CN201069386Y - LED optical pass testing device - Google Patents

LED optical pass testing device Download PDF

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Publication number
CN201069386Y
CN201069386Y CNU2007200744322U CN200720074432U CN201069386Y CN 201069386 Y CN201069386 Y CN 201069386Y CN U2007200744322 U CNU2007200744322 U CN U2007200744322U CN 200720074432 U CN200720074432 U CN 200720074432U CN 201069386 Y CN201069386 Y CN 201069386Y
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CN
China
Prior art keywords
led
light
reflector
flux
luminous flux
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Expired - Fee Related
Application number
CNU2007200744322U
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Chinese (zh)
Inventor
刘木清
李文宜
张万路
江磊
葛爱明
周小丽
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Fudan University
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Fudan University
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Priority to CNU2007200744322U priority Critical patent/CN201069386Y/en
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Publication of CN201069386Y publication Critical patent/CN201069386Y/en
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Abstract

The utility model belongs to the technical field of light source measurement, specifically a LED light flux measurement device. The device comprises a reflection cup, a clamp, a light-flux meter and a power supply, wherein the clamp fixes a LED at the bottom of the reflection cup, the LED emits light towards the opening of the reflection cup, the light-flux meter is tightly fixed at the opening of the reflection cup to receive optical signals, the power supply is a constant-current power supply for driving the LED. The total light flux of the LED is focused by the reflection cup and then collected and measured by the light-flux meter, and finally the light-flux meter displays the value of total light flux. The utility model has the advantages of simple structure and high measurement accuracy.

