CN201315658Y - Derating test device - Google Patents

Derating test device Download PDF

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Publication number
CN201315658Y
CN201315658Y CNU2008202131943U CN200820213194U CN201315658Y CN 201315658 Y CN201315658 Y CN 201315658Y CN U2008202131943 U CNU2008202131943 U CN U2008202131943U CN 200820213194 U CN200820213194 U CN 200820213194U CN 201315658 Y CN201315658 Y CN 201315658Y
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China
Prior art keywords
derate
test
test cell
unit
control unit
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Expired - Fee Related
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CNU2008202131943U
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Chinese (zh)
Inventor
陈志强
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Konka Group Co Ltd
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Konka Group Co Ltd
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Priority to CNU2008202131943U priority Critical patent/CN201315658Y/en
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Abstract

The embodiment of the utility model discloses a derating test device which comprises a test unit for the derating test, a control unit used for enabling the test unit to carry out the derating test and connected with the test unit and an output unit used for outputting the derating test results and connected with the test unit. By adopting the embodiment of the utility model, the derating test can be carried out to televisions and electronic components in the televisions, so as to enable a designer to design more reasonable applying components, thereby improving the applying reliability of the components and the stability of the derating test device.

Description

A kind of derate testing apparatus
Technical field
The utility model relates to electronic applications, relates in particular to a kind of derate testing apparatus.
Background technology
The design of television set must guarantee also that except will intactly going back the signal of reason TV station transmission television set has certain reliability, promptly will guarantee its failsafe in the regular hour, and being out of order does not damage environment, human body on every side.Reliability design-derate test is exactly to add the derate of components and parts utilization is tested in the test of television set, makes the utilization of components and parts more reliable, more reasonable.
Derate test is exactly that stress that the components and parts of working in television set (are watched) in its normal range of operation is lower than the specified stress of these components and parts under operational environment at that time.Stress has voltage, electric current, power, temperature, frequency, pressure, humidity or the like in the category of electronic component, what we considered for the electronic component in the television set mainly is voltage, electric current, temperature, power, frequency, and stress is measurable data." the specified stress under the operational environment at that time " generally is not meant the value of being indicated in the component specification book, the value of indicating in the specifications is not used under our television set " operational environment at that time " condition generally speaking, at this moment just can only serve as with the mark condition of component specification book with reference to or convert.
But in the prior art, to carry out the inspection of a lot of aspects after the design of television set is finished and be exactly inspection and the evaluation that does not have the derate aspect, thereby make except that the designer or the designer might not know that components and parts use irrational part in the television set, have reduced the reliability of television set.
Summary of the invention
The utility model embodiment technical problem to be solved is, a kind of device that is used for the derate test is provided.Can carry out the derate test to television set and electronic devices and components wherein, to improve the stability in the electronic devices and components use.
In order to solve the problems of the technologies described above, the utility model embodiment provides a kind of device that is used for the derate test, comprising:
Be used to carry out the test cell of derate test;
Be used to control the control unit that described test cell carries out the derate test, described control unit links to each other with described test cell;
Be used to export the output unit of derate test result, described output unit links to each other with described test cell.
Implement the utility model embodiment, have following beneficial effect:
Derate test by to television set and electronic devices and components wherein makes that the utilization of components and parts is more reliable, and is more reasonable, improved the stability of complete machine.
Description of drawings
Fig. 1 is the structural representation of derate testing apparatus among the utility model embodiment;
Fig. 2 is the structural representation of test cell among the utility model embodiment;
Fig. 3 is the structural representation of control unit among the utility model embodiment.
Embodiment
For making the purpose of this utility model, technical scheme and advantage clearer, the utility model is described in further detail below in conjunction with accompanying drawing.
With reference to Fig. 1, the utility model embodiment derate testing apparatus comprises:
Be used to carry out the test cell 2 of derate test.Be used to control the control unit 1 that described test cell carries out the derate test, described control unit 1 links to each other with described test cell 2.Be used to export the output unit 3 of derate test result, described output unit 3 links to each other with described test cell 2.
Wherein, control unit 1 can be controlled the derate test that test cell 2 carries out appointment, and the result that the derate test back of the described appointment of test cell 2 execution will be tested by output unit 3 exports.
With reference to Fig. 3, control unit 1 comprises in the utility model preferred embodiment:
Derate control unit 11 and unit of testing and controlling 12, wherein,
Derate ratio when derate control unit 11 is used to set the test of electronic devices and components derate, for example, derate control unit 11 can carry out the setting of derate ratio according to the concrete applied environment of electronic devices and components that will carry out the derate test and the performance parameter of electronic devices and components itself.
Unit of testing and controlling 12 is used for controlling described test cell according to the derate ratio that described derate control unit 11 is set and carries out the derate test.
