CN201218817Y - Automatic signal measurement platform - Google Patents

Automatic signal measurement platform Download PDF

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Publication number
CN201218817Y
CN201218817Y CNU2008200468685U CN200820046868U CN201218817Y CN 201218817 Y CN201218817 Y CN 201218817Y CN U2008200468685 U CNU2008200468685 U CN U2008200468685U CN 200820046868 U CN200820046868 U CN 200820046868U CN 201218817 Y CN201218817 Y CN 201218817Y
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CN
China
Prior art keywords
mentioned
measuring table
circuit orbit
automatic signal
controller
Prior art date
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Expired - Fee Related
Application number
CNU2008200468685U
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Chinese (zh)
Inventor
柳富升
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitac Computer Shunde Ltd
Shunda Computer Factory Co Ltd
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Mitac Computer Shunde Ltd
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Priority to CNU2008200468685U priority Critical patent/CN201218817Y/en
Application granted granted Critical
Publication of CN201218817Y publication Critical patent/CN201218817Y/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

The utility model disclose an automatic signal measuring table comprising a test board with a controller inside; a first circular orbit mounted on the surface of the test board, with the centre thereof as a put area for an object to be measured, a plurality of first robot arms being mounted on the first circular orbit, each being connected with the controller electrically, and each having a sounding rod base, each base having a sounding rod. Said controller is used for controlling each first robot arm to move on the first circular orbit. It is capable of enabling the sounding rod to position the coordinates of a test point accurately by use of the automatic signal measuring table of the utility model and there is no dead angle of the test points.