Description

LED luminous flux proving installation
Technical field
The utility model belongs to the light source measurement technical field, is specifically related to LED luminous flux proving installation.
Technical background
Semiconductor technology is breeding a new Industrial Revolution again after having caused microelectronic revolution---illumination revolution.The characteristics of light emitting diode (LED) make it obtain very big application in fields such as demonstration and special lightings.It is general lighting market that but the theoretic high light efficiency of LED makes its potential huge applications prospect.In various LED used, external quantum efficiency was the important indicator of LED, i.e. emergent light flux and the ratio that injects electric energy.
The test difficult point of LED external quantum efficiency is the test of luminous flux.Because LED, generally acknowledged easily-testing method that can be close with the conventional light source light flux testing method is not arranged so far in the world.
The problem that existing LED light flux testing method exists comprises:
(1) adopt in the classic method integrating sphere as when placing light source, baffle plate, because the logical ball of the light of test LED is generally very little, even diameter has only 5cm, and Theory of integrating sphere can't satisfy, thereby cause the test philosophy error;
(2) as placement surface, luminous conventional criteria lamp can't adopt to the four sides, and adopt the LED standard lamp to have the problem that can't realize spectral calibration.
These problems make the test of LED luminous flux have difference always, thereby have also influenced the differentiation to the LED performance, are unfavorable for the development of LED industry.
Summary of the invention
The purpose of this utility model be to provide a kind of simple in structure, measure the device of LED luminous flux accurately.
The measurement LED luminous flux device that the utility model proposes, form by power supply 1, anchor clamps 2, reflector 4 and lumen meter 5, wherein, anchor clamps 2 are fixed on LED to be measured the bottom of reflector 4, the LED light emission direction points to the reflector opening, lumen meter is fixed on the opening part of reflector, in order to receiving optical signals; Power supply adopts constant-current supply, driving LED.
In the utility model,
1 can adopt heteroid anchor clamps to cooperate the visible light LED of different packing forms, is positioned at the reflector bottom end vicinity with the luminescent center that guarantees visible light LED.
2 adopt the luminous flux gathering-device of reflector as tested visible light LED, and the reflectivity of reflector inwall evaporation reflectance coating is 99%.
3 lumen meters adopt silicon photocell as the probe material, and the probe sensitive surface is installed cosine corrector and V (λ) optical filter.V (λ) the optical filter match responding with the human eye luminosity function that is used to realize to pop one's head in, the cosine corrector is used to proofread and correct the light signal response of different directions.Probe fits tightly the reflector light-emitting window, to guarantee that emergent light drops within the photronic investigative range fully.The structure of lumen meter as shown in Figure 2.
Description of drawings
Fig. 1 is a LED total light flux test macro synoptic diagram.
Fig. 2 is the structural representation of silicon photocell lumen meter.
Number in the figure: 1 constant-current supply, 2LED anchor clamps, 3 LED to be measured, 4 reflectors, 5 lumen meters, 6 cosine correctors, 7V (λ) optical filter, 8 silicon photocell detector, 9 current-to-voltage converting circuits, 10 operational amplifiers, 11 displays.
Embodiment
The used element of the utility model is as follows:
LED3: tested led light source;
Reflector 4: be used to assemble the reflector of LED luminous flux, its ultimate principle is that cup inside surface evaporation high reflectance reflectivity 99% reflective membrane forms reflecting surface, and this surface reflexes to big opening direction with incident ray, realizes the gathering of light.Rotationally symmetric body that the concrete shape of cup can be cone, with para-curve be bus or the like can be realized the shape of light-ray condensing function.
Power supply 1: constant-current supply;
Lumen meter 5: with the lumen meter of silicon photocell as detector;
The instrument assembling process:
Assemble according to Fig. 1, tested LED3 is fixed on the bottom position of reflector 2 by anchor clamps.The silicon photocell test surface of lumen meter 5 is close to the light-emitting window of reflector and is installed.
Lumen meter is a conventional equipment, by: cosine corrector 6, V (λ) optical filter 7 and photodetector 8 and subsequent conditioning circuit comprise that current-to-voltage converting circuit 9, operational amplifier 10 and display 11 etc. form.
Below be this novel specific embodiment that is used to test visible light LED luminous flux.
The required main device of one test:
1, LED anchor clamps cooperate the packing forms of existing each main flow visible light LED, and the different package dimensions of different encapsulated types cooperate different anchor clamps the luminescent center of visible light LED to be positioned at the bottom position of reflector.
2, reflector, cup inwall evaporation reflectance coating, the rete reflectivity is 99%.
3, lumen meter, the probe of lumen meter adopts silicon photocell, and uses cosine corrector and V (λ) optical filter that it is revised.
Two test processs
Test with device shown in Figure 1,25 ℃ of environment temperatures, LED model to be measured is CREE XR-E, constant current 80mA drives.
The LED preheating begins test after 15 minutes.Obtain lumen meter and be output as 1.631m.
Be confirmatory experiment result's order of accuarcy, measure same LEDs with small distributed photometer secondary.The test environment temperature is all 25 ℃, drive current 80mA, and the LED preheating began test in 15 minutes.
The distributed photometer that adopts is the LED626 distribution photometer that a distant place, Hangzhou information company limited produces, and the measuring accuracy of this instrument is:
The forward current measuring accuracy ±0.2%F.S.
The forward voltage measuring accuracy ±0.2%F.S.
The reverse voltage measuring accuracy ±0.2%F.S.
The reverse leakage current measuring accuracy ±0.2%F.S.
Test result is as follows: the total light flux of tested LED is 1.7181m
Because the method for distribution photometer measurement light source total light flux is the absolute method of measurement of luminous flux, the precision of its measurement is very high, compares two kinds of measurement results that method draws, and can see:
Test result of the present invention (1m) Distribution photometer test result (1m)
1.63 1.718
This novel result of recording compares with the distribution photometer test result only 5% difference, and this result more preponderates on accuracy near 10% error compared to measure LED luminous flux method with integrating sphere.