Fig. 2 is the structural representation of test cell 2 preferred embodiments among the utility model embodiment, comprising:
Be used for the system test unit 201 of derate test Overall Power Consumption and stand-by power consumption, Overall Power Consumption is an important indicator of television set, and the consumed power of the television set of certain size has certain limit, and is excessive for avoiding Overall Power Consumption, do test.Overall Power Consumption is irrational excessive, must be the loss that inaction is arranged in the TV set circuit, and this loss has comprised that design is unreasonable, incorrect with element, television set is adjusted incorrect or element quality has problem or the like reason.Preferred version is a TV signal of choosing a standard, and 80% of rated value is chosen in sound accompaniment, uses the 1KHz sine wave, and television set watches that in standard state removes to test Overall Power Consumption.
Stand-by power consumption is our energy consumption index, is a restriction to energy savings.Go to make the television set standby can survey stand-by power consumption with remote control
The complete machine high-low pressure that is used for the derate test starts the high-low pressure startup test cell 202 of function, we start test cell 202 with minimum value that is lower than rated voltage and the maximum that is higher than rated voltage by high-low pressure, television set is arranged on the mains switch switching on and shutting down of standard operation state, remote control switch test, can checks that especially it is reducing the low voltage starting ability behind the stand-by power consumption.
The sound output test cell 203 that is used for derate testing audio power output, because the sound accompaniment modulation degree difference that each TV station sends, under the identical volume index indication of television set, output power of speaker is different, if it is excessive except meeting influences the load of power discharging IC, load to power supply also can increase the weight of, and also might produce mechanical oscillation, and this all is to violate us to design wish.Therefore our preferred version be under the sound accompaniment maximum percentage modulation, tv volume index full scale, go the peak power output of test horn by sound power output test cell 203 usefulness 1KHz sine waves.
Be used for the picture tube test cell 204 of derate test picture tube, the derate test that 204 pairs of picture tubes of picture tube test cell carry out mainly is the continuous variation at picture tube.Recently picture tube is in continuous variation, and is from common sphere pipe to flat tube, right angle, pure flat, super flat, 50Hz, 100Hz, short tube, a ultrashort pipe generation, ultrashort Guan Erdai, big or small in addition from 14 cun to 34 cun etc.The deflection current of various picture tubes is all different.
Under the situation of brightness, contrast maximum, measure row, vertical yoke current peak-to-peak value, can predict the current peak of line pipe, estimate that the nominal parameter symbol of line pipe is undesirable from horizontal deflection current peak peak value.Can check from the vertical yoke current peak-to-peak value whether the output current of an IC is lower than the rated value of an IC.
The voltage and current peak value that is used for derate test line pipe, the line pipe test cell 205 of waveform and power consumption, wherein, line pipe test cell 205 is at first to the voltage of line pipe collector electrode, current peak detects, the brightness of television set, contrast is got to maximum, selected standard signal, sandwich voltage probe, current probe just can be measured the collector voltage of line pipe under maximum rating, the peak value of electric current, more just know that with the rated value of line pipe can line pipe that we use operate as normal under this television set, in addition also will check the safety operation area of line pipe sometimes, the respective value of inscribing when same with voltage and electric current is removed the SOA curve in the comparison line pipe specifications exactly.
The voltage of line pipe collector electrode, current waveform detect, this detection is just so uneasy, it will be according to the tester to being familiar with of line pipe operating circuit, to being familiar with of the element of line-scan circuit, parameter, being familiar with, the situation of television set reliability testing is familiar with the waveform of line-scan circuit each point, also to also to be familiar with simultaneously the understanding of picture tube to the production of various types, feedback pre-sales, after sale.Can find out when bad from the voltage of line pipe collector electrode, quality, particularly operating state that current waveform can roughly be judged the line pipe operating state are obvious.
The detection of waveform just is a slight variation sometimes, does not also see the radian of the variation what is big, slight bent angle, trailing edge, and easy ordinary wave more a little is moving, and these all may make line pipe too early end useful life.Except the voltage of line pipe collector electrode, current waveform are detected, sometimes also will be to voltage, the current waveform inspection of line pipe base stage, and the operating state inspection that promotes of row.
(little does not see unusually sometimes after voltage, current waveform detection to the line pipe collector electrode do not have to find very big abnormal conditions, sometimes or even reasonably), also will be to the dissipation power inspection of line pipe, use the power consumption of oscillographic mathematical operation functional test line pipe, when the power consumption of finding line pipe is excessive, check a series of activities parameters such as work wave, circuit parameter, collector waveform fall time, base stage memory time of line pipe again conversely.Also will test the temperature rise of line pipe in case of necessity, those are again after television set work a few hours.
The power supply test unit 206 that is used for derate testing power supply switching tube and/or power supply IC, voltage, current peak that power supply test unit 206 can be used for testing power supply IC and power supply switch tube high pressure input pin detect, also can measure power supply switch tube or the voltage and current of power supply IC under maximum rating, load this moment also should be arranged on maximum rating.
