CN201260011Y

CN201260011Y - Test device

Info

Publication number: CN201260011Y
Application number: CNU2008202001278U
Authority: CN
Inventors: 朱德祥
Original assignee: Lotes Guangzhou Co Ltd
Current assignee: Lotes Guangzhou Co Ltd
Priority date: 2008-09-05
Filing date: 2008-09-05
Publication date: 2009-06-17
Anticipated expiration: 2018-09-05

Abstract

The utility model discloses a testing device, which comprises a body and at least one terminal; a plurality of containing holes and a plurality of limiting grooves are arranged on the body; the terminal is arranged in the containing holes; the terminal includes a first contacting part which is protruded form the upper surface of the body and is electrically conducted with a test chip, a second contacting part which is protruded from the lower surface of the body and is electrically conducted with a circuit board, a limiting block which is at least partially arranged in the limiting groove and an extending part which is connected with the limiting block. The limiting block of the terminal is fixed in the limiting groove of the body and the terminal is hard contacted with the limiting groove; therefore, the horizontal shifting width of the terminal can be rather small even the test device bears improper force, and the phenomenon of the poor contacting, inability of contacting or the misalignment of the test chip and the terminal can not occur.

Description

Testing apparatus

[technical field]

The utility model relates to a kind of testing apparatus, relates in particular to a kind of testing apparatus that is used for test chip.

[background technology]

Now, along with electronic system develops fast, people are more and more higher to the requirement of test chip transmission performance, thus, test chip need pass fast bus and electronic system swap data at a high speed, in order to ensure passing fast bus exchanging data by high speed normally between electronic installation, the input/output function of test chip will be through test, if want the input/output function of test chip, just must adopt high frequency testing apparatus at a high speed, could handle the high frequency input/output signal to test.

The patent No. a kind of testing apparatus that has been 5594355 U.S. Patent Publication; this testing apparatus comprises a body; this body is provided with a plurality of accepting grooves; accommodate a probe in each accepting groove; one elastomer is horizontally set with on accepting groove and is contained in the groove of probe; one lid protection probe and elastomer; it is located on the body; lid has passage, and in addition, probe is provided with a fulcrum; this fulcrum electrically contacts with the circuit of circuit board; probe also has feeler arm and electrically contacts with the test chip pin, and probe further is provided with a stop section, when the test chip pin acts on feeler arm; the probe fulcrum is swung on the circuit of circuit board; also can there be a rotational motion in whole probe by this, and in the process of this rotational motion, the stop section of probe can move in the passage of lid.

Its defective is: when the test chip pin acts on feeler arm, in case testing apparatus is subjected to improper external force, the wall of probe groove can act on elastomer, can be out of shape owing to elastomer again, so being compressed to very little shape in the horizontal direction, elastomer cause probe in accepting groove, to move horizontally a bigger amplitude, thereby probe can't be located in the horizontal direction, and then, can cause that the test chip pin is with the feeler arm loose contact, maybe can't contact or the generation of phenomenon such as dislocation.

Therefore, be necessary to design a kind of new testing apparatus, to overcome above-mentioned defective.

[utility model content]

The purpose of this utility model is to provide a kind of probe that prevents can't locate the testing apparatus that the test chip pin that causes can not contact with feeler arm or phenomenons such as loose contact or dislocation take place because of horizontal direction.

The utility model testing apparatus, comprise a body and at least one terminal, body is provided with a plurality of accommodation holes and a plurality of stopper slot, this terminal accommodating is in accommodation hole, described terminal comprises first contact site of an outstanding described body upper surface, and it electrically conducts mutually with described test chip, second contact site of an outstanding described body lower surface, it electrically conducts mutually with circuit board, and one is located in a guide vane end stop and an extension that links to each other with this guide vane end stop in the described stopper slot to small part.

Compared with prior art, the utlity model has following advantage: behind first contact site of test chip contact terminal, this terminal is the fulcrum motion that rotates with second contact site, because the guide vane end stop of terminal is limited in the stopper slot of body and terminal is rigid the contact with stopper slot, therefore, even testing apparatus is stressed improper, the terminal amplitude of moving horizontally can be very little, can not exist test chip with the first contact site loose contact of terminal, maybe can't contact or the generation of phenomenon such as dislocation.

[description of drawings]

Fig. 1 is the three-dimensional exploded view of the utility model testing apparatus;

Fig. 2 is the three-dimensional combination figure of testing apparatus shown in Figure 1;

Fig. 3 for shown in Figure 2 when A direction test chip acts on terminal front view.

[embodiment]

Below in conjunction with the drawings and specific embodiments the utility model testing apparatus is described further.

Please refer to Fig. 1, the utility model testing apparatus 1, in order to electrically conducting of a test chip (not shown) and a circuit board (not shown), it comprises a body 2, is contained at least one terminal 3 and at least one elastomer 4 in this body 2, this testing apparatus 1 also comprises at least one stop section 5, this stop section 5 can be independent moulding with this body 2, this stop section 5 also extends to form from described body 2, in the present embodiment, described stop section 5 is that stop section 5 independent moulding and described is a shielding plate.