Claims (4)

1. LED luminous flux proving installation, it is characterized in that forming by power supply (1), anchor clamps (2), reflector (4) and lumen meter (5), wherein, anchor clamps (2) are fixed on LED to be measured the bottom of reflector (4), the LED light emission direction points to the reflector opening, lumen meter is fixed on the opening part of reflector, in order to receiving optical signals; Power supply adopts constant-current supply, driving LED.
2. LED luminous flux proving installation according to claim 1, the inwall reflectivity that it is characterized in that described reflector (4) is more than 99%.
3. LED luminous flux proving installation according to claim 1 is characterized in that described reflector (4) is the taper or the paraboloid of revolution.
4. LED luminous flux proving installation according to claim 1 is characterized in that described lumen meter (5) is connected to form successively by cosine corrector (6), V (λ) optical filter (7), photodetector (8), current-to-voltage converting circuit (9), operational amplifier (10), display (11).
CNU2007200744322U 2007-09-06 2007-09-06 LED optical pass testing device Expired - Fee Related CN201069386Y (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CNU2007200744322U CN201069386Y (en) 2007-09-06 2007-09-06 LED optical pass testing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CNU2007200744322U CN201069386Y (en) 2007-09-06 2007-09-06 LED optical pass testing device

Publications (1)

Publication Number Publication Date
CN201069386Y true CN201069386Y (en) 2008-06-04

Family

ID=39490775

Family Applications (1)

Application Number Title Priority Date Filing Date
CNU2007200744322U Expired - Fee Related CN201069386Y (en) 2007-09-06 2007-09-06 LED optical pass testing device

Country Status (1)

Country Link
CN (1) CN201069386Y (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102589682A (en) * 2012-01-18 2012-07-18 深圳市聚飞光电股份有限公司 White light light-emitting diode (LED) measuring system and method
CN103018256A (en) * 2012-12-13 2013-04-03 清华大学深圳研究生院 LED (light-emitting diode) defect detecting system
TWI414764B (en) * 2010-06-29 2013-11-11 Ind Tech Res Inst Method and device for measuring luminous flux
CN103728015A (en) * 2012-10-16 2014-04-16 台湾超微光学股份有限公司 Optical head and optical system using the same
CN103969032A (en) * 2014-05-26 2014-08-06 复旦大学 LED luminous flux measurement system based on free-form surface lens
CN104412079A (en) * 2012-05-09 2015-03-11 希捷科技有限公司 Surface features mapping
CN111220295A (en) * 2018-11-26 2020-06-02 中国科学院长春光学精密机械与物理研究所 Automatic detection equipment and measurement method for non-contact measurement of junction temperature of LED lamp

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI414764B (en) * 2010-06-29 2013-11-11 Ind Tech Res Inst Method and device for measuring luminous flux
CN102589682A (en) * 2012-01-18 2012-07-18 深圳市聚飞光电股份有限公司 White light light-emitting diode (LED) measuring system and method
CN102589682B (en) * 2012-01-18 2014-10-08 深圳市聚飞光电股份有限公司 White light light-emitting diode (LED) measuring system and method
CN104412079A (en) * 2012-05-09 2015-03-11 希捷科技有限公司 Surface features mapping
CN103728015A (en) * 2012-10-16 2014-04-16 台湾超微光学股份有限公司 Optical head and optical system using the same
TWI452268B (en) * 2012-10-16 2014-09-11 Oto Photonics Inc Optical head for receiving light and optical system using the same
CN103728015B (en) * 2012-10-16 2016-04-20 台湾超微光学股份有限公司 Optical head and optical system using the same
CN103018256A (en) * 2012-12-13 2013-04-03 清华大学深圳研究生院 LED (light-emitting diode) defect detecting system
CN103018256B (en) * 2012-12-13 2014-08-13 清华大学深圳研究生院 LED (light-emitting diode) defect detecting system
CN103969032A (en) * 2014-05-26 2014-08-06 复旦大学 LED luminous flux measurement system based on free-form surface lens
CN111220295A (en) * 2018-11-26 2020-06-02 中国科学院长春光学精密机械与物理研究所 Automatic detection equipment and measurement method for non-contact measurement of junction temperature of LED lamp

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C14 Grant of patent or utility model
GR01 Patent grant
C17 Cessation of patent right
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20080604

Termination date: 20110906