The detection of voltage and current waveform be will according to the application note of specifications and in the past this type of machine precision waveform under normal operative condition observe comparison; note linearity, spike, vibration, level and smooth, unusual etc. generally speaking; it also has the scope of SOA for the power supply pipe; though for component parameters standardization around the power supply IC but also will suitably adjust sometimes; such as adjusting stand-by power consumption; over-current over-voltage protection, EMI interference etc.
The correction tube test cell 207 that is used for derate test correction tube, correction tube test cell 207 is used to test voltage, the current waveform of correction tube, wherein the voltage of correction tube, current waveform flip-flop weigh, voltage waveform generally is exactly the sine wave of band modulation, current waveform is just somewhat different, that is that designers are according to the isoparametric generation that differs of design, pipe arrangement, the adjustment of circuit, if linearity of raster, high pressure, etc. running parameter determine it is acceptable, subjective assessment is passed through again, as long as pipe arrangement is proofreaied and correct, that has also just passed through in the derate test.
The power supply secondary commutation pipe test cell 208 that is used for derate testing power supply secondary commutation pipe, can be by the output loading of power supply secondary commutation pipe test cell 208 testing power supply secondary commutation pipes, select power supply secondary commutation pipe, ordinary circumstance is that surplus is all greater than the rated value of device, but all accidents of the rectifying tube of some low pressure, be familiar with seeing model after the circuit, seeing the circuit purposes is just known to use.But have several problems to note:
The B+ rectifying tube will be noted its electric current, and the leeway of selection needs big, and just unlikely heating is excessive, there is no harm in two in parallel uses when not satisfying temperature rise sometimes;
The rectifying tube of digiboard power supply is directly to supply digiboard sometimes, and electric current is bigger, note choosing.Rectifying tube heating also can be big, select low pressure drop.By voltage stabilizing IC for digiboard to note voltage stabilizing IC input voltage size, note to reduce input voltage on the one hand, reduce the pressure drop of voltage stabilizing IC, will guarantee when standby, to have enough input voltages to give voltage stabilizing IC on the other hand, stable work is arranged to guarantee digiboard;
The distribution of electric current as far as possible evenly allows electric current that rectifying tube undertakes all in certain ratio, not Chong weight, light too light again;
The voltage stabilizing IC and the DC-DC test cell 209 that are used for derate test voltage stabilizing IC and DC-DC, the power consumption of the pressure drop of voltage stabilizing IC and DC-DC test cell 209 each voltage stabilizing of test IC, output current, calculating voltage stabilizing IC is measured DC-DC output current and output voltage to check the carrying load ability of DC-DC.
The power resistor test cell 210 that is used for derate measured power resistance, 210 pairs of power of power resistor test cell are all done the derate test basically more than or equal to the resistance of 2W, and the derate ratio is selected in 1/2, and promptly the resistance of 2W rated value only is used in the circuit of 1W, by that analogy.Fusing resistor, protective resistance are not chosen like this.(with current related) meeting heating that the use power of resistance is big, and have influence on peripheral element.The resistance of some 1W, 1/2W will be noted its electric current and voltage, if big also will suitably the adjusting of electric current and voltage.
The capacity measurement unit 211 that is used for the derate testing capacitor, capacity measurement unit 211 is used for inspection of testing capacitor operating voltage and ripple current, wherein, ripple current is the main cause that causes the electric capacity heating, because the electrolyte of the alminium electrolytic condenser inside in the television set is not fire proofing, overweight when load occurring, electric capacity heating causing inefficacy, cracking even blast, the electrolyte that ignites also can happen occasionally.Mainly the lower pressure rectifier filter capacitor of input rectifying filter capacitor, transformer secondary output B+ rectifying and wave-filtering electric capacity, big electric current, the large-current electric of pincushion correction circuitry are held inspection etc., again with conversion after the electric capacity ripple current relatively, can tentatively determine whether selecting for use appropriately of electric capacity.It is just passable generally to be no more than its rated voltage 80% for the operating voltage of electric capacity.
Since ripple current directly influence be the temperature rise of electric capacity, so measure the situation of selecting for use that the temperature rise of electric capacity also can be checked electric capacity, will both check that under doubt situation ripple current also checks temperature rise.
Be used for derate test field IC, look the IC test cell 212 of putting IC, 212 couples of field IC of IC test cell, look and put IC and carry out the derate test, this only does general inspection, the rated value that is no more than IC is just passable.Sometimes the temperature rise of an IC is relevant with operating voltage, has no idea again this moment to adjust, adjust to change switch transformer, and be major issue.That will equilibrium once, can remove to change the field IC of another kind of model or strengthen radiator area and solve.Look and put IC or look to put pipe mainly be problem of temperature rise, derate was not found any problem.
Therefore the utility model embodiment derate testing apparatus can carry out the derate test to television set and electronic component thereof, thereby makes the utilization of components and parts more reliable, more reasonable, has improved the stability of complete machine.
Need to prove, in the test cell 2 of other utility model embodiment derate device, also can include only any one or the arbitrarily combination of unit in above-mentioned each test cell.Simultaneously, described test cell 2 also can carry out the derate test to electronic device except that television set or single electronic devices and components.
Above disclosed only is a kind of preferred embodiment of the utility model, can not limit the interest field of the utility model certainly with this, and therefore the equivalent variations of being done according to the utility model claim still belongs to the scope that the utility model is contained.