Description

The automatic signal measuring table
[technical field]
The relevant a kind of measuring table of the utility model is meant a kind of automatic signal measuring table especially.
[background technology]
At present, adopt oscillographic probe that the test point on the mainboard is carried out signal measurement, it is the middle position that thing to be measured is positioned over test board, and determinand around be fixed with several mechanical arms, each mechanical arm is provided with a probe seat, this probe seat utilizes X in order to fixing oscillographic probe, and the Y coordinate is done the location to the mechanical arm of test board on the mainboard finished product.Carry out signal measurement by this probe, and measurement result is shown on the oscillograph.
Yet, utilizing X, the Y coordinate can't make the mechanical arm of tester table do location accurately on the mainboard finished product.And mechanical arm is fixed on the test board, may on the next door of assembly the dead angle be arranged because of the position of test point.
In view of this, be necessary to provide a kind of automatic signal measuring table in fact, utilize this measuring table, can make the X of probe to test point, the Y coordinate is located accurately, and makes test point not have the dead angle.
[summary of the invention]
Therefore, the purpose of this utility model is to provide a kind of automatic signal measuring table, utilizes this measuring table, can make the X of probe to test point, and the Y coordinate is located accurately, and makes test point not have the dead angle.
For reaching above-mentioned purpose, automatic signal measuring table of the present utility model, this measuring table comprises:
One test board is provided with a controller in it;
One first circuit orbit, it is located at above-mentioned test board surface, these first circuit orbit central authorities are the determinand put area, this first circuit orbit is provided with several first mechanical arms, each first mechanical arm electrically connects with above-mentioned controller respectively, be respectively equipped with a probe seat on each first mechanical arm, be respectively equipped with a probe on each probe seat.
Especially, above-mentioned automatic signal measuring table also comprises one second circuit orbit, it is located at above-mentioned test board surface, above-mentioned first circuit orbit is sheathed in this second circuit orbit, this second circuit orbit is provided with one second mechanical arm, and this second mechanical arm is provided with a luminophor and two charge-coupled image sensors.
This first mechanical arm moves on this first circuit orbit above-mentioned controller in order to control respectively, and above-mentioned controller moves on this second circuit orbit in order to control this second mechanical arm.
Compared to prior art, utilize automatic signal measuring table of the present utility model, each first mechanical arm can move on this first circuit orbit, thereby probe is located accurately to the coordinate of test point, and makes test point not have the dead angle.
For the purpose of this utility model, structural attitude and function thereof are had further understanding, conjunction with figs. is described in detail as follows now:
[description of drawings]
Fig. 1 illustrates the structural representation of automatic signal measuring table one preferred embodiment of the present utility model.
[embodiment]
See also Fig. 1, it illustrates the structural representation of automatic signal measuring table one preferred embodiment of the present utility model.
For reaching above-mentioned purpose, automatic signal measuring table of the present utility model, in present embodiment, this measuring table comprises:
One test board 10 is provided with a controller 11 in it;
One first circuit orbit 12, it is located at above-mentioned test board 10 surfaces, these first circuit orbit, 12 central authorities are determinand 1 put area, this first circuit orbit 12 is provided with several first mechanical arms 13, each first mechanical arm 13 electrically connects with above-mentioned controller 11 respectively, be respectively equipped with a probe seat 14 on each first mechanical arm 13, be respectively equipped with a probe 15 on each probe seat 14;
One second circuit orbit 16, it is located at above-mentioned test board 10 surfaces, above-mentioned first circuit orbit 12 is sheathed in this second circuit orbit 16, and this second circuit orbit 16 is provided with one second mechanical arm 17, and this second mechanical arm 17 is provided with a luminophor 18 and two charge-coupled image sensors 19.
This first mechanical arm 13 moves on this first circuit orbit 12 above-mentioned controller 10 in order to control respectively, and above-mentioned controller 10 moves on this second circuit orbit 16 in order to control this second mechanical arm 17.
Certainly, above-mentioned each probe 15 also is connected with a probe line 20 respectively; Above-mentioned charge-coupled image sensor 19 also is connected with charge-coupled image sensor signal wire 21; Above-mentioned determinand 1 also is connected with a determinand control line 22; Above-mentioned controller 11 also is connected with a controller line 23.
Certainly, the other end of above-mentioned probe line 20 connects an oscillograph 3; Above-mentioned charge-coupled image sensor signal wire 21 other ends connect an image identification positioning system 4; Above-mentioned determinand control line 22 other ends connect a determinand tele-control system 5; Above-mentioned controller line 23 other ends connect one and measure editor's executive system 6.Above-mentioned image identification positioning system 4 also is connected with an automatic measuring system 7, and this automatic measuring system 7 also is connected with oscillograph 3.This oscillograph 3 also connects a host computer 8
Preferably, this measuring table also comprises a hub 2, in order to converge whole above-mentioned probe line 20, charge-coupled image sensor signal wire 21, determinand control line 22 and controller line 23.
When using, determinand tele-control system 5 control determinands 1 are opened, in the tested point preset coordinate of measuring editor's executive system 6 input determinands 1 and be transferred to controller 10 and make its probe 15 arrive above-mentioned preset coordinate to carry out control first mechanical arm 13, and the actual coordinate that above-mentioned charge-coupled image sensor 19 detecting probes 15 are reached, and be sent to image identification positioning system 4 and judge whether identical with preset coordinate, if it is different, finely tune again, until identical, image identification positioning system 4 reinforms automatic measuring system 7 and measures, this measurement result is sent to oscillograph 3 again, and oscillograph 3 finally is sent to a host computer 8 with these these data again.
Compared to prior art, utilize automatic signal measuring table of the present utility model, each first mechanical arm 13 can move on this first circuit orbit 12, thereby the coordinate of 15 pairs of test points of probe is located accurately, and makes test point not have the dead angle.

