023824A (zh) * | 2015-07-08 | 2015-11-04 | 北京市北分仪器技术有限责任公司 | 一种离子栅门及其制作方法 |
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102903598A (zh) * | 2012-10-24 | 2013-01-30 | 公安部第三研究所 | 一种用于提高传统离子迁移管灵敏度的方法 |
CN102903598B (zh) * | 2012-10-24 | 2015-04-15 | 公安部第三研究所 | 一种用于提高传统离子迁移管灵敏度的方法 |
CN104392889A (zh) * | 2014-12-14 | 2015-03-04 | 中国科学院合肥物质科学研究院 | 一种利用交流叠加方法控制离子门的离子迁移谱仪及方法 |
CN105023824A (zh) * | 2015-07-08 | 2015-11-04 | 北京市北分仪器技术有限责任公司 | 一种离子栅门及其制作方法 |
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C14 | Grant of patent or utility model | ||
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Owner name: HE'NAN RELATIONS INC. Free format text: FORMER NAME: HENAN RELATIONS ELECTRONIC CO., LTD. |
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CP01 | Change in the name or title of a patent holder |
Address after: Stock building No. 1 high tech Zone relations in Henan province Zhengzhou City, Tsui Chuk street 450001 Patentee after: Henan Rilixin Co., Ltd. Address before: Stock building No. 1 high tech Zone relations in Henan province Zhengzhou City, Tsui Chuk street 450001 Patentee before: Henan Relations Electronic Co., Ltd. |
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CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20100106 Termination date: 20180320 |
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CF01 | Termination of patent right due to non-payment of annual fee |