Claims (4)

1, a kind of derate testing apparatus is characterized in that, comprising:
Be used to carry out the test cell of derate test;
Be used to control the control unit that described test cell carries out the derate test, described control unit links to each other with described test cell;
Be used to export the output unit of derate test result, described output unit links to each other with described test cell.
2, device as claimed in claim 1 is characterized in that, described test cell comprises following any one unit or the combination of unit arbitrarily:
The system test unit that is used for derate test Overall Power Consumption and stand-by power consumption;
The high-low pressure that is used for derate test complete machine starts the high-low pressure startup test cell of function;
The sound output test cell that is used for derate testing audio power output;
The picture tube test cell that is used for derate test picture tube;
The line pipe test cell that is used for voltage and current peak value, waveform and the power consumption of derate test line pipe;
The power supply test unit that is used for derate testing power supply switching tube and/or power supply IC;
The correction tube test cell that is used for derate test correction tube;
The power supply secondary commutation pipe test cell that is used for derate testing power supply secondary commutation pipe;
The voltage stabilizing IC and the DC-DC test cell that are used for derate test voltage stabilizing IC and DC-DC;
The power resistor test cell that is used for derate measured power resistance;
The capacity measurement unit that is used for the derate testing capacitor;
Be used for derate checkout area IC, look the IC test cell of putting IC.
3, device as claimed in claim 1 or 2 is characterized in that, described control unit comprises:
The derate control unit of the derate ratio when being used to set the test of electronic devices and components derate.
4, device as claimed in claim 3 is characterized in that, described control unit also comprises:
Be used for controlling the unit of testing and controlling that described test cell carries out the derate test according to the derate ratio that described derate control unit is set.
CNU2008202131943U 2008-11-07 2008-11-07 Derating test device Expired - Fee Related CN201315658Y (en)

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Application Number Priority Date Filing Date Title
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110829576A (en) * 2019-11-06 2020-02-21 漳州科华技术有限责任公司 Uninterruptible power supply input abnormity detection method and system and terminal equipment

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110829576A (en) * 2019-11-06 2020-02-21 漳州科华技术有限责任公司 Uninterruptible power supply input abnormity detection method and system and terminal equipment
CN110829576B (en) * 2019-11-06 2021-04-09 漳州科华技术有限责任公司 Uninterruptible power supply input abnormity detection method and system and terminal equipment

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C14 Grant of patent or utility model
GR01 Patent grant
C17 Cessation of patent right
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20090923

Termination date: 20111107