Claims (7)

1, a kind of automatic signal measuring table is characterized in that, this measuring table comprises:
One test board is provided with a controller in it;
One first circuit orbit, it is located at above-mentioned test board surface, these first circuit orbit central authorities are the determinand put area, this first circuit orbit is provided with several first mechanical arms, each first mechanical arm electrically connects with above-mentioned controller respectively, be respectively equipped with a probe seat on each first mechanical arm, be respectively equipped with a probe on each probe seat.
2, automatic signal measuring table as claimed in claim 1 is characterized in that, above-mentioned automatic signal measuring table also comprises one second circuit orbit, and it is located at above-mentioned test board surface, and above-mentioned first circuit orbit is sheathed in this second circuit orbit.
3, automatic signal measuring table as claimed in claim 2 is characterized in that, this second circuit orbit is provided with one second mechanical arm, and this second mechanical arm is provided with a luminophor and two charge-coupled image sensors.
4, automatic signal measuring table as claimed in claim 1 is characterized in that, above-mentioned controller control respectively this first mechanical arm is moved on this first circuit orbit.
5, as claim 2 or 3 described automatic signal measuring tables, it is characterized in that above-mentioned controller is controlled this second mechanical arm and moved on this second circuit orbit.
6, automatic signal measuring table as claimed in claim 3 is characterized in that, above-mentioned each probe also is connected with a probe line respectively; Above-mentioned charge-coupled image sensor also is connected with the charge-coupled image sensor signal wire; Above-mentioned determinand also is connected with a determinand control line; Above-mentioned controller also is connected with a controller line.
7, automatic signal measuring table as claimed in claim 6 is characterized in that, this measuring table also comprises a hub, and this hub converges puts in order above-mentioned probe line, charge-coupled image sensor signal wire, determinand control line and controller line.
CNU2008200468685U 2008-04-25 2008-04-25 Automatic signal measurement platform Expired - Fee Related CN201218817Y (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CNU2008200468685U CN201218817Y (en) 2008-04-25 2008-04-25 Automatic signal measurement platform

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CNU2008200468685U CN201218817Y (en) 2008-04-25 2008-04-25 Automatic signal measurement platform

Publications (1)

Publication Number Publication Date
CN201218817Y true CN201218817Y (en) 2009-04-08

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CNU2008200468685U Expired - Fee Related CN201218817Y (en) 2008-04-25 2008-04-25 Automatic signal measurement platform

Country Status (1)

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CN (1) CN201218817Y (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101907644A (en) * 2009-06-04 2010-12-08 鸿富锦精密工业(深圳)有限公司 Electronic probe control system
CN102116826A (en) * 2009-12-30 2011-07-06 鸿富锦精密工业(深圳)有限公司 System and method for measuring voltage of pin of electronic component
CN102298090A (en) * 2010-06-28 2011-12-28 鸿富锦精密工业(深圳)有限公司 Signal integrity test system and method
US8242798B2 (en) 2009-05-25 2012-08-14 Hon Hai Precision Industry Co., Ltd. Signal testing system and method of a printed circuit board
CN101865975B (en) * 2009-04-16 2012-11-21 鸿富锦精密工业(深圳)有限公司 Main board testing system and method
CN104062945A (en) * 2013-03-18 2014-09-24 张朵 Automatic detection control method and system

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101865975B (en) * 2009-04-16 2012-11-21 鸿富锦精密工业(深圳)有限公司 Main board testing system and method
US8242798B2 (en) 2009-05-25 2012-08-14 Hon Hai Precision Industry Co., Ltd. Signal testing system and method of a printed circuit board
CN101907644A (en) * 2009-06-04 2010-12-08 鸿富锦精密工业(深圳)有限公司 Electronic probe control system
CN101907644B (en) * 2009-06-04 2013-11-06 鸿富锦精密工业(深圳)有限公司 Electronic probe control system
CN102116826A (en) * 2009-12-30 2011-07-06 鸿富锦精密工业(深圳)有限公司 System and method for measuring voltage of pin of electronic component
CN102298090A (en) * 2010-06-28 2011-12-28 鸿富锦精密工业(深圳)有限公司 Signal integrity test system and method
CN104062945A (en) * 2013-03-18 2014-09-24 张朵 Automatic detection control method and system
CN104062945B (en) * 2013-03-18 2016-12-28 张朵 A kind of automatic detection control method and system

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C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20090408

Termination date: 20160425