Please refer to Fig. 1 to Fig. 3, described body 2 has a lower surface 25 that a upper surface 24 is parallel with described upper surface 24 with one and be oppositely arranged, the upper surface 24 of described body 2 convexes with at least one fin 241, in the present embodiment, the upper surface 24 of described body 2 convexes with four fins 241, these fins 241 surround a host cavity 242 of accommodating described test chip, described body 2 is provided with at least one running through on it,

lower surface

24,25 accommodation hole 21 and at least one stopper slot 22 that is connected with this accommodation hole 21, described stopper slot 22 extends to described fin 241 inside, simultaneously, described accommodation hole 21 also extends to described fin 241 inside.In addition, described body 2 offers at least two first through holes 27, and in the present embodiment, described body 2 contiguous its places, four angles are provided with described first through hole 27 respectively, the corresponding cooperation of location hole (not shown) that is provided with on described first through hole 27 and the described circuit board.

Please refer to Fig. 3, described terminal 3 is contained in the described accommodation hole 21, described terminal 3 comprises one second contact site 32, one first contact site 31 that extends to form from these second contact site, 32 1 sides, a guide vane end stop 33 that extends to form from these second contact site, 32 opposite sides and an extension 34 that links to each other with this guide vane end stop 33, this first contact site 31 is given prominence to the upper surface 24 of described bodies 2 and is electrically conducted with described test chip, this second contact site 32 is given prominence to the lower surface 25 of described bodies 2 and is electrically conducted with described circuit board, this guide vane end stop 33 is positioned at above-mentioned stopper slot 22, locating described terminal 3, described second contact site 32 to the horizontal range of described first contact site, 31 ends less than the horizontal range of described second contact site 32 to described extension 34 ends.

Please refer to Fig. 3, described elastomer 4 is positioned at described accommodation hole 21, when test chip acts on described first contact site 31, described elastomer 4 supports described extension 34, because there is the certain size error in described terminal 3, again because high frequency testing apparatus needs more described terminal 3, so in the process of test, the so many described terminal 3 of very difficult assurance can be simultaneously and electronic component (test chip, circuit board) excellent electrical property connects on same horizontal plane, can remedy the scale error of existence by the elastic deformation of described elastomer 4, thereby can overcome too many described terminal 3 can't while and the electronic component problem that excellent electrical property connects on same horizontal plane.

Please refer to Fig. 1 to Fig. 3, described stop section 5 is installed in the lower surface 25 times of described body 2, to carry described terminal 3, described stop section 5 and described elastomer 4 cooperate the extension 34 of the described lever terminal 3 of clamping, to avoid described terminal 3 vertically to break away from described accommodation hole 21, offer a square aperture 51 in the middle of the described stop section 5, second contact site 32 of described terminal 3 is positioned at described opening 51 or extends described opening 51, in addition, described stop section 5 is provided with first through hole 27 that four second through holes 52 correspond respectively to described body 2.

The test process of this testing apparatus is: described test chip is positioned in the described host cavity 242, at this moment, described test chip acts on described first contact site 31, described first contact site 31 is stressed to make that described terminal 3 is the fulcrum motion that rotates with its second contact site 32, described extension 34 supports described elastomer 4, distortion by described elastomer 4, overcome the scale error that described terminal 3 exists, make described terminal 3 can be simultaneously, consistent electrical contact circuit plate, thereby reach good test effect.

In sum, this creation has the following advantages:

Described terminal 3 is provided with a described limited block 33, when described test chip acts on described terminal 3, because described end Son 3 limited block 33 is limited in the stopper slot 22 of described body 2 and described terminal 3 is rigid the contact with described stopper slot 22, So when described terminal 3 was subjected to improper external force, described terminal 3 horizontal direction mobile ranges were very little, thereby, can avoid because of Described terminal 3 horizontal directions can't be located and be caused described test chip and 31 loose contacts of described first contact site or can't The generation of the phenomenons such as contact or dislocation, and then reach good test effect.

Claims

1. a testing apparatus in order to test chip and circuit board are electrically conducted, is characterized in that, comprising:

One body wherein is provided with the accommodation hole that at least one runs through its upper and lower surface, and at least one stopper slot that is connected with this accepting hole;

At least one terminal is located in the above-mentioned accommodation hole, and this terminal comprises first contact site of an outstanding described body upper surface, and it electrically conducts mutually with described test chip, and one gives prominence to second contact site of described body lower surface, itself and institute

Circuit board electrically conducts mutually, and one is located in a guide vane end stop and an extension that links to each other with this guide vane end stop in the described stopper slot to small part.

2. testing apparatus as claimed in claim 1 is characterized in that: described testing apparatus also comprises at least one elastomer, and it is located in the described accommodation hole, and offsets with described terminal.

3. testing apparatus as claimed in claim 1, it is characterized in that: described testing apparatus also comprises at least one elastomer, it is located in the described accommodation hole, and described first contact site is in a side of described second contact site, and this elastomer is positioned at the opposite side of described second contact site.

4. testing apparatus as claimed in claim 1 is characterized in that: described testing apparatus is provided with at least one stop section, and described terminal is carried in this stop section.

5. as claim 2 or 3 described testing apparatuss, it is characterized in that: described testing apparatus is provided with at least one stop section, and this stop section and described elastomer cooperate the extension of the described terminal of clamping.

6. as claim 4 or 5 described testing apparatuss, it is characterized in that: described stop section is a shielding plate.

7. as claim 4 or 5 described testing apparatuss, it is characterized in that: described stop section extends to form from described body.

8. testing apparatus as claimed in claim 1 is characterized in that: described body is convexly equipped with at least one fin from its upper surface, and described fin surrounds a host cavity of accommodating described test chip.